WO2017104575A1 - Testing system and testing method - Google Patents

Abstract

A testing system for testing a transparent sheet-shaped object to be tested, the testing system having an imaging device for imaging the object to be tested, a first light source for radiating light onto an imaging area of the imaging device so that the imaging device receives scattered and reflected light mainly from the surfaces of the object to be tested, and a testing device for testing whether any flaws are present in the object to be tested. The testing device has a detection unit for detecting flaws in the object to be tested on the basis of the imaged image produced by the imaging device.

Description

Inspection system and inspection method

The present invention relates to an inspection system and an inspection method.

For example, various methods have been proposed for detecting defects such as surface cracks and foreign matter that may occur in the manufacturing process using glass or prepreg as an inspection object.

For example, the camera and the light source are placed facing each other with the prepreg in between so that the light emitted from the light source passes through the prepreg and enters the camera, and voids inside the prepreg are detected based on the camera image A method has been proposed (see, for example, Patent Document 1).

In the method according to Patent Document 1, transmitted light from a prepreg as an inspection object enters the camera. For this reason, in the captured image of the camera, defects of different types such as cracks in the surface layer of the inspection object and foreign matter mixed inside also appear as shadows. Therefore, there is a possibility that the type of defect present in the inspection object cannot be determined.

The present invention has been made in view of the above, and an object thereof is to provide an inspection system capable of discriminating the type of detected defect.

According to one embodiment of the present invention, an inspection system that inspects a light-transmitting sheet-like inspection object includes an imaging device that images the inspection object, and the imaging device mainly diffusely reflects light from the surface of the inspection object. A first light source that irradiates the imaging region of the imaging device with light and an inspection device that inspects for the presence or absence of a defect in the inspection object. The inspection device is based on an image captured by the imaging device. And a detector for detecting a defect of the inspection object.

According to the embodiment of the present invention, an inspection system capable of discriminating the type of detected defect is provided.

It is a figure which illustrates the inspection system in a 1st embodiment. It is a figure (the 1) which illustrates the defect of a prepreg. It is a figure which illustrates the flowchart of the defect inspection process in 1st Embodiment. It is a figure which illustrates typically image data in a 1st embodiment. It is a figure which illustrates the inspection system in a 2nd embodiment. It is a figure which illustrates the flowchart of the defect inspection process in 2nd Embodiment. It is a figure which illustrates typically image data (B channel) in a 2nd embodiment. It is a figure which illustrates typically image data (R channel) in a 2nd embodiment. It is a figure which illustrates the inspection system in a 3rd embodiment. FIG. 3 is a diagram (part 2) illustrating a defect of a prepreg. It is a figure which illustrates the flowchart of the defect detection process in 3rd Embodiment. It is a figure which illustrates typically the 1st image data in a 3rd embodiment. It is a figure which illustrates typically the 2nd image data in a 3rd embodiment. It is FIG. (1) explaining the required processing time of a defect detection. It is FIG. (2) explaining the required processing time of a defect detection. It is a figure which illustrates the inspection system in a 4th embodiment. It is a figure which illustrates the flowchart of the defect detection process in 4th Embodiment. It is a figure which illustrates the inspection system in a 5th embodiment. It is a figure which illustrates the flowchart of the defect detection process in 5th Embodiment. It is a figure which illustrates typically the 1st image data (B channel) in a 5th embodiment. It is a figure which illustrates typically the 1st image data (R channel) in a 5th embodiment. It is a figure which illustrates the inspection system in a 6th embodiment. It is a figure which illustrates the inspection system in a 7th embodiment. It is a figure which illustrates the inspection system in an 8th embodiment.

Hereinafter, embodiments for carrying out the invention will be described with reference to the drawings. In the drawings, the same components are denoted by the same reference numerals, and redundant description may be omitted. In addition, although the following embodiment demonstrates the method to test | inspect the presence or absence of the defect of a prepreg as an inspection target object, an inspection target object is not restricted to a prepreg.

[First embodiment]
FIG. 1 is a diagram illustrating an inspection system 100 according to the first embodiment.

As shown in FIG. 1, the inspection system 100 includes a transport device 110, an imaging device 120, light sources 130a and 130b, and an inspection device 150, and inspects the presence or absence of defects in the prepreg 10 as an inspection object.

The prepreg 10 is obtained by impregnating a fiber base material with a thermosetting resin and then heating and hardening the thermosetting resin in the fiber base material. The fiber base material is made by weaving a thread formed of, for example, glass fiber or polyester fiber. The thermosetting resin is, for example, an epoxy resin or a phenol resin. The prepreg 10 in the present embodiment is formed in a sheet shape with a smooth surface, and transmits light through a transparent thermosetting resin from a gap between fiber base materials.

The transport device 110 has a first transport belt 111 as a first transport unit and a second transport belt 112 as a second transport unit, and transports the prepreg 10 in the direction of the arrow in FIG. In the first conveyor belt 111, an endless belt is stretched around a plurality of rollers including a driving roller. As the endless belt rotates following the rotation of the driving roller, the first transport belt 111 transports the prepreg 10 placed on the belt. The second conveyor belt 112 has the same configuration as the first conveyor belt 111 and conveys the prepreg 10 delivered from the first conveyor belt 111.

In addition, the structure of the conveying apparatus 110 is not restricted to the structure illustrated in this embodiment, For example, the structure which conveys the prepreg 10 with a some conveying roller may be sufficient.

The imaging device 120 is a digital camera including an imaging device such as a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor). The imaging device 120 is provided so that at least a part of the imaging area is a gap between the first conveyor belt 111 and the second conveyor belt 112 and overlaps with an area through which the prepreg 10 passes. In the present embodiment, the imaging device 120 is provided so that the entire width of the prepreg 10 can be imaged between the first conveyor belt 111 and the second conveyor belt 112.

Each of the light sources 130a and 130b is an LED (Light Emitting Diode) array, for example, and irradiates the imaging region of the imaging device 120 with white light. The light sources 130a and 130b may each be, for example, an organic EL (ElectroLuminescence) array, a fluorescent lamp such as a cold cathode tube, or the like.

The light sources 130a and 130b are disposed so that the imaging device 120 mainly receives diffusely reflected light from the surface of the prepreg 10 that is transported between the first transport belt 111 and the second transport belt 112, respectively. In the present embodiment, the light sources 130a and 130b are provided so that the incident angle of the irradiated light to the surface of the prepreg 10 is 45 degrees. Further, the imaging device 120 is provided so that the optical axis of the optical system is perpendicular to the surface of the prepreg 10.

Note that the positional relationship between the light sources 130 a and 130 b and the imaging device 120 is not limited to the above-described positional relationship as long as the imaging device 120 can mainly receive diffusely reflected light from the surface of the prepreg 10. In the present embodiment, two light sources 130a and 130b are provided, but the number of light sources is not limited to this, and one or three or more light sources may be provided. Further, as a light source, dome illumination may be provided so as to illuminate the imaging region of the imaging device 120. In the following description, “ light sources 130a and 130b” may be simply referred to as “light source 130”.

The support member 140 is provided between the first conveyor belt 111 and the second conveyor belt 112. The support member 140 supports the prepreg 10 that is transported between the first transport belt 111 and the second transport belt 112. The support member 140 has a support surface 141 that contacts the prepreg 10. The support surface 141 has a width that is greater than or equal to the width of the prepreg 10, and supports the entire width direction of the prepreg 10 between the first conveyance belt 111 and the second conveyance belt 112. Since the prepreg 10 is supported by the support surface 141 of the support member 140, the prepreg 10 is transported between the first transport belt 111 and the second transport belt 112 without bending.

The support surface 141 of the support member 140 is formed using a chromatic color material and has a chromatic color. In the present embodiment, the support surface 141 is formed of a cyan material. In the support member 140, for example, a chromatic paint may be applied to the support surface 141, and a portion including the support surface 141 may be formed of a material having a chromatic color. Moreover, the color of the support surface 141 should just be a chromatic color, and is not restricted to a cyan color.

The inspection apparatus 150 includes an image acquisition unit 151 and a detection unit 152. The inspection device 150 is, for example, a computer including a CPU (Central Processing Unit), a ROM (Read-Only Memory), a RAM (Random Access Memory), and the like. Each function of the inspection device 150, that is, the image acquisition unit 151 and the detection unit 152, for example, is realized by the CPU executing a program read from the ROM in cooperation with the RAM.

The image acquisition unit 151 acquires image data of the prepreg 10 from the imaging device 120. The detection unit 152 detects a defect present in the prepreg 10 based on the image data acquired by the image acquisition unit 151 from the imaging device 120.

FIG. 2 is a diagram illustrating a defect of the prepreg 10.

The defect A shown in FIG. 2 is a crack in the surface layer. Further, the defect B is a foreign matter mixed inside. The detection unit 152 of the inspection device 150 detects a defect of the prepreg 10 from the image data of the prepreg 10 acquired by the image acquisition unit 151 from the imaging device 120, and further determines the type of the detected defect (defect A or defect B). .

FIG. 3 is a diagram illustrating a flowchart of the defect detection process in the first embodiment.

As shown in FIG. 3, in the defect detection process in the inspection system 100, first, in step S <b> 101, the transport device 110 transports the prepreg 10 so as to be transferred from the first transport belt 111 to the second transport belt 112.

Next, in step S102, the light source 130 irradiates the imaging region of the imaging device 120 with light. Subsequently, in step S <b> 103, the imaging device 120 captures an image of the prepreg 10 that is transported in the imaging region between the first transport belt 111 and the second transport belt 112. As described above, the imaging device 120 has the imaging region provided in the gap between the first conveyor belt 111 and the second conveyor belt 112, and is supported by the support surface 141 of the support member 140 of the prepreg 10. The part that is present is imaged. The imaging device 120 captures images of the entire prepreg 10 by continuously capturing images of the prepreg 10 transported by the transport device 110.

In step S104, the image acquisition unit 151 of the inspection apparatus 150 acquires the image data of the prepreg 10 from the imaging apparatus 120. Subsequently, in step S <b> 105, the detection unit 152 detects a defect in the prepreg 10 based on the image data acquired by the image acquisition unit 151.

FIG. 4 is a diagram schematically illustrating image data of the prepreg 10 imaged by the imaging device 120.

In the imaging device 120, the diffuse reflection light reflected by the prepreg 10 and the diffuse reflection light reflected by the support surface 141 of the support member 140 through the prepreg 10 having translucency from a portion where the prepreg 10 has no defect. And receive light. Therefore, in the image data of the prepreg 10 imaged by the imaging device 120, the color of the support surface 141 of the support member 140 appears so that the support surface 141 of the support member 140 can be seen through the prepreg 10 in a portion having no defect. . In the present embodiment, since the support surface 141 of the support member 140 is cyan, the portion of the captured image of the imaging device 120 that is free of defects of the prepreg 10 is cyan.

In the defect A of the prepreg 10, the diffuse reflectance of the irradiation light emitted from the light source 130 is higher than the diffuse reflectance of the portion having no defect. For this reason, the amount of light received by the imaging device 120 that is reflected by the defect A of the prepreg 10 is larger than the amount of light that is received by the imaging device 120 after being reflected by a portion having no defect. Therefore, as shown in FIG. 4, in the image data of the prepreg 10, the portion where the defect A exists is brighter than the portion where there is no defect.

The reason why the amount of light received by the imaging device 120 is larger as the diffuse reflectance with respect to the light emitted from the light source 130 is higher is as follows. High diffuse reflectance means that the degree of diffuse reflection, that is, the reflection in a mode in which light is diffused in each direction regardless of the law of reflection when viewed macroscopically, is high. On the other hand, the positional relationship between the light source 130 (130a and 130b) and the imaging device 120 is such that the higher the degree of diffuse reflection, that is, the reflection of the aspect in which light is diffused in each direction regardless of the reflection law when viewed macroscopically. The higher the degree is, the larger the received light amount of the imaging device 120 is. Therefore, the higher the diffuse reflectance with respect to the light emitted from the light source 130, the greater the amount of light received by the imaging device 120.

In addition, the imaging device 120 generates diffuse reflected light from the surface of the prepreg 10 and diffuse reflected light reflected by a foreign substance via the translucent prepreg 10 from a portion where the defect B of the prepreg 10 exists. Receive light. Therefore, in the image data of the imaging device 120, the color of the foreign matter appears so that the foreign matter can be seen through the prepreg 10 in the portion where the defect B of the prepreg 10 exists. For example, when a black foreign substance is mixed in the prepreg 10 to generate a defect B, the defect B looks like a dark shadow in the captured image (see FIG. 4).

As described above, in the image data of the prepreg 10, the portion where the defect A exists is brighter than the portion where there is no defect. Therefore, the luminance of the pixel in the portion where the defect A exists in the image data is higher than the luminance of the pixel in the portion where there is no defect.

In the image data picked up by the image pickup device 120, for example, a portion where the defect B due to a black foreign substance exists is darker than a portion where there is no defect. Therefore, in this case, the luminance of the pixel where the defect B exists in the image data is lower than the luminance of the pixel where there is no defect.

Therefore, for example, the detection unit 152 of the inspection apparatus 150 calculates in advance the average brightness of pixels in a portion having no defect in the image data of the prepreg 10, and calculates the brightness of each pixel of the image data and the previously calculated average brightness. Detect defects based on the difference. For example, the detection unit 152 detects, as a defect A, a pixel whose luminance is higher than the average luminance in the image data. For example, the detection unit 152 detects a pixel having a luminance lower than the average luminance in the image data as the defect B.

In addition, the detection unit 152 calculates the difference between the luminance of each pixel in the image data and the average luminance, and defectives pixels whose luminance is higher than the average luminance and whose difference from the average luminance is preset to a first threshold value or more. You may detect as A. Further, the detection unit 152 may detect, as the defect B, a pixel whose luminance is lower than the average luminance and whose difference from the average luminance is equal to or higher than a second threshold value set in advance. By detecting a defect by comparing the difference between the luminance of each pixel and the average luminance with a threshold value, it is possible to reduce erroneous detection of the defect.

As described above, the detection unit 152 of the inspection device 150 detects defects such as the defect A (surface crack) and the defect B (mixed foreign matter) existing in the prepreg 10 based on the image data of the image captured by the imaging device 120. It can be detected by distinguishing. In the above-described example, the case where the defect B that is a black foreign substance is detected has been described. However, even when the defect B that is a foreign substance other than black is detected, the luminance of the pixel in the portion where the defect B exists, The defect B can be detected based on the difference from the luminance of the pixel in the part having no defect.

As described above, according to the inspection system 100 in the first embodiment, it is possible to detect the defect of the prepreg 10 as the inspection object and determine the type of the defect.

Further, in the inspection system 100, the light source 130 and the imaging device 120 are provided so as to inspect the prepreg 10 in the gap between the first conveyance belt 111 and the second conveyance belt 112. With such a configuration, it is possible to inspect defects of the prepreg 10 with high accuracy without being affected by irregularities on the surfaces of the first conveyance belt 111 and the second conveyance belt 112.

Further, since the support member 140 supports the prepreg 10 between the first conveyance belt 111 and the second conveyance belt 112, the prepreg 10 is bent between the first conveyance belt 111 and the second conveyance belt 112. It is possible to carry out the inspection with high accuracy without causing it to occur.

If the support surface 141 of the support member 140 is an achromatic color such as black, white, or gray, for example, in the image data picked up by the image pickup device 120, there is no portion where there is a defect A or a defect B. The difference from the part may be unclear. Therefore, in the present embodiment, the support surface 141 of the support member 140 is made chromatic, so that the difference due to the presence or absence of a defect is clarified as described above so that the defect can be detected with high accuracy.

Here, the image data of the captured image captured by the imaging device 120 is, for example, an RGB value in which each color of R (red), G (green), and B (blue) is represented by a numerical value of 0 to 255 for each pixel. Have. Therefore, the detection unit 152 uses the color value having the largest luminance difference between the defective portion and the non-defective portion among the color values included in the RGB values according to the color of the support surface 141 of the support member 140. A defect may be detected.

For example, when the support surface 141 of the support member 140 is blue, the detection of the defect A that appears to be whitened due to cracks in the surface layer may be performed using G channel data having the G value of each pixel or the R value of each pixel. R channel data having By using the G channel data and the R channel data, it is possible to clarify the difference between the defect A and the portion without the defect and increase the detection sensitivity. In this case, for example, the defect B, which is a black foreign substance, is detected by using B channel data having the B value of each pixel, thereby clarifying the difference between the defect B and the portion having no defect, thereby increasing the detection sensitivity. It becomes possible to raise.

In the description of the first embodiment, an example in which the light source 130 emits white light has been described. However, the light emitted from the light source is not limited to white light, and the wavelength of the color of the support surface 141 of the support member 140. Should be included. For example, when the color of the support surface 141 is blue, the light source may be light of other colors including blue light, or may be cyan light or magenta light.

[Second Embodiment]
Next, a second embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 5 is a diagram illustrating an inspection system 200 according to the second embodiment.

As shown in FIG. 5, the inspection system 200 includes a transport device 210, an imaging device 220, a first light source 230, a second light source 240, and an inspection device 250, and checks whether there is a defect in the prepreg 10 as an inspection object. inspect.

The transport device 210 includes a first transport belt 211 as a first transport unit and a second transport belt 212 as a second transport unit, and transports the prepreg 10 in the direction of the arrow in FIG. In the first conveying belt 211, an endless belt is stretched around a plurality of rollers including a driving roller. As the endless belt rotates following the rotation of the driving roller, the first transport belt 211 transports the prepreg 10 placed on the belt. The second transport belt 212 has the same configuration as the first transport belt 211 and transports the prepreg 10 delivered from the first transport belt 211.

The configuration of the transport device 210 is not limited to the configuration illustrated in the present embodiment, and may be a configuration in which the prepreg 10 is delivered and transported by a plurality of transport rollers, for example.

The imaging device 220 is a digital camera including an imaging element such as a CCD or CMOS. The imaging device 220 is provided so that at least a part of the imaging area is a gap between the first conveyor belt 211 and the second conveyor belt 212 and overlaps the area through which the prepreg 10 passes. In the present embodiment, the imaging device 220 is provided so that the entire width of the prepreg 10 can be imaged between the first conveyor belt 211 and the second conveyor belt 212.

The first light source 230 is, for example, a blue LED array, and irradiates blue light between the first conveyance belt 211 and the second conveyance belt 212. The first light source 230 is arranged such that the imaging device 220 receives mainly diffuse reflected light from the surface of the prepreg 10 being conveyed.

The second light source 240 is, for example, a white LED array, and irradiates white light between the first conveyance belt 211 and the second conveyance belt 212. The second light source 240 is disposed so as to face the imaging device 220 so that the imaging device 220 receives the transmitted light transmitted through the prepreg 10 being conveyed.

In the present embodiment, the first light source 230 emits blue light in a first wavelength range (blue wavelength range), and the second light source 240 has a second wavelength range different from the first wavelength range and the first wavelength range (for example, Irradiate white light including red and green wavelength regions. In addition, the 1st light source 230 and the 2nd light source 240 may each irradiate the light from which a wavelength range differs, and may be comprised so that the light of a color different from this embodiment may be irradiated. The first light source 230 and the second light source 240 may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, or the like.

The inspection apparatus 250 includes an image acquisition unit 251, a color information acquisition unit 252, and a detection unit 253. The inspection device 250 is a computer including a CPU, a ROM, a RAM, and the like, for example. Each function of the inspection apparatus 250, that is, the image acquisition unit 251, the color information acquisition unit 252, and the detection unit 253, for example, is realized by the CPU executing a program read from the ROM in cooperation with the RAM.

The image acquisition unit 251 acquires the image data of the prepreg 10 from the imaging device 220. The color information acquisition unit 252 acquires color information from the image data acquired by the image acquisition unit 251. The detection unit 253 detects defects present in the prepreg 10 based on the color information acquired by the color information acquisition unit 252.

