KR20000002270A - 펠티에 효과를 이용한 온도 제어 장치 - Google Patents
펠티에 효과를 이용한 온도 제어 장치 Download PDFInfo
- Publication number
- KR20000002270A KR20000002270A KR1019980022942A KR19980022942A KR20000002270A KR 20000002270 A KR20000002270 A KR 20000002270A KR 1019980022942 A KR1019980022942 A KR 1019980022942A KR 19980022942 A KR19980022942 A KR 19980022942A KR 20000002270 A KR20000002270 A KR 20000002270A
- Authority
- KR
- South Korea
- Prior art keywords
- control
- temperature
- metal
- test chamber
- peltier effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000005679 Peltier effect Effects 0.000 title claims abstract description 6
- 239000002184 metal Substances 0.000 claims abstract description 35
- 229910052751 metal Inorganic materials 0.000 claims abstract description 35
- 150000002739 metals Chemical class 0.000 claims abstract description 9
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000003507 refrigerant Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Control Of Temperature (AREA)
Abstract
Description
Claims (1)
- 이종(異種)의 두 금속이 맞대어진 구조의 제어 금속이 한 쌍으로 구비되고, 각 제어 금속의 양단은 온도 제어가 실시되는 소정의 대상체의 내부 및 외부에 배치되며, 상기 각 제어 금속의 양단은 금속 재질의 제어판에 의해 연결되고, 각 제어 금속의 외측은 직류 전원에 연결되어, 상기 직류 전원으로부터 양극 또는 음극 전압이 선택적으로 인가되어서, 상기 각 제어 금속 및 제어판의 온도가 상승 또는 하강되는 것에 의해, 상기 대상체의 온도를 제어하도록 구성된 것을 특징으로 하는 펠티에 효과를 이용한 온도 제어 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980022942A KR20000002270A (ko) | 1998-06-18 | 1998-06-18 | 펠티에 효과를 이용한 온도 제어 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980022942A KR20000002270A (ko) | 1998-06-18 | 1998-06-18 | 펠티에 효과를 이용한 온도 제어 장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20000002270A true KR20000002270A (ko) | 2000-01-15 |
Family
ID=19539929
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019980022942A Ceased KR20000002270A (ko) | 1998-06-18 | 1998-06-18 | 펠티에 효과를 이용한 온도 제어 장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20000002270A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100742291B1 (ko) * | 2005-11-10 | 2007-07-24 | 주식회사 메모리앤테스팅 | 메모리모듈 검사용 냉/온기 발생장치 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05259322A (ja) * | 1992-03-10 | 1993-10-08 | Nec Yamagata Ltd | 半導体装置 |
JPH0714890A (ja) * | 1993-06-24 | 1995-01-17 | Rohm Co Ltd | 電子部品の環境試験用温度設定装置およびこれを用いた電子部品の環境試験装置ならびに方法 |
US5515683A (en) * | 1992-09-22 | 1996-05-14 | Litef Gmbh | Thermoelectric heating or cooling device |
JPH09179078A (ja) * | 1995-12-25 | 1997-07-11 | Tera Tec:Kk | 光遅延装置 |
KR980011795A (ko) * | 1996-07-19 | 1998-04-30 | 김광호 | 챔버와 온도조절부가 일체형으로 된 반도체 제조장비 |
-
1998
- 1998-06-18 KR KR1019980022942A patent/KR20000002270A/ko not_active Ceased
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05259322A (ja) * | 1992-03-10 | 1993-10-08 | Nec Yamagata Ltd | 半導体装置 |
US5515683A (en) * | 1992-09-22 | 1996-05-14 | Litef Gmbh | Thermoelectric heating or cooling device |
JPH0714890A (ja) * | 1993-06-24 | 1995-01-17 | Rohm Co Ltd | 電子部品の環境試験用温度設定装置およびこれを用いた電子部品の環境試験装置ならびに方法 |
JPH09179078A (ja) * | 1995-12-25 | 1997-07-11 | Tera Tec:Kk | 光遅延装置 |
KR980011795A (ko) * | 1996-07-19 | 1998-04-30 | 김광호 | 챔버와 온도조절부가 일체형으로 된 반도체 제조장비 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100742291B1 (ko) * | 2005-11-10 | 2007-07-24 | 주식회사 메모리앤테스팅 | 메모리모듈 검사용 냉/온기 발생장치 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6212608B2 (ja) | 高周波美容処理装置 | |
CN104282643B (zh) | 基于tec的微型传感器温控系统 | |
KR20000002270A (ko) | 펠티에 효과를 이용한 온도 제어 장치 | |
KR960025299A (ko) | 플라즈마표시채널에의 돌입전류의 억제가 가능한 플라즈마구동회로 | |
KR880009461A (ko) | 레이저 장치 | |
KR101661958B1 (ko) | 인쇄회로기판 및 인쇄회로기판을 포함하는 모터구동장치 | |
JP5127866B2 (ja) | ペルチェ素子の駆動装置および駆動方法 | |
US2977559A (en) | Low resistance electrolytic tilt device | |
JP4617724B2 (ja) | 冷却装置、冷却装置の製造方法、接合装置及び電子機器 | |
JP2007281356A (ja) | 圧電セラミックトランス装置およびこれを用いる光源装置 | |
ATE318065T1 (de) | Elektrische heizpatrone | |
JP2011007496A (ja) | 分析装置 | |
JP2006261095A (ja) | 面状ヒータ装置 | |
JPH0643436A (ja) | 液晶表示器 | |
JP2009284195A (ja) | 電気機器及びその駆動方法 | |
JP2002314279A (ja) | 冷却装置 | |
JP2007040837A (ja) | ヒータシステム | |
JP2872116B2 (ja) | 冷陰極管 | |
JP2019184447A (ja) | 半導体試験装置 | |
KR200175568Y1 (ko) | Fed소자의 게터 형성 구조 | |
JP2015062330A (ja) | スタートアップ機能を有する電子制御回路 | |
JP2006108542A (ja) | 分極装置 | |
JP2005123375A (ja) | スイッチング装置 | |
JPH11307918A (ja) | ボンディング装置 | |
SU1388213A1 (ru) | Устройство дл пайки |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19980618 |
|
PG1501 | Laying open of application | ||
N231 | Notification of change of applicant | ||
PN2301 | Change of applicant |
Patent event date: 20011206 Comment text: Notification of Change of Applicant Patent event code: PN23011R01D |
|
N231 | Notification of change of applicant | ||
PN2301 | Change of applicant |
Patent event date: 20030228 Comment text: Notification of Change of Applicant Patent event code: PN23011R01D |
|
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20030418 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19980618 Comment text: Patent Application |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20041207 Patent event code: PE09021S01D |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20050630 Patent event code: PE09021S01D |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20051027 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20050630 Comment text: Notification of reason for refusal Patent event code: PE06011S01I Patent event date: 20041207 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |