JPH0413954A - Defect inspecting device for web - Google Patents
Defect inspecting device for webInfo
- Publication number
- JPH0413954A JPH0413954A JP11629090A JP11629090A JPH0413954A JP H0413954 A JPH0413954 A JP H0413954A JP 11629090 A JP11629090 A JP 11629090A JP 11629090 A JP11629090 A JP 11629090A JP H0413954 A JPH0413954 A JP H0413954A
- Authority
- JP
- Japan
- Prior art keywords
- defect
- web
- light
- foreign matter
- emitted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005540 biological transmission Effects 0.000 abstract 2
- 238000005286 illumination Methods 0.000 abstract 2
- 230000003287 optical Effects 0.000 abstract 1
- 230000000007 visual effect Effects 0.000 abstract 1
Abstract
PURPOSE: To automatically quantitatively detect the positions and sizes of a defect and a foreign matter by simultaneously detecting the defect on a material to be inspected and the matter on the material to be detected by separate light sources, correcting one as a bright pattern image, and collecting the other as a dark pattern image.
CONSTITUTION: The upper surface of a web is emitted obliquely with an illumination light, the lower surface of the web is simultaneously emitted with a weak transmission light, and scattered lights and transmitted lights at this time are imaged by a CCD camera through an objective lens 14. A defect 11A generated on the web protrudes on the surface like a lens. Thus, the weak transmission light is emitted and hence most light passed through the defect is refracted, and its optical axis is deviated out of the direction of the lens 14. Accordingly, only the defect becomes a low intensity. A foreign matter 11B adhered to the web generates a scattered light by strong obliquely projected illumination high intensity. If one visual field of the material to be inspected is observed by the camera in this principle, the foreign matter is glared brightly, and the defect is observed to be dark and is discriminated.
COPYRIGHT: (C)1992,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11629090A JPH0413954A (en) | 1990-05-03 | 1990-05-03 | Defect inspecting device for web |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11629090A JPH0413954A (en) | 1990-05-03 | 1990-05-03 | Defect inspecting device for web |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0413954A true JPH0413954A (en) | 1992-01-17 |
Family
ID=14683389
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11629090A Pending JPH0413954A (en) | 1990-05-03 | 1990-05-03 | Defect inspecting device for web |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0413954A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001311693A (en) * | 2000-04-28 | 2001-11-09 | Nitto Kogyo Co Ltd | Inspection apparatus |
| WO2017104575A1 (en) * | 2015-12-16 | 2017-06-22 | 株式会社リコー | Testing system and testing method |
-
1990
- 1990-05-03 JP JP11629090A patent/JPH0413954A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001311693A (en) * | 2000-04-28 | 2001-11-09 | Nitto Kogyo Co Ltd | Inspection apparatus |
| WO2017104575A1 (en) * | 2015-12-16 | 2017-06-22 | 株式会社リコー | Testing system and testing method |
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