FIG. 6 is a diagram illustrating a flowchart of defect detection processing in the second embodiment.

As shown in FIG. 6, in the defect detection process in the inspection system 200, first, in step S <b> 201, the transport device 210 transports the prepreg 10 so as to be transferred from the first transport belt 211 to the second transport belt 212. .

Next, in step S202, the first light source 230 and the second light source 240 irradiate the imaging region of the imaging device 120 with light. Subsequently, in step S <b> 203, the imaging device 120 images the prepreg 10 that is transferred from the first conveyance belt 211 to the second conveyance belt 212. The imaging device 220 captures images of the entire prepreg 10 by continuously capturing images of the prepreg 10 transported by the transport device 110.

In step S204, the image acquisition unit 251 of the inspection device 250 acquires the image data of the prepreg 10 from the imaging device 220. Subsequently, in step S205, the color information acquisition unit 252 acquires first color information described later from the image data of the prepreg 10 acquired by the image acquisition unit 151.

Here, the image data of the prepreg 10 imaged by the imaging device 220 is, for example, an RGB value in which each color of R (red), G (green), and B (blue) is represented by a numerical value of 0 to 255 for each pixel. Have The color information acquisition unit 252 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from each of the first light source 230 and the second light source 240 as first color information. In this way, the color information acquisition unit 252 acquires the color data included in the wavelength range of the blue light emitted from the first light source 230 from the image data as the first color information.

FIG. 7 is a diagram schematically illustrating image data (B channel data) of the prepreg 10.

In the defect A of the prepreg 10, the diffuse reflectance of the blue light emitted from the first light source 230 is higher than the diffuse reflectance of the portion without the defect. For this reason, the amount of light received by the imaging device 220 when the blue light emitted from the first light source 230 is reflected by the defect A is larger than the amount of light received by the imaging device 220 after being reflected by a portion having no defect. Therefore, as shown in FIG. 7, in the B channel data, the portion where the defect A exists in the prepreg 10 is brighter than the portion where there is no defect.

Note that the reason why the amount of light received by the imaging apparatus 220 is larger as the diffuse reflectance of the irradiation light from the first light source 230 is higher is the same as the reason described in the description of the first embodiment.

Further, in the defect B of the prepreg 10, the irradiation light from the second light source 240 is blocked by the foreign matter. For this reason, among the blue light included in the irradiation light from the second light source 240, the amount of light received by the imaging device 220 is smaller in the portion where the defect B exists than in the portion where there is no defect. Therefore, as shown in FIG. 7, in the B channel image data, the portion where the defect B exists in the prepreg 10 is darker than the portion where there is no defect.

In step S206, the color information acquisition unit 252 acquires second color information described later from the image data of the prepreg 10 acquired by the image acquisition unit 151. The color information acquisition unit 252 acquires red R channel data (R value of each pixel) corresponding to red light included in white light emitted from the second light source 240 as second color information. As described above, the color information acquisition unit 252 stores the data of the color included in the wavelength range of the red light, which is different from the blue light irradiated from the first light source 230 among the irradiation light from the second light source 240. Obtained from the image data as second color information.

The color information acquisition unit 252 may acquire green G channel data (G value of each pixel) corresponding to green light included in the white light emitted from the second light source 240 as the second color information. . Even in this case, the defect of the prepreg 10 can be detected as in the case of using the R channel data described below.

FIG. 8 is a diagram schematically illustrating image data (R channel data) of the prepreg 10.

The light emitted from the second light source 240 toward the imaging device 220 is blocked at a portion where the defect A or the defect B exists in the prepreg 10. For this reason, in the red light included in the irradiation light from the second light source 240, the amount of light received by the imaging device 220 is smaller in the portion where the defect A or the defect B exists than in the portion where there is no defect. Therefore, as shown in FIG. 8, in the R channel data, the portion where the defect A and the defect B exist in the prepreg 10 is darker than the portion where there is no defect.

Here, the R value of each pixel in the image data is not affected by the blue light emitted from the first light source 230, and the red light included in the white light emitted from the second light source 240 is received by the imaging device 220. It depends on the amount. For this reason, even if the amount of light received by the imaging device 220 of the blue light from the first light source 230 increases in the portion where the defect A exists, the R value included in the image data does not increase. Therefore, as shown in FIG. 8, the portion where the defect A exists in the R channel data is not affected by the blue light.

Next, in step S207, the detection unit 253 calculates the difference between the B channel data as the first color information acquired by the color information acquisition unit 252 and the R channel data as the second color information. Subsequently, in step S <b> 208, the detection unit 253 detects a defect in the prepreg 10.

In step S208, the detection unit 253 includes a difference value ((B value−R value) in the same pixel) between the B channel data as the first color information and the R channel data as the second color information in the image data. The calculation is performed for all pixels to be processed. Hereinafter, the difference data between the B channel data and the R channel data obtained in this way is referred to as BR channel data.

As described above, in the B channel data, the value of the defect A portion is larger than the value of the portion having no defect (see FIG. 7). On the other hand, in the R channel data, the value of the defect A portion is smaller than the value of the portion having no defect (see FIG. 8). Therefore, in the BR channel data, the difference between the value of the defective A portion and the value of the non-defective portion is the difference between the value of the defective A portion and the value of the non-defective portion in each of the B channel data and the R channel data. Greater than the difference.

For example, in the B channel data, it is assumed that the value of each part of (defect A, defect B, no defect) is (250, 50, 120). In the R channel data, the value of each part (defect A, defect B, no defect) is (50, 50, 120). In such a case, the BR channel data has a value of (200, 0, 0) for each part of (defect A, defect B, no defect).

Accordingly, in the BR channel data, the difference between the value of the defect A portion and the value of the portion without the defect is 200, and the difference between the value of the defect A portion and the value of the portion without the defect in the B channel data (130). Bigger than. Further, the difference (200) between the value of the defect A portion and the value of the non-defect portion in the BR channel data is the difference (70) between the value of the defect A portion and the value of the non-defect portion in the R channel data. Bigger than.

Therefore, when the detection unit 253 detects the defect A based on the difference between the value of the defect A portion and the value of the portion without the defect, the difference between the value of the defect A portion and the value of the portion without the defect is large. By using the BR channel data, the defect A can be detected with higher accuracy. Further, in the BR channel data, luminance unevenness in a portion where there is no defect in the prepreg 10 included in each of the B channel data and the R channel data is canceled. For this reason, the detection unit 253 can reduce erroneous detection of the defect A by using the BR channel data from which the luminance unevenness is canceled.

In addition, the detection unit 253 is a part of the B channel data in which the pixel value is smaller than the average value of the non-defective part and the difference from the average value of the non-defective part is equal to or greater than a preset threshold value. Is detected as a defect B.

As described above, according to the inspection system 200 in the second embodiment, it is possible to detect the defect of the prepreg 10 as the inspection object and determine the type of the defect. In addition, B channel data is acquired as the first color information and R channel data is acquired as the second color information from the image data captured by the imaging device 220, and a defect is detected based on these differences. In addition, the detection accuracy of the defect A is improved and the erroneous detection is reduced.

Next, a third embodiment, a fourth embodiment, a fifth embodiment, a sixth embodiment, a seventh embodiment, and an eighth embodiment will be described.

As described above, the prepreg is obtained by impregnating a fiber base material such as carbon fiber with a thermosetting resin such as an epoxy resin, and heating and drying to cure the thermosetting resin in the fiber base material. It is used for multilayer substrates. Such prepregs may have defects such as surface irregularities, surface layer cracks, and contamination by foreign matters in the manufacturing process.

Conventionally, such defect inspection has been performed visually, but automation has been desired in order to improve productivity. Therefore, the camera and the light source are placed facing each other with the prepreg in between so that the light emitted from the light source passes through the prepreg and enters the camera, and the void inside the prepreg is detected based on the camera image. A method has been proposed (see, for example, Patent Document 1).

In the method according to Patent Document 1, transmitted light from the prepreg enters the camera. For this reason, defects of different types, such as cracks in the surface layer of the prepreg and foreign matter mixed inside, also appear as shadows in the captured image of the camera, and it may be difficult to determine the type of defect. In addition, since a portion with unevenness on the surface transmits light in the same manner as a portion without a defect, there is a possibility that defects such as surface unevenness cannot be detected.

For example, in the prepreg manufacturing process, it is necessary to detect various defects as described above. Thus, for example, it is conceivable to sequentially inspect the prepreg using a plurality of inspection apparatuses that detect different defects. However, such a configuration may increase the size of the apparatus, increase the time required for defect detection, and reduce productivity.

Embodiment described below is made in view of the above-described situation, and an object thereof is to provide an inspection system capable of detecting a plurality of defects having different types of inspection objects in a short time.

According to the embodiment described below, an inspection system capable of detecting a plurality of defects with different types of inspection objects in a short time is provided.

[Third embodiment]
FIG. 9 is a diagram illustrating an inspection system 1100 according to the third embodiment.

As shown in FIG. 9, the inspection system 1100 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, first light sources 1131 a and 1131 b, a second light source 1132, a support member 1140, a sorting mechanism 1150, 1 tray 1151, second tray 1152, and inspection device 1160. The inspection system 1100 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveyance device 1110.

As described above, the prepreg 1010 is obtained by impregnating a fiber base material with a thermosetting resin and then heating and curing the thermosetting resin in the fiber base material. The fiber base material is made by weaving a thread formed of, for example, glass fiber or polyester fiber. The thermosetting resin is, for example, an epoxy resin or a phenol resin. The prepreg 1010 in this embodiment is formed in a sheet shape with a smooth surface, and transmits light through a transparent thermosetting resin from a gap between fiber base materials.

The conveyance device 1110 includes a first conveyance belt 1111 as a first conveyance unit, a second conveyance belt 1112 as a second conveyance unit, and a third conveyance belt 1113 as a third conveyance unit, and the prepreg 1010 is illustrated in FIG. Transport in the direction of the arrow.

In the first conveying belt 1111, an endless belt is stretched around a plurality of rollers including a driving roller. As the endless belt rotates following the rotation of the driving roller, the first transport belt 1111 transports the prepreg 1010 placed on the belt. The second conveyor belt 1112 has the same configuration as the first conveyor belt 1111, and conveys the prepreg 1010 delivered from the first conveyor belt 1111. The third conveyor belt 1113 has the same configuration as the first conveyor belt 1111, and conveys the prepreg 1010 delivered from the second conveyor belt 1112.

Note that the configuration of the transport device 1110 is not limited to the configuration illustrated in the present embodiment, and may be a configuration in which the prepreg 1010 is transported by a plurality of transport rollers, for example.

The first imaging device 1121 is a digital camera provided with an imaging element such as a CCD or CMOS. The first imaging device 1121 is configured such that at least a part of an imaging area (first imaging area) is a gap between the first conveyance belt 1111 and the second conveyance belt 1112 and overlaps an area through which the prepreg 1010 passes. Is provided. In the present embodiment, the first imaging device 1121 is provided so that the entire width of the prepreg 1010 can be imaged between the first conveyor belt 1111 and the second conveyor belt 1112.

The first light sources 1131a and 1131b are, for example, LED (Light Emitting Diode) arrays, and the first imaging device 1121 irradiates light to the first imaging region where the prepreg 1010 is imaged. The first light sources 1131a and 1131b may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, a halogen lamp, or the like. The light source is preferably an LED from the viewpoint of long life, little heat generation, and monochromatic light can be selected.

The first light sources 1131a and 1131b are arranged so that the first imaging device 1121 receives mainly diffuse reflected light from the surface of the prepreg 1010 conveyed between the first conveyance belt 1111 and the second conveyance belt 1112, respectively. Has been. In the present embodiment, the first light sources 1131a and 1131b are provided so that the incident angle of the irradiated light on the surface of the prepreg 1010 is 45 degrees. The first imaging device 1121 is provided so that the optical axis of the optical system is perpendicular to the surface of the prepreg 1010.

If the first imaging device 1121 can mainly receive diffusely reflected light from the surface of the prepreg 1010, the positional relationship between the first light sources 1131a and 1131b and the first imaging device 1121 is limited to the above-described positional relationship. It is not something that can be done. In this embodiment, the two light sources 1131a and 1131b are provided symmetrically, but the number of light sources is not limited to this, and one or three or more light sources may be provided. Further, a dome illumination may be provided as a light source so as to illuminate the first imaging region of the first imaging device 1121. In the following description, “ first light sources 1131a and 1131b” may be simply referred to as “first light source 1131”.

The support member 1140 is provided between the first transport belt 1111 and the second transport belt 1112. The support member 1140 supports the prepreg 1010 that is transported between the first transport belt 1111 and the second transport belt 1112. The support member 1140 has a support surface 1141 that contacts the prepreg 1010. The support surface 1141 is formed to have a width equal to or greater than the width of the prepreg 1010, and supports the entire width direction of the prepreg 1010 between the first conveyance belt 1111 and the second conveyance belt 1112. The prepreg 1010 is supported by the support surface 1141 of the support member 1140, so that the prepreg 1010 is transported between the first transport belt 111 and the second transport belt 1112 without being bent.

As described above, the support member 1140 supports the prepreg 1010 between the first conveyance belt 1111 and the second conveyance belt 1112, so that the prepreg 1010 is bent between the first conveyance belt 1111 and the second conveyance belt 1112. It is possible to accurately inspect the defect without causing the occurrence of the problem.

The support surface 1141 of the support member 1140 is formed using a chromatic color material and has a chromatic color. In this embodiment, the support surface 1141 is formed of a cyan material. In the support member 1140, for example, a chromatic paint may be applied to the support surface 1141, and a portion including the support surface 1141 may be formed of a material having a chromatic color. Moreover, the color of the support surface 1141 should just be a chromatic color, and is not restricted to a cyan color.

If the support surface 1141 of the support member 1140 is an achromatic color such as black, white, or gray, for example, the difference due to the presence or absence of a defect may be unclear in the image data captured by the first imaging device 1121. is there. Therefore, in the present embodiment, the support surface 1141 of the support member 1140 is chromatic in order to clarify the difference due to the presence or absence of defects in the image data and increase the defect detection accuracy.

The second imaging device 1122 is a digital camera including an imaging element such as a CCD or a CMOS, for example. The second imaging device 1122 is provided so that at least a part of the imaging region (second imaging region) is between the second conveyance belt 1112 and the third conveyance belt 1113 and overlaps the region through which the prepreg 1010 passes. ing. In the present embodiment, the second imaging device 1122 is provided so that the entire width of the prepreg 1010 can be imaged between the second conveyance belt 1112 and the third conveyance belt 1113.

The second light source 1132 is, for example, an LED array, and the second imaging device 1122 irradiates the second imaging region where the prepreg 1010 is imaged with light. The second light source 1132 may be, for example, an organic EL array, a fluorescent lamp such as a cold cathode tube, a halogen lamp, or the like.

The second light source 1132 is disposed so that the second imaging device 1122 mainly receives specularly reflected light from the surface of the prepreg 1010 that is transported between the second transport belt 1112 and the third transport belt 1113. In the present embodiment, the second light source 1132 is provided so that the incident angle of the irradiated light to the surface of the prepreg 1010 is 45 degrees. The second imaging device 1122 is provided such that the angle of the optical axis of the optical system with respect to the surface of the prepreg 1010 is 45 degrees.

The sorting mechanism 1150 guides the prepreg 1010 from the third transport belt 1113 to the first tray 1151 or the second tray 1152 according to the defect inspection result, as will be described later. The sorting mechanism 1150 may have any configuration as long as the prepreg 1010 can be sorted according to the defect inspection result.

That is, the prepreg 1010A in which no defect is detected is guided and stacked on the first tray 1151 by the sorting mechanism 1150. On the second tray 1152, the prepreg 1010B in which a defect is detected is guided and stacked by the sorting mechanism 1150.

The inspection apparatus 1160 includes an image acquisition unit 1161, a defect detection unit 1162, and a sorting unit 1163. The inspection device 1160 is, for example, a computer that includes a CPU, a ROM, a RAM, and the like. Each function of the inspection apparatus 1160, that is, the image acquisition unit 1161, the defect detection unit 1162, and the sorting unit 1163, for example, is realized by the CPU executing a program read from the ROM in cooperation with the RAM.

The image acquisition unit 1161 acquires image data of the prepreg 1010 from the first imaging device 1121 and the second imaging device 1122. The defect detection unit 1162 detects a defect present in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122.

The sorting unit 1163 controls the sorting mechanism 1150 based on the defect detection result of the prepreg 1010 by the defect detection unit 1162, and guides the prepreg 1010 from the third transport belt 1113 to the first tray 1151 or the second tray 1152. The sorting unit 1163 controls the sorting mechanism 1150 so that the prepreg 1010A in which no defect is detected is guided to the first tray 1151, and the prepreg 1010B in which the defect is detected is guided to the second tray 1152.

FIG. 10 is a diagram illustrating a defect of the prepreg 1010.

The defect AA shown in FIG. 10 is unevenness formed on the surface of the prepreg 1010. The defect BB is a crack in the surface layer of the prepreg 1010. Further, the defect CC is a foreign matter mixed in the prepreg 1010. The defect detection unit 1162 of the inspection apparatus 1160 detects a defect of the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 from the first imaging device 1121 and the second imaging device 1122. In FIG. 10, the defect AA is exaggerated, and the defect AA is a minute unevenness that cannot actually be visually confirmed.

FIG. 11 is a diagram illustrating a flowchart of defect detection processing in the third embodiment.

As shown in FIG. 11, in the defect detection process in the inspection system 1100, first, in step S <b> 1101, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 toward the third transport belt 1113.

Next, in step S1102, the first imaging device 1121 images the prepreg 1010 conveyed in the first imaging area between the first conveyance belt 1111 and the second conveyance belt 1112. As described above, the first imaging region of the first imaging device 1121 is provided between the first conveyor belt 1111 and the second conveyor belt 1112, and the first imaging device 1121 supports the support member 1140 of the prepreg 1010. The part supported by the surface 1141 is imaged. The first imaging device 1121 images the entire prepreg 1010 by continuously capturing images of the prepreg 1010 conveyed by the conveying device 1110.

In step S1103, the defect detection unit 1162 of the inspection apparatus 1160 detects a defect of the prepreg 1010 based on the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the first imaging device 1121 (hereinafter referred to as first image data). To do.

FIG. 12 is a diagram schematically illustrating the first image data of the prepreg 1010 imaged by the first imaging device 1121.

The first imaging device 1121 has diffuse reflection light from the prepreg 1010 and diffuse reflection light reflected on the support surface 1141 of the support member 1140 via the prepreg 1010 having translucency from a portion where the prepreg 1010 is not defective. And receive light. Therefore, in the first image data of the prepreg 1010, the color of the support surface 1141 of the support member 1140 appears so that the support surface 1141 of the support member 1140 can be seen through the prepreg 1010 in a portion having no defect. In this embodiment, since the support surface 1141 of the support member 1140 is cyan, the portion of the captured image of the first imaging device 1121 that has no defect in the prepreg 1010 is cyan.

The defect AA of the prepreg 1010 reflects the irradiation light from the first light source 1131 in the same manner as the part having no defect. For this reason, the amount of light received by the first imaging device 1121 from the defect AA of the prepreg 1010 is equal to the amount of light received by the first imaging device 1121 from a portion having no defect. Therefore, as shown in FIG. 12, the portion where the defect AA exists in the first image data of the prepreg 1010 has the same brightness as the portion without the defect.

The defect BB of the prepreg 1010 has a state of whitening due to internal cracks. The first imaging device 1121 has a diffuse reflection light from the surface of the prepreg 1010 and a diffuse reflection light reflected by the defect BB through the prepreg 1010 having translucency from a portion where the defect BB of the prepreg 1010 exists. Is received. Accordingly, the portion where the defect BB exists in the first image data of the prepreg 1010 has a higher luminance than the portion where there is no defect.

