KR20020025042A - 기판 처리 장치, 기판 처리 방법 및 반도체 장치의 제조방법 - Google Patents
기판 처리 장치, 기판 처리 방법 및 반도체 장치의 제조방법 Download PDFInfo
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- KR20020025042A KR20020025042A KR1020010059858A KR20010059858A KR20020025042A KR 20020025042 A KR20020025042 A KR 20020025042A KR 1020010059858 A KR1020010059858 A KR 1020010059858A KR 20010059858 A KR20010059858 A KR 20010059858A KR 20020025042 A KR20020025042 A KR 20020025042A
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- 239000000758 substrate Substances 0.000 title claims abstract description 96
- 238000000034 method Methods 0.000 title claims abstract description 87
- 238000004519 manufacturing process Methods 0.000 title claims description 23
- 239000004065 semiconductor Substances 0.000 title claims description 11
- 238000003672 processing method Methods 0.000 claims description 13
- 239000000969 carrier Substances 0.000 abstract description 3
- 238000010923 batch production Methods 0.000 abstract 2
- 238000005229 chemical vapour deposition Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 170
- 238000003860 storage Methods 0.000 description 8
- 238000009792 diffusion process Methods 0.000 description 7
- 238000007789 sealing Methods 0.000 description 6
- 239000012535 impurity Substances 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000011109 contamination Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000005468 ion implantation Methods 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 235000013405 beer Nutrition 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/28556—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by chemical means, e.g. CVD, LPCVD, PECVD, laser CVD
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (12)
- 하우징의 내부에 프로세스 튜브가 설치되어 있고, 상기 프로세스 튜브에서 한번에 처리하는 제품 기판의 매수가 1대의 제품 기판용 캐리어에 수납되는 매수 이하로 설정되어 있고, 또한 1대의 제품 기판용 캐리어에 수용된 제품 기판이 한번에 처리되는 것을 특징으로 하는기판 처리 장치.
- 제 1 항에 있어서,상기 제품 기판용 캐리어는 캡을 갖는 포드로 구성되어 있고, 이 포드의 캡을 개폐하는 하나 또는 복수의 포드 오프너와, 상기 포드를 탑재하는 하나 또는 복수의 포드 스테이지를 구비하고 있고, 상기 포드 오프너의 포드 탑재대와 상기 포드 스테이지가 상기 하우징의 외부에 각각 설치되어 있는 것을 특징으로 하는기판 처리 장치.
- 한번에 처리되는 상기 제품 기판의 매수가 1대의 상기 제품 기판용 캐리어에 수납되는 기판의 매수 이하이며, 1대의 제품 기판용 캐리어에 수납된 제품 기판이 한번에 처리되는 것을 특징으로 하는기판 처리 방법.
- 한번에 처리되는 상기 제품 기판의 매수가 1대의 상기 제품 기판용 캐리어에 수납되는 기판의 매수 이하이며, 1대의 제품 기판용 캐리어에 수납된 제품 기판이 한번에 처리되는 것을 특징으로 하는반도체 장치의 제조 방법.
- 프로세스 튜브가 설치된 하우징과, 복수매의 기판을 수납하는 포드의 캡을 개폐하는 하나 또는 복수의 포드 오프너와, 상기 포드를 탑재하는 하나 또는 복수의 포드 스테이지와, 상기 포드를 상기 포드 오프너의 포드 탑재대와 상기 포드 스테이지 사이에서 반송하는 포드 반송 장치를 구비하고 있는 기판 처리 장치에 있어서,상기 포드 오프너의 포드 탑재대와 상기 포드 스테이지가 상기 하우징의 외부에 각각 배치되어 있는 것을 특징으로 하는기판 처리 장치.
- 제 5 항에 있어서,상기 포드 반송 장치는 상기 포드 오프너의 포드 탑재대와 상기 포드 스테이의 위쪽에 배치되어 있는 것을 특징으로 하는기판 처리 장치.
- 제 6 항에 있어서,상기 포드 오프너의 포드 탑재대와 상기 포드 스테이지는 이웃하도록 배치되어 있는 것을 특징으로 하는기판 처리 장치.
