KR102141216B1 - Inspection system and inspection method - Google Patents

Abstract

An inspection system for inspecting a sheet-shaped inspection object having light transmittance includes: an imaging device for imaging an inspection object, and a first for irradiating light to an imaging area of the imaging device such that the imaging device mainly receives diffused reflected light from the surface of the inspection object A light source and an inspection device for inspecting the presence or absence of a defect of the inspection object, the inspection device includes a detection unit for detecting a defect of the inspection object based on the captured image by the imaging device.

Description

Inspection system and inspection method

The present invention relates to an inspection system and an inspection method.

For example, various methods have been proposed to detect defects such as cracks in the surface layer and contamination of foreign substances that may occur in the manufacturing process using glass, prepreg, and the like as inspection objects.

For example, the camera and the light source are arranged to face the prepreg so that light irradiated from the light source passes through the prepreg and enters the camera, and the voids inside the prepreg are based on the camera image. A method for detection has been proposed (see Patent Document 1).

Japanese Patent Application Publication No. 2006-064531

In the method according to Patent Document 1, transmitted light enters the camera from a prepreg as an inspection object. Thus, in the captured image of the camera, defects of different types, such as cracks on the surface of the object to be inspected and foreign matter mixed therein, are reflected like a shadow. Therefore, there is a possibility that it is impossible to determine the type of defects present in the inspection object.

The present invention has been made in consideration of the above problems, and an object thereof is to provide an inspection system capable of discriminating the type of detected defects.

According to one aspect of the present invention, an inspection system for inspecting a sheet-shaped inspection object having light transmittance includes an imaging device for imaging an inspection object, and an imaging device so that the imaging device mainly receives diffuse reflected light from the surface of the inspection object. A first light source for irradiating light to the region, and an inspection device for inspecting the presence or absence of a defect of the inspection object, the inspection device includes a detection unit for detecting a defect of the inspection object based on the captured image by the imaging device.

According to the embodiment of the present invention, an inspection system capable of discriminating the types of detected defects is provided.

1 is a diagram illustrating the inspection system in the first embodiment.
2 is a diagram (1) illustrating the defects of the prepreg.
3 is a diagram illustrating a flow chart of a defect inspection process in the first embodiment.
4 is a diagram schematically illustrating image data in the first embodiment.
5 is a diagram illustrating the inspection system in the second embodiment.
6 is a diagram illustrating a flow chart of a defect inspection process in the second embodiment.
7 is a diagram schematically illustrating image data (B channel) in the second embodiment.
8 is a diagram schematically illustrating image data (R channel) in the second embodiment.
9 is a diagram illustrating the inspection system in the third embodiment.
10 is a diagram (2) illustrating the defects of the prepreg.
11 is a diagram illustrating a flow chart of a defect detection process in the third embodiment.
12 is a diagram schematically illustrating the first image data in the third embodiment.
13 is a diagram schematically illustrating the second image data in the third embodiment.
14A is a diagram (1) for explaining a necessary processing time for defect detection.
14B is a diagram (2) for explaining the necessary processing time for defect detection.
15 is a diagram illustrating the inspection system in the fourth embodiment.
16 is a diagram illustrating a flow chart of a defect detection process in the fourth embodiment.
17 is a diagram illustrating the inspection system in the fifth embodiment.
18 is a diagram illustrating a flow chart of a defect detection process in the fifth embodiment.
19 is a diagram schematically illustrating the first image data (B channel) in the fifth embodiment.
20 is a diagram schematically illustrating the first image data (R channel) in the fifth embodiment.
21 is a diagram illustrating an inspection system in the sixth embodiment.
22 is a diagram illustrating the inspection system in the seventh embodiment.
23 is a diagram illustrating an inspection system in the eighth embodiment.

EMBODIMENT OF THE INVENTION Hereinafter, the form for implementing an invention is demonstrated with reference to drawings. The same reference numerals are given to the same components in each drawing, and duplicate descriptions may be omitted. On the other hand, in the following embodiment, a method for inspecting the presence or absence of a defect in the prepreg as an inspection object is described, but the inspection object is not limited to the prepreg.

[First Embodiment]

1 is a diagram illustrating the inspection system 100 in the first embodiment.

As shown in FIG. 1, the inspection system 100 has a conveying device 110, an imaging device 120, a light source 130a, 130b, and an inspection device 150, and the prepreg 10 as an inspection object Check the presence or absence of defects.

The prepreg 10 is obtained by impregnating a fiber base material with a thermosetting resin, followed by heating and curing the thermosetting resin in the fiber base material. The fiber base material is, for example, woven fibers formed of glass fibers, polyester fibers, and the like. The thermosetting resin is, for example, an epoxy resin or a phenol resin. The prepreg 10 in this embodiment is formed in a sheet shape having a smooth surface, and transmits light through a transparent thermosetting resin from the gap of the fiber base material.

The conveying device 110 has a first conveying belt 111 as a first conveying part and a second conveying belt 112 as a second conveying part, and conveys the prepreg 10 in the direction of the arrow in Fig. 1. In the first conveyance belt 111, an endless belt is hung on a plurality of rollers including a drive roller. The first conveying belt 111 conveys the prepreg 10 placed on the belt by moving and rotating in accordance with the driving roller on which the endless belt rotates. The second conveyance belt 112 has the same configuration as the first conveyance belt 111, and conveys the prepreg 10 received from the first conveyance belt 111.

Meanwhile, the configuration of the conveying apparatus 110 is not limited to the configuration illustrated in this embodiment, and may be, for example, a configuration of conveying the prepreg 10 with a plurality of conveying rollers.

The imaging device 120 is, for example, a digital camera equipped with an imaging element such as a Charge Coupled Device (CCD) or a Complementary Metal Oxide Semiconductor (CMOS). The imaging device 120 is provided so that at least a part of the imaging area overlaps an area through which the prepreg 10 passes as a gap between the first conveyance belt 111 and the second conveyance belt 112. In the present embodiment, the imaging device 120 is provided so as to be capable of imaging the entire width direction of the prepreg 10 between the first conveying device 111 and the second conveying device 112.

Each of the light sources 130a and 130b is, for example, an LED (Light Emitting Diode) array, and irradiates white light onto the imaging area of the imaging device 120. Meanwhile, the light sources 130a and 130b may be, for example, fluorescent lamps such as organic EL (ElectroLuminescence) arrays or cold cathode tubes.

The light sources 130a and 130b respectively allow the imaging device 120 to mainly receive diffused reflected light from the surface of the prepreg 10 conveyed between the first conveying belt 111 and the second conveying belt 112. , Are arranged. In this embodiment, the light sources 130a and 130b are provided so that the angle at which the irradiated light enters the surface of the prepreg 10 is 45 degrees, respectively. In addition, the imaging device 120 is provided so that the optical axis of the optical system is perpendicular to the surface of the prepreg 10.

On the other hand, if it is possible for the imaging device 120 to receive diffusely reflected light mainly from the surface of the prepreg 10, the positional relationship between the light sources 130a and 130b and the imaging device 120 is limited to the above-described positional relationship no. In this embodiment, two light sources 130a and 130b are provided, but the number of light sources is not limited to this, and one or three or more light sources may be installed. Also, as a light source, dome lighting may be provided to illuminate the imaging area of the imaging device 120. In the following description, “light sources 130a and 130b” may be referred to simply as “light source 130”.

The support member 140 is provided between the first conveyance belt 111 and the second conveyance belt 112. The support member 140 supports the prepreg 10 conveyed between the first conveyance belt 111 and the second conveyance belt 112. The support member 140 has a support surface 141 that abuts the prepreg 10. The support surface 141 is formed to have a width greater than or equal to the width of the prepreg 10, and supports the entire width direction of the prepreg 10 between the first conveyance belt 111 and the second conveyance belt 112. . The prepreg 10 is supported by the support surface 141 of the support member 140, thereby being transported without deformation between the first transport belt 111 and the second transport belt 112.

Since the support surface 141 of the support member 140 is formed using a chromatic material, it has a chromatic color. In this embodiment, the support surface 141 is formed of a cyan color material. On the other hand, in the support member 140, for example, a colored paint may be applied to the support surface 141, or a portion including the support surface 141 may be formed of a material having a chromatic color. In addition, the color of the support surface 141 may be a chromatic color, and is not limited to cyan.

The inspection apparatus 150 has an image acquisition unit 151 and a detection unit 152. The inspection device 150 is, for example, a computer equipped with a central processing unit (CPU), read-only memory (ROM), random access memory (RAM), and the like. Each function of the inspection apparatus 150, that is, the image acquisition unit 151 and the detection unit 152 is realized by, for example, executing a program read by the CPU from the ROM in cooperation with the RAM.

The image acquisition unit 151 acquires image data of the prepreg 10 from the imaging device 120. The detection unit 152 detects a defect existing in the prepreg 10 based on the image data acquired by the image acquisition unit 151 from the imaging device 120.

2 is a diagram illustrating defects of the prepreg 10.

Defect A shown in Fig. 2 is a crack in the surface layer. In addition, defect B is a foreign substance mixed inside. The detection unit 152 of the inspection device 150 detects a defect of the prepreg 10 from the image data of the prepreg 10 obtained by the image acquisition unit 151 from the imaging device 120, and furthermore, of the detected defect The type (defect A or defect B) is determined.

3 is a diagram illustrating a flow chart of the defect detection processing in the first embodiment.

As shown in FIG. 3, in the defect detection processing in the detection system 100, first, in step S101, the conveying apparatus 110 transfers the prepreg 10 from the first conveying belt 111 to the second conveying belt 112 ) To return.

Subsequently, in step S102, the light source 130 irradiates light to the imaging area of the imaging device 120. Subsequently, in step S103, the imaging device 120 captures the prepreg 10 conveyed to the imaging area between the first conveyance belt 111 and the second conveyance belt 112. As described above, the imaging device 120 has an imaging area provided in a gap between the first conveying belt 111 and the second conveying belt 112, and the supporting member 140 of the prepreg 10. The part supported by the support surface 141 is imaged. The imaging device 120 images the whole prepreg 10 by continuously imaging the prepreg 10 conveyed by the conveying device 110.

