KR20010102294A - 무전해도금액 및 이것을 사용한 배선형성방법 - Google Patents
무전해도금액 및 이것을 사용한 배선형성방법 Download PDFInfo
- Publication number
- KR20010102294A KR20010102294A KR1020017010619A KR20017010619A KR20010102294A KR 20010102294 A KR20010102294 A KR 20010102294A KR 1020017010619 A KR1020017010619 A KR 1020017010619A KR 20017010619 A KR20017010619 A KR 20017010619A KR 20010102294 A KR20010102294 A KR 20010102294A
- Authority
- KR
- South Korea
- Prior art keywords
- copper
- plating solution
- wiring
- electroless
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/38—Coating with copper
- C23C18/40—Coating with copper using reducing agents
- C23C18/405—Formaldehyde
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1605—Process or apparatus coating on selected surface areas by masking
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1646—Characteristics of the product obtained
- C23C18/165—Multilayered product
- C23C18/1653—Two or more layers with at least one layer obtained by electroless plating and one layer obtained by electroplating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/46—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a liquid
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemically Coating (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-1999-00365464 | 1999-12-22 | ||
| JP36546499A JP2001181854A (ja) | 1999-12-22 | 1999-12-22 | 無電解めっき液及びこれを用いた配線形成方法 |
| PCT/JP2000/009099 WO2001046494A1 (en) | 1999-12-22 | 2000-12-21 | Electroless plating solution and method of forming wiring with the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20010102294A true KR20010102294A (ko) | 2001-11-15 |
Family
ID=18484335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020017010619A Ceased KR20010102294A (ko) | 1999-12-22 | 2000-12-21 | 무전해도금액 및 이것을 사용한 배선형성방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20030024431A1 (https=) |
| EP (1) | EP1160356A1 (https=) |
| JP (1) | JP2001181854A (https=) |
| KR (1) | KR20010102294A (https=) |
| TW (1) | TW581823B (https=) |
| WO (1) | WO2001046494A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030039980A (ko) * | 2001-11-15 | 2003-05-22 | 가부시끼가이샤 히다치 세이사꾸쇼 | 무전해 구리 도금액, 무전해 구리 도금 보충액, 및배선판의 제조방법 |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100758186B1 (ko) * | 2000-03-21 | 2007-09-13 | 와코 쥰야꾸 고교 가부시키가이샤 | 반도체 기판 세정제 및 세정 방법 |
| KR100434946B1 (ko) * | 2001-09-28 | 2004-06-10 | 학교법인 성균관대학 | 무전해도금방식을 이용한 반도체 소자의 구리배선형성방법 |
| US6875260B2 (en) | 2002-12-10 | 2005-04-05 | Enthone Inc. | Copper activator solution and method for semiconductor seed layer enhancement |
| US6897152B2 (en) | 2003-02-05 | 2005-05-24 | Enthone Inc. | Copper bath composition for electroless and/or electrolytic filling of vias and trenches for integrated circuit fabrication |
| JP2004304167A (ja) | 2003-03-20 | 2004-10-28 | Advanced Lcd Technologies Development Center Co Ltd | 配線、表示装置及び、これらの形成方法 |
| JP2011154380A (ja) * | 2003-03-20 | 2011-08-11 | Toshiba Mobile Display Co Ltd | 表示装置の形成方法 |
| JP4931196B2 (ja) * | 2005-11-08 | 2012-05-16 | 学校法人早稲田大学 | 無電解銅めっき浴、無電解銅めっき方法及びulsi銅配線形成方法 |
| KR20080083790A (ko) * | 2007-03-13 | 2008-09-19 | 삼성전자주식회사 | 무전해 구리 도금액, 그의 제조방법 및 무전해 구리도금방법 |
| US20080248194A1 (en) * | 2007-04-04 | 2008-10-09 | L'air Liquide - Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Method for producing a copper layer on a substrate in a flat panel display manufacturing process |
| FR3013995A1 (fr) * | 2013-11-29 | 2015-06-05 | Commissariat Energie Atomique | Procede ameliore de metallisation d'un materiau poreux |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3473890D1 (en) * | 1983-07-25 | 1988-10-13 | Hitachi Ltd | Electroless copper plating solution |
| JPH0684545B2 (ja) * | 1985-03-29 | 1994-10-26 | 日立化成工業株式会社 | 無電解銅めっき液 |
| JPH07193214A (ja) * | 1993-12-27 | 1995-07-28 | Mitsubishi Electric Corp | バイアホール及びその形成方法 |
| KR960005765A (ko) * | 1994-07-14 | 1996-02-23 | 모리시다 요이치 | 반도체 장치의 배선형성에 이용하는 무전해 도금욕 및 반도체 장치의 배선성형방법 |
| JPH09316649A (ja) * | 1996-05-27 | 1997-12-09 | Matsushita Electric Ind Co Ltd | 無電解めっき液 |
| JP3276919B2 (ja) * | 1998-03-06 | 2002-04-22 | 英夫 本間 | 樹脂基材への高密着性めっき方法およびこれに用いる銅めっき液 |
| JP3217319B2 (ja) * | 1998-12-11 | 2001-10-09 | 松下電器産業株式会社 | 半導体装置の製造方法 |
-
1999
- 1999-12-22 JP JP36546499A patent/JP2001181854A/ja active Pending
-
2000
- 2000-12-21 KR KR1020017010619A patent/KR20010102294A/ko not_active Ceased
- 2000-12-21 WO PCT/JP2000/009099 patent/WO2001046494A1/ja not_active Ceased
- 2000-12-21 US US09/890,455 patent/US20030024431A1/en not_active Abandoned
- 2000-12-21 EP EP00985822A patent/EP1160356A1/en not_active Withdrawn
- 2000-12-22 TW TW089127647A patent/TW581823B/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030039980A (ko) * | 2001-11-15 | 2003-05-22 | 가부시끼가이샤 히다치 세이사꾸쇼 | 무전해 구리 도금액, 무전해 구리 도금 보충액, 및배선판의 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20030024431A1 (en) | 2003-02-06 |
| WO2001046494A1 (en) | 2001-06-28 |
| TW581823B (en) | 2004-04-01 |
| JP2001181854A (ja) | 2001-07-03 |
| EP1160356A1 (en) | 2001-12-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| R18 | Changes to party contact information recorded |
Free format text: ST27 STATUS EVENT CODE: A-3-3-R10-R18-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |