JP6677260B2 - Inspection system and inspection method - Google Patents

Description

  The present invention relates to an inspection system and an inspection method.

  For example, various methods have been proposed for detecting defects such as cracks in the surface layer and the intrusion of foreign matter that may occur in the manufacturing process using glass, prepreg, or the like as an inspection target.

  For example, a camera and a light source are arranged to face each other with a prepreg sandwiched between them so that light emitted from a light source passes through the prepreg and enters the camera, and a void inside the prepreg is detected based on a camera image. A method has been proposed (see, for example, Patent Document 1).

  In the method according to Patent Literature 1, transmitted light from a prepreg as an inspection target enters a camera. For this reason, defects of different types, such as cracks on the surface layer of the inspection object and foreign substances mixed inside, also appear as shadows in the image captured by the camera. Therefore, there is a possibility that the type of the defect existing in the inspection object cannot be determined.

  The present invention has been made in view of the above, and an object of the present invention is to provide an inspection system capable of determining the type of a detected defect.

According to one embodiment of the present invention, an inspection system for inspecting a sheet-like inspection target having a light-transmitting property includes an imaging device that captures an image of the inspection target, and an imaging device that mainly emits diffuse reflected light from the surface of the inspection target. A first light source that irradiates light to an imaging region of the imaging device so as to receive light, a second light source that irradiates light to the imaging region so that the imaging device receives light transmitted through the inspection target, A first light source that emits light in a first wavelength range, and the second light source includes a second wavelength range different from the first wavelength range. A color information acquisition unit that irradiates light and acquires first color information of a color included in the first wavelength range and second color information of a color included in the second wavelength range from an image captured by the imaging apparatus ; includes a detector for detecting a defect of the inspection object based on the captured image, a detection unit, Detecting a defect of the inspection object based on the difference between the 1-color information and second color information.

  According to the embodiment of the present invention, an inspection system capable of determining the type of a detected defect is provided.

FIG. 1 is a diagram illustrating an inspection system according to a first embodiment. It is a figure (the 1) which illustrates a defect of a prepreg. FIG. 3 is a diagram illustrating a flowchart of a defect inspection process according to the first embodiment. FIG. 3 is a diagram schematically illustrating image data according to the first embodiment. It is a figure which illustrates the inspection system in 2nd Embodiment. FIG. 11 is a diagram illustrating a flowchart of a defect inspection process according to the second embodiment. It is a figure which illustrates typically image data (B channel) in a 2nd embodiment. It is a figure which illustrates typically image data (R channel) in a 2nd embodiment. It is a figure which illustrates the inspection system in a 3rd embodiment. FIG. 3 is a diagram (part 2) illustrating a defect of a prepreg. It is a figure which illustrates the flowchart of the defect detection processing in 3rd Embodiment. It is a figure which illustrates the 1st image data in a 3rd embodiment typically. It is a figure which illustrates typically 2nd image data in a 3rd embodiment. FIG. 6 is a diagram (part 1) for explaining a required processing time for defect detection. FIG. 8 is a diagram (part 2) for explaining a required processing time for defect detection. It is a figure which illustrates the inspection system in a 4th embodiment. It is a figure which illustrates the flowchart of the defect detection processing in 4th Embodiment. It is a figure which illustrates the inspection system in a 5th embodiment. It is a figure which illustrates the flowchart of the defect detection processing in 5th Embodiment. It is a figure which illustrates typically 1st image data (B channel) in 5th Embodiment. It is a figure which illustrates typically 1st image data (R channel) in a 5th embodiment. It is a figure which illustrates the inspection system in a 6th embodiment. It is a figure which illustrates the inspection system in a 7th embodiment. It is a figure which illustrates the inspection system in an 8th embodiment.

  Hereinafter, embodiments for carrying out the invention will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and redundant description may be omitted. In the following embodiments, a method for inspecting the presence or absence of a defect in a prepreg as an inspection object will be described, but the inspection object is not limited to the prepreg.

[First Embodiment]
FIG. 1 is a diagram illustrating an inspection system 100 according to the first embodiment.

  As shown in FIG. 1, the inspection system 100 includes a transport device 110, an imaging device 120, light sources 130a and 130b, and an inspection device 150, and inspects the prepreg 10 as an inspection object for a defect.

  The prepreg 10 is obtained by impregnating a fiber base material with a thermosetting resin and then heating and curing the thermosetting resin in the fiber base material. The fiber base material is, for example, a material in which a yarn formed of glass fiber, polyester fiber, or the like is woven. The thermosetting resin is, for example, an epoxy resin or a phenol resin. The prepreg 10 in the present embodiment is formed in a sheet shape with a smooth surface, and transmits light from a gap between the fiber base materials through a transparent thermosetting resin.

  The transport device 110 has a first transport belt 111 as a first transport unit and a second transport belt 112 as a second transport unit, and transports the prepreg 10 in the direction of the arrow in FIG. In the first transport belt 111, an endless belt is stretched over a plurality of rollers including a driving roller. When the endless belt rotates following the rotating drive roller, the first transport belt 111 transports the prepreg 10 placed on the belt. The second transport belt 112 has the same configuration as the first transport belt 111, and transports the prepreg 10 transferred from the first transport belt 111.

  Note that the configuration of the transport device 110 is not limited to the configuration illustrated in the present embodiment, and may be, for example, a configuration in which the prepreg 10 is transported by a plurality of transport rollers.

  The imaging device 120 is, for example, a digital camera including an imaging element such as a charge coupled device (CCD) and a complementary metal oxide semiconductor (CMOS). The imaging device 120 is provided so that at least a part of the imaging region is a gap between the first transport belt 111 and the second transport belt 112 and overlaps with a region through which the prepreg 10 passes. In the present embodiment, the imaging device 120 is provided so as to be able to take an image of the entire prepreg 10 in the width direction between the first transport belt 111 and the second transport belt 112.

  Each of the light sources 130a and 130b is, for example, an LED (Light Emitting Diode) array, and irradiates the imaging region of the imaging device 120 with white light. Each of the light sources 130a and 130b may be, for example, an organic EL (ElectroLuminescence) array, a fluorescent lamp such as a cold-cathode tube, or the like.

  The light sources 130a and 130b are respectively arranged such that the imaging device 120 mainly receives diffuse reflected light from the surface of the prepreg 10 conveyed between the first conveyor belt 111 and the second conveyor belt 112. In the present embodiment, each of the light sources 130a and 130b is provided such that the incident angle of the irradiation light on the surface of the prepreg 10 is 45 degrees. The imaging device 120 is provided so that the optical axis of the optical system is perpendicular to the surface of the prepreg 10.

  Note that the positional relationship between the light sources 130a and 130b and the image capturing device 120 is not limited to the above-described positional relationship as long as the image capturing device 120 can mainly receive diffuse reflected light from the surface of the prepreg 10. In the present embodiment, two light sources 130a and 130b are provided, but the number of light sources is not limited to this, and one or three or more light sources may be provided. In addition, a dome illumination may be provided as a light source so as to illuminate the imaging region of the imaging device 120. In the following description, the “light sources 130a and 130b” may be simply referred to as the “light source 130”.

  The support member 140 is provided between the first transport belt 111 and the second transport belt 112. The support member 140 supports the prepreg 10 transported between the first transport belt 111 and the second transport belt 112. The support member 140 has a support surface 141 that contacts the prepreg 10. The support surface 141 is formed to have a width equal to or greater than the width of the prepreg 10, and supports the entire prepreg 10 in the width direction between the first transport belt 111 and the second transport belt 112. The prepreg 10 is supported by the support surface 141 of the support member 140, and is conveyed between the first conveyor belt 111 and the second conveyor belt 112 without bending.

  The support surface 141 of the support member 140 is formed using a chromatic material and has a chromatic color. In the present embodiment, the support surface 141 is formed of a cyan material. In the support member 140, for example, a chromatic paint may be applied to the support surface 141, and a portion including the support surface 141 may be formed of a material having a chromatic color. Further, the color of the support surface 141 may be a chromatic color, and is not limited to cyan.

  The inspection device 150 has an image acquisition unit 151 and a detection unit 152. The inspection device 150 is, for example, a computer including a CPU (Central Processing Unit), a ROM (Read-Only Memory), a RAM (Random Access Memory), and the like. Each function of the inspection device 150, that is, the image acquisition unit 151 and the detection unit 152 is realized, for example, by the CPU executing a program read from the ROM in cooperation with the RAM.

  The image acquisition unit 151 acquires image data of the prepreg 10 from the imaging device 120. The detection unit 152 detects a defect existing in the prepreg 10 based on the image data acquired by the image acquisition unit 151 from the imaging device 120.

  FIG. 2 is a diagram illustrating a defect of the prepreg 10.

  The defect A shown in FIG. 2 is a crack in the surface layer. Further, the defect B is a foreign substance mixed inside. The detection unit 152 of the inspection device 150 detects a defect of the prepreg 10 from the image data of the prepreg 10 acquired by the image acquisition unit 151 from the imaging device 120, and further determines the type of the detected defect (defect A or defect B). .

  FIG. 3 is a diagram illustrating a flowchart of a defect detection process according to the first embodiment.

  As shown in FIG. 3, in the defect detection process in the inspection system 100, first, in step S101, the transport device 110 transports the prepreg 10 so as to transfer the prepreg 10 from the first transport belt 111 to the second transport belt 112.

  Next, in step S102, the light source 130 irradiates the imaging region of the imaging device 120 with light. Subsequently, in step S103, the imaging device 120 captures an image of the prepreg 10 that is transported in the imaging area between the first transport belt 111 and the second transport belt 112. As described above, the imaging device 120 has the imaging region provided in the gap between the first transport belt 111 and the second transport belt 112, and is supported by the support surface 141 of the support member 140 of the prepreg 10. Image of the part that is. The imaging device 120 images the entire prepreg 10 by continuously imaging the prepreg 10 transported by the transport device 110.

  In Step S104, the image acquisition unit 151 of the inspection device 150 acquires image data of the prepreg 10 from the imaging device 120. Subsequently, in step S105, the detection unit 152 detects a defect of the prepreg 10 based on the image data acquired by the image acquisition unit 151.

  FIG. 4 is a diagram schematically illustrating image data of the prepreg 10 captured by the imaging device 120.

  The image pickup device 120 transmits the diffuse reflected light reflected by the prepreg 10 from the defect-free portion of the prepreg 10 and the diffuse reflected light reflected by the support surface 141 of the support member 140 via the translucent prepreg 10. Are received. Therefore, in the image data of the prepreg 10 captured by the imaging device 120, the color of the support surface 141 of the support member 140 appears so that the support surface 141 of the support member 140 can be seen through the prepreg 10 in a portion having no defect. . In the present embodiment, since the support surface 141 of the support member 140 is cyan, a portion of the image captured by the imaging device 120 where there is no defect in the prepreg 10 is cyan.

  In the defect A of the prepreg 10, the diffuse reflectance of the irradiation light emitted from the light source 130 is higher than the diffuse reflectance of a portion having no defect. For this reason, the amount of light received by the imaging device 120 that is reflected by the defect A of the prepreg 10 is greater than the amount of light that is received by the imaging device 120 that is reflected by a portion having no defect. Therefore, as shown in FIG. 4, in the image data of the prepreg 10, the portion where the defect A exists is brighter than the portion where there is no defect.

  The reason why the higher the diffuse reflectance of the light emitted from the light source 130 is, the larger the amount of light received by the imaging device 120 is as follows. A high diffuse reflectance means that the degree of diffuse reflection, that is, a mode of diffusing light in each direction irrespective of the law of reflection macroscopically, is high. On the other hand, the positional relationship between the light sources 130 (130a and 130b) and the imaging device 120 is such that the higher the degree of diffuse reflection is, that is, the light is diffused in each direction regardless of the law of reflection when viewed macroscopically. The positional relationship is such that the higher the degree, the larger the amount of light received by the imaging device 120. Therefore, the higher the diffuse reflectance of the light emitted from the light source 130, the larger the amount of light received by the imaging device 120.

  Further, the imaging device 120 converts diffused reflected light from the surface of the prepreg 10 and diffuse reflected light reflected by a foreign substance through the translucent prepreg 10 from a portion where the defect B of the prepreg 10 is present. Receive light. Therefore, in the portion of the image data of the imaging device 120 where the defect B of the prepreg 10 exists, the color of the foreign material appears so that the foreign material can be seen through the prepreg 10. For example, when a black foreign matter is mixed into the inside of the prepreg 10 to cause the defect B, the defect B looks like a dark shadow in the captured image (see FIG. 4).

  As described above, in the image data of the prepreg 10, the portion where the defect A exists is brighter than the portion where there is no defect. Therefore, the brightness of the pixel in the portion where the defect A exists in the image data is higher than the brightness of the pixel in the portion without the defect.

  In the image data captured by the image capturing apparatus 120, a portion where a defect B due to, for example, a black foreign substance exists is darker than a portion where no defect exists. Therefore, in this case, the luminance of the pixel in the portion where the defect B exists in the image data is lower than the luminance of the pixel in the portion without the defect.

  Therefore, for example, the detection unit 152 of the inspection device 150 calculates in advance the average luminance of pixels in a portion having no defect in the image data of the prepreg 10 and calculates the average luminance of each pixel of the image data and the average luminance calculated in advance. A defect is detected based on the difference. The detection unit 152 detects, for example, a pixel whose luminance is higher than the average luminance in the image data as the defect A. Further, the detection unit 152 detects, for example, a pixel whose luminance is lower than the average luminance in the image data as the defect B.

  In addition, the detection unit 152 calculates a difference between the luminance of each pixel in the image data and the average luminance, and detects a pixel whose luminance is higher than the average luminance and whose difference from the average luminance is equal to or greater than a predetermined first threshold value. A may be detected. Further, the detection unit 152 may detect, as the defect B, a pixel whose luminance is lower than the average luminance and whose difference from the average luminance is equal to or larger than a second threshold value set in advance. By detecting a defect by comparing the difference between the luminance of each pixel and the average luminance with a threshold, false detection of a defect can be reduced.

  As described above, the detection unit 152 of the inspection device 150 detects the defects such as the defect A (crack on the surface layer) and the defect B (the contaminated foreign matter) existing in the prepreg 10 based on the image data of the image captured by the image capturing device 120. Can be detected separately. In the above-described example, the case where the defect B which is a black foreign substance is detected has been described. However, even when the defect B which is a non-black foreign substance is detected, the luminance of the pixel of the portion where the defect B exists, The defect B can be detected based on the difference between the luminance of the pixel having no defect and the luminance.

  As described above, according to the inspection system 100 in the first embodiment, it is possible to detect a defect of the prepreg 10 as an inspection object and determine a type of the defect.

  In the inspection system 100, the light source 130 and the imaging device 120 are provided so as to inspect the prepreg 10 in the gap between the first transport belt 111 and the second transport belt 112. With such a configuration, it is possible to inspect the defects of the prepreg 10 with high accuracy without being affected by irregularities or the like on the surfaces of the first conveyor belt 111 and the second conveyor belt 112.

  In addition, since the support member 140 supports the prepreg 10 between the first conveyor belt 111 and the second conveyor belt 112, the prepreg 10 is bent between the first conveyor belt 111 and the second conveyor belt 112. The inspection can be performed with high accuracy without causing the inspection.

  If the support surface 141 of the support member 140 is achromatic, for example, black, white, or gray, the image data captured by the imaging device 120 has no defect A or defect B and no defect. Differences from parts may be unclear. Therefore, in the present embodiment, by making the support surface 141 of the support member 140 a chromatic color, the difference due to the presence or absence of the defect is clarified as described above, and the defect can be detected with high accuracy.

  Here, the image data of the captured image captured by the imaging device 120 is, for example, an RGB value in which each color of R (red), G (green), and B (blue) is represented by a numerical value of 0 to 255 for each pixel. Have. Therefore, the detection unit 152 uses the value of the color having the largest luminance difference between the defective portion and the non-defective portion among the values of the RGB values according to the color of the support surface 141 of the support member 140. May be used to detect defects.

  For example, when the support surface 141 of the support member 140 is blue, the detection of the defect A that appears to be whitened due to the cracks on the surface layer requires the G channel data having the G value of each pixel and the R value of each pixel. Is used. By using the G channel data and the R channel data, it is possible to clarify the difference between the defect A and the portion having no defect, and to increase the detection sensitivity. Further, in this case, for example, in detecting a defect B which is a black foreign substance, B channel data having a B value of each pixel is used to clarify the difference between the defect B and a portion having no defect, thereby increasing the detection sensitivity. It becomes possible to raise.

  Further, in the description of the first embodiment, an example in which the light source 130 emits white light has been described. However, the irradiation light of the light source is not limited to white light, and the wavelength of the color of the support surface 141 of the support member 140 is not limited to white light. Should be included. For example, when the color of the support surface 141 is blue, the light source may be light of another color including blue light, or may be cyan light or magenta light.

[Second embodiment]
Next, a second embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 5 is a diagram illustrating an inspection system 200 according to the second embodiment.

  As illustrated in FIG. 5, the inspection system 200 includes a transport device 210, an imaging device 220, a first light source 230, a second light source 240, and an inspection device 250, and determines whether or not there is a defect in the prepreg 10 as an inspection target. inspect.

  The transport device 210 has a first transport belt 211 as a first transport unit and a second transport belt 212 as a second transport unit, and transports the prepreg 10 in the arrow direction in FIG. In the first transport belt 211, an endless belt is stretched over a plurality of rollers including a driving roller. When the endless belt rotates following the rotating drive roller, the first transport belt 211 transports the prepreg 10 placed on the belt. The second transport belt 212 has the same configuration as the first transport belt 211, and transports the prepreg 10 transferred from the first transport belt 211.

  Note that the configuration of the transport device 210 is not limited to the configuration illustrated in the present embodiment, and may be, for example, a configuration in which the prepreg 10 is delivered and transported by a plurality of transport rollers.

  The imaging device 220 is, for example, a digital camera including an imaging device such as a CCD and a CMOS. The imaging device 220 is provided so that at least a part of the imaging region is a gap between the first conveyance belt 211 and the second conveyance belt 212 and overlaps with a region where the prepreg 10 passes. In the present embodiment, the imaging device 220 is provided between the first transport belt 211 and the second transport belt 212 so as to capture an image of the entire prepreg 10 in the width direction.

  The first light source 230 is, for example, a blue LED array, and emits blue light between the first transport belt 211 and the second transport belt 212. The first light source 230 is arranged so that the imaging device 220 mainly receives diffuse reflected light from the surface of the prepreg 10 being conveyed.

  The second light source 240 is, for example, a white LED array, and emits white light between the first transport belt 211 and the second transport belt 212. The second light source 240 is arranged so as to face the imaging device 220 so that the imaging device 220 receives the transmitted light transmitted through the prepreg 10 being conveyed.

  In the present embodiment, the first light source 230 emits blue light in a first wavelength range (blue wavelength range), and the second light source 240 emits a first wavelength range and a second wavelength range different from the first wavelength range (for example, Irradiate white light including red and green wavelength ranges). Note that the first light source 230 and the second light source 240 may each emit light having a different wavelength range, or may be configured to emit light of a color different from that of the present embodiment. Further, the first light source 230 and the second light source 240 may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, or the like.

  The inspection device 250 includes an image acquisition unit 251, a color information acquisition unit 252, and a detection unit 253. The inspection device 250 is, for example, a computer including a CPU, a ROM, a RAM, and the like. Each function of the inspection device 250, that is, the image acquisition unit 251, the color information acquisition unit 252, and the detection unit 253 is realized, for example, by the CPU executing a program read from the ROM in cooperation with the RAM.

  The image acquisition unit 251 acquires image data of the prepreg 10 from the imaging device 220. The color information acquisition unit 252 acquires color information from the image data acquired by the image acquisition unit 251. The detection unit 253 detects a defect existing in the prepreg 10 based on the color information acquired by the color information acquisition unit 252.

  FIG. 6 is a diagram illustrating a flowchart of a defect detection process according to the second embodiment.

  As shown in FIG. 6, in the defect detection process in the inspection system 200, first, in step S201, the transport device 210 transports the prepreg 10 so as to be transferred from the first transport belt 211 to the second transport belt 212. .

  Next, in step S202, the first light source 230 and the second light source 240 irradiate the imaging region of the imaging device 120 with light. Subsequently, in step S203, the imaging device 120 captures an image of the prepreg 10 transferred from the first transport belt 211 to the second transport belt 212. The imaging device 220 images the entire prepreg 10 by continuously imaging the prepreg 10 transported by the transport device 110.

  In Step S204, the image acquisition unit 251 of the inspection device 250 acquires the image data of the prepreg 10 from the imaging device 220. Subsequently, in step S205, the color information acquisition unit 252 acquires first color information described later from the image data of the prepreg 10 acquired by the image acquisition unit 151.

  Here, the image data of the prepreg 10 captured by the imaging device 220 is, for example, an RGB value in which each color of R (red), G (green), and B (blue) is represented by a numerical value of 0 to 255 for each pixel. Having. The color information acquisition unit 252 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from each of the first light source 230 and the second light source 240 as first color information. The color information acquisition unit 252 thus acquires color data included in the wavelength range of the blue light emitted from the first light source 230 from the image data as first color information.

  FIG. 7 is a diagram schematically illustrating image data (B channel data) of the prepreg 10.

  In the defect A of the prepreg 10, the diffuse reflectance of the blue light emitted from the first light source 230 is higher than the diffuse reflectance of a portion having no defect. For this reason, the amount of light received by the imaging device 220 when the blue light emitted from the first light source 230 is reflected by the defect A is greater than the amount of light received by the imaging device 220 when reflected by a portion having no defect. Therefore, as shown in FIG. 7, in the B channel data, the portion where the defect A exists in the prepreg 10 is brighter than the portion where there is no defect.

  The reason why the higher the diffuse reflectance of the light emitted from the first light source 230 is, the larger the amount of light received by the imaging device 220 is, for the same reason as described in the description of the first embodiment.

  In the defect B of the prepreg 10, the irradiation light from the second light source 240 is blocked by the foreign matter. Therefore, of the blue light included in the irradiation light from the second light source 240, the amount of light received by the imaging device 220 is smaller in the portion where the defect B exists than in the portion where no defect exists. Therefore, as shown in FIG. 7, in the B channel image data, the portion where the defect B exists in the prepreg 10 is darker than the portion where there is no defect.

  In step S206, the color information acquisition unit 252 acquires second color information described later from the image data of the prepreg 10 acquired by the image acquisition unit 151. The color information acquisition unit 252 acquires red R channel data (R value of each pixel) corresponding to red light included in white light emitted from the second light source 240 as second color information. The color information acquisition unit 252 thus converts the color data included in the wavelength range of red light, which is different in wavelength range from the blue light emitted from the first light source 230, of the illumination light from the second light source 240. The second color information is obtained from the image data.

  Note that the color information acquisition unit 252 may acquire green G channel data (G value of each pixel) corresponding to green light included in white light emitted from the second light source 240 as second color information. . Also in this case, a defect of the prepreg 10 can be detected as in the case of using the R channel data described below.

  FIG. 8 is a diagram schematically illustrating image data (R channel data) of the prepreg 10.

  Light emitted from the second light source 240 toward the imaging device 220 is blocked by a portion of the prepreg 10 where the defect A or the defect B exists. For this reason, of the red light included in the irradiation light from the second light source 240, the amount of light received by the imaging device 220 is smaller in the portion where the defect A or the defect B is present than in the portion where there is no defect. Therefore, as shown in FIG. 8, in the R channel data, the portion where the defect A and the defect B exist in the prepreg 10 is darker than the portion without the defect.

  Here, the R value of each pixel in the image data is not affected by the blue light emitted from the first light source 230, and the R value of the red light included in the white light emitted from the second light source 240 is received by the imaging device 220. Depends on quantity. For this reason, even if the amount of blue light from the first light source 230 received by the imaging device 220 increases in the portion where the defect A exists, the R value included in the image data does not increase. Therefore, as shown in FIG. 8, the portion where the defect A exists in the R channel data is not affected by the blue light.

  Next, in step S207, the detection unit 253 calculates a difference between the B channel data as the first color information acquired by the color information acquisition unit 252 and the R channel data as the second color information. Subsequently, in step S208, the detection unit 253 detects a defect of the prepreg 10.

  In step S208, the detection unit 253 includes, in the image data, a difference value ((B value−R value) in the same pixel) between the B channel data as the first color information and the R channel data as the second color information. Is calculated for all the pixels to be processed. Hereinafter, the data of the difference value between the B channel data and the R channel data thus obtained is referred to as BR channel data.

  As described above, in the B channel data, the value of the defect A portion is larger than the value of the portion having no defect (see FIG. 7). On the other hand, in the R channel data, the value of the defect A portion is smaller than the value of the portion having no defect (see FIG. 8). For this reason, in the BR channel data, the difference between the value of the defect A portion and the value of the portion having no defect is the difference between the value of the defect A portion and the value of the portion having no defect in the B channel data and the R channel data. Is greater than the difference.

  For example, assume that the value of each part of (defect A, defect B, no defect) is (250, 50, 120) in the B channel data. Further, in the R channel data, the value of each part of (defect A, defect B, no defect) is (50, 50, 120). In such a case, in the BR channel data, the value of each part of (defect A, defect B, no defect) is (200, 0, 0).

  Therefore, in the BR channel data, the difference between the value of the defect A portion and the value of the defect-free portion is 200, and the difference between the value of the defect A portion and the value of the defect-free portion in the B channel data (130). Greater than. The difference (200) between the value of the defect A portion in the BR channel data and the value of the defect-free portion (200) is the difference (70) between the value of the defect A portion and the value of the defect-free portion in the R channel data. Greater than.

  Therefore, when detecting the defect A based on the difference between the value of the defect A portion and the value of the defect-free portion, the detection unit 253 has a large difference between the value of the defect A portion and the value of the defect-free portion. By using the BR channel data, the defect A can be detected with higher accuracy. In the B-R channel data, the luminance unevenness in the defect-free portion of the prepreg 10 included in each of the B channel data and the R channel data is canceled. Therefore, the detection unit 253 can reduce the erroneous detection of the defect A by using the BR channel data in which the luminance unevenness is canceled.

  In addition, the detection unit 253 determines, in the B-channel data, a portion where the pixel value is smaller than the average value of the value of the defect-free portion and the difference between the pixel value and the average value of the defect-free portion is equal to or larger than the preset threshold value. Is detected as a defect B.

  As described above, according to the inspection system 200 in the second embodiment, it is possible to detect a defect of the prepreg 10 as an inspection object and determine the type of the defect. Also, by acquiring B channel data as the first color information and R channel data as the second color information from the image data captured by the imaging device 220, a defect can be detected based on a difference between these. In addition, the detection accuracy of the defect A is improved and erroneous detection is reduced.

  Next, a third embodiment, a fourth embodiment, a fifth embodiment, a sixth embodiment, a seventh embodiment, and an eighth embodiment will be described.

  As described above, the prepreg is obtained by impregnating a fiber base material such as carbon fiber with a thermosetting resin such as an epoxy resin, heating and drying to cure the thermosetting resin in the fiber base material, It is used for multilayer substrates and the like. Such prepregs may have defects such as surface irregularities, surface layer cracks, and inclusion of foreign matter during the manufacturing process.

  Conventionally, such a defect inspection has been performed visually, but automation has been desired to improve productivity. Therefore, the camera and the light source are arranged to face each other with the prepreg sandwiched between them so that the light emitted from the light source passes through the prepreg and enters the camera, and the void inside the prepreg is detected based on the camera image. A method has been proposed (see, for example, Patent Document 1).

  In the method according to Patent Literature 1, transmitted light from a prepreg enters a camera. For this reason, defects of different types, such as cracks on the surface layer of the prepreg and foreign substances mixed inside, also appear as shadows in the image captured by the camera, and it may be difficult to determine the type of the defect. Further, since a portion having unevenness on the surface transmits light similarly to a portion having no defect, a defect such as unevenness on the surface may not be detected.

  For example, in the prepreg manufacturing process, it is necessary to detect various defects as described above. Therefore, for example, it is conceivable to sequentially inspect the prepreg using a plurality of inspection devices that detect different defects. However, such a configuration may increase the size of the apparatus, increase the time required for defect detection, and reduce productivity.

  The embodiment described below is made in view of the above situation, and aims to provide an inspection system capable of detecting a plurality of defects having different types of inspection objects in a short time.

  According to the embodiment described below, an inspection system capable of detecting a plurality of defects having different types of inspection objects in a short time is provided.

[Third embodiment]
FIG. 9 is a diagram illustrating an inspection system 1100 according to the third embodiment.

  As illustrated in FIG. 9, the inspection system 1100 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, first light sources 1131a and 1131b, a second light source 1132, a support member 1140, a sorting mechanism 1150, It has one tray 1151, second tray 1152, and inspection device 1160. The inspection system 1100 inspects the prepreg 1010 as an inspection object transported by the transport device 1110 for a defect.

  As described above, the prepreg 1010 is obtained by impregnating the fiber base material with the thermosetting resin and then heating and curing the thermosetting resin in the fiber base material. The fiber base material is, for example, a material in which a yarn formed of glass fiber, polyester fiber, or the like is woven. The thermosetting resin is, for example, an epoxy resin or a phenol resin. The prepreg 1010 in the present embodiment is formed in a sheet shape having a smooth surface, and transmits light from a gap between the fiber base materials through a transparent thermosetting resin.