- 제 7 항에 있어서,상기 포드 스테이지가 복수 배치되어 있는 것을 특징으로 하는기판 처리 장치.
- 제 8 항에 있어서,상기 포드 오프너의 포드 탑재대가 복수의 상기 포드 스테이지 사이에 끼워지도록 배치되어 있는 것을 특징으로 하는기판 처리 장치.
- 제 9 항에 있어서,복수의 상기 포드 스테이지의 하나에 제품 기판용 포드가 탑재되고, 다른 포드 스테이지에 더미 기판용 포드가 탑재되어 있는 것을 특징으로 하는기판 처리 장치.
- 복수매의 기판이 수납된 포드가 하우징의 외부에 배치된 포드 스테이지에 탑재되고, 이 포드가 상기 하우징의 외부에 배치된 포드 오프너의 포드 탑재부로 포드 반송 장치에 의해 반송되고, 상기 포드의 캡이 상기 포드 오프너에 의해서 열려, 상기 포드내의 기판이 상기 하우징의 내부로 반송되어 소정의 처리가 그 기판에 실시되는 것을 특징으로 하는기판 처리 방법.
- 복수매의 기판이 수납된 포드가 하우징의 외부에 배치된 포드 스테이지에 탑재되고, 이 포드가 상기 하우징의 외부에 배치된 포드 오프너의 포드 탑재부로 포드 반송 장치에 의해서 반송되고, 상기 포드의 캡이 상기 포드 오프너에 의해서 열려, 상기 포드내의 기판이 상기 하우징의 내부에 반송되어 소정의 처리가 그 기판에 실시되는 것을 특징으로 하는반도체 장치의 제조 방법.
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2000-00294176 | 2000-09-27 | ||
JP2000294176 | 2000-09-27 | ||
JP2000330968 | 2000-10-30 | ||
JPJP-P-2000-00330968 | 2000-10-30 | ||
JP2001134821A JP4342745B2 (ja) | 2000-09-27 | 2001-05-02 | 基板処理方法および半導体装置の製造方法 |
JPJP-P-2001-00134821 | 2001-05-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020025042A true KR20020025042A (ko) | 2002-04-03 |
KR100532584B1 KR100532584B1 (ko) | 2005-12-02 |
Family
ID=27344765
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR10-2001-0059858A KR100532584B1 (ko) | 2000-09-27 | 2001-09-27 | 기판 처리 장치, 기판 처리 방법 및 반도체 장치의 제조방법 |
Country Status (4)
Country | Link |
---|---|
US (2) | US6638860B2 (ko) |
JP (1) | JP4342745B2 (ko) |
KR (1) | KR100532584B1 (ko) |
TW (1) | TW563184B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004109632A2 (en) * | 2003-06-05 | 2004-12-16 | Charm Engineering Co., Ltd. | Working stage system for flat panel display and flat panel display working method using same |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4342745B2 (ja) * | 2000-09-27 | 2009-10-14 | 株式会社日立国際電気 | 基板処理方法および半導体装置の製造方法 |
JP4731755B2 (ja) * | 2001-07-26 | 2011-07-27 | 東京エレクトロン株式会社 | 移載装置の制御方法および熱処理方法並びに熱処理装置 |
US6748282B2 (en) * | 2002-08-22 | 2004-06-08 | Taiwan Semiconductor Manufacturing Co., Ltd | Flexible dispatching system and method for coordinating between a manual automated dispatching mode |
JP4413562B2 (ja) * | 2003-09-05 | 2010-02-10 | 東京エレクトロン株式会社 | 処理システム及び処理方法 |
JP4047826B2 (ja) * | 2004-03-25 | 2008-02-13 | 東京エレクトロン株式会社 | 縦型熱処理装置及び移載機構の自動教示方法 |
JP4559427B2 (ja) * | 2004-07-13 | 2010-10-06 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
JPWO2007102426A1 (ja) * | 2006-03-06 | 2009-07-23 | 株式会社日立国際電気 | 基板処理装置および基板処理方法 |
TWI452643B (zh) * | 2006-05-11 | 2014-09-11 | Tokyo Electron Ltd | Inspection device and inspection method |
US7887280B2 (en) * | 2006-05-11 | 2011-02-15 | Tokyo Electron Limited | Processing apparatus |
JP4762825B2 (ja) * | 2006-08-21 | 2011-08-31 | 日精樹脂工業株式会社 | Icカード製造システム及びその駆動方法 |
JP4762826B2 (ja) * | 2006-08-21 | 2011-08-31 | 日精樹脂工業株式会社 | Icカード製造システム |
US7740437B2 (en) | 2006-09-22 | 2010-06-22 | Asm International N.V. | Processing system with increased cassette storage capacity |
US7585142B2 (en) * | 2007-03-16 | 2009-09-08 | Asm America, Inc. | Substrate handling chamber with movable substrate carrier loading platform |
KR100978129B1 (ko) | 2008-06-04 | 2010-08-26 | 세메스 주식회사 | 기판 이송 방법 |
US9449862B2 (en) | 2011-06-03 | 2016-09-20 | Tel Nexx, Inc. | Parallel single substrate processing system |
US8807550B2 (en) * | 2011-12-13 | 2014-08-19 | Intermolecular, Inc. | Method and apparatus for controlling force between reactor and substrate |
KR102384558B1 (ko) * | 2017-09-27 | 2022-04-08 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 반도체 장치의 제조 방법 및 프로그램 |
KR102622303B1 (ko) * | 2017-11-16 | 2024-01-05 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 스팀 어닐링 프로세싱 장치 |
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KR100251873B1 (ko) * | 1993-01-21 | 2000-04-15 | 마쓰바 구니유키 | 종형 열처리 장치 |
JP3218488B2 (ja) * | 1993-03-16 | 2001-10-15 | 東京エレクトロン株式会社 | 処理装置 |
KR100310249B1 (ko) * | 1995-08-05 | 2001-12-17 | 엔도 마코토 | 기판처리장치 |
JP3070660B2 (ja) * | 1996-06-03 | 2000-07-31 | 日本電気株式会社 | 気体不純物の捕獲方法及び半導体製造装置 |
KR19990031280A (ko) * | 1997-10-10 | 1999-05-06 | 윤종용 | 이온 주입 장치의 엔드스테이션 모듈 |
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JP2000021798A (ja) * | 1998-07-03 | 2000-01-21 | Kokusai Electric Co Ltd | 基板処理装置 |
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JP4342745B2 (ja) * | 2000-09-27 | 2009-10-14 | 株式会社日立国際電気 | 基板処理方法および半導体装置の製造方法 |
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2001
- 2001-05-02 JP JP2001134821A patent/JP4342745B2/ja not_active Expired - Lifetime
- 2001-09-27 TW TW090123947A patent/TW563184B/zh not_active IP Right Cessation
- 2001-09-27 KR KR10-2001-0059858A patent/KR100532584B1/ko active IP Right Grant
- 2001-09-27 US US09/963,382 patent/US6638860B2/en not_active Expired - Lifetime
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2003
- 2003-10-01 US US10/674,345 patent/US6927165B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004109632A2 (en) * | 2003-06-05 | 2004-12-16 | Charm Engineering Co., Ltd. | Working stage system for flat panel display and flat panel display working method using same |
WO2004109632A3 (en) * | 2003-06-05 | 2005-02-17 | Charm Engineering Co Ltd | Working stage system for flat panel display and flat panel display working method using same |
Also Published As
Publication number | Publication date |
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KR100532584B1 (ko) | 2005-12-02 |
US6927165B2 (en) | 2005-08-09 |
JP2002203892A (ja) | 2002-07-19 |
JP4342745B2 (ja) | 2009-10-14 |
US20020037645A1 (en) | 2002-03-28 |
TW563184B (en) | 2003-11-21 |
US6638860B2 (en) | 2003-10-28 |
US20040177926A1 (en) | 2004-09-16 |
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