KR102610063B1 - 적외선 온도 센서, 회로 기판 및 상기 센서를 이용한 장치 - Google Patents
적외선 온도 센서, 회로 기판 및 상기 센서를 이용한 장치 Download PDFInfo
- Publication number
- KR102610063B1 KR102610063B1 KR1020177026408A KR20177026408A KR102610063B1 KR 102610063 B1 KR102610063 B1 KR 102610063B1 KR 1020177026408 A KR1020177026408 A KR 1020177026408A KR 20177026408 A KR20177026408 A KR 20177026408A KR 102610063 B1 KR102610063 B1 KR 102610063B1
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- South Korea
- Prior art keywords
- temperature sensor
- infrared
- substrate
- infrared temperature
- sensor according
- Prior art date
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0215—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/20—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N15/00—Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using the Nernst-Ettingshausen effect
- H10N15/10—Thermoelectric devices using thermal change of the dielectric constant, e.g. working above and below the Curie point
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015063207 | 2015-03-25 | ||
| JPJP-P-2015-063207 | 2015-03-25 | ||
| PCT/JP2016/051663 WO2016152220A1 (ja) | 2015-03-25 | 2016-01-21 | 赤外線温度センサ、回路基板及び赤外線温度センサを用いた装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20170129755A KR20170129755A (ko) | 2017-11-27 |
| KR102610063B1 true KR102610063B1 (ko) | 2023-12-05 |
Family
ID=56979219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020177026408A KR102610063B1 (ko) | 2015-03-25 | 2016-01-21 | 적외선 온도 센서, 회로 기판 및 상기 센서를 이용한 장치 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6076549B1 (zh) |
| KR (1) | KR102610063B1 (zh) |
| CN (1) | CN107407602B (zh) |
| WO (1) | WO2016152220A1 (zh) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109073468B (zh) * | 2016-12-20 | 2020-04-28 | 株式会社芝浦电子 | 红外线温度传感器及其制造方法 |
| WO2018225141A1 (ja) * | 2017-06-06 | 2018-12-13 | 株式会社芝浦電子 | 赤外線温度センサおよびその製造方法 |
| JP6892500B2 (ja) * | 2017-09-12 | 2021-06-23 | 株式会社芝浦電子 | 赤外線温度センサ |
| CN111504476A (zh) * | 2019-01-31 | 2020-08-07 | 众智光电科技股份有限公司 | 红外线温度传感器 |
| CN113447132A (zh) * | 2020-03-27 | 2021-09-28 | 维沃移动通信有限公司 | 电子设备 |
| TWI841861B (zh) * | 2021-07-29 | 2024-05-11 | 原相科技股份有限公司 | 高穩定度溫度計結構及使用該溫度計結構的系統 |
| CN115767881B (zh) * | 2022-12-29 | 2024-02-13 | 安徽光智科技有限公司 | 红外焦平面成像系统的emc整改方法、红外焦平面成像系统 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003194630A (ja) * | 2001-12-27 | 2003-07-09 | Ishizuka Electronics Corp | 非接触温度センサおよび非接触温度センサ用検出回路 |
| JP2008111849A (ja) * | 1997-09-29 | 2008-05-15 | Ishizuka Electronics Corp | 非接触温度センサ |
| JP2011013213A (ja) * | 2009-06-02 | 2011-01-20 | Mitsubishi Materials Corp | 赤外線センサ |
| WO2015020081A1 (ja) * | 2013-08-09 | 2015-02-12 | Ｓｅｍｉｔｅｃ株式会社 | 赤外線温度センサ及び赤外線温度センサを用いた装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4628540B2 (ja) | 2000-11-20 | 2011-02-09 | 石塚電子株式会社 | 赤外線温度センサ |
| JP2006270885A (ja) * | 2005-03-25 | 2006-10-05 | Orion Denki Kk | 電子機器 |
| JP2007255929A (ja) * | 2006-03-20 | 2007-10-04 | Kyoto Univ | 焦電型赤外線センサ |
| JP5640529B2 (ja) | 2009-10-17 | 2014-12-17 | 三菱マテリアル株式会社 | 赤外線センサ及びこれを備えた回路基板 |
| CN102478432A (zh) * | 2010-11-30 | 2012-05-30 | 三菱综合材料株式会社 | 红外线传感器 |
| CN202420687U (zh) * | 2011-12-20 | 2012-09-05 | 友丽系统制造股份有限公司 | 测量模块 |
| WO2014112392A1 (ja) * | 2013-01-21 | 2014-07-24 | パナソニック株式会社 | 赤外線検出素子、赤外線検出器及び赤外線式ガスセンサ |
| US9377365B2 (en) * | 2013-04-22 | 2016-06-28 | Excelitas Technologies Singapore Pte. Ltd. | Thermal sensor module with lens array |
-
2016
- 2016-01-21 KR KR1020177026408A patent/KR102610063B1/ko active IP Right Grant
- 2016-01-21 WO PCT/JP2016/051663 patent/WO2016152220A1/ja active Application Filing
- 2016-01-21 JP JP2016538806A patent/JP6076549B1/ja active Active
- 2016-01-21 CN CN201680016650.2A patent/CN107407602B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008111849A (ja) * | 1997-09-29 | 2008-05-15 | Ishizuka Electronics Corp | 非接触温度センサ |
| JP2003194630A (ja) * | 2001-12-27 | 2003-07-09 | Ishizuka Electronics Corp | 非接触温度センサおよび非接触温度センサ用検出回路 |
| JP2011013213A (ja) * | 2009-06-02 | 2011-01-20 | Mitsubishi Materials Corp | 赤外線センサ |
| WO2015020081A1 (ja) * | 2013-08-09 | 2015-02-12 | Ｓｅｍｉｔｅｃ株式会社 | 赤外線温度センサ及び赤外線温度センサを用いた装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107407602A (zh) | 2017-11-28 |
| JPWO2016152220A1 (ja) | 2017-04-27 |
| CN107407602B (zh) | 2020-10-23 |
| JP6076549B1 (ja) | 2017-02-08 |
| WO2016152220A1 (ja) | 2016-09-29 |
| KR20170129755A (ko) | 2017-11-27 |
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