In step S104, the image acquisition unit 151 of the inspection device 150 acquires the image data of the prepreg 10 from the imaging device 120. Next, in step S105, the detection unit 152 detects a defect in the prepreg 10 based on the image data acquired by the image acquisition unit 120.

4 is a diagram schematically illustrating image data of the prepreg 10 imaged by the imaging device 120.

The imaging device 120 is a supporting surface of the support member 140 through the diffused reflected light reflected from the prepreg 10 and the prepreg 10 having transparency, from a portion without defects of the prepreg 10. The diffuse reflected light reflected at 141 is received. Therefore, in the portion of the image data of the prepreg 10 captured by the imaging device 120 without defects, the support surface 141 of the support member 140 is visible through the prepreg 10 so that the support member The color of the support surface 141 of 140 appears. In this embodiment, since the support surface 141 of the support member 140 is cyan, a portion without defects of the prepreg 10 in the captured image of the imaging device 120 becomes cyan.

In the defect A of the prepreg 10, the diffuse reflectance of the irradiated light irradiated from the light source 130 is higher than the diffuse reflectance of the defect-free portion. Thus, the amount of light reflected by the defect A of the prepreg 10 and received by the imaging device 120 is greater than the amount of light received by the imaging device 120 reflected by the defect-free portion. Therefore, as shown in Fig. 4, the portion where the defect A exists in the image data of the prepreg 10 is brighter than the portion without the defect.

On the other hand, the reason that the higher the diffuse reflectance of the irradiated light from the light source 130 is, the greater the amount of light received by the imaging device 120 is as follows. The high diffuse reflectance means that diffuse reflection, i.e., macroscopically, reflects in a manner in which light is diffused in each direction regardless of the reflection law. In addition, the positional relationship between the light sources 130: 130a, 130b and the imaging device 120 is that the greater the degree of diffuse reflection, that is, the macroscopically, the degree of reflection in the aspect of diffusing light in each direction regardless of the reflection law. The larger the positional relationship is, the larger the amount of light received by the imaging device 120 is. Therefore, the higher the diffuse reflectance of the irradiated light from the light source 130, the greater the amount of light received by the imaging device 120.

Further, the imaging device 120 reflects foreign substances through the diffused reflected light from the surface of the prepreg 10 and the prepreg 10 having light transmittance from the portion where the defect B of the prepreg 10 is present. Diffuse reflected light is received. Thus, in the image data of the imaging device 120, the portion in which the defect B of the prepreg 10 is present is visible through the prepreg 10 so that the color of the foreign substance appears. For example, in the case where defect B occurs due to black foreign matter being mixed inside the prepreg 10, defect B appears as a dark shadow in the captured image (see FIG. 4).

As described above, in the image data of the prepreg 10, the portion where the defect A is present is brighter than the portion without the defect. Therefore, the luminance of the pixel in the portion where the defect A exists in the image data is higher than the luminance of the pixel in the portion without the defect.

In addition, in the image data imaged by the imaging device 120, for example, a portion in which the defect B due to a black foreign substance is present is darker than a portion without the defect. Therefore, in this case, the luminance of the pixel in the portion where the defect B exists in the image data is lower than the luminance of the pixel in the portion without the defect.

Thus, the detection unit 152 of the inspection apparatus 150 calculates, in advance, the average pixel luminance of the defective portion of the image data of the prepreg 10 in advance, and the luminance of each pixel of the image data in advance. Defects are detected based on the calculated difference in average luminance. The detection unit 152 detects, for example, a pixel whose luminance is higher than the average luminance in image data as defect A. Further, the detection unit 152 detects, for example, a pixel whose luminance is lower than the average luminance in image data as defect B.

Further, the detection unit 152 may calculate the difference between the luminance and the average luminance of each pixel in the image data, and detect a pixel whose defect is higher than the average luminance and the difference between the average luminance is equal to or greater than a preset first threshold as defect A have. In addition, the detection unit 152 may detect a pixel whose luminance is lower than the average luminance and the difference from the average luminance is equal to or greater than a preset second threshold value as the defect B. By detecting a defect by comparing the difference between the luminance of each pixel and the average luminance with a threshold value, it is possible to reduce false detection of the defect.

As described above, the detection unit 152 of the inspection device 150 is based on the image data of the captured image by the imaging device 120, the defects A (cracks in the surface layer) and the defects B (mixed in the prepreg 10). Defects, etc.). In the above-described example, the case of detecting defect B as a foreign substance in black has been described, but even when detecting defect B as a foreign substance in black, the luminance of the pixel in the portion where the defect B is present and the pixel in the portion without the defect Defect B can be detected based on the difference in luminance of.

As described above, according to the inspection system 100 in the first embodiment, it is possible to detect the defect of the prepreg 10 as an inspection object and determine the type of defect.

In addition, in the inspection system 100, the light source 130 and the imaging device 120 are provided so that the prepreg 10 can be inspected in the gap between the first conveyance belt 111 and the second conveyance belt 112. Installed. With such a configuration, it is possible to accurately inspect defects of the prepreg 10 without being affected by irregularities on the surfaces of the first conveyance belt 111 and the second conveyance belt 112.

In addition, the first conveyance belt 111 and the second conveyance belt 112 are supported by the support member 140 supporting the prepreg 10 between the first conveyance belt 111 and the second conveyance belt 112. It is possible to inspect the prepreg 10 with high precision without causing deformation.

On the other hand, when the support surface 141 of the support member 140 is, for example, achromatic color such as black, white or gray, defects A and B are present in the image data captured by the imaging device 120. There is a possibility that the difference between the part to be performed and the part without a defect becomes unclear. Therefore, in the present embodiment, by making the support surface 141 of the support member 140 chromatic, the difference due to the presence or absence of the defect is clarified, so that the defect can be detected with high precision.

Here, the image data of the captured image captured by the imaging device 120 is, for example, RGB for each color of R (red), G (green), and B (blue) for each pixel, represented by numerical values of 0 to 255. Have a value Thus, the detection unit 152, according to the color of the support surface 141 of the support member 140, among the values of each color included in the RGB value, the value of the color having the largest difference in luminance between the defective portion and the defect-free portion It is also possible to detect defects.

For example, in the case where the supporting surface 141 of the supporting member 140 is blue, in order to detect a defect A that appears to have been whitened by cracks in the surface layer, G channel data having a G value of each pixel, each R channel data or the like having R values of pixels is used. By using G-channel data, R-channel data, and the like, it becomes possible to increase the detection sensitivity by clarifying the difference between the defect A and the defect-free part. Further, in this case, for example, in order to detect defect B, which is a black foreign substance, by using B channel data having a B value of each pixel, the difference between the defect B and the defect-free portion is clarified to increase detection sensitivity. It becomes possible.

In addition, in the description of the first embodiment, an example in which the light source 130 irradiates white light is described, but the light irradiated from the light source is not limited to white light, and the color of the support surface 141 of the support member 140 Just include the wavelength. For example, when the color of the support surface 141 is blue, the light source may be other colors of light including blue light, and may be cyan light or magenta light.

[Second Embodiment]

Next, the second embodiment will be described based on the drawings. On the other hand, description of the same components as those of the embodiment already described is omitted as appropriate.

5 is a diagram illustrating the inspection system 200 in the second embodiment.

As shown in FIG. 5, the inspection system 200 has a conveying device 210, an imaging device 220, a first light source 230, a second light source 240, and an inspection device 250, and an inspection object As, the presence or absence of defects in the prepreg 10 is inspected.

The conveying device 210 has a first conveying belt 211 as a first conveying part and a second conveying belt 212 as a second conveying part, and conveys the prepreg 10 in the direction of the arrow in Fig. 5. In the first conveyance belt 211, an endless belt is hung on a plurality of rollers including a drive roller. The first conveying belt 211 conveys the prepreg 10 placed on the belt by moving and rotating in accordance with the driving roller on which the endless belt rotates. The 2nd conveyance belt 212 has the same structure as the 1st conveyance belt 211, and conveys the prepreg 10 received from the 1st conveyance belt 211.

Meanwhile, the configuration of the conveying device 210 is not limited to the configuration illustrated in this embodiment, and may be, for example, a configuration for conveying the prepreg 10 with a plurality of conveying rollers.

The imaging device 220 is, for example, a digital camera equipped with imaging elements such as CCD and CMOS. The imaging device 220 is provided so that at least a part of the imaging area overlaps an area through which the prepreg 10 passes as a gap between the first transport belt 211 and the second transport belt 212. In this embodiment, the imaging device 220 is provided so as to be capable of imaging the entire width direction of the prepreg 10 between the first conveyance belt 211 and the second conveyance belt 212.

The first light source 230 is, for example, a blue LED array, and irradiates blue light between the first conveyance belt 211 and the second conveyance belt 212. The first light source 230 is disposed so as to mainly receive diffused reflected light from the surface of the prepreg 10 to which the imaging device 220 is conveyed.

The second light source 240 is, for example, a white LED array, and irradiates white light between the first conveyance belt 211 and the second conveyance belt 212. The second light source 240 is disposed to face the imaging device 220 so that the transmitted light transmitted through the prepreg 10 conveyed by the imaging device 220 can be received.

In the present embodiment, the first light source 230 irradiates blue light in the first wavelength region (blue wavelength region), and the second light source 240 has a second wavelength region different from the first wavelength region and the first wavelength region. White light containing (for example, a red or green wavelength region) is irradiated. On the other hand, the first light source 230 and the second light source 240 may be irradiated with light having different wavelengths, respectively, or may be configured to irradiate light having a different color from the present embodiment. Further, the first light source 230 and the second light source 240 may be, for example, fluorescent lamps such as organic EL arrays or cold cathode tubes.

The inspection apparatus 250 has an image acquisition unit 151, a color information acquisition unit 252, and a detection unit 253. The inspection device 250 is, for example, a computer equipped with a CPU, ROM, RAM, or the like. Each function of the inspection device 250, that is, the image acquisition unit 251, the color information acquisition unit 252, and the detection unit 152, for example, by executing a program read from the CPU by ROM in cooperation with RAM Is realized.

The image acquisition unit 251 acquires image data of the prepreg 10 from the imaging device 220. The color information acquisition unit 252 acquires color information from the image data acquired by the image acquisition unit 251. The detection unit 253 detects a defect existing in the prepreg 10 based on the color information acquired by the color information acquisition unit 252.

