KR102775938B1 - 광 반응 평가 장치 및 포톤수 산출 방법 - Google Patents
광 반응 평가 장치 및 포톤수 산출 방법 Download PDFInfo
- Publication number
- KR102775938B1 KR102775938B1 KR1020227027926A KR20227027926A KR102775938B1 KR 102775938 B1 KR102775938 B1 KR 102775938B1 KR 1020227027926 A KR1020227027926 A KR 1020227027926A KR 20227027926 A KR20227027926 A KR 20227027926A KR 102775938 B1 KR102775938 B1 KR 102775938B1
- Authority
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- South Korea
- Prior art keywords
- light
- light source
- intensity distribution
- sample
- irradiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000011156 evaluation Methods 0.000 title claims description 45
- 238000000034 method Methods 0.000 title claims description 23
- 238000009826 distribution Methods 0.000 claims abstract description 148
- 238000001514 detection method Methods 0.000 claims abstract description 106
- 238000005259 measurement Methods 0.000 claims abstract description 90
- 230000005855 radiation Effects 0.000 claims abstract description 71
- 238000004364 calculation method Methods 0.000 claims abstract description 28
- 230000004298 light response Effects 0.000 claims description 34
- 238000000862 absorption spectrum Methods 0.000 claims description 28
- 230000003287 optical effect Effects 0.000 claims description 18
- 230000004044 response Effects 0.000 claims description 15
- 238000010521 absorption reaction Methods 0.000 claims description 10
- 230000005284 excitation Effects 0.000 claims description 8
- 238000011835 investigation Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 238000012545 processing Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 9
- 238000006552 photochemical reaction Methods 0.000 description 9
- 239000000126 substance Substances 0.000 description 8
- 238000006862 quantum yield reaction Methods 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 2
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 229910052805 deuterium Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2866—Markers; Calibrating of scan
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3125—Measuring the absorption by excited molecules
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6491—Measuring fluorescence and transmission; Correcting inner filter effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/127—Calibration; base line adjustment; drift compensation
- G01N2201/12707—Pre-test of apparatus, e.g. dark test, sensor test
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020027514 | 2020-02-20 | ||
| JPJP-P-2020-027514 | 2020-02-20 | ||
| PCT/JP2020/036556 WO2021166310A1 (ja) | 2020-02-20 | 2020-09-28 | 光反応評価装置およびフォトン数算出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20220123469A KR20220123469A (ko) | 2022-09-06 |
| KR102775938B1 true KR102775938B1 (ko) | 2025-03-04 |
Family
ID=77390601
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020227027926A Active KR102775938B1 (ko) | 2020-02-20 | 2020-09-28 | 광 반응 평가 장치 및 포톤수 산출 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20230082052A1 (https=) |
| EP (1) | EP4109075A4 (https=) |
| JP (1) | JP7315088B2 (https=) |
| KR (1) | KR102775938B1 (https=) |
| CN (1) | CN115104023A (https=) |
| WO (1) | WO2021166310A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20240230524A1 (en) * | 2021-05-06 | 2024-07-11 | Shimadzu Corporation | Photoreaction Evaluation Apparatus |