In addition, the first imaging device 1121 has diffuse reflection light from the surface of the prepreg 1010 and diffuse reflection light reflected by foreign matter through the prepreg 1010 having translucency from a portion where the defect CC of the prepreg 1010 exists. And receive light. Accordingly, in the first image data of the first imaging device 1121, the color of the foreign matter appears so that the foreign matter can be seen through the prepreg 1010 in the portion where the defect CC of the prepreg 1010 exists. For example, when a black foreign substance is mixed into the prepreg 1010 and a defect CC occurs, the defect CC appears as a dark shadow in the first image data.

As described above, in the first image data of the prepreg 1010 by the first imaging device 1121, the portion where the defect BB and the defect CC are present is different in brightness and color from the portion having no defect.

Therefore, for example, the defect detection unit 1162 of the inspection apparatus 1160 calculates in advance the average luminance of the pixels in the first image data of the prepreg 1010 where there is no defect, and the luminance of each pixel of the first image data is calculated in advance. A defect is detected based on the comparison with the calculated average luminance. For example, the defect detection unit 1162 detects, as the defect BB, a pixel whose luminance is higher than the average luminance in the first image data. In addition, the defect detection unit 1162 detects, for example, a pixel whose luminance is lower than the average luminance in the first image data as a defect CC.

In addition, the defect detection unit 1162 calculates, for example, the luminance difference between each pixel and the average luminance in the first image data (that is, “the luminance of each pixel” − “average luminance”), and the defect BB is calculated based on the luminance difference. And a defect CC may be detected. For example, the defect detection unit 1162 compares the first threshold value (> 0) and the second threshold value (<0) set in advance with the luminance difference, and detects a pixel having the luminance difference equal to or greater than the first threshold value as the defect BB. . In addition, a pixel having a luminance difference equal to or smaller than the second threshold is detected as a defect CC.

Thus, the defect detection unit 1162 of the inspection apparatus 1160 can detect the defect BB and the defect CC present in the prepreg 1010 based on the first image data acquired from the first imaging apparatus 1121. In the above-described example, the case where the defect CC that is a black foreign substance is detected has been described. However, even if the defect CC is a non-black foreign substance, the luminance of the pixel in the part where the defect CC exists and the part that does not have the defect The defect CC can be detected based on the difference from the luminance of the pixel.

Returning to the flowchart of the defect detection process shown in FIG. 11, in step S <b> 1104, the second imaging device 1122 images the prepreg 1010 that is conveyed in the second imaging region between the second conveyance belt 1112 and the third conveyance belt 1113. To do. The second imaging region of the second imaging device 1122 is provided between the second conveyor belt 1112 and the third conveyor belt 1113 as described above. The second imaging device 1122 captures the entire prepreg 1010 by continuously capturing images of the prepreg 1010 transported by the transport device 1110.

In step S1105, the defect detection unit 1162 of the inspection apparatus 1160 detects defects in the prepreg 1010 based on the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122 (hereinafter referred to as second image data). To detect.

FIG. 13 is a diagram schematically illustrating second image data of the prepreg 1010 imaged by the second imaging device 1122.

The second imaging device 1122 receives specularly reflected light from the surface of the prepreg 1010 from a portion where the prepreg 1010 is not defective. Further, in the portion where the defect CC exists, the surface of the prepreg 1010 regularly reflects the irradiation light from the second light source 1132 in the same manner as the portion where there is no defect. Therefore, the second imaging device 1122 receives specularly reflected light from the surface of the prepreg 1010 from the portion where the defect CC of the prepreg 1010 exists, similarly to the portion without the defect.

The diffuse reflectance of the irradiation light from the second light source 1132 at the defect AA and the defect BB of the prepreg 1010 is higher than the diffuse reflectance of the portion having no defect. For this reason, the amount of light received by the second imaging device 1122 from the defect AA and the defect BB of the prepreg 1010 is smaller than the amount of light received by the second imaging device 1122 from a portion where there is no defect. Therefore, as shown in FIG. 13, in the second image data of the prepreg 1010, the portion where the defect AA and the defect BB are present is darker than the portion where there is no defect or the portion where the defect CC is present.

The reason why the amount of received light received by the second imaging device 1122 is smaller as the diffuse reflectance of the prepreg 1010 with respect to the irradiation light from the second light source 1132 is higher is as follows. High diffuse reflectance means that diffuse reflection, that is, the degree of reflection that diffuses light in each direction regardless of the law of reflection when viewed macroscopically is high. On the other hand, the positional relationship between the second light source 1132 and the second imaging device 1122 is a positional relationship in which the amount of light received by the second imaging device 1122 is larger as the degree of diffuse reflection is lower, that is, closer to regular reflection. Accordingly, the higher the diffuse reflectance of the prepreg 1010 with respect to the irradiation light from the second light source 1132, the smaller the amount of light received by the second imaging device 1122. Therefore, the defect detection unit 1162 of the inspection device 1160 is, for example, the second prepreg 1010. In the image data, the average luminance of the pixels of the portion having no defect is calculated in advance, and the defect AA and the defect BB are detected by comparing the luminance of each pixel of the second image data with the previously calculated average luminance. For example, the defect detection unit 1162 detects, as the defect AA and the defect BB, pixels whose luminance is lower than the average luminance in the second image data. Further, the defect detection unit 1162 calculates, for example, a luminance difference with respect to the average luminance of each pixel in the second image data (that is, “the luminance of each pixel” − “average luminance”), and the luminance difference is preset. Pixels that are less than or equal to the threshold value may be detected as defects AA and BB.

Thus, the defect detection unit 1162 of the inspection apparatus 1160 detects the defect AA and the defect BB present in the prepreg 1010 based on the second image data acquired from the second imaging apparatus 1122.

Returning to the flowchart of the defect detection process shown in FIG. 11, when none of the defect AA, the defect BB, and the defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1106: NO), the process proceeds to step S1107. Proceed to In step S1107, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect has been detected from the third transport belt 1113 to the first tray 1151, and ends the process.

If the defect detection unit 1162 detects any one of the defects AA, BB, and CC from the prepreg 1010 (step S1106: YES), the process proceeds to step S1108. In step S1108, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which the defect is detected from the third transport belt to the second tray 1152, and the process is ended.

Here, as described above, the defect detection unit 1162 of the inspection device 1160 detects the defect BB and the defect CC of the prepreg 1010 from the first image data imaged by the first imaging device 1121 (step S1103). Further, the defect AA and the defect BB of the prepreg 1010 are detected from the second image data imaged by the second imaging device 1122 (step S1105). As described above, the type of defect to be detected is different between the process using the first image data and the process using the second image data. Further, in step S1103 by the first image data, the defect BB and the defect CC are processed differently (for example, a process in which a pixel having a luminance higher than the average luminance is detected as a defect BB, and a pixel having a luminance lower than the average luminance is determined as the defect CC. Detecting process). On the other hand, in step S1105 based on the second image data, the defect AA and the defect BB are detected by the same process (for example, a process of detecting pixels whose luminance is lower than the average luminance as the defect AA and the defect BB). As a result, the processing time t1 of the process using the first image data is longer than the processing time t2 of the process using the second image data.

Therefore, for example, if the second imaging device 1122 is configured to capture an image upstream of the first imaging device 1121 in the transport path of the prepreg 1010, the overall processing time increases. In this case, when the transport time of the prepreg 1010 between the first imaging region of the first imaging device 1121 and the second imaging region of the second imaging device 1122 is t3, as shown in FIG. 14A, the first image data The necessary processing time required for detecting a defect from the second image data is T21 = t1 + t3.

In contrast, in the inspection system 1100 according to the present embodiment, the first imaging device 1121 is configured to capture an image upstream of the second imaging device 1122 in the transport path of the prepreg 1010. With such a configuration, as shown in FIG. 14B, the necessary processing time required for defect detection from the first image data and the second image data is T12 = t1, which is shorter than the above-described necessary processing time T21 (= t1 + t3). It becomes possible to do.

As described above, according to the inspection system 1100 in the third embodiment, the defect of the prepreg 1010 as the inspection object is detected based on the images captured by the first imaging device 1121 and the second imaging device 1122. can do. In addition, the first imaging device 1121 captures an image upstream of the second imaging device 1122 in the transport path of the prepreg 1010, so that it is possible to shorten the time required for defect detection processing and improve productivity. Become.

In the inspection system 1100 according to the third embodiment, the first imaging device 1121 is provided so as to inspect the prepreg 1010 in the gap between the conveyor belts 1111 and 1112 of the conveyor device 1110. Further, a second imaging device 1122 and the like are provided so as to inspect the prepreg 1010 in the gap between the conveyance belts 1112 and 1113 of the conveyance device 1110. With such a configuration, it is possible to inspect defects of the prepreg 1010 with high accuracy without being affected by irregularities on the surface of the conveyor belt in the conveyor 1110.

[Fourth Embodiment]
Next, a fourth embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 15 is a diagram illustrating an inspection system 1200 according to the fourth embodiment.

As shown in FIG. 15, the inspection system 1200 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1200 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveyance device 1110.

The conveyance device 1110 includes a fourth conveyance belt 1114 as a fourth conveyance unit in addition to the first conveyance belt 1111, the second conveyance belt 1112, and the third conveyance belt 1113, and the prepreg 1010 is moved in the direction of the arrow in FIG. 15. Transport to. The fourth conveyor belt has the same configuration as the first conveyor belt 1111, and conveys the prepreg 1010 delivered from the third conveyor belt 1113.

The third imaging device 1123 is, for example, a digital camera including an imaging element such as a CCD or a CMOS. The third imaging device 1123 is such that at least a part of an imaging area (third imaging area) is a gap between the third conveyance belt 1113 and the fourth conveyance belt 1114 and overlaps with an area through which the prepreg 1010 passes. Is provided. The third imaging device 1123 images the prepreg 1010 from the side opposite to the second imaging device 1122. In the present embodiment, the third imaging device 1123 images the prepreg 1010 via the mirror 1171.

The third light source 1133 is, for example, an LED array, and the third imaging device 1123 irradiates the third imaging region where the prepreg 1010 is imaged with light. Irradiation light from the third light source 1133 is reflected by the half mirror 1172 and guided to the third imaging region between the third conveyor belt 1113 and the fourth conveyor belt 1114.

The third light source 1133, the mirror 1171, and the half mirror 1172 receive specularly reflected light mainly from the surface of the prepreg 1010 that the third imaging device 1123 is transported between the third transport belt 1113 and the fourth transport belt 1114. Are arranged as follows. For example, a light control film may be provided in the third light source 1133 so that the light emitted from the third light source 1133 becomes parallel light.

FIG. 16 is a diagram illustrating a flowchart of defect detection processing in the fourth embodiment.

As shown in FIG. 16, in the defect detection processing in the inspection system 1200, first, in step S1201, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 toward the fourth transport belt 1114.

Next, in step S1202, the first imaging device 1121 images the prepreg 1010 conveyed in the first imaging area between the first conveyance belt 1111 and the second conveyance belt 1112. In step S1203, the defect detection unit 1162 of the inspection apparatus 1160 uses the prepreg in the same manner as in the third embodiment described above based on the first image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the first imaging device 1121. 1010 defects BB and CC are detected.

In step S1204, the second imaging device 1122 images the prepreg 1010 that is transported in the second imaging region between the second transport belt 1112 and the third transport belt 1113. In step S1205, the defect detection unit 1162 of the inspection apparatus 1160 uses the prepreg in the same manner as in the third embodiment described above based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122. Defect AA and defect BB on the first surface side of 1010 are detected.

In step S1206, the third imaging device 1123 images the prepreg 1010 conveyed in the third imaging area between the third conveyor belt 1113 and the fourth conveyor belt 1114. In step S1207, the defect detection unit 1162 of the inspection apparatus 1160 uses the prepreg 1010 of the prepreg 1010 based on the image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the third imaging device 1123 (hereinafter referred to as third image data). A defect AA defect BB on the second surface side opposite to the first surface is detected.

The defect detection method of the third image data acquired from the third imaging device 1123 by the defect detection unit 1162 is the same as the defect detection method of the second image data captured by the second imaging device 1122. As described above, the defect AA and the defect BB can be detected on both surfaces of the prepreg 1010 based on the second image data captured by the second imaging device 1122 and the third image data captured by the third imaging device 1123.

If none of the defect AA, the defect BB, and the defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: NO), the process proceeds to step S1209. In step S1209, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect has been detected from the fourth transport belt 1114 to the first tray 1151, and ends the process.

If any one of the defect AA, defect BB, and defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1208: YES), the process proceeds to step S1210. In step S1210, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which a defect has been detected from the fourth transport belt 1114 to the second tray 1152, and the process ends.

As described above, according to the inspection system 1200 of the fourth embodiment, the inspection object is based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. Further, the first imaging device 1121 is configured to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device in the transport path of the prepreg 1010, and is similar to the above-described third embodiment. It is possible to improve the productivity by shortening the time required for the defect detection process.

In addition, the inspection system 1200 according to the fourth embodiment performs the first imaging device 1121, the second imaging device 1122, and the third imaging device so that the prepreg 1010 is inspected in the gap between the respective transport belts of the transport device 1110. An imaging device 1123 and the like are provided. With such a configuration, it is possible to inspect the prepreg 1010 for defects with high accuracy without being affected by irregularities on the surface of the conveyor belt in the conveyor 1110 as in the third embodiment. .

[Fifth Embodiment]
Next, a fifth embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 17 is a diagram illustrating an inspection system 1300 according to the fifth embodiment.

As shown in FIG. 17, the inspection system 1300 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a fourth light source 1134, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1300 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveyance device 1110.

The first light sources 1131a and 1131b are, for example, blue LED arrays, and irradiate blue light between the first transport belt 1111 and the second transport belt 1112. The first light sources 1131a and 1131b are arranged so that the first imaging device 1121 receives mainly diffuse reflected light from the surface of the prepreg 1010 being conveyed.

The fourth light source 1134 is, for example, a white LED array, and irradiates white light between the first conveyance belt 1111 and the second conveyance belt 1112. The fourth light source 1134 is disposed so as to face the first imaging device 1121 so that the first imaging device 1121 receives the transmitted light that has passed through the prepreg 1010 being conveyed.

In the present embodiment, the first light sources 1131a and 1131b emit blue light in the first wavelength range (blue wavelength range), and the fourth light source 1134 is a second wavelength range different from the first wavelength range and the first wavelength range. Irradiate light including, for example, red and green wavelength regions. The first light sources 1131a and 1131b and the fourth light source 1134 may irradiate light having different wavelength ranges, or may be configured to irradiate light having a different color from the present embodiment. The first light sources 1131a and 1131b and the fourth light source 1134 may be, for example, an organic EL array, a cold cathode tube, a fluorescent lamp such as a halogen lamp, or the like.

The inspection apparatus 1160 includes a color information acquisition unit 1164 in addition to the image acquisition unit 1161, the defect detection unit 1162, and the sorting unit 1163. The color information acquisition unit 1164 acquires color information from the image data acquired by the image acquisition unit 1161. The defect detection unit 1162 detects a defect present in the prepreg 1010 based on the image data acquired by the image acquisition unit 1161 and the color information acquired by the color information acquisition unit 1164.

FIG. 18 is a diagram illustrating a flowchart of defect detection processing in the fifth embodiment.

18, in the defect detection process in the inspection system 1300, first, in step S1301, the transport device 1110 transports the prepreg 1010 from the first transport belt 1111 toward the fourth transport belt 1114. In step S <b> 1302, the first imaging device 1121 images the prepreg 1010 that is conveyed in the first imaging region between the first conveyance belt 1111 and the second conveyance belt 1112.

In step S1303, the color information acquisition unit 1164 of the inspection device 1160 acquires first color information from the first image data captured by the first imaging device 1121.

Here, the first image data of the prepreg 1010 imaged by the first imaging device 1121 is expressed by numerical values of 0 to 255 for each color of R (red), G (green), and B (blue) for each pixel, for example. RGB values. The color information acquisition unit 1164 acquires blue B channel data (B value of each pixel) corresponding to blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 as the first color information. As described above, the color information acquisition unit 1164 acquires the color data included in the wavelength range of the blue light emitted from the first light sources 1131a and 1131b and the fourth light source 1134 as the first color information from the first image data. .

FIG. 19 is a diagram schematically illustrating the first image data (B channel data) of the prepreg 1010 imaged by the first imaging device 1121.

In the defect AA of the prepreg 1010, the blue light emitted from the first light sources 1131a and 1131b is reflected in the same manner as the part without the defect. For this reason, the amount of light received from the defect AA of the prepreg 1010 received by the first imaging device 1121 is equal to the amount of light received from the portion having no defect. Accordingly, as shown in FIG. 19, the B channel data shows the same brightness in the portion where the defect AA exists and the portion where there is no defect.

In the defect BB of the prepreg 1010, the diffuse reflectance of the blue light irradiated from the first light sources 1131a and 1131b is higher than the diffuse reflectance of the portion without the defect. For this reason, the amount of received light from the defect BB of the blue light emitted from the first light source 1131 received by the first imaging device 1121 is larger than the amount of light received from the portion having no defect. Therefore, as shown in FIG. 19, in the B channel data, the portion where the defect BB exists in the prepreg 1010 is brighter than the portion where there is no defect.

Further, in the defect CC of the prepreg 1010, the irradiation light from the fourth light source 1134 is blocked by the foreign matter. For this reason, the amount of blue light received in the irradiation light from the fourth light source 1134 received by the first imaging device 1121 is smaller in the portion where the defect CC exists than in the portion where there is no defect. Accordingly, as shown in FIG. 19, in the B channel data, the portion where the defect CC exists is darker than the portion where there is no defect.

Since the sum of the reflected light of the irradiation light from the first light sources 1131a and 1131b and the transmitted light of the irradiation light from the fourth light source 1134 becomes the first image data, as shown in FIG. The portion where the defect BB exists is brighter than the portion where there is no defect. Further, the portion where the defect CC exists is darker than the portion where there is no defect.

In step S1304, the color information acquisition unit 1164 acquires the second color information from the first image data captured by the first imaging device 1121. The color information acquisition unit 1164 acquires red R channel data (R value of each pixel) corresponding to red light included in white light emitted from the fourth light source 1134 as second color information. As described above, the color information acquisition unit 1164 outputs the color data included in the wavelength range of the red light, which is different from the blue light irradiated from the first light source 1131 among the irradiation light from the fourth light source 1134. Obtained from the image data as second color information.

Note that the color information acquisition unit 1164 may acquire green G channel data (G value of each pixel) corresponding to green light included in white light emitted from the fourth light source 1134 as second color information. . Also in this case, the defect of the prepreg 1010 can be detected as in the case of using the R channel data described below.

FIG. 20 is a diagram schematically illustrating the first image data (R channel data) of the prepreg 1010 imaged by the first imaging device 1121.

The light emitted from the fourth light source 1134 toward the first imaging device 1121 is transmitted in the same manner in the portion where the defect AA exists and the portion where there is no defect in the prepreg 1010. For this reason, the amount of red light received in the irradiation light from the fourth light source 1134 received by the first imaging device 1121 is substantially equal between the portion where the defect AA exists and the portion where there is no defect. Therefore, as shown in FIG. 20, the R channel data shows the same brightness in the portion where the defect AA exists in the prepreg 1010 as in the portion where there is no defect.

Further, the light emitted from the fourth light source 1134 toward the first imaging device 1121 is blocked by a portion where the defect BB or the defect CC exists in the prepreg 1010. For this reason, in the first imaging device 1121, the amount of red light received in the irradiation light from the fourth light source 1134 is smaller in the portion where the defect BB or the defect CC exists than in the portion where there is no defect. Therefore, as shown in FIG. 20, in the R channel data, the portion where the defect BB and the defect CC exist in the prepreg 1010 is darker than the portion where there is no defect.