  The transport device 1110 includes a first transport belt 1111 as a first transport unit, a second transport belt 1112 as a second transport unit, and a third transport belt 1113 as a third transport unit. Is transported in the direction of the arrow.

  In the first transport belt 1111, an endless belt is stretched over a plurality of rollers including a driving roller. When the endless belt rotates following the rotating drive roller, the first transport belt 1111 transports the prepreg 1010 placed on the belt. The second transport belt 1112 has the same configuration as the first transport belt 1111 and transports the prepreg 1010 delivered from the first transport belt 1111. The third conveyor belt 1113 has the same configuration as the first conveyor belt 1111, and conveys the prepreg 1010 delivered from the second conveyor belt 1112.

  Note that the configuration of the transport device 1110 is not limited to the configuration illustrated in the present embodiment, and may be, for example, a configuration in which the prepreg 1010 is transported by a plurality of transport rollers.

  The first imaging device 1121 is, for example, a digital camera including an imaging device such as a CCD and a CMOS. The first imaging device 1121 is configured such that at least a part of an area to be imaged (first imaging area) is a gap between the first transport belt 1111 and the second transport belt 1112 and overlaps an area through which the prepreg 1010 passes. Is provided. In the present embodiment, the first imaging device 1121 is provided between the first transport belt 1111 and the second transport belt 1112 so as to capture an image of the entire prepreg 1010 in the width direction.

  The first light sources 1131a and 1131b are, for example, LED (Light Emitting Diode) arrays, and irradiate a first imaging region where the first imaging device 1121 images the prepreg 1010 with light. Note that the first light sources 1131a and 1131b may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, a halogen lamp, or the like. As a light source, an LED is preferable from the viewpoint that it has a long life, generates little heat, and can select monochromatic light.

  The first light sources 1131a and 1131b are arranged such that the first imaging device 1121 receives mainly diffuse reflection light from the surface of the prepreg 1010 conveyed between the first conveyance belt 1111 and the second conveyance belt 1112, respectively. Have been. In the present embodiment, the first light sources 1131a and 1131b are provided such that the incident angle of the irradiation light on the surface of the prepreg 1010 is 45 degrees. The first imaging device 1121 is provided such that the optical axis of the optical system is perpendicular to the surface of the prepreg 1010.

  If the first imaging device 1121 can mainly receive diffusely reflected light from the surface of the prepreg 1010, the positional relationship between the first light sources 1131a and 1131b and the first imaging device 1121 is limited to the above-described positional relationship. It is not something that can be done. In the present embodiment, the two light sources 1131a and 1131b are provided symmetrically, but the number of light sources is not limited thereto, and one or three or more light sources may be provided. In addition, a dome illumination may be provided as a light source so as to illuminate the first imaging region of the first imaging device 1121. In the following description, the “first light sources 1131a and 1131b” may be simply referred to as “first light source 1131”.

  The support member 1140 is provided between the first transport belt 1111 and the second transport belt 1112. The support member 1140 supports the prepreg 1010 that is transported between the first transport belt 1111 and the second transport belt 1112. The support member 1140 has a support surface 1141 that contacts the prepreg 1010. The support surface 1141 is formed to have a width equal to or larger than the width of the prepreg 1010, and supports the entire width of the prepreg 1010 between the first conveyor belt 1111 and the second conveyor belt 1112. The prepreg 1010 is transported between the first transport belt 111 and the second transport belt 1112 without being bent by being supported by the support surface 1141 of the support member 1140.

  As described above, since the support member 1140 supports the prepreg 1010 between the first conveyor belt 1111 and the second conveyor belt 1112, the prepreg 1010 bends between the first conveyor belt 1111 and the second conveyor belt 1112. It is possible to carry out defect inspection with high accuracy without causing defects.

  The support surface 1141 of the support member 1140 is formed using a chromatic material and has a chromatic color. In the present embodiment, the support surface 1141 is formed of a cyan material. In the support member 1140, for example, a chromatic paint may be applied to the support surface 1141, and a portion including the support surface 1141 may be formed of a material having a chromatic color. The color of the support surface 1141 may be a chromatic color, and is not limited to cyan.

  If the support surface 1141 of the support member 1140 is achromatic, for example, black, white, or gray, the difference due to the presence or absence of a defect in the image data captured by the first imaging device 1121 may be unclear. is there. Therefore, in the present embodiment, the support surface 1141 of the support member 1140 is chromatic in order to clarify the difference due to the presence or absence of the defect in the image data and to improve the defect detection accuracy.

  The second imaging device 1122 is, for example, a digital camera including an imaging device such as a CCD and a CMOS. The second imaging device 1122 is provided such that at least a part of an area to be imaged (a second imaging area) is between the second conveyor belt 1112 and the third conveyor belt 1113 and overlaps an area where the prepreg 1010 passes. ing. In the present embodiment, the second imaging device 1122 is provided between the second conveyor belt 1112 and the third conveyor belt 1113 so as to be able to image the entire prepreg 1010 in the width direction.

  The second light source 1132 is, for example, an LED array, and irradiates a second imaging region where the second imaging device 1122 images the prepreg 1010 with light. The second light source 1132 may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, a halogen lamp, or the like.

  The second light source 1132 is arranged such that the second imaging device 1122 mainly receives specularly reflected light from the surface of the prepreg 1010 conveyed between the second conveyance belt 1112 and the third conveyance belt 1113. In the present embodiment, the second light source 1132 is provided such that the incident angle of the irradiation light on the surface of the prepreg 1010 is 45 degrees. The second imaging device 1122 is provided such that the optical axis of the optical system has an angle of 45 degrees with the surface of the prepreg 1010.

  The sorting mechanism 1150 guides the prepreg 1010 from the third conveyor belt 1113 to the first tray 1151 or the second tray 1152 according to the result of the defect inspection, as described later. The sorting mechanism 1150 may have any configuration as long as it can sort the prepreg 1010 according to the defect inspection result.

  In other words, the prepreg 1010A in which no defect is detected is guided and stacked on the first tray 1151 by the sorting mechanism 1150. On the second tray 1152, a prepreg 1010B in which a defect is detected is guided by the sorting mechanism 1150 and stacked.

  The inspection device 1160 includes an image acquisition unit 1161, a defect detection unit 1162, and a sorting unit 1163. The inspection device 1160 is, for example, a computer including a CPU, a ROM, a RAM, and the like. Each function of the inspection apparatus 1160, that is, the image acquisition unit 1161, the defect detection unit 1162, and the sorting unit 1163 is realized, for example, by the CPU executing a program read from the ROM in cooperation with the RAM.

  The image acquisition unit 1161 acquires image data of the prepreg 1010 from the first imaging device 1121 and the second imaging device 1122. The defect detection unit 1162 detects a defect existing in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122.

  The sorting unit 1163 controls the sorting mechanism 1150 based on the defect detection result of the prepreg 1010 by the defect detection unit 1162, and guides the prepreg 1010 from the third transport belt 1113 to the first tray 1151 or the second tray 1152. The sorting unit 1163 controls the sorting mechanism 1150 such that the prepreg 1010A in which no defect is detected is guided to the first tray 1151, and the prepreg 1010B in which a defect is detected is guided to the second tray 1152.

  FIG. 10 is a diagram illustrating a defect of the prepreg 1010.

  The defect AA shown in FIG. 10 is unevenness formed on the surface of the prepreg 1010. The defect BB is a crack in the surface layer of the prepreg 1010. In addition, the defect CC is a foreign substance mixed inside the prepreg 1010. The defect detection unit 1162 of the inspection device 1160 detects a defect of the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122. Note that FIG. 10 shows the defect AA in an exaggerated manner, and the defect AA is a minute unevenness that cannot be actually visually confirmed.

  FIG. 11 is a diagram illustrating a flowchart of a defect detection process according to the third embodiment.

  As shown in FIG. 11, in the defect detection processing in the inspection system 1100, first, in step S1101, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 to the third transport belt 1113.

  Next, in step S1102, the first imaging device 1121 captures an image of the prepreg 1010 that is transported in the first imaging area between the first transport belt 1111 and the second transport belt 1112. The first imaging region of the first imaging device 1121 is provided between the first conveyance belt 1111 and the second conveyance belt 1112 as described above, and the first imaging device 1121 supports the support member 1140 of the prepreg 1010. The part supported by the surface 1141 is imaged. The first imaging device 1121 images the entire prepreg 1010 by continuously imaging the prepreg 1010 transported by the transport device 1110.

  In step S1103, the defect detection unit 1162 of the inspection device 1160 detects a defect of the prepreg 1010 based on the image data of the prepreg 1010 (hereinafter, referred to as first image data) acquired by the image acquisition unit 1161 from the first imaging device 1121. I do.

  FIG. 12 is a diagram schematically illustrating first image data of the prepreg 1010 captured by the first imaging device 1121.

  The first imaging device 1121 transmits the diffuse reflected light from the prepreg 1010 having no defect and the diffuse reflected light reflected by the support surface 1141 of the support member 1140 via the prepreg 1010 having a light transmitting property. Are received. Therefore, in the first image data of the prepreg 1010, the color of the support surface 1141 of the support member 1140 appears so that the support surface 1141 of the support member 1140 can be seen through the prepreg 1010 in a portion having no defect. In the present embodiment, since the support surface 1141 of the support member 1140 is cyan, a portion of the image captured by the first imaging device 1121 where the prepreg 1010 has no defect is cyan.

  The defect AA of the prepreg 1010 reflects the irradiation light from the first light source 1131 similarly to the portion having no defect. Therefore, the amount of light received by the first imaging device 1121 from the defect AA of the prepreg 1010 is equal to the amount of light received by the first imaging device 1121 from a portion having no defect. Therefore, as shown in FIG. 12, the portion where the defect AA exists in the first image data of the prepreg 1010 has the same brightness as the portion without the defect.