| US20250052613A1 (en) * | 2021-12-14 | 2025-02-13 | Shimadzu Corporation | Spectrophotometer |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001060010A (ja) | 1999-08-24 | 2001-03-06 | Fuji Xerox Co Ltd | 短波長レーザ用電子写真感光体及びそれを用いた画像形成装置 |
| US20100029952A1 (en) | 2008-05-23 | 2010-02-04 | Kent State University | Fluorogenic compounds converted to fluorophores by photochemical or chemical means and their use in biological systems |
| CN108033977A (zh) | 2018-01-17 | 2018-05-15 | 上海科技大学 | 一种有机锡卤化合物发光材料的制备及应用 |
| JP2019128202A (ja) | 2018-01-23 | 2019-08-01 | 浜松ホトニクス株式会社 | 光測定装置及び光測定方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001013094A1 (en) * | 1999-08-19 | 2001-02-22 | Washington State University Research Foundation | Methods for determining the physiological state of a plant |
| WO2009000293A1 (de) * | 2007-06-25 | 2008-12-31 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Messgerät und verfahren zur bestimmung optischer kenngrössen zum nachweis photo- und elektrochemischer abbaureaktionen |
| DE102008038968A1 (de) | 2008-08-13 | 2010-02-18 | Schad Gmbh | System zur Überwachung, Steuerung und Datenerfassung technischer Prozesse |
| US20100292581A1 (en) * | 2009-05-13 | 2010-11-18 | Peter Guy Howard | Dynamic Calibration of an Optical Spectrometer |
| JP6248460B2 (ja) | 2013-08-08 | 2017-12-20 | 株式会社島津製作所 | 励起光照射装置 |
| JP6279399B2 (ja) * | 2014-05-23 | 2018-02-14 | 浜松ホトニクス株式会社 | 光計測装置及び光計測方法 |
| JP6693694B2 (ja) * | 2014-12-02 | 2020-05-13 | 浜松ホトニクス株式会社 | 分光測定装置および分光測定方法 |
| CN105738339B (zh) * | 2016-03-30 | 2018-09-21 | 东南大学 | 一种荧光粉量子效率测量装置 |
| EP3532429B1 (en) * | 2016-10-26 | 2025-08-06 | Board of Regents, The University of Texas System | High throughput, high resolution optical metrology for reflective and transmissive nanophotonic devices |
| JP2018179884A (ja) * | 2017-04-19 | 2018-11-15 | 株式会社島津製作所 | 量子収率算出方法、分光蛍光光度計及び量子収率算出プログラム |
| WO2018198364A1 (ja) * | 2017-04-28 | 2018-11-01 | 株式会社島津製作所 | 分光蛍光光度計、分光測定方法、及び分光蛍光光度計用制御ソフトウェア |
| JP6763995B2 (ja) * | 2019-04-18 | 2020-09-30 | 浜松ホトニクス株式会社 | 分光測定装置および分光測定方法 |
-
2020
- 2020-09-28 WO PCT/JP2020/036556 patent/WO2021166310A1/ja not_active Ceased
- 2020-09-28 JP JP2022501618A patent/JP7315088B2/ja active Active
- 2020-09-28 US US17/792,572 patent/US20230082052A1/en not_active Abandoned
- 2020-09-28 EP EP20919516.3A patent/EP4109075A4/en not_active Withdrawn
- 2020-09-28 CN CN202080096404.9A patent/CN115104023A/zh not_active Withdrawn
- 2020-09-28 KR KR1020227027926A patent/KR102775938B1/ko active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001060010A (ja) | 1999-08-24 | 2001-03-06 | Fuji Xerox Co Ltd | 短波長レーザ用電子写真感光体及びそれを用いた画像形成装置 |
| US20100029952A1 (en) | 2008-05-23 | 2010-02-04 | Kent State University | Fluorogenic compounds converted to fluorophores by photochemical or chemical means and their use in biological systems |
| CN108033977A (zh) | 2018-01-17 | 2018-05-15 | 上海科技大学 | 一种有机锡卤化合物发光材料的制备及应用 |
| JP2019128202A (ja) | 2018-01-23 | 2019-08-01 | 浜松ホトニクス株式会社 | 光測定装置及び光測定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP4109075A4 (en) | 2024-04-03 |
| KR20220123469A (ko) | 2022-09-06 |
| CN115104023A (zh) | 2022-09-23 |
| US20230082052A1 (en) | 2023-03-16 |
| JP7315088B2 (ja) | 2023-07-26 |
| WO2021166310A1 (ja) | 2021-08-26 |
| JPWO2021166310A1 (https=) | 2021-08-26 |
| EP4109075A1 (en) | 2022-12-28 |
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Patent event date: 20220811 Patent event code: PA01051R01D Comment text: International Patent Application |
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