6 is a diagram illustrating a flow chart of a defect detection process in the second embodiment.

As shown in Fig. 6, in the defect detection processing in the detection system 200, first, in step S201, the conveying apparatus 210 transfers the prepreg 10 from the first conveying belt 211 to the second conveying belt 212. ) To return.

Subsequently, in step S202, the first light source 230 and the second light source 240 irradiate light to the imaging area of the imaging device 120. Subsequently, in step S203, the imaging device 120 captures the prepreg 10 passed from the first conveyance belt 211 to the second conveyance belt 212. The imaging apparatus 220 images the whole prepreg 10 by continuously imaging the prepreg 10 conveyed by the conveying apparatus 110.

In step S204, the image acquisition unit 251 of the inspection device 250 acquires the image data of the prepreg 10 from the imaging device 220. Subsequently, in step S205, the color information acquisition unit 252 acquires the first color information described later from the image data of the prepreg 10 acquired by the image acquisition unit 151.

Here, in the image data of the prepreg 10 captured by the imaging device 220, for example, each color of R (red), G (green), and B (blue) for each pixel is a numerical value of 0 to 255. It has an RGB value represented by. The color information acquisition unit 252 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from the first light source 230 and the second light source 240 as first color information. The color information acquisition unit 252 acquires color data included in the wavelength region of blue light emitted from the first light source 230 as image information from the image data.

7 is a diagram schematically illustrating image data (B-channel data) of the prepreg 10.

In the defect A of the prepreg 10, the diffuse reflectance of the blue light irradiated from the first light source 230 is higher than the diffuse reflectance of the defect-free portion. Thus, the amount of light received by the imaging device 220 is reflected by the blue light emitted from the first light source 230 and reflected by the defect A, and is greater than the amount of light received by the imaging device 220 by being reflected by the portion without the defect. Therefore, as shown in Fig. 7, in the B-channel data, the portion where the defect A exists in the prepreg 10 is brighter than the portion without the defect.

On the other hand, the higher the diffuse reflectance of the irradiated light from the first light source 230, the greater the amount of light received by the imaging device 220 is the same as the reason explained in the description of the first embodiment.

In addition, in the defect B of the prepreg 10, the irradiation light from the second light source 240 is blocked by foreign matter. Thus, among the blue light included in the irradiation light from the second light source 240, the amount of light received by the imaging device 220 is smaller in the portion where the defect B is present than in the portion without the defect. Therefore, as shown in Fig. 7, in the B-channel image data, the portion where the defect B exists in the prepreg 10 is darker than the portion without the defect.

Further, in step S206, the color information acquisition unit 252 acquires second color information to be described later from the image data of the prepreg 10 acquired by the image acquisition unit 151. The color information acquisition unit 252 acquires red R channel data (R value of each pixel) corresponding to red light included in the white light irradiated from the second light source 240 as second color information. As described above, the color information acquisition unit 252 includes color data included in a wavelength range of red light having a different wavelength range from blue light emitted from the first light source 230 among the light emitted from the second light source 240. Is obtained from image data as second color information.

Meanwhile, the color information acquisition unit 252 may acquire green G channel data (G value of each pixel) corresponding to green light included in the white light emitted from the second light source 240 as second color information. Also in this case, the defect of the prepreg 10 can be detected as in the case of using the R channel data described above.

8 is a diagram schematically illustrating image data (R channel data) of the prepreg 10.

The light irradiated from the second light source 240 toward the imaging device 220 is blocked in the portion where the defect A or the defect B exists in the prepreg 10. Thus, the amount of light received by the imaging device 220 among the red light included in the irradiation light from the second light source 240 is smaller in the portion where the defect A or the defect B is present than in the portion without the defect. Therefore, as shown in Fig. 8, in the R-channel data, the portion where the defect A and the defect B exist in the prepreg 10 is darker than the portion without the defect.

Here, in the image data, the R value of each pixel is not affected by the blue light emitted from the first light source 230, and the imaging device 220 captures red light included in the white light emitted from the second light source 240. It depends on the amount of light received. Thus, in the portion where the defect A is present, the R value included in the image data does not increase even if the amount of the imaging device 220 receiving blue light from the first light source 230 increases. Therefore, as shown in Fig. 8, the portion where the defect A exists in the R channel data is not affected by the blue light.

Next, in step S207, the detection unit 253 calculates the difference between the B channel data as the first color information acquired by the color information acquisition unit 252 and the R channel data as the second color information. Subsequently, in step S208, the detection unit 253 detects a defect in the prepreg 10.

In step S208, the detection unit 253 includes the difference value ((B value-R value) in the same pixel) between the B channel data as the first color information and the R channel data as the second color information in the image data Calculate for the whole. Hereinafter, the difference value data between the B-channel data and the R-channel data thus obtained is referred to as B-R channel data.

As described above, in the B channel data, the value of the defective A portion is larger than the value of the defective portion (see FIG. 7). On the other hand, in the R channel data, the value of the defect A portion is smaller than the value of the defect-free portion (see FIG. 8). Therefore, in the B-R channel data, the difference between the value of the defective portion A and the value of the defective portion is greater than the difference between the value of the defective portion A and the value of the defective portion in each of the B channel data and the R channel data.

For example, suppose that the value of each part of (defect A, defect B, no defect) in the B channel data was (250,50,120). And, suppose that the value of each part of (defect A, defect B, no defect) in the R channel data was (50,50,120). In this case, the value of each part of (Defect A, Defect B, No Defect) in the B-R channel data is (200,0,0).

Therefore, the difference between the value of the defect A portion and the value of the defect-free portion in the B-R channel data is 200, which is greater than the difference 130 between the value of the defect A portion and the value of the defect-free portion in the B-channel data. In addition, the difference 200 between the value of the defective portion A and the value of the defective portion in the B-R channel data is greater than the difference 70 between the value of the defective portion A and the value of the defective portion in the R channel data.

Therefore, when detecting the defect A based on the difference between the value of the defect A portion and the value of the defect-free portion, the detection unit 253 has a large difference between the value of the defect A portion and the value of the defect-free BR channel data. By using, it becomes possible to detect defect A with higher precision. In addition, in the B-R channel data, the luminance unevenness in the defect-free portion of the prepreg 10 included in each of the B-channel data and the R-channel data is canceled. Thus, the detection unit 253 can reduce the false detection of defect A by using B-R channel data in which luminance unevenness is canceled.

In addition, in the B channel data, the detection unit 253 is a defect B in which a pixel value is smaller than an average value of a defect-free portion and a difference between an average value of a defect-free portion and a preset threshold or more. It is detected as.

As described above, according to the inspection system 200 in the second embodiment, it is possible to detect a defect of the prepreg 10 as an inspection object and discriminate the type of the defect. Further, by obtaining the B channel data as the first color information from the image data captured by the imaging device 220, the R channel data as the second color information, and detecting a defect based on these differences , The detection accuracy of defect A is improved, and false detection is reduced.

Next, the third embodiment, the fourth embodiment, the fifth embodiment, the sixth embodiment, the seventh embodiment and the eighth embodiment will be described.

As described above, the prepreg is obtained by impregnating a fiber substrate such as carbon fiber with a thermosetting resin such as an epoxy resin, and heating and drying to cure the thermosetting resin in the fiber substrate, and can be used for a multilayer substrate or the like. In such a prepreg, defects such as irregularities on the surface, cracks in the surface layer, and mixing of foreign substances may occur in the manufacturing process.

Conventionally, such defect inspection has been performed by the naked eye, but automation is preferable to improve productivity. Thus, a method of detecting voids inside the prepreg based on the camera image by arranging the camera and the light source to face the prepreg so that light irradiated from the light source passes through the prepreg and enters the camera has been proposed. There is (for example, refer patent document 1).

In the method according to Patent Document 1, transmitted light enters the camera from the prepreg. Thus, in the captured image of the camera, defects of different types, such as surface cracks of the prepreg and foreign matter mixed therein, are reflected like shadows, and there is a possibility that it is difficult to discriminate the types of defects. In addition, since a portion having irregularities on the surface transmits light similarly to a portion without defects, there is a possibility that defects such as irregularities on the surface cannot be detected.

For example, in the prepreg manufacturing process, it is necessary to detect various defects as described above. Thus, for example, it is possible to consider sequentially inspecting the prepreg using a plurality of inspection devices that detect different defects. However, in such a configuration, there is a possibility that the size of the device increases and the time required for defect detection increases, resulting in a decrease in productivity.

The embodiments described below are made in consideration of the above-described situation, and an object thereof is to provide an inspection system capable of detecting a plurality of defects having different types of inspection objects in a short time.

According to the embodiment described below, there is provided an inspection system capable of detecting a plurality of defects having different types of inspection objects in a short time.

[Third Embodiment]

9 is a diagram illustrating the inspection system 1100 in the third embodiment.

As shown in FIG. 9, the inspection system 1100 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, first light sources 1131a, 1131b, and a second light source 1132. ), a supporting member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1100 inspects the presence or absence of a defect in the prepreg 10 as an inspection object conveyed by the conveying device 1110.

The prepreg 1010 is obtained by impregnating a fiber base with a thermosetting resin as described above, followed by heating and curing the thermosetting resin in the fiber base. The fiber base material is, for example, woven fibers formed of glass fibers, polyester fibers, and the like. Moreover, thermosetting resin is epoxy resin, phenol resin, etc., for example. The prepreg 1010 in the present embodiment is formed in a sheet shape having a smooth surface, and transmits light through a transparent thermosetting resin from the gap between the fiber substrates.

The conveying device 1110 has a first conveying belt 1111 as a first conveying part, a second conveying belt 1112 as a second conveying part, and a third conveying belt 1113 as a third conveying part, and the prepreg ( 1010) in the direction of the arrow in FIG. 9.

In the first conveyance belt 1111, an endless belt is hung on a plurality of rollers including a drive roller. The first conveyance belt 1111 conveys the prepreg 1010 placed on the belt by moving and rotating along the drive roller on which the endless belt rotates. The 2nd conveyance belt 1112 has the same structure as the 1st conveyance belt 1111, and conveys the prepreg 1010 handed over from the 1st conveyance belt 1111. The 3rd conveyance belt 1113 has the same structure as the 1st conveyance belt 1111, and conveys the prepreg 1010 handed over from the 2nd conveyance belt 1112.