  The defect BB of the prepreg 1010 has a state of whitening due to internal cracks. The first imaging device 1121 transmits diffused reflected light from the surface of the prepreg 1010 and diffused reflected light reflected by the defect BB through the translucent prepreg 1010 from the portion of the prepreg 1010 where the defect BB exists. Is received. Therefore, the portion where the defect BB exists in the first image data of the prepreg 1010 has a higher luminance than the portion having no defect.

  In addition, the first imaging device 1121 performs, from a portion of the prepreg 1010 where the defect CC exists, diffuse reflection light from the surface of the prepreg 1010 and diffuse reflection light reflected by a foreign substance through the translucent prepreg 1010. Are received. Therefore, in the first image data of the first imaging device 1121, in the portion where the defect CC of the prepreg 1010 exists, the color of the foreign material appears so that the foreign material can be seen through the prepreg 1010. For example, when a black foreign substance is mixed into the inside of the prepreg 1010 to generate a defect CC, the defect CC appears as a dark shadow in the first image data.

  As described above, in the first image data of the prepreg 1010 by the first imaging device 1121, the portion where the defect BB and the defect CC exist has different brightness and color from the portion without the defect.

  Therefore, the defect detection unit 1162 of the inspection device 1160 previously calculates, for example, the average luminance of pixels of a portion where there is no defect in the first image data of the prepreg 1010, and determines the luminance of each pixel of the first image data in advance. A defect is detected based on a comparison with the calculated average luminance. The defect detection unit 1162 detects, for example, a pixel whose luminance is higher than the average luminance in the first image data as the defect BB. In addition, the defect detection unit 1162 detects, for example, a pixel in the first image data whose luminance is lower than the average luminance as the defect CC.

  The defect detection unit 1162 calculates, for example, a luminance difference between the luminance of each pixel and the average luminance in the first image data (that is, “luminance of each pixel” − “average luminance”), and based on the luminance difference, the defect BB. And a defect CC may be detected. The defect detection unit 1162 compares, for example, a preset first threshold value (> 0) and a second threshold value (<0) with a luminance difference, and detects a pixel whose luminance difference is equal to or greater than the first threshold value as a defect BB. . Further, a pixel whose luminance difference is equal to or smaller than the second threshold is detected as a defective CC.

  As described above, the defect detection unit 1162 of the inspection device 1160 can detect the defect BB and the defect CC existing in the prepreg 1010 based on the first image data acquired from the first imaging device 1121. In the above example, the case where the defect CC which is a black foreign substance is detected has been described. However, even if the defect CC is a non-black foreign substance, the luminance of the pixel where the defect CC exists and the defect-free part Defective CC can be detected based on the difference from the luminance of the pixel.

  Returning to the flowchart of the defect detection process shown in FIG. 11, in step S1104, the second imaging device 1122 images the prepreg 1010 conveyed in the second imaging region between the second conveyance belt 1112 and the third conveyance belt 1113. I do. The second imaging region of the second imaging device 1122 is provided between the second transport belt 1112 and the third transport belt 1113 as described above. The second imaging device 1122 images the entire prepreg 1010 by continuously imaging the prepreg 1010 conveyed by the conveyance device 1110.

  In step S1105, the defect detection unit 1162 of the inspection device 1160 detects a defect of the prepreg 1010 based on the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122 (hereinafter, referred to as second image data). To detect.

  FIG. 13 is a diagram schematically illustrating second image data of the prepreg 1010 captured by the second imaging device 1122.

  The second imaging device 1122 receives specularly reflected light from the surface of the prepreg 1010 from a portion of the prepreg 1010 where there is no defect. Further, in the portion where the defect CC exists, the surface of the prepreg 1010 specularly reflects the irradiation light from the second light source 1132, similarly to the portion having no defect. Therefore, the second imaging device 1122 receives specularly reflected light from the surface of the prepreg 1010 from the portion of the prepreg 1010 where the defect CC exists as well as the portion without the defect.

  The diffuse reflectance of the irradiation light from the second light source 1132 at the defect AA and the defect BB of the prepreg 1010 is higher than the diffuse reflectance of a portion having no defect. Therefore, the amount of light received by the second imaging device 1122 from the defects AA and BB of the prepreg 1010 is smaller than the amount of light received by the second imaging device 1122 from a portion having no defect. Therefore, as shown in FIG. 13, in the second image data of the prepreg 1010, the portion where the defect AA and the defect BB exist is darker than the portion where no defect exists and the portion where the defect CC exists.

The reason why the higher the diffuse reflectance of the prepreg 1010 with respect to the irradiation light from the second light source 1132 is, the smaller the amount of light received by the second imaging device 1122 is as follows. High diffuse reflectance means that the degree of diffuse reflection, that is, the degree of reflection that diffuses light in each direction regardless of the law of reflection macroscopically, is high. On the other hand, the positional relationship between the second light source 1132 and the second imaging device 1122 is such that the lower the degree of diffuse reflection, that is, the closer to regular reflection, the greater the amount of light received by the second imaging device 1122. Therefore, the higher the diffuse reflectance of the prepreg 1010 with respect to the irradiation light from the second light source 1132, the smaller the amount of light received by the second imaging device 1122. Therefore, the defect detection unit 1162 of the inspection device 1160 The average luminance of pixels in a portion where there is no defect in the image data is calculated in advance, and the defect AA and the defect BB are detected by comparing the luminance of each pixel of the second image data with the previously calculated average luminance. The defect detection unit 1162 detects, for example, a pixel whose luminance is lower than the average luminance in the second image data as the defect AA and the defect BB. In addition, the defect detection unit 1162 calculates, for example, a luminance difference between the luminance of each pixel in the second image data and the average luminance (that is, “luminance of each pixel” − “average luminance”), and the luminance difference is set in advance. Pixels that have fallen below the threshold may be detected as defects AA and BB.

  As described above, the defect detection unit 1162 of the inspection device 1160 detects the defects AA and BB existing in the prepreg 1010 based on the second image data acquired from the second imaging device 1122.

  Returning to the flowchart of the defect detection processing shown in FIG. 11, when none of the defect AA, the defect BB, and the defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1106: NO), the processing is step S1107. Proceed to. In step S1107, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the third transport belt 1113 to the first tray 1151, and ends the processing.

  If any of the defects AA, BB, and CC has been detected from the prepreg 1010 by the defect detection unit 1162 (step S1106: YES), the process proceeds to step S1108. In step S1108, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which the defect has been detected from the third transport belt to the second tray 1152, and ends the processing.

  Here, as described above, the defect detection unit 1162 of the inspection device 1160 detects the defect BB and the defect CC of the prepreg 1010 from the first image data captured by the first imaging device 1121 (Step S1103). In addition, a defect AA and a defect BB of the prepreg 1010 are detected from the second image data captured by the second imaging device 1122 (step S1105). As described above, the types of defects to be detected are different between the processing based on the first image data and the processing based on the second image data. Further, in step S1103 based on the first image data, the defect BB and the defect CC are processed differently (for example, a process of detecting a pixel whose luminance is higher than the average luminance as the defect BB, and a process of detecting a pixel whose luminance is lower than the average luminance as the defect CC). In the process of detecting as On the other hand, in step S1105 based on the second image data, the defect AA and the defect BB are detected by the same process (for example, a process of detecting a pixel whose luminance is lower than the average luminance as the defect AA and the defect BB). As a result, the processing time t1 of the processing based on the first image data is longer than the processing time t2 of the processing based on the second image data.

  Therefore, for example, if the second imaging device 1122 is configured to take an image on the upstream side of the first imaging device 1121 on the transport path of the prepreg 1010, the entire processing time increases. In this case, assuming that the transport time of the prepreg 1010 between the first imaging region of the first imaging device 1121 and the second imaging region of the second imaging device 1122 is t3, as shown in FIG. The required processing time required to detect a defect from the second image data is T21 = t1 + t3.

  In contrast, the inspection system 1100 according to the present embodiment is configured such that the first imaging device 1121 captures an image on the transport path of the prepreg 1010 on the upstream side of the second imaging device 1122. With such a configuration, as shown in FIG. 14B, the required processing time required for defect detection from the first image data and the second image data is T12 = t1, which is shorter than the required processing time T21 (= t1 + t3) described above. It becomes possible to do.

  As described above, according to the inspection system 1100 in the third embodiment, the defect of the prepreg 1010 as the inspection target is detected based on the images captured by the first imaging device 1121 and the second imaging device 1122. can do. In addition, since the first imaging device 1121 captures an image on the transport path of the prepreg 1010 on the upstream side of the second imaging device 1122, the time required for the defect detection processing can be shortened and the productivity can be improved. Become.

  In the inspection system 1100 according to the third embodiment, the first imaging device 1121 is provided so as to inspect the prepreg 1010 in the gap between the conveyor belts 1111 and 1112 of the conveyor 1110. In addition, a second imaging device 1122 and the like are provided so as to inspect the prepreg 1010 in a gap between the conveyor belts 1112 and 1113 of the conveyor 1110. With such a configuration, a defect of the prepreg 1010 can be inspected with high accuracy without being affected by irregularities on the surface of the conveyor belt in the conveyor 1110.

[Fourth embodiment]
Next, a fourth embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 15 is a diagram illustrating an inspection system 1200 according to the fourth embodiment.

  As illustrated in FIG. 15, the inspection system 1200 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1200 inspects the prepreg 1010 as an inspection object transported by the transport device 1110 for a defect.

  The transport device 1110 has a fourth transport belt 1114 as a fourth transport unit in addition to the first transport belt 1111, the second transport belt 1112, and the third transport belt 1113, and moves the prepreg 1010 in the arrow direction in FIG. 15. Transport to The fourth transport belt has the same configuration as the first transport belt 1111 and transports the prepreg 1010 delivered from the third transport belt 1113.

