KR20020028480A - Handler of horizontal type for testing device and method for operating the same - Google Patents

Abstract

PURPOSE: A horizontal device test handler and an operation method thereof are provided, which reduces the number of pick and place epochally, and minimizes a damage of a device and reduces an index time, and performs a room temperature and a high temperature test. CONSTITUTION: A loading part(10), where trays(11) filled with devices to be tested, is installed in one side of a front part of a base(1) of a handler. And an unloading part(20) comprising a number of good devices loading trays(21) and retest device loading trays(22) where devices classified as good devices and retest devices among the devices whose tests are completed are loaded respectively is installed on both sides of the loading part. And a number of failed devices loading trays(23) loaded with failed devices are comprised in another side of the front of the base. Each tray of the loading part and the unloading part is moved front and back on the base of the handler. And a loading shuttle(51) divided into a number of sections is comprised on a center of the base.

Description

Handler of horizontal type for testing device and method for operating the same}

TECHNICAL FIELD The present invention relates to a horizontal test handler for testing a device, and more particularly, to a horizontal device test handler and a method of operating the same, capable of testing room temperature and high temperature conditions of a logic device.

In general, devices manufactured on the production line are tested to determine whether they are good or defective before shipping. The horizontal handler is a QFP, BGA, PGA, which is mainly a non-memory semiconductor package. This equipment is used to test various logic devices such as SOP, etc., and the device contained in the tray is transferred to the horizontal state between processes to perform the test in the horizontally placed test part, and then classified into several grades according to the test result and then placed into the tray again. To load.

However, the conventional horizontal handlers as described above have a large number of pick and place operations, and thus, expensive devices are often damaged during the operation, and index efficiency is long, resulting in high efficiency. There was a problem of deterioration.

Accordingly, the present invention has been made to solve the above problems, by dramatically reducing the number of pick (Pick & Place) to pick up the device, to minimize the damage of the device and to reduce the index time, The purpose is to provide a horizontal device test handler capable of both a room temperature test and a high temperature test and a method of operating the same.

1 is a plan view showing the configuration of a horizontal handler according to the present invention

Figure 2 is a perspective view showing only the main part to show the configuration of the horizontal handler of FIG.

Explanation of Reference Symbols in Major Parts of Drawings

1-Base 10-Loading Section

11-Tray 20-Unloading Section

21-Tray for loading good goods 22-Tray for loading retest items

23-Tray for loading defective items 31-Guide frame

32-loading head 33-first unloading head

34-2nd unloading head 40-Preheater

41-Heating Plate 42-Transfer Cylinder

45-Loading Shuttle Conveyor 51-Loading Shuttle

55-Unloading shuttle 60-Test chamber

61-test socket 62-indexer

71-Buffer section 80-Tray trans

According to an aspect of the present invention for achieving the above object, the loading unit is installed on the base of the handler, the tray on which the devices to be tested are placed; A loading shuttle to which the devices placed on the tray of the loading unit are transferred and remounted; A preheater for preheating the devices on the loading shuttle while the loading shuttle passes during the high temperature test of the device; A test socket in which the device on the loading shuttle is continuously transferred and mounted after the loading shuttle passing through the preheating unit is transferred and positioned; and an unloading shuttle in which the tested device is transferred and mounted on the test socket; A test apparatus comprising: an indexing device for continuously transferring a device of a loading shuttle to a test socket, a tested device of a test socket to the unloading shuttle, and a heat supply means for supplying hot heat to the test socket during a high temperature test A chamber; An unloading unit comprising a plurality of trays for classifying and loading the devices mounted in the unloading shuttle of the test chamber according to a test result; There is provided a horizontal device test handler configured to include a transfer device for transferring the device of the loading unit to the loading shuttle and the device of the unloading shuttle to the unloading unit.

In addition, according to the present invention, the preheating unit is made of a heating plate that is heated while the loading shuttle is mounted.

This reduces the number of tasks of picking up the device, enabling both the room temperature and high temperature testing of the device in the handler itself.

In addition, according to the horizontal handler of the present invention, the unloading unit includes a plurality of good quality stacking trays on which the sorted devices are placed and stacked, and a plurality of retested articles on which the sorted devices are determined and stacked. The stacking tray and a plurality of trays for stacking defective products, which are determined and sorted as defective products, are placed and stacked, thereby stacking and stacking the devices according to the test results.

