KR102416273B1 - 소재 웹 관찰 및 소재 웹 검사를 위한 방법 및 장치 - Google Patents

소재 웹 관찰 및 소재 웹 검사를 위한 방법 및 장치 Download PDF

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KR102416273B1
KR102416273B1 KR1020170135385A KR20170135385A KR102416273B1 KR 102416273 B1 KR102416273 B1 KR 102416273B1 KR 1020170135385 A KR1020170135385 A KR 1020170135385A KR 20170135385 A KR20170135385 A KR 20170135385A KR 102416273 B1 KR102416273 B1 KR 102416273B1
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KR20180044198A (ko
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마르쿠스 헤르만
만프레드 크뢴
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텍스마그 게엠베하 베르트리에브스게셀스차프트
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/69—Control of means for changing angle of the field of view, e.g. optical zoom objectives or electronic zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G01N2021/8864—Mapping zones of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10148—Varying focus
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Signal Processing (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020170135385A 2016-10-21 2017-10-18 소재 웹 관찰 및 소재 웹 검사를 위한 방법 및 장치 Active KR102416273B1 (ko)

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Application Number Priority Date Filing Date Title
DE102016220757.1A DE102016220757A1 (de) 2016-10-21 2016-10-21 Verfahren und Vorrichtung zur Materialbahnbeobachtung und Materialbahninspektion
DE102016220757.1 2016-10-21

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KR20180044198A KR20180044198A (ko) 2018-05-02
KR102416273B1 true KR102416273B1 (ko) 2022-07-05