  The third imaging device 1123 is, for example, a digital camera including an imaging element such as a CCD and a CMOS. The third imaging device 1123 is configured such that at least a part of an area to be imaged (third imaging area) is a gap between the third transport belt 1113 and the fourth transport belt 1114 and overlaps an area through which the prepreg 1010 passes. Is provided. The third imaging device 1123 images the prepreg 1010 from the side opposite to the second imaging device 1122. In the present embodiment, the third imaging device 1123 images the prepreg 1010 via the mirror 1171.

  The third light source 1133 is, for example, an LED array, and irradiates a third imaging region where the third imaging device 1123 images the prepreg 1010 with light. Irradiation light from the third light source 1133 is reflected by the half mirror 1172 and guided to a third imaging area between the third transport belt 1113 and the fourth transport belt 1114.

  The third light source 1133, the mirror 1171, and the half mirror 1172 mainly receive specularly reflected light from the surface of the prepreg 1010 in which the third imaging device 1123 is transported between the third transport belt 1113 and the fourth transport belt 1114. Are arranged as follows. Note that, for example, a light control film may be provided in the third light source 1133 so that light emitted from the third light source 1133 becomes parallel light.

  FIG. 16 is a diagram illustrating a flowchart of a defect detection process according to the fourth embodiment.

  As shown in FIG. 16, in the defect detection processing in the inspection system 1200, first, in step S1201, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 to the fourth transport belt 1114.

  Next, in step S1202, the first imaging device 1121 captures an image of the prepreg 1010 that is transported in the first imaging area between the first transport belt 1111 and the second transport belt 1112. In step S1203, based on the first image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the first imaging device 1121, the defect detection unit 1162 of the inspection device 1160 performs the prepreg operation in the same manner as in the third embodiment. 1010 defect BB and defect CC are detected.

  In step S1204, the second imaging device 1122 images the prepreg 1010 conveyed in the second imaging region between the second conveyance belt 1112 and the third conveyance belt 1113. In step S1205, the defect detection unit 1162 of the inspection device 1160 uses the prepreg based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122 in the same manner as in the third embodiment. A defect AA and a defect BB on the first surface side of 1010 are detected.

  In step S1206, the third imaging device 1123 captures an image of the prepreg 1010 transported in the third imaging area between the third transport belt 1113 and the fourth transport belt 1114. In step S1207, the defect detection unit 1162 of the inspection device 1160 uses the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the third imaging device 1123 (hereinafter, referred to as third image data) to generate A defect AA defect BB on the second surface side opposite to the one surface is detected.

  The defect detection method of the third image data acquired from the third imaging device 1123 by the defect detection unit 1162 is the same as the defect detection method of the second image data captured by the second imaging device 1122. As described above, based on the second image data captured by the second imaging device 1122 and the third image data captured by the third imaging device 1123, the defects AA and BB can be detected on both surfaces of the prepreg 1010.

  If none of the defect AA, the defect BB, and the defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: NO), the process proceeds to step S1209. In step S1209, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the fourth transport belt 1114 to the first tray 1151, and ends the processing.

  If any of the defects AA, BB, and CC has been detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: YES), the process proceeds to step S1210. In step S1210, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which the defect has been detected from the fourth transport belt 1114 to the second tray 1152, and ends the processing.

  As described above, according to the inspection system 1200 in the fourth embodiment, the inspection object is determined based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. Further, by configuring the first imaging device 1121 to image the prepreg 1010 on the transport path of the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device, the same as in the third embodiment described above. In addition, it is possible to shorten the time required for the defect detection processing and improve the productivity.

  In addition, the inspection system 1200 in the fourth embodiment performs the inspection of the prepreg 1010 in the gap between the respective transport belts of the transport device 1110 so as to inspect the prepreg 1010, the second imaging device 1122, and the third An imaging device 1123 and the like are provided. With such a configuration, similarly to the above-described third embodiment, it is possible to inspect defects of the prepreg 1010 with high accuracy without being affected by irregularities on the surface of the conveyor belt in the conveyor 1110. .

[Fifth Embodiment]
Next, a fifth embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 17 is a diagram illustrating an inspection system 1300 according to the fifth embodiment.

  As shown in FIG. 17, the inspection system 1300 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a fourth light source 1134, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1300 inspects the prepreg 1010 as an inspection object transported by the transport device 1110 for a defect.

  The first light sources 1131a and 1131b are, for example, blue LED arrays, and emit blue light between the first transport belt 1111 and the second transport belt 1112. The first light sources 1131a and 1131b are arranged so that the first imaging device 1121 receives diffusely reflected light mainly from the surface of the prepreg 1010 being conveyed.

  The fourth light source 1134 is, for example, a white LED array, and emits white light between the first transport belt 1111 and the second transport belt 1112. The fourth light source 1134 is arranged to face the first imaging device 1121 so that the transmitted light transmitted through the prepreg 1010 being conveyed is received by the first imaging device 1121.

  In the present embodiment, the first light sources 1131a and 1131b emit blue light in the first wavelength range (blue wavelength range), and the fourth light source 1134 emits the first wavelength range and a second wavelength range different from the first wavelength range. (Eg, a red or green wavelength range) is applied. The first light sources 1131a and 1131b and the fourth light source 1134 may each emit light having a different wavelength range, or may be configured to emit light of a color different from that of the present embodiment. The first light sources 1131a and 1131b and the fourth light source 1134 may be, for example, an organic EL array, a cold cathode tube, a fluorescent lamp such as a halogen lamp, or the like.

  The inspection device 1160 includes a color information acquisition unit 1164 in addition to the image acquisition unit 1161, the defect detection unit 1162, and the sorting unit 1163. The color information acquisition unit 1164 acquires color information from the image data acquired by the image acquisition unit 1161. The defect detection unit 1162 detects a defect existing in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 and the color information acquired by the color information acquisition unit 1164.

  FIG. 18 is a diagram illustrating a flowchart of a defect detection process according to the fifth embodiment.

  As shown in FIG. 18, in the defect detection process in the inspection system 1300, first, in step S1301, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 to the fourth transport belt 1114. Next, in step S1302, the first imaging device 1121 captures an image of the prepreg 1010 transported in the first imaging area between the first transport belt 1111 and the second transport belt 1112.

  In step S1303, the color information acquisition unit 1164 of the inspection device 1160 acquires first color information from the first image data imaged by the first imaging device 1121.

  Here, the first image data of the prepreg 1010 imaged by the first imaging device 1121 is, for example, each color of R (red), G (green), and B (blue) is represented by a numerical value of 0 to 255 for each pixel. RGB values. The color information acquisition unit 1164 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 as first color information. As described above, the color information acquisition unit 1164 acquires, from the first image data, the color data included in the wavelength range of the blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 as the first color information. .

  FIG. 19 is a diagram schematically illustrating first image data (B channel data) of the prepreg 1010 captured by the first imaging device 1121.

  In the defect AA of the prepreg 1010, blue light emitted from the first light sources 1131a and 1131b is reflected in the same manner as a portion having no defect. For this reason, the amount of light received by the first imaging device 1121 from the defect AA of the prepreg 1010 is equal to the amount of light received from a portion having no defect. Therefore, as shown in FIG. 19, the B channel data shows the same brightness in the portion where the defect AA exists and in the portion where there is no defect.

  In the defect BB of the prepreg 1010, the diffuse reflectance of the blue light emitted from the first light sources 1131a and 1131b is higher than the diffuse reflectance of a portion having no defect. Therefore, the amount of light received by the first imaging device 1121 from the defect BB of the blue light emitted from the first light source 1131 is larger than the amount of light received from a portion having no defect. Therefore, as shown in FIG. 19, in the B channel data, the portion where the defect BB exists in the prepreg 1010 is brighter than the portion where there is no defect.

  Further, in the defect CC of the prepreg 1010, the irradiation light from the fourth light source 1134 is blocked by the foreign matter. For this reason, the light receiving amount of the blue light included in the irradiation light from the fourth light source 1134, which is received by the first imaging device 1121, is smaller in the part where the defect CC exists than in the part without the defect. Therefore, as shown in FIG. 19, in the B channel data, the portion where the defect CC exists is darker than the portion where there is no defect.

  Since the sum of the reflected light of the irradiation light from the first light sources 1131a and 1131b and the transmitted light of the irradiation light from the fourth light source 1134 is the first image data, as shown in FIG. The portion where the defect BB exists is brighter than the portion where no defect exists. Further, the portion where the defect CC exists is darker than the portion where there is no defect.

  In step S1304, the color information acquisition unit 1164 acquires the second color information from the first image data captured by the first imaging device 1121. The color information acquisition unit 1164 acquires, as second color information, red R channel data (R value of each pixel) corresponding to red light included in white light emitted from the fourth light source 1134. As described above, the color information acquiring unit 1164 converts the color data included in the wavelength range of the red light, which is different in wavelength range from the blue light emitted from the first light source 1131, of the illumination light from the fourth light source 1134. The second color information is obtained from the image data.

  Note that the color information acquisition unit 1164 may acquire, as the second color information, green G channel data (G value of each pixel) corresponding to the green light included in the white light emitted from the fourth light source 1134. . Also in this case, the defect of the prepreg 1010 can be detected as in the case where the R channel data described below is used.

  FIG. 20 is a diagram schematically illustrating first image data (R channel data) of the prepreg 1010 captured by the first imaging device 1121.

  Light emitted from the fourth light source 1134 toward the first imaging device 1121 is transmitted in the prepreg 1010 in a portion where the defect AA exists and in a portion without the defect in the same manner. Therefore, the amount of red light received by the first imaging device 1121 and included in the irradiation light from the fourth light source 1134 is substantially equal between the portion where the defect AA exists and the portion where there is no defect. Therefore, as shown in FIG. 20, the R channel data shows the same brightness at the portion where the defect AA exists in the prepreg 1010 as at the portion without the defect.