In addition, according to the present invention, the conveying apparatus is provided with a guide frame installed to horizontally cross the upper portion of the handler, and is movably installed on one side of the guide frame, and grips the device to be tested while being moved along the guide frame. And a loading head for remounting on the loading shuttle and the other side of the guide frame, which is installed to be movable on the other side of the guide frame, holding the tested devices on the unloading shuttle while moving along the guide frame and classifying and loading them into each tray of the unloading unit. It is configured to include a head.

Accordingly, the transport device for transporting the device moves uniaxially on the handler, thereby improving the safety of the work.

According to another aspect of the present invention, the horizontal handler further includes a buffer unit for temporarily loading devices determined as defective before the device of the unloading shuttle is transferred to the unloading unit, and the transfer unit further comprises the buffer unit. And a second unloading head for separately transferring the defective device loaded into the tray to the defective article stacking tray of the unloading unit.

Accordingly, since the devices determined to be defective are separately loaded on the defective product stacking tray of the unloading unit, the device unloading operation can be efficiently performed.

In addition, according to another aspect of the present invention, the horizontal handler further includes a loading shuttle directing device for allowing the loading shuttle to be transferred directly to the test chamber without passing through the preheating part when the device is tested at room temperature.

As a result, when the room temperature test is performed, the test operation can be made more efficiently by shortening the movement path of the loading shuttle.

In addition, the horizontal handler of the present invention is characterized in that it further comprises a tray dispensing apparatus for distributing and supplying the empty tray to the unloading unit after all the devices are transferred from the tray of the loading unit.

According to this, the empty tray can be recycled and used on the handler, thereby increasing the efficiency of test work and facilitating the work.

According to another aspect of the present invention, there is provided a method of operating a horizontal handler having the above configuration, the method comprising: loading a tray filled with a device to be tested in a loading unit; Gripping the devices loaded on the loading unit with a loading head of a transfer device, transferring the devices to a loading shuttle, and remounting the devices; During a high temperature test of the device, preheating the devices on the loading shuttle while passing the loading shuttle through a preheating unit after the devices are mounted on the loading shuttle; Transferring the loading shuttle passing through the preheater to the test chamber; During the room temperature test of the device, after the devices are mounted on the loading shuttle, transferring the loading shuttle to the test chamber without a preheating unit to the test chamber; Mounting the device on the loading shuttle transported into the test chamber to the test socket by the indexing device to perform a test and then unloading the unloading shuttle; The tested devices filled on the unloading shuttle are classified according to the test results, and the devices, which are judged as good or reinspected as the first unloading head, are transferred to the unloading unit for loading the good and reinspected goods, and installed as defective. Determining that the determined devices are temporarily mounted in the buffer unit; Provided is a method of operating a horizontal device test handler configured to transfer and mount devices mounted on the buffer unit to a tray for loading defective parts of the unloading unit as a second unloading head of the transfer apparatus.

Hereinafter, with reference to the accompanying drawings an embodiment of the configuration and operation method of the horizontal handler of the present invention will be described in detail.

1 and 2 illustrate a configuration of a horizontal handler according to the present invention. In one side of the front part of the base 1 of the handler, a loading unit 10 in which trays 11 filled with devices to be tested are stacked up and down is provided. On both sides of the loading unit 10, a plurality of good quality stacking trays 21 and retestable stacking trays 22, each of which are classified as good and retested products, are loaded. The unloading part 20 provided is provided.

In addition, the other side of the front part of the base 1 is provided with a plurality of defective goods stacking trays 23 for classifying and stacking devices determined as defective products among tested devices according to a defective grade. The stacking tray 21, the retesting stacking tray 22, and the defective stacking tray 23 form the unloading unit 20.

Each tray of the loading section 10 and the unloading section 20 is movable back and forth on the base 1 of the handler.

In addition, the central portion of the base 1 is provided with a loading shuttle 51 partitioned into a plurality of compartments for remounting the devices transferred from the tray 11 of the loading unit 10.

In addition, a guide frame 31 is installed at an intermediate portion of the base 1 to cross the upper portion of the base 1, and both sides of the guide frame 31 are movable along the guide frame 31. The loading head 32 and the first unloading head 33 and the second unloading head 34 are installed, and the loading head 32 and the second unloading head 34 are guide frames 31. Each part of the guide frame 31 is moved in the range which is installed on the same surface of each other and does not overlap each other.

The loading head 32 is responsible for holding and loading the devices loaded on the tray 11 of the loading unit 10 to the loading shuttle 51, and the first and second unloading heads 33. , 34 serves to classify and load the tested devices into the trays 21, 22, and 23 of the unloading unit 20.

Meanwhile, a heating plate 41 in which the devices on the loading shuttle 51 are preheated while the loading shuttle 51 filled with the device is mounted on the front part of the base 1, and the loading shuttle 51 is heated by the heating plate ( The preheating part 40 which consists of the transfer cylinder 42 which conveys on 41 is provided.