Here, the R value of each pixel in the image data is not affected by the blue light emitted from the first light source 1131 by the first imaging device 1121, and the light emitted from the fourth light source 1134 by the first imaging device 1121. It is determined by the amount of red light received in. For this reason, the amount of blue light received from the first light source 1131 received by the first imaging device 1121 in the portion where the defect AA exists is increased, and the R value included in the image data does not increase. Therefore, as shown in FIG. 20, the portion where the defect AA exists in the R channel data is not affected by the blue light.

Returning to the flowchart of the defect detection process shown in FIG. 18, in step S1305, the defect detection unit 1162 acquires the B channel data as the first color information acquired by the color information acquisition unit 1164 and the second color information. The difference from the R channel data is calculated. Subsequently, in step S1306, the defect detection unit 1162 detects a defect of the prepreg 1010 based on the first image data and the color information.

In step S1305, the defect detection unit 1162 calculates a difference value ((B value−R value) in the same pixel) between the B channel data as the first color information and the R channel data as the second color information as image data. Are calculated for all the pixels included in. Hereinafter, the difference data between the B channel data and the R channel data obtained in this way is referred to as BR channel data.

As described above, in the B channel data, the value of the defective BB portion is larger than the value of the portion having no defect (see FIG. 19). On the other hand, in the R channel data, the value of the defective BB portion is smaller than the value of the portion having no defect (see FIG. 20). Therefore, in the BR channel data, the difference between the value of the defective BB portion and the value of the non-defective portion is the difference between the value of the defective BB portion and the value of the non-defective portion in each of the B channel data and the R channel data. Greater than the difference.

For example, in the B channel data, the value of each part of (defect BB, no defect) is (250, 120). In the R channel data, the value of each part (defect BB, no defect) is (50, 120). In such a case, in the BR channel data, the value of each part of (defect AA, no defect) is (200, 0).

Therefore, in the BR channel data, the difference between the value of the defective BB portion and the value of the portion without the defect is 200, and the difference between the value of the defective BB portion and the value of the portion without the defect in the B channel data (130). Greater than. Further, the difference (200) between the value of the defective BB portion and the value of the non-defective portion in the BR channel data is the difference (70) between the value of the defective BB portion and the non-defective portion of the R channel data. Bigger than.

Therefore, when the defect detection unit 1162 detects the defect BB based on the difference between the value of the defect BB portion and the value of the portion without the defect, the difference between the value of the defect BB portion and the value of the portion without the defect is By using large BR channel data, it becomes possible to detect the defect BB with higher accuracy. Further, in the BR channel data, luminance unevenness in a portion where there is no defect in the prepreg 1010 included in each of the B channel data and the R channel data is canceled. For this reason, the defect detection unit 1162 can detect the defect BB with high accuracy by reducing erroneous detection by using the BR channel data from which the luminance unevenness is canceled.

Further, the defect detection unit 1162 has a pixel value smaller than the average value of the non-defective portion in the R channel data, and the difference from the average value of the non-defective portion is equal to or greater than a preset threshold value. The part is detected as a defect BB or a defect CC.

In step S1307, the second imaging device 1122 images the prepreg 1010 conveyed in the second imaging area between the second conveyance belt 1112 and the third conveyance belt 1113. In step S1308, the defect detection unit 1162 detects the defect AA and the defect BB on the first surface side of the prepreg 1010 based on the second image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the second imaging device 1122. .

In step S1309, the third imaging device 1123 images the prepreg 1010 conveyed in the third imaging area between the third conveyance belt 1113 and the fourth conveyance belt 1114. In step S1310, the defect detection unit 1162 uses the third image data of the prepreg 1010 acquired by the image acquisition unit 1161 from the third imaging device 1123, and the second surface side of the prepreg 1010 opposite to the first surface. A defect AA and a defect BB are detected.

The detection method of the defect AA and the defect BB based on the second image data imaged by the second imaging device 1122 and the third image data imaged by the third imaging device 1123 is the same as that of the above-described fourth embodiment. .

If none of the defect AA, defect BB, and defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: NO), the process proceeds to step S1312. In step S1312, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which no defect has been detected from the fourth transport belt 1114 to the first tray 1151, and ends the process.

If any one of the defect AA, defect BB, and defect CC is detected from the prepreg 1010 by the defect detection unit 1162 (step S1311: YES), the process proceeds to step S1313. In step S <b> 1313, the sorting unit 1163 controls the sorting mechanism 1150 to discharge the prepreg 1010 in which the defect is detected from the fourth transport belt 1114 to the second tray 1152, and the process is ended.

As described above, according to the inspection system 1300 in the fifth embodiment, the inspection object is based on the images imaged by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. In addition, the defect detection unit 1162 uses the B channel data as the first color information and the R channel data as the second color information acquired by the color information acquisition unit 1164 from the first image data, thereby reducing erroneous detection. Thus, the defect BB can be detected with high accuracy. Furthermore, in the conveyance path of the prepreg 1010, the first imaging device 1121 is configured to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device 1123, and thus the third embodiment described above. Similarly, productivity can be improved by shortening the time required for defect detection processing.

[Sixth Embodiment]
Next, a sixth embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 21 is a diagram illustrating an inspection system 1400 according to the sixth embodiment.

As shown in FIG. 21, the inspection system 1400 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1400 inspects the presence or absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveyance device 1110.

The transport device 1110 includes a first transport belt 1111, a second transport belt 1112, and a third transport belt 1113, and transports the prepreg 1010 in the direction of the arrow in FIG.

The third imaging device 1123 is configured such that at least a part of an imaging area (third imaging area) is a gap between the second conveyance belt 1112 and the third conveyance belt 1113 and overlaps with an area through which the prepreg 1010 passes. Is provided. The third imaging device 1123 images the prepreg 1010 from the side opposite to the second imaging device 1122. Similar to the second imaging device 1122, the third imaging device 1123 is provided so as to image the prepreg 1010 that passes between the second conveyance belt 1112 and the third conveyance belt 1113.

Here, when the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 increase, the defect detection accuracy based on the image data of each imaging device decreases. there is a possibility. For this reason, the second imaging device 1122, the third imaging device 1122, the third imaging device 1122, and the third imaging device 1123 receive light from the second light source 1132 as low as possible. It is preferable to configure the imaging device 1123, the second light source 1132, the third light source 1133, and the like.

As in the fourth embodiment, the defect detection unit 1162 of the inspection apparatus 1160 is based on the image data acquired from the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. AA, defect BB, and defect CC are detected.

The inspection system 1400 in the sixth embodiment detects a defect of the prepreg 1010 as an inspection object by the same process as the defect detection process in the fourth embodiment, and the first prepreg 1010 is detected according to the defect detection result. Sort into tray 1151 or second tray 1152.

As described above, according to the inspection system 1400 in the sixth embodiment, the inspection object is based on the images imaged by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. The third embodiment described above is configured such that the first imaging device 1121 images the prepreg 1010 upstream of the second imaging device 1122 and the third imaging device 1123 in the transport path of the prepreg 1010. Similarly, it is possible to improve productivity by reducing the time required for the defect detection processing.

Further, according to the inspection system 1400 in the sixth embodiment, both the second imaging device 1122 and the third imaging device 1123 image the prepreg 1010 between the second conveyance belt 1112 and the third conveyance belt 1113. With this configuration, the overall configuration can be reduced in size.

As in the fifth embodiment, a fourth light source 1134 is provided, color information is acquired from the first image data imaged by the first imaging device 1121, and a defect is detected based on the acquired color information. It may be configured.

[Seventh Embodiment]
Next, a seventh embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 22 is a diagram illustrating an inspection system 1500 according to the seventh embodiment.

As shown in FIG. 22, the inspection system 1500 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, a third imaging device 1123, first light sources 1131a and 1131b, a second light source 1132, and a third light source. 1133, a support member 1140, a sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160. The inspection system 1500 inspects for the presence or absence of a prepreg 1010 defect as an inspection object conveyed by the conveyance device 1110.

The third imaging device 1123 is configured such that at least a part of an imaging area (third imaging area) is a gap between the second conveyance belt 1112 and the third conveyance belt 1113 and overlaps with an area through which the prepreg 1010 passes. Is provided. The third light source 1133 is disposed so that the third imaging device 1123 receives specularly reflected light mainly from the surface of the prepreg 1010 that is transported between the second transport belt 1112 and the third transport belt 1113. .

Here, when the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 increase, the defect detection accuracy based on the image data of each imaging device decreases. there is a possibility. For this reason, the second imaging device 1122, the third imaging device 1123, so that the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 can be reduced. The second light source 1132 and the third light source 1133 are preferably configured.

Therefore, in the present embodiment, as shown in FIG. 22, the optical axis 1132a (light irradiation direction) of the second light source 1132 and the optical axis 1133a (light irradiation direction) of the third light source 1133 are configured to be parallel. Has been. With such a configuration, the amount of light received from the third light source 1133 of the second imaging device 1122 and the amount of light received from the second light source 1132 of the third imaging device 1123 are reduced, and at the same time the defect detection accuracy of the prepreg 1010 is maintained. Thus, the device configuration can be reduced in size.

As in the fourth embodiment, the defect detection unit 1162 of the inspection apparatus 1160 is based on image data captured by the first imaging apparatus 1121, the second imaging apparatus 1122, and the third imaging apparatus 1123, respectively. The defect AA, the defect BB, and the defect CC are detected.

The inspection system 1500 according to the seventh embodiment detects a defect of the prepreg 1010 as an inspection object by a process similar to the defect detection process according to the fourth embodiment, and the first prepreg 1010 is detected according to the defect detection result. Sort into tray 1151 or second tray 1152.

As described above, according to the inspection system 1500 in the seventh embodiment, the inspection object is based on the images captured by the first imaging device 1121, the second imaging device 1122, and the third imaging device 1123. The defect of the prepreg 1010 can be detected. Further, the first imaging device 1121 is configured to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device in the transport path of the prepreg 1010, and is similar to the above-described third embodiment. It is possible to improve the productivity by shortening the time required for the defect detection process.