  Further, light emitted from the fourth light source 1134 toward the first imaging device 1121 is blocked by a portion of the prepreg 1010 where the defect BB or the defect CC exists. Therefore, in the first imaging device 1121, the light receiving amount of the red light included in the irradiation light from the fourth light source 1134 is smaller in the portion where the defect BB or the defect CC exists than in the portion where there is no defect. Therefore, as shown in FIG. 20, in the R channel data, the portion where the defect BB and the defect CC exist in the prepreg 1010 is darker than the portion where there is no defect.

  Here, the R value of each pixel in the image data is not affected by the blue light emitted from the first light source 1131 to the first imaging device 1121, and the R value emitted from the fourth imaging light source 1134 to the first imaging device 1121 is not affected. Is determined by the amount of red light received. For this reason, if the amount of blue light received from the first light source 1131 received by the first imaging device 1121 in the portion where the defect AA is present increases, the R value included in the image data does not increase significantly. Therefore, as shown in FIG. 20, the portion where the defect AA exists in the R channel data is not affected by the blue light.

  Returning to the flowchart of the defect detection process shown in FIG. 18, next, in step S1305, the defect detection unit 1162 determines that the B-channel data as the first color information acquired by the color information acquisition unit 1164 and the second color information Is calculated with respect to the R channel data. Subsequently, in step S1306, the defect detection unit 1162 detects a defect of the prepreg 1010 based on the first image data and the color information.

  In step S1305, the defect detection unit 1162 determines the difference value between the B channel data as the first color information and the R channel data as the second color information ((B value−R value) at the same pixel) in the image data. Is calculated for all the pixels included in. Hereinafter, the data of the difference value between the B channel data and the R channel data thus obtained is referred to as BR channel data.

  As described above, in the B channel data, the value of the defective BB portion is larger than the value of the portion having no defect (see FIG. 19). On the other hand, in the R channel data, the value of the defective BB portion is smaller than the value of the portion having no defect (see FIG. 20). Therefore, in the BR channel data, the difference between the value of the defective BB portion and the value of the non-defective portion is the difference between the value of the defective BB portion and the value of the non-defective portion in the B channel data and the R channel data, respectively. Is greater than the difference.

  For example, assume that the value of each part of (defect BB, no defect) is (250, 120) in the B channel data. Further, it is assumed that the value of each part of (defect BB, no defect) in the R channel data is (50, 120). In such a case, in the BR channel data, the value of each part of (defect AA, no defect) is (200, 0).

  Therefore, in the BR channel data, the difference between the value of the defective BB portion and the value of the non-defective portion is 200, and the difference between the value of the defective BB portion and the value of the non-defective portion in the B channel data (130). Greater than. The difference (200) between the value of the defective BB portion and the value of the non-defective portion in the BR channel data is the difference (70) between the value of the defective BB portion and the value of the non-defective portion in the R channel data. Greater than.

  Therefore, when detecting the defect BB based on the difference between the value of the defect BB portion and the value of the portion having no defect, the defect detection section 1162 determines that the difference between the value of the defect BB portion and the value of the portion having no defect is small. By using the large BR channel data, it is possible to detect the defect BB with higher accuracy. In addition, in the BR channel data, the uneven brightness at the defect-free portion of the prepreg 1010 included in each of the B channel data and the R channel data is canceled. For this reason, the defect detection unit 1162 can detect the defect BB with high accuracy by reducing the erroneous detection by using the BR channel data in which the luminance unevenness is canceled.

  Further, in the R channel data, the defect detection unit 1162 determines that the difference between the pixel value is smaller than the average value of the defect-free part and the average value of the defect-free part is equal to or larger than a predetermined threshold value. The part is detected as a defect BB or a defect CC.

  In step S1307, the second imaging device 1122 images the prepreg 1010 conveyed in the second imaging region between the second conveyance belt 1112 and the third conveyance belt 1113. In step S1308, the defect detection unit 1162 detects the defects AA and BB on the first surface side of the prepreg 1010 based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122. .

  In step S1309, the third imaging device 1123 captures an image of the prepreg 1010 transported in the third imaging area between the third transport belt 1113 and the fourth transport belt 1114. In step S1310, the defect detection unit 1162 uses the second image side of the prepreg 1010 opposite to the first surface based on the third image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the third imaging device 1123. And the defect AA and the defect BB are detected.

  A method for detecting the defect AA and the defect BB based on the second image data captured by the second imaging device 1122 and the third image data captured by the third imaging device 1123 is the same as in the above-described fourth embodiment. .

  If none of the defects AA, BB, and CC has been detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: NO), the process proceeds to step S1312. In step S1312, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect is detected from the fourth transport belt 1114 to the first tray 1151, and ends the processing.

  If any of the defects AA, BB, and CC has been detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: YES), the process proceeds to step S1313. In step S1313, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which the defect has been detected from the fourth transport belt 1114 to the second tray 1152, and ends the processing.

  As described above, according to the inspection system 1300 in the fifth embodiment, the inspection object is determined based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. Further, the defect detection unit 1162 reduces erroneous detection by using the B channel data as the first color information and the R channel data as the second color information acquired by the color information acquisition unit 1164 from the first image data. Thus, the defect BB can be detected with high accuracy. Further, in the transport path of the prepreg 1010, the first imaging device 1121 is configured to capture an image of the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device 1123. Similarly, it is possible to improve the productivity by reducing the time required for the defect detection processing.

[Sixth Embodiment]
Next, a sixth embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 21 is a diagram illustrating an inspection system 1400 according to the sixth embodiment.

  As shown in FIG. 21, the inspection system 1400 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1400 inspects the prepreg 1010 as an inspection object transported by the transport device 1110 for a defect.

  The transport device 1110 has a first transport belt 1111, a second transport belt 1112, and a third transport belt 1113, and transports the prepreg 1010 in the direction of the arrow in FIG. 21.

  The third imaging device 1123 is configured such that at least a part of an area to be imaged (third imaging area) is a gap between the second transport belt 1112 and the third transport belt 1113 and overlaps with an area through which the prepreg 1010 passes. Is provided. The third imaging device 1123 images the prepreg 1010 from the side opposite to the second imaging device 1122. The third imaging device 1123 is provided so as to capture an image of the prepreg 1010 passing between the second transport belt 1112 and the third transport belt 1113, similarly to the second imaging device 1122.

  Here, when the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 increase, the accuracy of defect detection based on image data of each imaging device decreases. there is a possibility. For this reason, the second imaging device 1122 and the third imaging device 1123 are configured to reduce the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 as low as possible. It is preferable to configure the imaging device 1123, the second light source 1132, the third light source 1133, and the like.

  The defect detection unit 1162 of the inspection device 1160 determines the defect of the prepreg 1010 based on the image data acquired from the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123 as in the fourth embodiment. AA, defect BB, and defect CC are detected.

  The inspection system 1400 according to the sixth embodiment detects a defect of the prepreg 1010 as an inspection object by the same processing as the defect detection processing according to the fourth embodiment, and sets the first prepreg 1010 according to the defect detection result. Sorting into the tray 1151 or the second tray 1152.

  As described above, according to the inspection system 1400 in the sixth embodiment, the inspection object is determined based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. In the transport path of the prepreg 1010, the first imaging device 1121 is configured to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device 1123, and thus the third embodiment described above. Similarly, it is possible to shorten the time required for the defect detection processing and improve the productivity.

  Further, according to the inspection system 1400 in the sixth embodiment, both the second imaging device 1122 and the third imaging device 1123 image the prepreg 1010 between the second transport belt 1112 and the third transport belt 1113. With such a configuration, it is possible to reduce the overall configuration.

  Note that, similarly to the fifth embodiment, a fourth light source 1134 is provided, color information is acquired from first image data captured by the first imaging device 1121, and a defect is detected based on the acquired color information. You may comprise.

[Seventh embodiment]
Next, a seventh embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 22 is a diagram illustrating an inspection system 1500 according to the seventh embodiment.

  As shown in FIG. 22, the inspection system 1500 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1500 inspects the presence or absence of a prepreg 1010 defect as an inspection object transported by the transport device 1110.

  The third imaging device 1123 is configured such that at least a part of an area to be imaged (third imaging area) is a gap between the second transport belt 1112 and the third transport belt 1113 and overlaps with an area through which the prepreg 1010 passes. Is provided. The third light source 1133 is arranged so that the third imaging device 1123 mainly receives specularly reflected light from the surface of the prepreg 1010 conveyed between the second conveyance belt 1112 and the third conveyance belt 1113. .

  Here, when the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 increase, the accuracy of defect detection based on image data of each imaging device decreases. there is a possibility. For this reason, the second imaging device 1122, the third imaging device 1123, and the second imaging device 1123 are configured to reduce the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123. It is preferable to configure the second light source 1132, the third light source 1133, and the like.

  Therefore, in the present embodiment, as shown in FIG. 22, the optical axis 1132a (light irradiation direction) of the second light source 1132 and the optical axis 1133a (light irradiation direction) of the third light source 1133 are parallel to each other. Have been. With such a configuration, the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 are reduced, and the defect detection accuracy of the prepreg 1010 is maintained. In addition, the device configuration can be reduced in size.

  As in the fourth embodiment, the defect detection unit 1162 of the inspection device 1160 uses the prepreg 1010 based on image data captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123, respectively. , A defect AA, a defect BB, and a defect CC.

  The inspection system 1500 according to the seventh embodiment detects the defect of the prepreg 1010 as the inspection object by the same processing as the defect detection processing according to the fourth embodiment, and sets the first prepreg 1010 according to the defect detection result. Sorting into the tray 1151 or the second tray 1152.

  As described above, according to the inspection system 1500 in the seventh embodiment, the inspection object is determined based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. Further, by configuring the first imaging device 1121 to image the prepreg 1010 on the transport path of the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device, the same as the third embodiment described above. In addition, it is possible to shorten the time required for the defect detection processing and improve the productivity.