The heating plate 41 is preferably operated by electrical energy to facilitate temperature control.

The heating plate 41 of the preheater 40 is installed at the rear of the base 1 and extends to the test chamber 60 for testing the device, and the loading shuttle 51 passing through the preheater 40. ) Is transferred into the test chamber 60.

On the other hand, when performing the room temperature test of the device does not need to preheat the device on the loading shuttle 51, the loading shuttle entry portion of the preheater 40, the loading shuttle 51 during the room temperature test of the device Is equipped with a direct loading shuttle 45 for the transfer to the position near the test chamber 60 in the shortest path without passing through the foreground of the preheater 40.

In addition, the test chamber 60 is configured to form a substantially closed space in order to maintain the ambient temperature at a constant state during the high temperature test of the device. The test chamber 60 is transferred through the preheater 40 in the test chamber 60. A test socket 61 for mounting a device on the loading shuttle 51 to perform a test; an unloading shuttle 55 for remounting the device tested in the test socket 61; An index device 62 for continuously transferring the device to be tested to the test socket 61, the tested device of the test socket 61 to the unloading shuttle 55, and the test socket during the high temperature state test of the device ( A heat supply duct 63 for supplying a high temperature gas to 61 is provided.

Since the loading shuttle 51 is movable in the test chamber 60, all the devices to be tested are transferred so that the empty loading shuttle 51 is transferred to the rear side of the test chamber 60, and then the unloading shuttle ( 55) is moved to the position to act as the unloading shuttle (55).

The unloading shuttle 55 filled with all the tested devices is drawn out of the test chamber 60 to be moved to the position of the guide frame 31 in the middle of the base 1.

On the other hand, the front side of the test chamber 60, the buffer unit 71 is temporarily installed on the side of the guide frame 31 to the reciprocating movement is installed on the other side of the device that is determined to be defective among the tested devices have.

In addition, on the rear side of the base 1, the empty trays 11 transferred from the loading unit 10 are loaded with the good goods stacking tray 21 of the unloading unit 20 and the trays for retesting item loading 22. Tray transfer (80; tray transfer) is provided to distribute to both sides for use.

Hereinafter, the operation of the horizontal handler having the above configuration will be described.

First, when the operation of the handler is started while the plurality of trays 11 filled with devices to be tested in the loading unit 10 are stacked up and down, the bottom of the trays 11 stacked on the loading unit 10 are started. The tray moves sequentially from the rear of the base.

The tray 11 moved backward from the loading unit 10 pauses at the front side of the guide frame 31 in the middle of the base 1 and proceeds step by step as the device is taken out. At this time, the guide frame 31 The loading head 32 on) moves reciprocally between the tray 11 and the loading shuttle 51 and moves the device in the tray 11 to the loading shuttle 51 for mounting.

Subsequently, the trays from which the devices are all taken out are transferred to the tray transfer 80 behind the base, while the loading shuttle 51 filled with all the devices is transferred onto the heating plate 41 of the preheater 40 and preheated. Or it is directly conveyed to the rear part of the preheating part 40 by the loading shuttle transfer device 45.

The loading shuttle 51 via the preheater 40 is transferred to the test chamber 60 behind the base 1, and in this test chamber 60 the loading shuttle 51 is provided by the indexing device 62. Devices are continuously transported and mounted on the test socket 61 to perform the test, and then the tested devices are again mounted on the unloading shuttle 55 opposite the loading shuttle 51 by the indexing device 62. .

When all the tested devices are mounted on the unloading shuttle 55, the unloading shuttle 55 is drawn out through the front part of the test chamber 60 to be located directly below the guide frame 31, and then the guide frame ( The first unloading head 33 of 31 moves along the guide frame 31 and moves the devices of the unloading shuttle 55 to the trays 21, 22, and 23 of the unloading unit 20 according to the test result. The devices that are determined to be good are loaded into the good loading tray 21, the devices that are determined to be re-inspected needing to be retested are loaded into the retestable loading tray 22, and the devices determined to be defective are It is loaded in the buffer part 71.

Subsequently, when the buffer unit 71 moves to a position opposite to the guide frame 31, the second unloading head 34 of the guide frame 31 moves, and the defective devices on the buffer unit 71 may be replaced with a tray for loading defective products. 23) in the

On the other hand, when the testing of the devices loaded in the loading unit is completed, the test is automatically performed on the devices loaded on the re-inspection loading tray 22 of the unloading unit 20, bar of the base (1) The tray 22 for re-inspecting article placed in the front is moved to the rear to the tray transfer 80 position, and then moved to the front of the base 1 at the position coinciding with the loading section 10 again. It pauses immediately below the frame 31 and advances step by step depending on whether the device is taken out.