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US (1) US10878552B2 (enExample)
EP (1) EP3312596B1 (enExample)
JP (2) JP7266362B2 (enExample)
KR (1) KR102416273B1 (enExample)
CN (1) CN107976450B (enExample)
DE (1) DE102016220757A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3502637A1 (en) * 2017-12-23 2019-06-26 ABB Schweiz AG Method and system for real-time web manufacturing supervision
JP6927124B2 (ja) 2018-03-30 2021-08-25 東洋紡株式会社 熱収縮性ポリエステル系フィルム
JP2020000577A (ja) * 2018-06-29 2020-01-09 株式会社三洋物産 遊技機
JP2020000581A (ja) * 2018-06-29 2020-01-09 株式会社三洋物産 遊技機
JP2020000578A (ja) * 2018-06-29 2020-01-09 株式会社三洋物産 遊技機
JP2020000580A (ja) * 2018-06-29 2020-01-09 株式会社三洋物産 遊技機
EP3661191A1 (de) * 2018-11-27 2020-06-03 B&R Industrial Automation GmbH Verfahren zum auslesen eines flächensensors
KR102629343B1 (ko) 2018-12-21 2024-01-26 삼성전자주식회사 다중 셀 구조의 카메라 모듈 및 그 카메라 모듈을 포함하는 휴대용 통신 장치
US20200371040A1 (en) * 2019-05-21 2020-11-26 Industrial Maintenance Engineering, Inc. d/b/a AIS Gauging Static full width measurement system
US11218641B2 (en) * 2019-09-09 2022-01-04 Qualcomm Incorporated Image capture mode adaptation
CN111586289A (zh) * 2020-03-31 2020-08-25 广东利元亨智能装备股份有限公司 一种高速飞拍控制方法及系统
JP7552181B2 (ja) * 2020-09-16 2024-09-18 東洋製罐グループホールディングス株式会社 表面検査システム
KR102580271B1 (ko) 2021-02-25 2023-09-20 삼성전자주식회사 이미지센서를 이용한 다중 생체신호 측정 장치 및 방법과, 전자장치
CN117941368A (zh) * 2022-08-05 2024-04-26 核心光电有限公司 用于具有自动可调变焦视场的变焦数字相机的系统和方法
CN116718276A (zh) * 2023-04-20 2023-09-08 中国人民解放军93236部队 一种基于f数和像元尺寸匹配重构的红外成像系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006174408A (ja) * 2004-12-10 2006-06-29 Ambarella Inc デジタルビデオカメラ用高解像度ズーム法
US20100214416A1 (en) * 2006-02-01 2010-08-26 Hannu Ruuska Device for Monitoring a Web
US20120013733A1 (en) * 2010-07-15 2012-01-19 Eltromat Gmbh Apparatus for Monitoring a Print Result in a Rotary Printing Press
JP2013513188A (ja) 2009-12-16 2013-04-18 ザ プロクター アンド ギャンブル カンパニー ラインスキャンカメラを使用してオンラインウェブを監視するシステム及び方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0686183A (ja) * 1992-08-31 1994-03-25 Canon Inc 固体撮像素子
JPH11248641A (ja) * 1998-03-03 1999-09-17 Sumitomo Metal Ind Ltd 表面欠陥検査装置及び表面欠陥検査方法
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen
SE523681C2 (sv) 2002-04-05 2004-05-11 Integrated Vision Prod System och sensor för avbildning av egenskaper hos ett objekt
JP4151948B2 (ja) 2002-11-07 2008-09-17 住友化学株式会社 帯状被検体の検査システム及び検査プログラム
US7257278B2 (en) * 2003-02-26 2007-08-14 Hewlett-Packard Development Company, L.P. Image sensor for capturing and filtering image data
US20050226466A1 (en) * 2004-04-06 2005-10-13 Quad/Tech, Inc. Image acquisition assembly
JP4655991B2 (ja) * 2006-04-21 2011-03-23 カシオ計算機株式会社 撮像装置及び電子ズーム方法と、プログラム
JP2008172506A (ja) 2007-01-11 2008-07-24 Nec Corp イメージセンサ
DE102007055820A1 (de) * 2007-12-14 2009-06-18 Voith Patent Gmbh Verfahren und Vorrichtung zur Erfassung zumindest einer die Eigenschaften einer Oberfläche in einer Materialbahnbehandlungseinrichtung wenigstens mittelbar charaktersierenden Größe und Verfahren zur Optimierung der Betriebsweise einer Materialbahnbehandlungseinrichtung
ATE511637T1 (de) * 2008-02-11 2011-06-15 Texmag Gmbh Vertriebsges Vorrichtung zum erfassen eines bildes
FR2936605B1 (fr) * 2008-10-01 2014-10-31 Saint Gobain Dispositif d'analyse de la surface d'un substrat
DE102009029081A1 (de) * 2009-09-02 2011-03-03 Voith Patent Gmbh Lasermarkierung
JP4813628B1 (ja) 2010-03-23 2011-11-09 富士フイルム株式会社 撮影装置及びその制御方法、並びに三次元情報測定装置
FI20106053A0 (fi) * 2010-10-13 2010-10-13 Metso Automation Oy Järjestelmä rainan tarkkailemiseksi ja vastaava menetelmä rainan tarkkailemiseksi
EP2630473A2 (en) * 2010-10-19 2013-08-28 3M Innovative Properties Company Continuous charting of non-uniformity severity for detecting variability in web-based materials
EP2472842B1 (en) * 2010-12-30 2020-03-04 ALLTEC Angewandte Laserlicht Technologie Gesellschaft mit beschränkter Haftung Sensor apparatus
EP2757769B1 (en) * 2011-09-13 2017-08-16 NEC Corporation Imaging device, imaging method and recording medium
DE102012101310C5 (de) 2012-02-17 2014-09-04 Stephan Krebs Vorrichtung und Verfahren zur Druckbildkontrolle
KR101205128B1 (ko) 2012-05-11 2012-11-26 주식회사 앤비젼 이미지 센서 비닝 기법을 이용하여 이미지 센서의 픽셀당 해상도를 조정하는 광학 검사 장치
CN102721702A (zh) * 2012-06-27 2012-10-10 山东轻工业学院 基于嵌入式处理器的分布式纸病检测系统及方法
ES2890649T3 (es) 2013-05-23 2022-01-21 Rina Consulting Centro Sviluppo Mat S P A Método para la inspección de superficie de productos largos y aparato adecuado para llevar a cabo dicho método
CN104422698B (zh) * 2013-09-04 2017-03-29 昆山钞票纸业有限公司 随动式防伪纸定位施放荧光纤维在线检测装置
JP2015105930A (ja) 2013-12-02 2015-06-08 旭硝子株式会社 透光性基板の微小欠陥検査方法および透光性基板の微小欠陥検査装置
CN104713483B (zh) * 2015-03-30 2017-09-12 昆山钞票纸业有限公司 防伪纸内嵌光敏纤维的检测方法和装置
CN105203557B (zh) * 2015-10-28 2018-06-08 江西洁美电子信息材料有限公司 一种电子纸带造纸质量在线检测系统

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006174408A (ja) * 2004-12-10 2006-06-29 Ambarella Inc デジタルビデオカメラ用高解像度ズーム法
US20100214416A1 (en) * 2006-02-01 2010-08-26 Hannu Ruuska Device for Monitoring a Web
JP2013513188A (ja) 2009-12-16 2013-04-18 ザ プロクター アンド ギャンブル カンパニー ラインスキャンカメラを使用してオンラインウェブを監視するシステム及び方法
US20120013733A1 (en) * 2010-07-15 2012-01-19 Eltromat Gmbh Apparatus for Monitoring a Print Result in a Rotary Printing Press

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US20180114308A1 (en) 2018-04-26
JP7311665B2 (ja) 2023-07-19
US10878552B2 (en) 2020-12-29
JP2018066740A (ja) 2018-04-26
CN107976450A (zh) 2018-05-01
CN107976450B (zh) 2021-10-29
EP3312596A1 (de) 2018-04-25
EP3312596B1 (de) 2021-11-17
JP2022091853A (ja) 2022-06-21
JP7266362B2 (ja) 2023-04-28
DE102016220757A1 (de) 2018-04-26
KR20180044198A (ko) 2018-05-02

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