Meanwhile, the configuration of the conveying device 1110 is not limited to the configuration illustrated in this embodiment, and may be, for example, a configuration for conveying the prepreg 1010 with a plurality of conveying rollers.

The 1st imaging device 1121 is a digital camera provided with imaging elements, such as CCD and CMOS, for example. In the first imaging device 1121, at least a part of an area to be imaged (the first imaging area) passes through the prepreg 1010 as a gap between the first conveyance belt 1111 and the second conveyance belt 1112. It is installed so as to overlap the area. In this embodiment, the 1st imaging device 1121 is provided so that the whole width direction of the prepreg 1010 may be imaged between the 1st conveyance belt 1111 and the 2nd conveyance belt 1112.

The first light sources 1131a and 1131b are, for example, LED (Light Emitting Diode) arrays, and the first imaging device 1121 irradiates light to a first imaging area imaging the prepreg 1010. Meanwhile, the first light sources 1131a and 1131b may be, for example, fluorescent lamps such as organic EL arrays or cold cathode tubes, halogen lamps, or the like. As a light source, LED is preferable from the viewpoint of long life, low heat generation, and monochromatic light selection.

The first light sources 1131a and 1131b mainly diffuse from the surface of the prepreg 1010 to which the first imaging device 1121 is conveyed between the first conveyance belt 1111 and the second conveyance belt 1112, respectively. It is arranged to receive reflected light. In the present embodiment, the first light sources 1131a and 1131b are provided so that the angle at which the irradiated light enters the surface of the prepreg 1010 is 45 degrees, respectively. Further, the first imaging device 1121 is provided so that the optical axis of the optical system is perpendicular to the surface of the prepreg 1010.

On the other hand, if it is possible for the first imaging device 1121 to mainly receive diffused reflected light from the surface of the prepreg 1010, the positional relationship between the first light sources 1131a, 1131b and the first imaging device 1121 is described above. It is not limited to the positional relationship. In this embodiment, the two light sources 1131a and 1131b are symmetrically installed, but the number of light sources is not limited to this, and one or three or more light sources may be installed. Further, as a light source, dome illumination may be provided to illuminate the first imaging area of the first imaging device 1121. In the following description, the “first light sources 1131a and 1131b” may be referred to simply as the “first light sources 1131”.

The support member 1140 is provided between the first conveyance belt 1111 and the second conveyance belt 1112. The support member 1140 supports the prepreg 1010 conveyed between the first conveyance belt 1111 and the second conveyance belt 1112. The support member 1140 has a support surface 1141 abutting the prepreg 1010. The support surface 1141 is formed to have a width greater than or equal to that of the prepreg 1010 and supports the entire width direction of the prepreg 1010 between the first conveyance belt 1111 and the second conveyance belt 1112. . The prepreg 1010 is supported by the support surface 1141 of the support member 1140, thereby being transported without deformation between the first transport belt 1111 and the second transport belt 1112.

In this way, the first conveyance belt 1111 and the second conveyance belt 1112 are supported by the support member 1140 supporting the prepreg 1010 between the first conveyance belt 1111 and the second conveyance belt 1112. ), it is possible to inspect the defect with high precision without causing deformation in the prepreg 1010.

Since the support surface 1141 of the support member 1140 is formed using a chromatic material, it has a chromatic color. In this embodiment, the support surface 1141 is formed of a cyan color material. Meanwhile, in the support member 1140, for example, a chromatic paint may be applied to the support surface 1141, and a portion including the support surface 1141 may be formed of a material having a chromatic color. In addition, the color of the support surface 1141 may be a chromatic color, and is not limited to cyan.

For example, when the support surface 1141 of the support member 1140 is, for example, achromatic color such as black, white, or gray, the difference due to the presence or absence of a defect in the image data captured by the first imaging device 1121 It is possible to become unclear. Therefore, in this embodiment, the support surface 1141 of the support member 1140 is colored in color to clarify the difference due to the presence or absence of a defect in the image data and to improve the accuracy of the defect detection.

The 2nd imaging device 1122 is a digital camera provided with imaging elements, such as CCD and CMOS, for example. In the second imaging device 1122, at least a portion of the area to be imaged (the second imaging area) is between the second transport belt 1112 and the third transport belt 1113 while the prepreg 1010 passes. It is installed to overlap. In the present embodiment, the second imaging device 1122 is provided so as to be capable of imaging the entire width direction of the prepreg 1010 between the second conveyance belt 1112 and the third conveyance belt 1113.

The second light source 1132 is, for example, an LED array, and the second imaging device 1122 irradiates light to a second imaging area imaging the prepreg 1010. Meanwhile, the second light source 1132 may be, for example, a fluorescent lamp such as an organic EL array or a cold cathode tube, or a halogen lamp.

The second light source 1132 mainly receives specular light from the surface of the prepreg 1010 to which the second imaging device 1122 is conveyed between the second conveyance belt 1112 and the third conveyance belt 1113. So, it is arranged. In the present embodiment, the second light source 1132 is provided so that the angle at which the irradiated light enters the surface of the prepreg 1010 is 45 degrees. In addition, the second imaging device 1122 is provided so that the optical axis of the optical system is 45 degrees to the surface of the prepreg 1010.

The sorting mechanism 150 guides the prepreg 10 from the third transport belt 1113 to the first tray 1151 or the second tray 1152 according to the defect investigation result, as described later. The sorting mechanism 1150 may have any configuration as long as it is possible to sort the prepreg 1010 according to the defect inspection result.

That is, the prepreg 1010A in which a defect is not detected is guided and stacked by the sorting mechanism 1150 to the first tray 1151. As the second tray 1152, a prepreg 1010B in which a defect is detected is guided and stacked by the sorting mechanism 1150.

The inspection apparatus 1160 has an image acquisition unit 1161, a defect detection unit 1162, and a classification unit 1163. The inspection device 1160 is, for example, a computer equipped with a CPU, ROM, RAM, or the like. Each function of the inspection device 1160, that is, the image acquisition unit 1161, the defect detection unit 1162, and the classification unit 1163, is realized, for example, by executing a program read by the CPU in cooperation with RAM. do.

The image acquisition unit 1161 acquires image data of the prepreg 1010 from the first imaging device 1121 and the second imaging device 1122. The defect detection unit 1162 detects a defect existing in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122.

The sorting unit 1163 controls the sorting mechanism 1150 based on the defect detection result of the prepreg 1010 by the defect detection unit 1162, so that the prepreg 1010 is first transferred from the third conveyance belt 1113. Guide to the tray 1151 or the second tray 1152. The sorting unit 1163 guides the prepreg 1010A in which the defect is not detected to the first tray 1151 and guides the prepreg 1010B in which the defect is detected to the second tray 1152. 1150).

10 is a diagram illustrating a defect of the prepreg 1010.

The defect AA shown in Fig. 10 is irregularities formed on the surface of the prepreg 1010. The defect BB is a surface crack of the prepreg 1010. In addition, the defect CC is a foreign substance mixed inside the prepreg 1010. The defect detection unit 1162 of the inspection device 1160 detects a defect in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122. do. On the other hand, in Fig. 10, the defect AA is exaggerated, and the defect AA is actually fine irregularities that cannot be visually confirmed.

11 is a diagram illustrating a flow chart of a defect detection process in the third embodiment.

As shown in Fig. 11, in the defect detection processing in the inspection system 1100, first, in step S1101, the conveying device 1110 prepregs 1010 from the first conveying belt 1111 toward the third conveying belt 1113. ).

Subsequently, in step S1102, the first imaging device 1121 captures the prepreg 1010 conveyed in the first imaging area between the first conveyance belt 1111 and the second conveyance belt 1112. As described above, the first imaging area of the first imaging device 1121 is provided between the first conveying belt 1111 and the second conveying belt 1112, and the first imaging device 1121 is prepped. In the leg 1010, the part supported by the support surface 1141 of the support member 1140 is imaged. The first imaging device 1121 images the entire prepreg 1010 by continuously imaging the prepreg 1010 conveyed by the conveying device 1110.

In step S1103, the defect detection unit 1162 of the inspection device 1160, the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the first imaging device 1121 (hereinafter, "first image data") ), a defect in the prepreg 1010 is detected.

12 is a diagram schematically illustrating first image data of the prepreg 1010 captured by the first imaging device 1121.

The 1st imaging apparatus 1121 supports the support member 1140 through the diffused reflected light from the prepreg 1010 and the prepreg 1010 which has transparency, from the defect-free part of the prepreg 1010 Diffuse reflected light reflected from the surface 1141 is received. Therefore, in the first image data of the prepreg 1010, in the portion without defects, the support surface 1140 of the support member 1140 is shown so that the support surface 1141 of the support member 1140 is visible through the prepreg 1010. 1141) appears. In this embodiment, since the support surface 1141 of the support member 1140 is cyan, the part without the defect of the prepreg 1010 in the captured image of the first imaging device is cyan.

The defect AA of the prepreg 1010 reflects the irradiation light from the light source 1131, similarly to the portion without the defect. Therefore, the amount of light received by the first imaging device 1121 from the defect AA of the prepreg 1010 and the amount of light received by the first imaging device 1121 from the portion without the defect are equal. Therefore, as shown in FIG. 12, in the first image data of the prepreg 1010, the portion where the defect AA is present has the same brightness as the portion without the defect.

The defect BB of the prepreg 1010 has the same state as whitened by an internal crack. The first imaging device 1121 reflects diffused reflected light from the surface of the prepreg 1010 from the portion where the defective BB of the prepreg 1010 is present, and reflected from the defective BB through the prepreg 1010 having transmissivity. Diffuse reflected light to be received. Therefore, in the first image data of the prepreg 1010, the portion where the defect BB is present has higher luminance than the portion without the defect.

In addition, the first imaging device 1121 is from the foreign material through the diffused reflected light from the surface of the prepreg 1010 and the prepreg 1010 having transmissivity from the portion where the defect CC of the prepreg 1010 exists. The reflected diffuse reflected light is received. Therefore, in the first image data of the first imaging device 1121, the color of the foreign matter appears so that the foreign matter is visible through the prepreg 1010 in the portion where the defect CC of the prepreg 1010 exists. For example, when a defect CC occurs because black foreign matter is mixed into the prepreg 1010, the defect CC appears as a dark shadow in the first image data.

As described above, in the first image data of the prepreg 1010 by the first imaging device 1121, the portion where the defect BB and the defect CC are present differs in brightness and color from the portion without the defect.

Therefore, the defect detection unit 1162 of the inspection device 1160 calculates, in advance, the average pixel luminance of the portion without defects in the first image data of the prepreg 1010, and determines the first image data. Defects are detected based on the comparison of the luminance of each element and the average luminance calculated in advance. The defect detection unit 1162 detects, for example, a pixel whose luminance is higher than the average luminance in the first image data as the defect BB. The defect detection unit 1162 detects, for example, a pixel whose luminance is lower than the average luminance in the first image data as the defect CC.

Further, the defect detection unit 1162 calculates, for example, a luminance difference (i.e., "luminance of each pixel"-"average luminance") with respect to the luminance and average luminance of each pixel in the first image data, and the luminance Defect BB and defect CC may be detected based on the difference. The defect detection unit 1162 compares, for example, a luminance difference with a preset first threshold value (>0) and a second threshold value (<0), and detects a pixel whose luminance difference is equal to or greater than the first threshold value as the defect BB. In addition, a pixel whose luminance difference is equal to or less than the second threshold is detected as a defect CC.

As described above, the defect detection unit 1162 of the inspection device 1160 can detect the defect BB and the defect CC existing in the prepreg 1010 based on the first image data acquired from the first imaging device 1121. have. In the above example, the case of detecting the defect CC which is a foreign substance in black was described, but even if the defect CC is a foreign substance other than black, the difference between the pixel luminance of the portion where the defect CC exists and the pixel luminance of the portion where there is no defect. Based on this, a defective CC can be detected.

Returning to the flow chart of the defect detection process shown in Fig. 11, in step S1104, the second imaging device 1122 is conveyed in the second imaging area between the second conveying belt 1112 and the third conveying belt 1113. The prepreg 1010 is imaged. As described above, the second imaging area of the second imaging device 1122 is provided between the second transportation belt 1112 and the third transportation belt 1113. The second imaging device 1122 images the entire prepreg 1010 by continuously imaging the prepreg 1010 conveyed by the conveying device 1110.

In step S1105, the defect detection unit 1162 of the inspection device 1160, the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122 (hereinafter, "second image data") ), a defect in the prepreg 1010 is detected.

13 is a diagram schematically illustrating the second image data of the prepreg 1010 captured by the second imaging device 1122.

The second imaging device 1122 receives specular light from the surface of the prepreg 1010 from a portion without defects in the prepreg 1010. In addition, in the portion where the defect CC is present, as in the portion without the defect, the surface of the prepreg 1010 reflects the irradiation light from the second light source 1132 specularly. Therefore, the second imaging device 1122 receives specular light from the surface of the prepreg 1010, even from the portion where the defect CC of the prepreg 1010 exists.

In the defects AA and BB of the prepreg 1010, the diffuse reflectance of the irradiated light from the second light source 1132 is higher than the diffuse reflectance in the defect-free portion. Thus, the amount of light received by the second imaging device 1122 from the defects AA and BB of the prepreg 1010 is smaller than the amount of light received by the second imaging device 1122 from the portions without defects. Therefore, as shown in FIG. 13, in the second image data of the prepreg 1010, the portion where the defect AA and the defect BB are present is darker than the portion without the defect or the portion where the defect CC is present.

In addition, the reason why the amount of light received by the second imaging device 1122 is smaller as the diffusion reflectance of the prepreg 1010 to the irradiation light from the second light source 1132 is higher is as follows. A high diffuse reflectance means that diffuse reflection, i.e., macroscopically, has a large degree of reflection that diffuses light in each direction regardless of the reflection law. On the other hand, the positional relationship between the second light source 1132 and the second imaging device 1122 is a positional relationship between the smaller the degree of diffuse reflection, that is, the closer the specular reflection, and the larger the amount of light received by the second imaging device 1122. . Therefore, the higher the diffuse reflectance of the prepreg 1010 to the irradiation light from the second light source 1132, the smaller the amount of light received by the second imaging device 1122 is.

Thus, the defect detection unit 1162 of the inspection device 1160, for example, calculates in advance the pixel average luminance of the portion without defects in the second image data of the prepreg 1010, and the second image data. Defect AA and defect BB are detected by comparing the luminance of each pixel with the average luminance previously calculated. The defect detection unit 1162 detects, as the defect AA and the defect BB, a pixel whose luminance is lower than the average luminance in the second image data, for example. Further, the defect detection unit 1162 calculates, for example, a luminance difference of the luminance of each pixel with respect to the average luminance (ie, “luminance of each pixel”-“average luminance”) in the second image data, Pixels whose luminance difference is equal to or less than a preset threshold may also be detected as defects AA and BBs.

As described above, the defect detection unit 1162 of the inspection device 1160 detects the defect AA and the defect BB present in the prepreg 1010 based on the second image data acquired from the second imaging device 1122.

Returning to the flow chart of the defect detection process shown in Fig. 11, when none of the defects AA, defects BB, and CCs is detected from the prepreg 1010 by the defect detection unit 1162 (step S1106: NO), Processing proceeds to step S1107. In step S1107, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the third conveyance belt 1113 to the first tray 1151 to process. Ends.

In addition, when any of the defects AA, defects BB, and defects CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1106: YES), the process proceeds to step S1108. In step S1108, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which a defect is detected from the third conveyance belt to the second tray 1152, and the processing ends.

Here, as described above, the defect detection unit 1162 of the inspection device 1160 detects the defect BB and the defect CC of the prepreg 1010 from the first image data captured by the first imaging device 1121. (Step S1103). Further, the defect AA and the defect BB of the prepreg 1010 are detected from the second image data captured by the second imaging device 1122 (step S1105). In this way, the types of defects are different in the processing by the first image data and the processing by the second image data. Further, in step S1103 based on the first image data, the defect BB and the defect CC are processed differently (for example, a process of detecting a pixel whose luminance is higher than the average luminance as the defect BB, and a pixel whose luminance is lower than the average luminance). Detection). On the other hand, in step S1105 by the second image data, defect AA and defect BB are detected by the same process (for example, a process of detecting a pixel whose luminance is lower than the average luminance as defect AA and defect BB). As a result, the processing time t1 of the processing by the first image data is longer than the processing time t2 of the processing by the second image data.

Therefore, for example, when the second imaging device 1122 is configured to image on the upstream side of the first imaging device 1121 in the conveyance path of the prepreg 1010, the overall processing time increases. In this case, if the prepreg 1010 transfer time between the first imaging area of the first imaging device 1121 and the second imaging area of the second imaging device 1122 is t3, as shown in FIG. 14A, The required processing time required for defect detection from the first image data and the second image data is T21 = t1 + t3.

In contrast, in the inspection system 1100 according to the present embodiment, the first imaging device 1121 is configured to image the upstream side of the second imaging device 1122 in the conveyance path of the prepreg 1010. With this configuration, as shown in Fig. 14B, the necessary processing time required for defect detection from the first image data and the second image data is T12 = t1, and the required processing time T21 (= t1 + t3) described above. It becomes possible to shorten it more.

As described above, according to the inspection system 1100 in the third embodiment, based on the images captured by the first imaging device 1121 and the second imaging device 1122, the prepreg as an inspection object ( The defect of 1010) can be detected. In addition, in the conveyance path of the prepreg 1010, the first imaging device 1121 is imaged upstream from the second imaging device 1122, so that it is possible to shorten the time required for the defect detection process and improve productivity. do.

In addition, in the inspection system 1100 in the third embodiment, the first imaging device 1121 is installed to inspect the prepreg 1010 in the gap between the conveyance belts 1111 and 1112 of the conveying device 1110. have. Further, a second imaging device 1122 or the like is provided to inspect the prepreg 1010 in the gap between the conveyance belts 1112 and 1113 of the conveying device 1110. With this configuration, the defects of the prepreg 1010 can be inspected with high precision without being affected by irregularities on the surface of the conveying belt in the conveying device 1110.

[Fourth Embodiment]

Next, a 4th embodiment is demonstrated based on drawing. On the other hand, description of the same components as those of the above-described embodiment will be appropriately omitted.

15 is a diagram illustrating the inspection system 1200 in the fourth embodiment.

As shown in FIG. 15, the inspection system 1200 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, and a first light source 1131a, 1131b), a second light source 1132, a third light source 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160 . The inspection system 1200 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object to be conveyed by the conveying device 1110.

The conveying device 1110 has a fourth conveying belt 1114 as a fourth conveying part in addition to the first conveying belt 1111, the second conveying belt 1112, and the third conveying belt 1113, and the prepreg ( 1010) in the direction of the arrow in FIG. The 4th conveyance belt has the same structure as the 1st conveyance belt 1111, and conveys the prepreg 1010 handed over from the 3rd conveyance belt 1113.

The third imaging device 1123 is, for example, a digital camera equipped with imaging elements such as CCD and CMOS. In the third imaging device 1123, at least a portion of the region to be imaged (third imaging region) passes through the prepreg 1010 as a gap between the third transportation belt 1113 and the fourth transportation belt 1114. It is installed so as to overlap the area. In this embodiment, the third imaging device 1123 images the prepreg 1010 from the opposite side to the second imaging device 1122. In the present embodiment, the third imaging device 1123 images the prepreg 1010 through the mirror 1171.

The third light source 1133 is, for example, an LED array, and the third imaging device 1123 irradiates light to a third imaging area imaging the prepreg 1010. The irradiation light from the third light source 1133 is reflected by the half mirror 1172 and is guided to the third imaging area between the third conveyance belt 1113 and the fourth conveyance belt 1114.

The third light source 1133, the mirror 1171, and the half mirror 1172 include a prepreg 1010 in which the third imaging device 1123 is conveyed between the third conveyance belt 1113 and the fourth conveyance belt 1114. ) Is mainly arranged to receive specular light from the surface. On the other hand, for example, a light control film may be provided on the third light source 1133 so that light emitted from the third light source 1133 becomes parallel light.