At this time, the loading head 32 on the guide frame 31 picks up the device of the tray 22 for re-inspecting article loading and transports it to the loading shuttle 51, and the subsequent procedure is the same as described above, When all the devices of the tray 22 have been tested and unloaded, the operation is finished.

As described above, the horizontal handler according to the present invention can drastically reduce the damage of the device that can occur during operation by greatly reducing the number of pick & place operations, and the index time (Index By reducing the time, the test efficiency can be maximized.

Claims (10)

A loading unit mounted on the base of the handler, on which trays in which devices to be tested are placed are loaded; A loading shuttle to which the devices placed on the tray of the loading unit are transferred and remounted; A preheater for preheating the devices on the loading shuttle while the loading shuttle passes during the high temperature test of the device; A test socket in which the device on the loading shuttle is continuously transferred and mounted after the loading shuttle passing through the preheating unit is transferred and positioned; and an unloading shuttle in which the tested device is transferred and mounted on the test socket; A test apparatus comprising: an indexing device for continuously transferring a device of a loading shuttle to a test socket, a tested device of a test socket to the unloading shuttle, and a heat supply means for supplying hot heat to the test socket during a high temperature test A chamber; An unloading unit comprising a plurality of trays for classifying and loading the devices mounted in the unloading shuttle of the test chamber according to a test result; And a transfer device for transferring the device of the loading unit to the loading shuttle and the device of the unloading shuttle to the unloading unit. The horizontal device test handler as claimed in claim 1, wherein the preheating unit comprises a heating plate which is heated while the loading shuttle is mounted thereon. The apparatus of claim 1, wherein the unloading unit comprises: a plurality of good quality stacking trays on which the devices classified and classified as good are placed and loaded; a plurality of retestable stacking trays on which the devices classified and determined as retested are placed and stacked; A horizontal device test handler, comprising: a plurality of defective product stacking trays in which devices classified and classified as defective are placed and stacked. According to claim 1, wherein the transfer device is a guide frame installed to horizontally cross the upper portion of the handler, and is movably installed on one side of the guide frame to grip the device to be tested of the loading unit while moving along the guide frame And a loading head for remounting on the loading shuttle and the other side of the guide frame, which is installed to be movable on the other side of the guide frame, holding the tested devices on the unloading shuttle while moving along the guide frame and classifying and loading them into each tray of the unloading unit. Horizontal device test handler comprising a head. The horizontal device test handler as claimed in claim 1 or 4, further comprising a buffer unit which temporarily loads the devices determined as defective before transferring the devices of the unloading shuttle to the unloading unit. 6. The horizontal device test handler as claimed in claim 5, wherein the transfer device further comprises a second unloading head for separately transferring a defective device loaded in the buffer unit to a tray for loading a defective product in the unloading unit. The horizontal device test handler as claimed in claim 1, further comprising a loading shuttle directing device configured to transfer the loading shuttle directly to the test chamber without passing through the preheating unit when the device is tested at room temperature. The horizontal device test handler as claimed in claim 1, further comprising a tray dispensing device configured to distribute and supply an empty tray to the unloading unit after all devices are transferred from the tray of the loading unit. The horizontal device test handler as claimed in claim 1, wherein the transfer device is configured to move left and right only in one horizontal axis of the handler. Loading a tray filled with a device to be tested in the loading unit; Gripping the devices loaded on the loading unit with a loading head of a transfer device, transferring the devices to a loading shuttle, and remounting the devices; During a high temperature test of the device, preheating the devices on the loading shuttle while passing the loading shuttle through a preheating unit after the devices are mounted on the loading shuttle; Transferring the loading shuttle passing through the preheater to the test chamber; During the room temperature test of the device, after the devices are mounted on the loading shuttle, transferring the loading shuttle to the test chamber without a preheating unit to the test chamber; Mounting the device on the loading shuttle transported into the test chamber to the test socket by the indexing device to perform a test and then unloading the unloading shuttle; The tested devices filled on the unloading shuttle are classified according to the test results, and the devices, which are judged as good or reinspected as the first unloading head, are transferred to the unloading unit for loading the good and reinspected goods, and installed as defective. Determining that the determined devices are temporarily mounted in the buffer unit; And transferring the devices mounted on the buffer part to the unloading part loading tray as a second unloading head of the conveying apparatus.