KR102432900B1 - 수직 자화막 및 이를 포함하는 자기 장치 - Google Patents
수직 자화막 및 이를 포함하는 자기 장치 Download PDFInfo
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- KR102432900B1 KR102432900B1 KR1020170057524A KR20170057524A KR102432900B1 KR 102432900 B1 KR102432900 B1 KR 102432900B1 KR 1020170057524 A KR1020170057524 A KR 1020170057524A KR 20170057524 A KR20170057524 A KR 20170057524A KR 102432900 B1 KR102432900 B1 KR 102432900B1
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- film
- perpendicular magnetization
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/80—Constructional details
- H10N50/85—Materials of the active region
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- H01L43/02—
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/06—Thin magnetic films, e.g. of one-domain structure characterised by the coupling or physical contact with connecting or interacting conductors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
- H01F10/123—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys having a L10 crystallographic structure, e.g. [Co,Fe][Pt,Pd] thin films
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/26—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/26—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers
- H01F10/30—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers characterised by the composition of the intermediate layers, e.g. seed, buffer, template, diffusion preventing, cap layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3286—Spin-exchange coupled multilayers having at least one layer with perpendicular magnetic anisotropy
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- H01L43/08—
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- H01L43/10—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Thin Magnetic Films (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016094864A JP6713650B2 (ja) | 2016-05-10 | 2016-05-10 | 垂直磁化膜と垂直磁化膜構造並びに磁気抵抗素子および垂直磁気記録媒体 |
| JPJP-P-2016-094864 | 2016-05-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20170126805A KR20170126805A (ko) | 2017-11-20 |
| KR102432900B1 true KR102432900B1 (ko) | 2022-08-16 |
Family
ID=60294828
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020170057524A Active KR102432900B1 (ko) | 2016-05-10 | 2017-05-08 | 수직 자화막 및 이를 포함하는 자기 장치 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10395809B2 (enExample) |
| JP (1) | JP6713650B2 (enExample) |
| KR (1) | KR102432900B1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019059679A1 (ko) * | 2017-09-20 | 2019-03-28 | 주식회사 케이티 | 비디오 신호 처리 방법 및 장치 |
| US10170696B1 (en) * | 2017-10-26 | 2019-01-01 | International Business Machines Corporation | MnN and Heusler layers in magnetic tunnel junctions |
| CN113036032B (zh) * | 2019-12-24 | 2024-08-27 | Tdk株式会社 | 磁阻效应元件 |
| JP7572228B2 (ja) * | 2019-12-24 | 2024-10-23 | Tdk株式会社 | 磁気抵抗効果素子 |
| JP7434962B2 (ja) * | 2020-02-05 | 2024-02-21 | Tdk株式会社 | 磁気抵抗効果素子 |
| US11925124B2 (en) * | 2021-01-12 | 2024-03-05 | Samsung Electronics Co., Ltd. | Insertion layers for perpendicularly magnetized Heusler layers with reduced magnetic damping |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015126221A (ja) * | 2013-12-27 | 2015-07-06 | 株式会社サムスン日本研究所 | 磁気トンネル接合素子の製造方法および製造装置 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US117201A (en) * | 1871-07-18 | Improvement in hay-rakes and forks | ||
| JPH05109040A (ja) * | 1991-10-16 | 1993-04-30 | Sony Corp | 垂直磁気記録媒体 |
| JP2009054776A (ja) | 2007-08-27 | 2009-03-12 | Institute Of Physical & Chemical Research | 磁気冷凍材料およびその製造方法、ならびに、反強磁性材料を強磁性材料に変質させる方法 |
| JP5491757B2 (ja) | 2009-03-27 | 2014-05-14 | 株式会社東芝 | 磁気抵抗素子および磁気メモリ |
| US8686484B2 (en) * | 2011-06-10 | 2014-04-01 | Everspin Technologies, Inc. | Spin-torque magnetoresistive memory element and method of fabricating same |
| KR101831931B1 (ko) | 2011-08-10 | 2018-02-26 | 삼성전자주식회사 | 외인성 수직 자화 구조를 구비하는 자기 메모리 장치 |
| US8993134B2 (en) | 2012-06-29 | 2015-03-31 | Western Digital Technologies, Inc. | Electrically conductive underlayer to grow FePt granular media with (001) texture on glass substrates |
| KR102017623B1 (ko) | 2012-08-30 | 2019-09-03 | 삼성전자주식회사 | 자기 메모리 소자 |
| JP2014060297A (ja) | 2012-09-18 | 2014-04-03 | Toshiba Corp | 磁気抵抗効果素子 |
| JP6647590B2 (ja) * | 2015-04-23 | 2020-02-14 | 国立研究開発法人物質・材料研究機構 | 垂直磁化膜と垂直磁化膜構造並びに磁気抵抗素子および垂直磁気記録媒体 |
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2016
- 2016-05-10 JP JP2016094864A patent/JP6713650B2/ja active Active
-
2017
- 2017-05-08 KR KR1020170057524A patent/KR102432900B1/ko active Active
- 2017-05-10 US US15/591,348 patent/US10395809B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015126221A (ja) * | 2013-12-27 | 2015-07-06 | 株式会社サムスン日本研究所 | 磁気トンネル接合素子の製造方法および製造装置 |
Non-Patent Citations (1)
| Title |
|---|
| H. Lee et. al., Ferromagnetic MnGaN thin films with perpendicular magnetic anisotropy for spintronics applications, APPLIED PHYSICS LETTERS 107, 032403 (2015) 1부.* |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6713650B2 (ja) | 2020-06-24 |
| US20170330668A1 (en) | 2017-11-16 |
| US10395809B2 (en) | 2019-08-27 |
| JP2017204542A (ja) | 2017-11-16 |
| KR20170126805A (ko) | 2017-11-20 |
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