16 is a diagram illustrating a flow chart of a defect detection process in the fourth embodiment.

As shown in FIG. 16, in the defect detection process in the inspection system 1200, first, in step S1201, the conveying device 1110 is directed from the first conveying belt 1111 toward the fourth conveying belt 1114, and the prepreg ( 1010).

Next, in step S1202, the first imaging device 1121 captures the prepreg 1010 conveyed in the first imaging area between the first conveying belt 1111 and the second conveying belt 1112. In step S1203, the defect detection unit 1162 of the inspection device 1160 is based on the first image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the first imaging device 1121, and the above-described agent Defect BB and defect CC of the prepreg 1010 are detected in the same manner as in the third embodiment.

In step S1204, the second imaging device 1122 photographs the prepreg 1010 conveyed in the second imaging area between the second conveyance belt 1112 and the third conveyance belt 1113. In step S1205, the defect detection unit 1162 of the inspection device 1160 is based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122, and the above-described agent. In the same manner as in the third embodiment, the defect AA and the defect BB on the first surface side of the prepreg 1010 are detected.

In step S1206, the third imaging device 1123 photographs the prepreg 1010 conveyed in the third imaging area between the third conveyance belt 1113 and the fourth conveyance belt 1114. In step S1207, the defect detection unit 1162 of the inspection device 1160, the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the third imaging device 1123 (hereinafter referred to as "third image data") On the other hand, the defect AA and the defect BB on the second surface side opposite to the first surface in the prepreg 1010 are detected.

The method of detecting the defect of the third image data acquired from the third imaging device 1123 by the defect detection unit 1162 is the same as the method of detecting the defect of the second image data captured by the second imaging device 1122. to be. Thus, defects AA and defects on both sides of the prepreg 1010 based on the second image data captured by the second imaging device 1122 and the third image data captured by the third imaging device 1123 BB can be detected.

If none of the defects AA, defects BB, and CCs is detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: NO), the process proceeds to step S1209. In step S1209, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the fourth conveyance belt 1114 to the first tray 1151 and finish the processing. do.

In addition, when any of the defects AA, defect BB, and defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: YES), the process proceeds to step S1210. In step S1210, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which a defect is detected from the fourth conveyance belt 1114 to the second tray 1152 and finish the processing. .

As described above, according to the inspection system 1200 in the fourth embodiment, it is based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. Thus, the defect of the prepreg 1010 can be detected as an inspection object. In addition, by configuring the first imaging device 1121 in the conveyance path of the prepreg 1010 to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device, the above-described agent is As in the third embodiment, it is possible to shorten the time required for the defect detection processing and to improve productivity.

In addition, the inspection system 1200 in the fourth embodiment includes the first imaging device 1121 and the second imaging so as to inspect the prepreg 1010 in the gap between the respective conveying belts in the conveying device 1110. A device 1122, a third imaging device 1123, and the like are provided. With this configuration, as in the third embodiment described above, it is possible to inspect the defects of the prepreg 1010 with high accuracy without being affected by irregularities on the surface of the conveying belt in the conveying device 1110. have.

[Fifth Embodiment]

Next, the fifth embodiment will be described based on the drawings. On the other hand, description of the same components as those of the above-described embodiment will be appropriately omitted.

17 is a diagram illustrating the inspection system 1300 in the fifth embodiment.

As shown in FIG. 17, the inspection system 1300 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, and a first light source 1131a, 1131b), the second light source 1132, the third light source 1133, the fourth light source 1134, the sorting mechanism 1150, the first tray 1151, the second tray 1152, and the inspection device 1160 Have The inspection system 1300 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveying device 1110.

The first light sources 1131a and 1131b are, for example, blue LED arrays, and irradiate blue light between the first conveyance belt 1111 and the second conveyance belt 1112. The first light sources 1131a and 1131b are arranged so as to mainly receive diffused reflected light from the surface of the prepreg 1010 to which the first imaging device 1121 is conveyed.

The fourth light source 1134 is, for example, a white LED array, and irradiates white light between the first conveyance belt 1111 and the second conveyance belt 1112. The fourth light source 1134 is disposed so as to face the first imaging device 1121 so that the transmitted light transmitted through the prepreg 1010 to which the first imaging device 1121 is conveyed is several degrees.

In this embodiment, the first light sources 1131a and 1131b irradiate blue light in the first wavelength region (blue wavelength region), and the fourth light source 1134 is different from the first wavelength region and the first wavelength region. Light containing a wavelength region (eg, a red or green wavelength region) is irradiated. Meanwhile, the first light sources 1131a and 1131b and the fourth light source 1134 may each be irradiated with light having different wavelengths, and may be configured to irradiate light having a different color from the present embodiment. Further, the first light sources 1131a, 1131b and the fourth light source 1134 may be, for example, fluorescent lamps such as organic EL arrays, cold cathode tubes, halogen lamps, and the like.

The inspection apparatus 1160 has a color information acquisition unit 1164 in addition to the image acquisition unit 1161, the defect detection unit 1162, and the classification unit 1163. The color information acquisition unit 1164 acquires color information from the image data acquired by the image acquisition unit 1161. The defect detection unit 1162 detects a defect existing in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 and the color information acquired by the color information acquisition unit 1164.

18 is a diagram illustrating a flow chart of a defect detection process in the fifth embodiment.

As shown in FIG. 18, in the detection detection process in the inspection system 1300, first, in step S1301, the conveying device 1110 prepregs from the first conveying belt 1111 toward the fourth conveying belt 1114. 1010 is returned. Subsequently, in step S1302, the first imaging device 1121 captures the prepreg 1010 conveyed in the first imaging area between the first conveyance belt 1111 and the second conveyance belt 1112.

In step S1303, the color information acquisition unit 1164 of the inspection device 1160 acquires the first color information from the first image data captured by the first imaging device 1121.

Here, the first image data of the prepreg 1010 captured by the first imaging device 1121 is, for example, R (red), G (green), or B (blue) color for each pixel. It has an RGB value represented by a number from 0 to 255. The color information acquisition unit 1164 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 as first color information. . As described above, the color information acquisition unit 1164 acquires color data included in the wavelength region of blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 from the first image data as the first color information. do.

19 is a diagram schematically illustrating first image data (B channel data) of the prepreg 1010 captured by the first imaging device 1121.

In the defect AA of the prepreg 1010, the blue light irradiated from the first light sources 131a and 131b is reflected as in the portion without the defect. Thus, the first imaging device 1121 receives light. The amount of light received from the defect AA of the prepreg 1010 is equal to the amount of light received from the portion without the defect. Therefore, as shown in Fig. 19, the B channel data shows equal brightness in the portion where the defect AA exists and the portion without the defect.

In the defect BB of the prepreg 1010, the diffuse reflectance of the blue light emitted from the first light sources 131a, 131b is greater than the diffuse reflectance of the portion without defects. Thus, in the blue light emitted from the first light sources 131a and 131b, which the first imaging device 1121 receives, the amount of light received from the defect BB is larger than the amount of light received from the defective portion. Therefore, as shown in FIG. 19, in the B channel data, the portion in the prepreg 1010 where the defect BB exists is brighter than the portion without the defect.

In addition, in the defect CC of the prepreg 1010, the irradiation light from the fourth light source 1134 is blocked by foreign matter. Thus, the amount of blue light included in the irradiation light from the fourth light source 1134 received by the first imaging device 1121 is smaller in the portion where the defect CC is present than in the portion without the defect. Therefore, as shown in Fig. 19, in the B channel data, the portion where the defect CC exists is darker than the portion without the defect.

On the other hand, since the sum of the reflected light of the irradiated light from the first light sources 1131a and 1131b and the transmitted light of the irradiated light from the fourth light source 1134 becomes first image data, as shown in FIG. The area where BB is present is brighter than the area without defects. Further, the portion where the defect CC is present is darker than the portion without the defect.

In addition, in step S1304, the color information acquisition unit 1164 acquires the second color information from the first image data captured by the first imaging device 1121. The color information acquisition unit 1164 acquires red R channel data (R value of each pixel) corresponding to the red light included in the white light irradiated from the fourth light source 1134 as second color information. As described above, the color information acquisition unit 1164 receives color data included in the wavelength region of the red light having a different wavelength region from the blue light emitted from the first light source 1131 among the light emitted from the fourth light source 1134. It is obtained from image data as second color information.

Meanwhile, the color information acquisition unit 1164 may acquire green G-channel data (G value of each pixel) corresponding to green light included in the white light emitted from the fourth light source 1134 as second color information. Also in this case, the defect of the prepreg 1010 can be detected as in the case of using the R channel data described below.

20 is a diagram schematically illustrating first image data (R channel data) of the prepreg 1010 imaged by the first imaging device 1121.

The light irradiated from the fourth light source 1134 toward the first imaging device 1121 is transmitted through the same method in the prepreg 1010 where the defect AA is present and where there is no defect. Thus, the amount of light received by the red light included in the irradiation light from the fourth light source 1134 received by the first imaging device 1121 is substantially equal to the portion where the defect AA exists and the portion without the defect. Therefore, as shown in FIG. 20, the R channel data shows the brightness equivalent to the portion without the defect in the portion where the defect AA exists in the prepreg 1010.

In addition, the light irradiated from the fourth light source 1134 toward the first imaging device 1121 is blocked in the prepreg 1010 where a defect BB or a defect CC exists. Thus, in the first imaging device 1121, the amount of red light included in the irradiation light from the fourth light source 1134 is smaller in the portion where the defect BB or the defect CC is present than in the portion without the defect. Therefore, as shown in FIG. 20, in the R channel data, the portion in which the defect BB or the defect CC exists in the prepreg 1010 is darker than the portion without the defect.

Here, the R value of each pixel in the image data is not affected by the blue light emitted from the first light source 1131 by the first imaging device 1121, and the first imaging device 1121 is the fourth light source ( 1134) is determined by the amount of light received by the red light included in the light irradiated. Thus, even if the amount of blue light received from the first light source 1131 received by the first imaging device 1121 increases at a portion where the defect AA is present, the R value included in the image data does not increase. Therefore, as shown in Fig. 20, the portion where the defect AA exists in the R channel data is not affected by the blue light.