As in the fifth embodiment, a fourth light source 1134 is provided, color information is acquired from the first image data imaged by the first imaging device 1121, and a defect is detected based on the acquired color information. It may be configured.

[Eighth embodiment]
Next, an eighth embodiment will be described based on the drawings. Note that the description of the same components as those of the already described embodiment will be omitted as appropriate.

FIG. 23 is a diagram illustrating an inspection system 1600 according to the eighth embodiment.

As shown in FIG. 23, the inspection system 1600 includes a transport device 1110, a first imaging device 1121, a second imaging device 1122, first light sources 1131a and 1131b, a second light source 1132, a third light source 1133, a support member 1140, A sorting mechanism 1150, a first tray 1151, a second tray 1152, and an inspection device 1160 are included. The inspection system 1600 inspects the presence / absence of a defect in the prepreg 1010 as an inspection object conveyed by the conveyance device 1110.

In the present embodiment, the first imaging device 1121 and the second imaging device 1122 are provided so as to image the prepreg 1010 conveyed by the conveying device 1110 on the conveying belt. The first imaging device 1121 is provided to image the prepreg 1010 on the first transport belt 1111. The second imaging device 1122 is provided so as to image the prepreg 1010 on the second conveyance belt 1112. Note that the first imaging device 1121 and the second imaging device 1122 may be provided so as to image the prepreg 1010 on the same conveyance belt.

As in the third embodiment, the defect detection unit 1162 of the inspection apparatus 1160 uses the prepreg based on the first image data captured by the first image capturing apparatus 1121 and the second image data captured by the second image capturing apparatus 1122. 1010 defects are detected.

As described above, according to the inspection system 1600 in the eighth embodiment, the defect of the prepreg 1010 as the inspection object is detected based on the images captured by the first imaging device 1121 and the second imaging device 1122. Can be detected. Further, the first imaging device 1121 is configured to image the prepreg 1010 on the upstream side of the second imaging device 1122 and the third imaging device in the transport path of the prepreg 1010, and is similar to the above-described third embodiment. It is possible to improve the productivity by shortening the time required for the defect detection process. Furthermore, by arranging the first imaging region of the first imaging device 1121 and the second imaging region of the second imaging device 1122 so as to be close to each other, the device configuration can be reduced in size.

The inspection system and the inspection method according to the embodiment have been described above, but the present invention is not limited to the above embodiment, and various modifications and improvements can be made within the scope of the present invention. In the description of each embodiment described above, the method for inspecting the prepreg 1010 as the inspection object has been described, but the inspection object is not limited to the prepreg.

This international application claims priority based on Japanese Patent Application No. 2015-245600 filed on December 16, 2015 and Japanese Patent Application No. 2015-245708 filed on December 16, 2015. Yes, the entire contents of Japanese Patent Application No. 2015-245600 and Japanese Patent Application No. 2015-245708 are incorporated herein by reference.

10 prepreg (inspection object)
100, 200 Inspection systems 110, 210 Conveying devices 111, 211 First conveying belt (first conveying unit)
112, 212 Second conveyor belt (second conveyor)
120, 220 Imaging device 130a, 130b Light source 140 Support member 141 Support surface 150, 250 Inspection device 152, 253 Detection unit 230 First light source 240 Second light source 252 Color information acquisition unit 1010 Prepreg (inspection object)
1100, 1200, 1300, 1400, 1500, 1600 Inspection system 1110 Conveying device 1111 First conveying belt (first conveying unit)
1112 Second conveyor belt (second conveyor)
1113 Third conveyor belt (third conveyor)
1121 1st imaging device 1122 2nd imaging device 1123 3rd imaging device 1131a, 1131b 1st light source 1132 2nd light source 1133 3rd light source 1134 4th light source 1140 Support member 1141 Support surface 1160 Inspection device 1162 Defect detection part 1164 Color information acquisition Part A, B, AA, BB, CC Defect

JP 2006-64531 A

Claims (18)

1. An inspection system for inspecting a sheet-like inspection object having translucency,
   An imaging device for imaging the inspection object;
   A first light source that irradiates light to an imaging region of the imaging device such that the imaging device receives mainly diffuse reflected light from the surface of the inspection object;
   An inspection device for inspecting the inspection object for defects, and
   The inspection system includes a detection unit that detects a defect of the inspection target based on an image captured by the imaging device.
2. A transfer device that transfers the inspection object from the first transfer unit to the second transfer unit;
   The imaging apparatus is provided so that at least a part of the imaging region is a gap between the first transport unit and the second transport unit and overlaps a region through which the inspection object passes. The inspection system according to claim 1, wherein
3. The inspection system according to claim 2, further comprising a support member that supports the inspection object in the imaging region.
4. The inspection system according to claim 3, wherein the support member has a chromatic color on a support surface that abuts on the inspection object.
5. A second light source for irradiating the imaging region with light so that the imaging device receives light transmitted through the inspection object;
   The first light source emits light in a first wavelength range;
   The second light source irradiates light including a second wavelength range different from the first wavelength range,
   The inspection apparatus includes a color information acquisition unit that acquires first color information of a color included in the first wavelength range and second color information of a color included in the second wavelength range from the captured image,
   The inspection system according to claim 1, wherein the detection unit detects a defect of the inspection object based on a difference between the first color information and the second color information.
6. 6. The defect of the inspection object detected by the detection unit is a crack in a surface layer of the inspection object and a foreign matter mixed in the inspection object. Inspection system as described in.
7. An inspection method for inspecting a sheet-like inspection object having translucency,
   An imaging step of imaging the inspection object by an imaging device;
   A light irradiation step of irradiating light to an imaging region of the imaging device so that the imaging device mainly receives diffuse reflected light from the surface of the inspection object;
   A detection step of detecting a defect of the inspection object based on an image captured by the imaging device.
8. An inspection system for inspecting a sheet-like inspection object having translucency,
   A transport device for transporting the inspection object;
   A first imaging device that images the inspection object that is transported by the transport device and passes through a first imaging region;
   A first light source that emits light to the first imaging region so that the first imaging device receives mainly diffuse reflected light from the surface of the inspection object;
   A second imaging device that images the inspection object that is transported by the transport device and passes through a second imaging region downstream of the first imaging region;
   A second light source for irradiating the second imaging region with light so that the second imaging device receives mainly regular reflection light from the surface of the inspection object;
   An inspection system comprising: a defect detection unit configured to detect a defect of the inspection object based on an image captured by the first image capturing device and an image captured by the second image capturing device.
9. The transport device includes a first transport unit that transports the inspection object, and a second transport unit that transports the inspection object delivered from the first transport unit,
   The first imaging device is provided so that at least a part of the first imaging region is a gap between the first transport unit and the second transport unit and overlaps a region through which the inspection object passes. The inspection system according to claim 8, wherein:
10. It has a supporting member which is provided between the 1st conveyance part and the 2nd conveyance part, and supports the inspection subject passed to the 2nd conveyance part from the 1st conveyance part. Item 10. The inspection system according to Item 9.
11. The inspection system according to claim 10, wherein the support member has a chromatic color on a support surface that abuts the inspection object.
12. A fourth light source that irradiates the first imaging region with light so that the first imaging device receives light transmitted through the inspection object;
    A color information acquisition unit that acquires color information from an image captured by the first imaging device;
    The first light source emits light in a first wavelength range;
    The fourth light source irradiates light including a second wavelength range different from the first wavelength range,
    The color information acquisition unit acquires first color information of a color included in the first wavelength range and second color information of a color included in the second wavelength range from an image captured by the first imaging device,
    The inspection system according to claim 9, wherein the defect detection unit detects a defect of the inspection object based on a difference between the first color information and the second color information.
13. The transport device further includes a third transport unit that transports the inspection object delivered from the second transport unit,
    The second imaging device is provided so that at least a part of the second imaging region is a gap between the second transport unit and the third transport unit and overlaps with a region through which the inspection object passes. The inspection system according to any one of claims 9 to 12, wherein the inspection system is provided.
14. A third imaging device that images the inspection object that is transported by the transport device and passes through a third imaging region downstream of the first imaging region, from the side opposite to the second imaging device;
    A third light source that irradiates the third imaging region with light so that the third imaging device mainly receives specularly reflected light from the surface of the inspection object;
    The inspection system according to any one of claims 8 to 13, wherein the defect detection unit detects a defect of the inspection object based on an image captured by the third imaging device.
15. The inspection system according to claim 14, wherein the third imaging device is provided so that at least a part of the third imaging region overlaps the second imaging region.
16. The inspection system according to claim 15, wherein an optical axis of the second light source and an optical axis of the third light source are parallel to each other.
17. The defect of the inspection object detected by the defect detection unit is unevenness formed on the surface of the inspection object, cracks in the surface layer of the inspection object, and foreign matter mixed in the inspection object. The inspection system according to any one of claims 8 to 16.
18. A transport device for transporting a sheet-like inspection object having translucency;
    A first imaging device that images the inspection object that is transported by the transport device and passes through a first imaging region;
    A first light source that emits light to the first imaging region so that the first imaging device receives mainly diffuse reflected light from the surface of the inspection object;
    A second imaging device that images the inspection object that is transported by the transport device and passes through a second imaging region downstream of the first imaging region;
    A second light source for irradiating the second imaging region with light so that the second imaging device receives mainly regular reflection light from the surface of the inspection object;
    An inspection method for inspecting the inspection object in an inspection system comprising:
    A first imaging step in which the inspection object that is conveyed by the conveyance device and passes through the first imaging region is imaged by the first imaging device;
    A first defect detection step of detecting a defect of the inspection object based on an image captured by the first imaging device;
    A second imaging step in which the inspection object that is conveyed by the conveyance device and passes through the second imaging region is imaged by the second imaging device;
    A second defect detection step of detecting a defect of the inspection object based on an image captured by the second imaging device.

Images