  Note that, similarly to the fifth embodiment, a fourth light source 1134 is provided, color information is acquired from first image data captured by the first imaging device 1121, and a defect is detected based on the acquired color information. You may comprise.

[Eighth Embodiment]
Next, an eighth embodiment will be described with reference to the drawings. The description of the same components as those of the embodiment described above will be omitted as appropriate.

  FIG. 23 is a diagram illustrating an inspection system 1600 according to the eighth embodiment.

  As shown in FIG. 23, the inspection system 1600 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, first light sources 1131a and 1131b, a second light source 1132, a third light source 1133, a support member 1140, It has a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1600 inspects the prepreg 1010 as an inspection object transported by the transport device 1110 for a defect.

  In the present embodiment, the first imaging device 1121 and the second imaging device 1122 are provided so as to image the prepreg 1010 conveyed by the conveyance device 1110 on the conveyance belt. The first imaging device 1121 is provided so as to image the prepreg 1010 on the first conveyor belt 1111. The second imaging device 1122 is provided so as to image the prepreg 1010 on the second transport belt 1112. Note that the first imaging device 1121 and the second imaging device 1122 may be provided so as to image the prepreg 1010 on the same transport belt.

  The defect detection unit 1162 of the inspection device 1160 performs prepreg based on the first image data captured by the first imaging device 1121 and the second image data captured by the second imaging device 1122, as in the third embodiment. 1010 defects are detected.

  As described above, according to the inspection system 1600 of the eighth embodiment, based on the images captured by the first imaging device 1121 and the second imaging device 1122, the defect of the prepreg 1010 as the inspection target is determined. Can be detected. Further, by configuring the first imaging device 1121 to image the prepreg 1010 on the transport path of the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device, the same as the third embodiment described above. In addition, it is possible to shorten the time required for the defect detection processing and improve the productivity. Furthermore, by arranging the first imaging region of the first imaging device 1121 and the second imaging region of the second imaging device 1122 close to each other, the device configuration can be downsized.

  The inspection system and the inspection method according to the embodiment have been described above, but the present invention is not limited to the above embodiment, and various modifications and improvements can be made within the scope of the present invention. In the description of each of the embodiments described above, the method of inspecting the prepreg 1010 as the inspection target has been described, but the inspection target is not limited to the prepreg.

  This international application claims priority based on Japanese Patent Application No. 2015-245600 filed on December 16, 2015 and Japanese Patent Application No. 2015-245708 filed on December 16, 2015. Yes, the entire contents of Japanese Patent Application No. 2015-245600 and Japanese Patent Application No. 2015-245708 are incorporated herein by reference.

10 Pre-preg (object to be inspected)
100, 200 Inspection system 110, 210 Transport device 111, 211 First transport belt (first transport unit)
112, 212 Second transport belt (second transport section)
120, 220 Imaging device 130a, 130b Light source 140 Support member 141 Support surface 150, 250 Inspection device 152, 253 Detection unit 230 First light source 240 Second light source 252 Color information acquisition unit 1010 Prepreg (object to be inspected)
1100, 1200, 1300, 1400, 1500, 1600 Inspection system 1110 Transport device 1111 First transport belt (first transport unit)
1112 2nd conveyance belt (2nd conveyance section)
1113 Third transport belt (third transport unit)
1121 First imaging device 1122 Second imaging device 1123 Third imaging device 1131a, 1131b First light source 1132 Second light source 1133 Third light source 1134 Fourth light source 1140 Support member 1141 Support surface 1160 Inspection device 1162 Defect detection unit 1164 Color information acquisition Parts A, B, AA, BB, CC Defects

JP 2006-64531 A

Claims (12)

An inspection system for inspecting a sheet-like inspection target having a light-transmitting property,
An imaging device for imaging the inspection object;
A first light source that irradiates light to an imaging region of the imaging device so that the imaging device mainly receives diffuse reflected light from the surface of the inspection target;
A second light source that irradiates the imaging region with light so that the imaging device receives light transmitted through the inspection target;
Having an inspection device for inspecting the presence or absence of a defect of the inspection object,
The first light source emits light in a first wavelength range,
The second light source irradiates light including a second wavelength range different from the first wavelength range,
The inspection device,
A color information acquisition unit that acquires, from an image captured by the imaging device, first color information of a color included in the first wavelength band and second color information of a color included in the second wavelength band,
A detection unit that detects a defect of the inspection object based on the captured image,
Has,
The inspection system, wherein the detection unit detects a defect of the inspection object based on a difference between the first color information and the second color information. A transport device that delivers and transports the inspection object from the first transport unit to the second transport unit;
The imaging device may be configured such that at least a part of the imaging region is provided as a gap between the first transport unit and the second transport unit and overlaps with a region through which the inspection target passes. The inspection system according to claim 1, wherein: Inspection system according to claim 1 or 2, wherein the defect of the tested object is characterized in that it is a foreign matter mixed in the interior of the surface layer of cracking and the inspection target of the inspection object to the detecting unit detects . An inspection method for inspecting a sheet-like inspection target having a light-transmitting property,
An imaging step of imaging the inspection object by an imaging device;
A first light irradiation step of irradiating light to an imaging region of the imaging device so that the imaging device mainly receives diffuse reflected light from the surface of the inspection target;
A second light irradiation step of irradiating the imaging region with light, so that the imaging device receives light transmitted through the inspection target,
In the first light irradiation step, light in a first wavelength range is irradiated,
In the second light irradiation step, light including a second wavelength range different from the first wavelength range is irradiated,
The inspection method further comprises:
A color information acquisition step of acquiring first color information of a color included in the first wavelength range and second color information of a color included in the second wavelength range from an image captured by the imaging apparatus;
A detecting step of detecting a defect of the inspection object based on the captured image,
The inspection method, wherein in the detecting step, a defect of the inspection object is detected based on a difference between the first color information and the second color information. An inspection system for inspecting a sheet-like inspection target having a light-transmitting property,
A transport device that transports the inspection object,
A first imaging device that images the inspection target that is conveyed by the conveyance device and passes through a first imaging region;
A first light source that irradiates the first imaging region with light so that the first imaging device mainly receives diffuse reflected light from the surface of the inspection target;
A fourth light source that irradiates the first imaging region with light so that the first imaging device receives light transmitted through the inspection target;
A second imaging device that images the inspection target that is transported by the transport device and passes through a second imaging region downstream of the first imaging region;
A second light source that irradiates the second imaging region with light so that the second imaging device mainly receives specularly reflected light from the surface of the inspection target;
A color information acquisition unit that acquires color information from an image captured by the first imaging device;
A defect detection unit that detects a defect of the inspection object based on an image captured by the first imaging device and an image captured by the second imaging device;
The first light source emits light in a first wavelength range,
The fourth light source irradiates light including a second wavelength range different from the first wavelength range,
The color information acquisition unit acquires first color information of a color included in the first wavelength band and second color information of a color included in the second wavelength band from an image captured by the first imaging device,
The inspection system, wherein the defect detection unit detects a defect of the inspection object based on a difference between the first color information and the second color information. The transport device has a first transport unit that transports the inspection target, and a second transport unit that transports the inspection target delivered from the first transport unit,
The first imaging device is provided such that at least a part of the first imaging region is a gap between the first transport unit and the second transport unit and overlaps a region through which the inspection target passes. The inspection system according to claim 5 , wherein: The transport device further includes a third transport unit that transports the inspection target delivered from the second transport unit,
The second imaging device is provided such that at least a part of the second imaging region is a gap between the second transport unit and the third transport unit and overlaps an area through which the inspection object passes. The inspection system according to claim 6 , wherein: A third imaging device that is imaged from the side opposite to the second imaging device, the inspection object that is transported by the transportation device and passes through a third imaging region downstream of the first imaging region;
A third light source configured to irradiate the third imaging region with light so that the third imaging device mainly receives specularly reflected light from the surface of the inspection target;
The inspection system according to claim 5 , wherein the defect detection unit detects a defect of the inspection target based on an image captured by the third imaging device. The inspection system according to claim 8 , wherein the third imaging device is provided so that at least a part of the third imaging region overlaps the second imaging region. The inspection system according to claim 9 , wherein an optical axis of the second light source and an optical axis of the third light source are parallel. Defects of the inspection object detected by the defect detection unit are irregularities formed on the surface of the inspection object, cracks on the surface layer of the inspection object, and foreign matters mixed inside the inspection object. The inspection system according to any one of claims 5 to 10 . A transport device that transports a sheet-like inspection target having a light-transmitting property,
A first imaging device that images the inspection target that is conveyed by the conveyance device and passes through a first imaging region;
A first light source that irradiates the first imaging region with light so that the first imaging device mainly receives diffuse reflected light from the surface of the inspection target;
A fourth light source that irradiates the first imaging region with light so that the first imaging device receives light transmitted through the inspection target;
A second imaging device that images the inspection target that is transported by the transport device and passes through a second imaging region downstream of the first imaging region;
A second light source that irradiates the second imaging region with light so that the second imaging device mainly receives specularly reflected light from the surface of the inspection target;
An inspection method for inspecting the inspection object in an inspection system having a,
A first imaging step of imaging the inspection target that is transported by the transport device and passes through the first imaging region with the first imaging device;
A color information acquisition step of acquiring color information from an image captured by the first imaging device;
A first defect detection step of detecting a defect of the inspection object based on an image captured by the first imaging device;
A second imaging step of imaging the inspection target that is transported by the transport device and passes through the second imaging region with the second imaging device;
A second defect detection step of detecting a defect of the inspection object based on an image captured by the second imaging device,
The first light source emits light in a first wavelength range,
The fourth light source irradiates light including a second wavelength range different from the first wavelength range,
In the color information obtaining step, first color information of a color included in the first wavelength range and second color information of a color included in the second wavelength range are obtained from an image captured by the first imaging device,
The inspection method, wherein in the first defect detection step, a defect of the inspection object is detected based on a difference between the first color information and the second color information.

Images