Returning to the flow chart of the defect detection processing shown in Fig. 18, in step S1305, the defect detection unit 1162 is the first channel information acquired by the color information acquisition unit 1164, and B channel data and second color information. As, the difference from R channel data is calculated. Next, in step S1306, the defect detection unit 1162 detects a defect in the prepreg 1010 based on the first image data and color information.

The defect detection unit 1162 includes, in step S1305, the difference value ((B value-R value) in the same pixel) of the B channel data as the first color information and the R channel data as the second color information, included in the image data Calculate for all pixels. Hereinafter, the difference value data between the B channel data and the R channel data thus obtained is referred to as B-R channel data.

As described above, in the B channel data, the value of the defective BB portion is greater than the value of the defective portion (see FIG. 19). On the other hand, in the R channel data, the value of the defective BB portion is smaller than the value of the defective portion (see Fig. 20). Therefore, in the B-R channel data, the difference between the value of the defective BB portion and the value of the defective portion is greater than the difference between the value of the defective BB portion and the value of the defective portion in each of the B channel data and the R channel data.

For example, suppose that the value of each part of (defect BB, no defect) in the B channel data was (250,120). In addition, suppose that the value of each part of (defect BB, no defect) in the R channel data was (50,120). In this case, the value of each part of (defect BB, no defect) of the B-R channel data is (200,0).

Therefore, in the BR channel data, the difference between the value of the defective BB portion and the value of the defective portion is 200, so that the difference between the value of the defective BB portion and the value of the defective portion in the B channel data is greater than 130. . In addition, in the B-R channel data, the difference 200 between the value of the defective BB portion and the value of the defective portion is greater than the difference 70 of the value of the defective BB portion and the value of the defective portion in the R channel data.

Therefore, when the defect detection unit 1162 detects a defect BB based on the difference between the value of the defect BB portion and the value of the defect-free portion, the difference between the value of the defect BB portion and the value of the defect-free portion is large. By using the BR channel data, it is possible to detect the defect BB with higher accuracy. In addition, in the B-R channel data, the precision unevenness in the portion without defects in the prepreg 1010 included in each of the B channel data and the R channel data is canceled. Thus, the defect detection unit 1162 can use the B-R channel data in which precision non-uniformity is canceled, thereby reducing the false detection and detecting the defect BB with high precision.

In addition, the defect detection unit 1162 is a portion in which the value of the pixel in the R channel data is smaller than the average value of the defect-free portion and the difference between the average value of the value of the defect-free portion is equal to or greater than a preset threshold, the defect BB Alternatively, it is detected as a defective CC.

In step S1307, the second imaging device 1122 captures the prepreg 1010 conveyed in the second imaging area between the second conveyance belt 1112 and the third conveyance belt 1113. In step S1308, the defect detection unit 1162 is based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122, the first surface of the prepreg 1010 Defect AA and defect BB on the side are detected.

In step S1309, the third imaging device 1123 photographs the prepreg 1010 conveyed in the third imaging area between the third conveyance belt 1113 and the fourth conveyance belt 1114. In step S1310, the defect detection unit 1162 is first in the prepreg 1010 based on the third image data of the prepreg 1010 obtained by the image acquisition unit 1161 from the third imaging device 1123. The defect AA and the defect BB on the second side opposite to the side are detected.

The method of detecting defects AA and defects BB based on the second image data captured by the second imaging device 1122 and the third image data captured by the third imaging device 1123 is the above-described fourth embodiment Same as in Esau.

If none of the defects AA, defects BB, and CCs is detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: NO), the process proceeds to step S1312. In step S1312, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the fourth conveyance belt 1114 to the first tray 1151 and finish the processing. do.

In addition, when any of the defects AA, defect BB, and defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: YES), the process proceeds to step S1313. In step S1313, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which a defect is detected from the fourth conveyance belt 1114 to the second tray 1152 and finish the processing. .

As described above, according to the inspection system 1300 in the fifth embodiment, it is based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. Thus, the defect of the prepreg 1010 can be detected as an inspection object. In addition, the defect detection unit 1162 reduces defects by reducing the false detection by using the B channel data and the R channel data as the second color information as the first color information acquired by the color information acquisition unit 1164 from the first image data. It becomes possible to detect BB with high precision. Further, by configuring the first imaging device 1121 in the conveyance path of the prepreg 1010 to image the prepreg 1010 from the upstream side of the second imaging device 1122 and the third imaging device 1123, As in the third embodiment described above, it is possible to shorten the time required for the defect detection processing and to improve productivity.

[Sixth Embodiment]

Next, a sixth embodiment will be described based on the drawings. On the other hand, description of the same components as those of the above-described embodiment will be appropriately omitted.

21 is a diagram illustrating the inspection system 1400 in the sixth embodiment.

As shown in FIG. 21, the inspection system 1400 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, and a first light source 1131a. 1131b), a second light source 1132, a third light source 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160 . The inspection system 1400 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveying device 1110.

The conveying device 1110 has a first conveying belt 1111, a second conveying belt 1112, and a third conveying belt 1113, and conveys the prepreg 1010 in the direction of the arrow in FIG.

In the third imaging device 1123, at least a portion of the area to be imaged (third imaging area) passes through the prepreg 1010 as a gap between the second conveyance belt 1112 and the third conveyance belt 1113. It is installed so as to overlap the area. The third imaging device 1123 images the prepreg 1010 from the opposite side to the second imaging device 1122. Like the second imaging device 1122, the third imaging device 1123 is provided so as to image the prepreg 1010 that passes between the second transportation belt 1112 and the third transportation belt 1113. .

Here, when the amount of light received by the second imaging device 1122 from the third light source 1133 and the amount of light received by the third imaging device 1123 from the second light source 1132 increase, the image in each imaging device is increased. There is a possibility that the precision of detecting defects based on data may deteriorate. Thus, the second imaging device 1122 receives the amount of light received from the third light source 1133 and the third imaging device 1123 receives the amount of light received from the second light source 1132 so as to be suppressed as low as possible. It is preferable to configure the second imaging device 1122, the third imaging device 1123, the second light source 1132, the third light source 1133, and the like.

The defect detection unit 1162 of the inspection device 1160 is based on image data obtained from the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123, as in the fourth embodiment. Then, the defect AA, the defect BB, and the defect CC of the prepreg 1010 are detected.

The inspection system 1400 in the sixth embodiment detects a defect of the prepreg 1010 as an inspection object by processing similar to the defect detection processing in the fourth embodiment, and prepregs according to the defect detection result. The 1010 is classified as the first tray 1151 or the second tray 1152.

As described above, according to the inspection system 1400 in the sixth embodiment, it is based on the images captured by the first imaging device 1121, the second imaging device 1122 and the third imaging device 1123. Thus, the defect of the prepreg 1010 can be detected as an inspection object. Further, by configuring the first imaging device 1121 in the conveyance path of the prepreg 1010 to image the prepreg 1010 from the upstream side of the second imaging device 1122 and the third imaging device 1123, As in the above-described third embodiment, it is possible to shorten the time required for the defect detection processing and to improve productivity.

Further, according to the inspection system 1400 in the sixth embodiment, the second imaging device 1122 and the third imaging device 1123 are between the second conveyance belt 1112 and the third conveyance belt 1113. In the configuration, the prepreg 1010 is imaged so that the entire configuration can be made compact.

On the other hand, as in the fifth embodiment, a fourth light source 1134 is provided, color information is obtained from the first image data captured by the first imaging device 1121, and a defect is detected based on the acquired color information. It can also be configured to.

[Seventh Embodiment]

Next, a 7th embodiment is demonstrated based on drawing. On the other hand, description of the same components as those of the above-described embodiment will be appropriately omitted.

22 is a diagram illustrating the inspection system 1500 in the seventh embodiment.

22, the conveyance apparatus 1110, the 1st imaging apparatus 1121, the 2nd imaging apparatus 1122, the 3rd imaging apparatus 1123, the 1st light source 1131a, as shown in FIG. 1131b), a second light source 1132, a third light source 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160 . The inspection system 1500 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveying device 1110.

In the third imaging device 1123, at least a portion of the area to be imaged (third imaging area) passes through the prepreg 1010 as a gap between the second conveyance belt 1112 and the third conveyance belt 1113. It is installed so as to overlap the area. In addition, the third light source 1133 mainly receives specular light from the surface of the prepreg 1010 in which the third imaging device 1123 is transferred between the second conveyance belt 1112 and the third conveyance belt 1113. It is arranged to receive light.

Here, when the amount of light received by the second imaging device 1122 from the third light source 1133 and the amount of light received by the third imaging device 1123 from the second light source 1132 increase, the image in each imaging device is increased. There is a possibility that the precision of detecting defects based on data may deteriorate. Thus, the second imaging device (1122) can reduce the amount of light received from the third light source 1133 and the amount of light received by the third imaging device 1123 from the second light source 1132 by the second imaging device 1122 ( 1122), it is preferable to configure the third imaging device 1123, the second light source 1132, the third light source 1133, and the like.

Thus, in this embodiment, as shown in FIG. 22, the optical axis 1132a (light irradiation direction) of the second light source 1132 and the optical axis 1133a (light irradiation direction) of the third light source 1133 are configured to be parallel. have. With this configuration, the amount of light received by the second imaging device 1122 from the third light source 1133 and the amount of light received by the third imaging device 1123 from the second light source 1132 are respectively reduced, thereby prepreg ( It is possible to keep the defect detection precision of 1010) and to downsize the device configuration.

As in the fourth embodiment, the defect detection unit 1162 of the inspection device 1160 is an image captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123, respectively. Based on the data, defects AA, defects BB and defects CC of the prepreg 1010 are detected.

The inspection system 1500 in the seventh embodiment detects a defect of the prepreg 1010 as an inspection object by processing similar to the defect detection processing in the fourth embodiment, and prepregs according to the defect detection result. The 1010 is classified as the first tray 1151 or the second tray 1152.

As described above, according to the inspection system 1500 in the seventh embodiment, it is based on the images captured by the first imaging device 1121, the second imaging device 1122 and the third imaging device 1123. Thus, the defect of the prepreg 1010 can be detected as an inspection object. Further, by configuring the first imaging device 1121 in the conveyance path of the prepreg 1010 to image the prepreg 1010 from the upstream side of the second imaging device 1122 and the third imaging device 1123, As in the above-described third embodiment, it becomes possible to shorten the time required for the defect detection processing and to improve productivity.

On the other hand, as in the fifth embodiment, a fourth light source 1134 is provided, color information is obtained from the first image data captured by the first imaging device 1121, and a defect is detected based on the acquired color information. It can also be configured to.

[Eighth Embodiment]

Next, an eighth embodiment will be described based on the drawings. On the other hand, description of the same components as those of the above-described embodiment will be appropriately omitted.

23 is a diagram illustrating the inspection system 1600 in the eighth embodiment.

23, the conveyance apparatus 1110, the 1st imaging apparatus 1121, the 2nd imaging apparatus 1122, the 1st light sources 1131a, 1131b, and the 2nd light source 1132 as shown in FIG. ), a third light source 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1600 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveying device 1110.

In this embodiment, the 1st imaging device 1121 and the 2nd imaging device 1122 are provided so that the prepreg 1010 conveyed by the conveying device 1110 can be imaged on a conveyance belt. The first imaging device 1121 is provided to image the prepreg 1010 on the first conveyance belt 1111. In addition, the second imaging device 1122 is provided to image the prepreg 1010 on the second conveyance belt 1112. Meanwhile, the first imaging device 1121 and the second imaging device 1122 may be installed to image the prepreg 1010 on the same conveyance belt.

The defect detection unit 1162 of the inspection device 1160, as in the third embodiment, the first image data captured by the first imaging device 1121 and the second image captured by the second imaging device 1122 A defect in the prepreg 1010 is detected based on the image data.

As described above, according to the inspection system 1600 in the eighth embodiment, based on the images captured by the first imaging device 1121 and the second imaging device 1122, a prepreg ( The defect of 1010) can be detected. Further, by configuring the first imaging device 1121 in the conveyance path of the prepreg 1010 to image the prepreg 1010 from the upstream side of the second imaging device 1122 and the third imaging device 1123, As in the above-described third embodiment, it becomes possible to shorten the time required for the defect detection processing and to improve productivity. Further, by arranging the first imaging area of the first imaging device 1121 and the second imaging area of the second imaging device 1122 closely, it is possible to miniaturize the device configuration.

Although the inspection system and inspection method for the embodiments have been described above, the present invention is not limited to the above embodiments, and various modifications and improvements are possible within the scope of the present invention. In the description of each of the above-described embodiments, a method of inspecting the prepreg 1010 as an inspection object has been described, but the inspection object is not limited to the prepreg.

This application claims priority based on Japanese Patent Application No. 2015-245600 filed on December 16, 2015 and Japanese Patent Application No. 2015-245708 filed on December 16, 2015. The entire contents of Korean Patent Application No. 2015-245600 and Japanese Patent Application No. 2015-245708 are used in this international application.

10 Prepreg (inspection object)
100,200 inspection system
110,210 conveying device
111,211 1st conveyance belt (1st conveyance part)
112,212 Second conveyance belt (second conveyance part)
120,220 imaging device
130a,130b light source
140 support member
141 support surface
150,250 inspection devices
152,253 detection unit
230 first light source
240 second light source
252 color information acquisition department
1010 Prepreg (inspection object)
1100,1200,1300,1400,1500,1600 inspection system
1110 conveying device
1111 First conveyance belt (first conveyance part)
1112 Second conveyance belt (second conveyance part)
1113 3rd transfer belt (3rd transfer section)
1121 First imaging device
1122 Second imaging device
1123 third imaging device
1131a,1131b 1st light source
1132 second light source
1133 Third light source
1134 4th light source
1140 support member
1141 support surface
1160 inspection device
1162 defect detection unit
1164 color information acquisition department
A,B,AA,BB,CC defect

Claims (18)

An inspection system for inspecting a sheet-shaped inspection object having light transmittance,
An imaging device for imaging the inspection object;
A first light source for irradiating light to the imaging area of the imaging device, so that the imaging device mainly receives diffused reflected light from the surface of the inspection object;
A second light source that irradiates light to the imaging area so that the imaging device receives light that has passed through the inspection object;
It includes an inspection device for inspecting the presence or absence of a defect in the inspection object,
The first light source irradiates light in a first wavelength region,
The second light source irradiates light including a second wavelength region different from the first wavelength region,
The inspection device,
A color information acquisition unit that acquires first color information of a color included in the first wavelength region and second color information of a color included in the second wavelength region from the captured image by the imaging device;
A detection unit that detects a defect of the inspection object based on the captured image
Including,
The detection unit detects a defect of the inspection object based on a difference between the first color information and the second color information. According to claim 1,
And a conveying device for conveying the object to be inspected from the first conveying part to the second conveying part,
The imaging system is characterized in that at least a part of the imaging area is provided so as to overlap an area through which the inspection object passes as a gap between the first conveying part and the second conveying part. delete delete delete The method according to claim 1 or 2,
The defect of the inspection object detected by the detection unit is an inspection system, characterized in that a crack in the surface layer of the inspection object and a foreign substance mixed inside the inspection object. As an inspection method for inspecting a sheet-shaped inspection object having light transmittance,
An imaging step of imaging the inspection object by an imaging device;
A first light irradiation step of irradiating light to an imaging area of the imaging device such that the imaging device mainly receives diffused reflected light from the surface of the inspection object;
A second light irradiation step of irradiating light to the imaging area, so that the imaging device receives light transmitted through the inspection object,
In the first light irradiation step, light in a first wavelength region is irradiated,
In the second light irradiation step, light including a second wavelength region different from the first wavelength region is irradiated,
The above inspection method is also
A color information acquisition step of acquiring first color information of a color included in the first wavelength region and second color information of a color included in the second wavelength region from the captured image by the imaging device;
And a detection step of detecting a defect of the inspection object based on the captured image,
In the detection step, the inspection method characterized in that the defect of the inspection object is detected based on the difference between the first color information and the second color information. An inspection system for inspecting a sheet-shaped inspection object having light transmittance,
A conveying device for conveying the inspection object,
A first imaging device that is conveyed by the conveying device to image the inspection object passing through the first imaging area;
A first light source that irradiates light to the first imaging area so that the first imaging device receives diffusely reflected light mainly from the surface of the inspection object;
A second imaging device conveyed by the conveying device and imaging the inspection object passing through the second imaging area downstream of the first imaging area;
A second light source that irradiates light to the second imaging area so that the second imaging device mainly receives specular light from the surface of the inspection object;
A defect detection unit that detects a defect of the inspection object based on the captured image by the first imaging device and the captured image by the second imaging device,
A fourth light source that irradiates light to the first imaging area so that the first imaging device receives light that has passed through the inspection object;
And a color information acquisition unit that acquires color information from the captured image by the first imaging device,
The first light source irradiates light in a first wavelength region,
The fourth light source irradiates light including a second wavelength region different from the first wavelength region,
The color information acquisition unit acquires first color information of a color included in the first wavelength region and second color information of a color included in the second wavelength region from the captured image by the first imaging device,
The defect detection unit detects a defect of the inspection object based on the difference between the first color information and the second color information. The method of claim 8,
The conveying apparatus includes a first conveying part for conveying the inspection object, and a second conveying part for conveying the inspection object handed over from the first conveying part,
The first imaging device is characterized in that at least a part of the first imaging area is provided so as to overlap an area through which the inspection object passes as a gap between the first conveying part and the second conveying part. system. delete delete delete The method of claim 9,
The conveying device further includes a third conveying part for conveying the inspection object handed over from the second conveying part,
The second imaging device is characterized in that at least a part of the second imaging area is provided so as to overlap an area through which the inspection object passes as a gap between the second conveying part and the third conveying part. system. The method of claim 8 or 9,
A third imaging device that is conveyed by the conveying device and passes the third imaging area downstream of the first imaging area and images the object to be inspected from the side opposite to the second imaging device;
Further comprising a third light source for irradiating light to the third imaging area, so that the third imaging device mainly receives specular light from the surface of the inspection object,
The defect detection unit detects a defect of the inspection object based on the captured image by the third imaging device. The method of claim 14,
The third imaging device is an inspection system, characterized in that at least a part of the third imaging area is provided to overlap the second imaging area. The method of claim 15,
The inspection system, characterized in that the optical axis of the second light source and the optical axis of the third light source are parallel. The method of claim 8 or 9,
The inspection system, characterized in that the defect of the inspection object detected by the defect detection unit is irregularities formed on the surface of the inspection object, cracks in the surface layer of the inspection object, and a foreign substance mixed inside the inspection object. A conveying device for conveying a sheet-shaped inspection object having light transmissivity,
A first imaging device that is conveyed by the conveying device to image the inspection object passing through the first imaging area;
A first light source that irradiates light to the first imaging area so that the first imaging device receives diffusely reflected light mainly from the surface of the inspection object;
A second imaging device conveyed by the conveying device and imaging the inspection object passing through the second imaging area downstream of the first imaging area;
A second light source that irradiates light to the second imaging area so that the second imaging device mainly receives specular light from the surface of the inspection object;
A fourth light source that irradiates light to the first imaging area so that the first imaging device receives light that has passed through the inspection object;
And a color information acquisition unit that acquires color information from the captured image by the first imaging device,
The first light source irradiates light in a first wavelength region,
The fourth light source is an inspection method for inspecting the inspection object in an inspection system that irradiates light including a second wavelength region different from the first wavelength region.
A first imaging step of imaging the inspection target object conveyed by the conveying device and passing through the first imaging area by the first imaging device;
A first defect detection step of detecting a defect of the inspection object based on the captured image by the first imaging device,
A second imaging step of imaging the inspection target object conveyed by the conveying device and passing through the second imaging area by the second imaging device;
A second defect detection step of detecting a defect of the inspection object based on the captured image by the second imaging device,
The color information acquisition unit acquires first color information of a color included in the first wavelength region and second color information of a color included in the second wavelength region from the captured image by the first imaging device. The step of obtaining color information,
In the first defect detection step, an inspection method characterized by detecting a defect of the inspection object based on a difference between the first color information and the second color information.

Images