KR101940162B1 - 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 - Google Patents

레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 Download PDF

Info

Publication number
KR101940162B1
KR101940162B1 KR1020137032594A KR20137032594A KR101940162B1 KR 101940162 B1 KR101940162 B1 KR 101940162B1 KR 1020137032594 A KR1020137032594 A KR 1020137032594A KR 20137032594 A KR20137032594 A KR 20137032594A KR 101940162 B1 KR101940162 B1 KR 101940162B1
Authority
KR
South Korea
Prior art keywords
optical member
light source
gas
volume
flow
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020137032594A
Other languages
English (en)
Korean (ko)
Other versions
KR20140036219A (ko
Inventor
아이고르 브이. 포멘코프
블라디미르 비. 플레우로프
윌리엄 엔. 파틀로
알렉산더 아이. 에르쇼프
Original Assignee
에이에스엠엘 네델란즈 비.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에이에스엠엘 네델란즈 비.브이. filed Critical 에이에스엠엘 네델란즈 비.브이.
Publication of KR20140036219A publication Critical patent/KR20140036219A/ko
Application granted granted Critical
Publication of KR101940162B1 publication Critical patent/KR101940162B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/002Supply of the plasma generating material
    • H05G2/0027Arrangements for controlling the supply; Arrangements for measurements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/008Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
    • H05G2/0082Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
    • H05G2/0086Optical arrangements for conveying the laser beam to the plasma generation location

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • X-Ray Techniques (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020137032594A 2011-06-08 2012-05-10 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 Active KR101940162B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/156,188 US9516730B2 (en) 2011-06-08 2011-06-08 Systems and methods for buffer gas flow stabilization in a laser produced plasma light source
US13/156,188 2011-06-08
PCT/US2012/037363 WO2012170144A1 (en) 2011-06-08 2012-05-10 Systems and methods for buffer gas flow stabilization in a laser produced plasma light source

Publications (2)

Publication Number Publication Date
KR20140036219A KR20140036219A (ko) 2014-03-25
KR101940162B1 true KR101940162B1 (ko) 2019-01-18

Family

ID=47292352

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020137032594A Active KR101940162B1 (ko) 2011-06-08 2012-05-10 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법

Country Status (6)

Country Link
US (1) US9516730B2 (enExample)
EP (1) EP2719261A4 (enExample)
JP (1) JP6043789B2 (enExample)
KR (1) KR101940162B1 (enExample)
TW (1) TWI576013B (enExample)
WO (1) WO2012170144A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9390892B2 (en) 2012-06-26 2016-07-12 Kla-Tencor Corporation Laser sustained plasma light source with electrically induced gas flow
JP6099241B2 (ja) * 2012-06-28 2017-03-22 ギガフォトン株式会社 ターゲット供給装置
US8853655B2 (en) * 2013-02-22 2014-10-07 Kla-Tencor Corporation Gas refraction compensation for laser-sustained plasma bulbs
US8872143B2 (en) 2013-03-14 2014-10-28 Asml Netherlands B.V. Target for laser produced plasma extreme ultraviolet light source
US8791440B1 (en) * 2013-03-14 2014-07-29 Asml Netherlands B.V. Target for extreme ultraviolet light source
US8680495B1 (en) * 2013-03-15 2014-03-25 Cymer, Llc Extreme ultraviolet light source
US9560730B2 (en) 2013-09-09 2017-01-31 Asml Netherlands B.V. Transport system for an extreme ultraviolet light source
US9557650B2 (en) * 2013-09-09 2017-01-31 Asml Netherlands B.V. Transport system for an extreme ultraviolet light source
WO2015086232A1 (en) * 2013-12-09 2015-06-18 Asml Netherlands B.V. Radiation source device, lithographic apparatus and device manufacturing method
US9338870B2 (en) 2013-12-30 2016-05-10 Asml Netherlands B.V. Extreme ultraviolet light source
US9539622B2 (en) * 2014-03-18 2017-01-10 Asml Netherlands B.V. Apparatus for and method of active cleaning of EUV optic with RF plasma field
US9155178B1 (en) * 2014-06-27 2015-10-06 Plex Llc Extreme ultraviolet source with magnetic cusp plasma control
US9544986B2 (en) 2014-06-27 2017-01-10 Plex Llc Extreme ultraviolet source with magnetic cusp plasma control
US9357625B2 (en) 2014-07-07 2016-05-31 Asml Netherlands B.V. Extreme ultraviolet light source
JP6393196B2 (ja) * 2015-01-19 2018-09-19 浜松ホトニクス株式会社 レーザ光増幅装置
US9776218B2 (en) 2015-08-06 2017-10-03 Asml Netherlands B.V. Controlled fluid flow for cleaning an optical element
US10128016B2 (en) * 2016-01-12 2018-11-13 Asml Netherlands B.V. EUV element having barrier to hydrogen transport
EP3291650B1 (en) * 2016-09-02 2019-06-05 ETH Zürich Device and method for generating uv or x-ray radiation by means of a plasma
US10149375B2 (en) * 2016-09-14 2018-12-04 Asml Netherlands B.V. Target trajectory metrology in an extreme ultraviolet light source
KR102536355B1 (ko) * 2017-01-06 2023-05-25 에이에스엠엘 네델란즈 비.브이. 안내 장치 및 관련 시스템
US10955749B2 (en) 2017-01-06 2021-03-23 Asml Netherlands B.V. Guiding device and associated system
US10165664B1 (en) * 2017-11-21 2018-12-25 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus for decontaminating windows of an EUV source module
US10959318B2 (en) * 2018-01-10 2021-03-23 Kla-Tencor Corporation X-ray metrology system with broadband laser produced plasma illuminator
NL2022644A (en) * 2018-03-05 2019-09-10 Asml Netherlands Bv Prolonging optical element lifetime in an euv lithography system
NL2023633A (en) * 2018-09-25 2020-04-30 Asml Netherlands Bv Laser system for target metrology and alteration in an euv light source
JP7143439B2 (ja) 2018-11-15 2022-09-28 ギガフォトン株式会社 極端紫外光生成装置及び電子デバイスの製造方法
KR102869765B1 (ko) * 2019-05-17 2025-10-13 삼성전자주식회사 소스 용기용 잔류물 제거 장치, 소스 용기 및 극자외선 노광장치
JP7368984B2 (ja) * 2019-09-05 2023-10-25 ギガフォトン株式会社 極端紫外光生成装置、及び電子デバイスの製造方法
US10923311B1 (en) * 2019-11-11 2021-02-16 Xia Tai Xin Semiconductor (Qing Dao) Ltd. Cathode for ion source comprising a tapered sidewall
JP2023121488A (ja) 2022-02-21 2023-08-31 ギガフォトン株式会社 極端紫外光生成装置及び電子デバイスの製造方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004501491A (ja) * 2000-06-09 2004-01-15 サイマー, インコーポレイテッド 活性ガス及びバッファガス制御を有するプラズマ集束光源
JP2010161092A (ja) * 2009-01-06 2010-07-22 Komatsu Ltd 極端紫外光源装置
WO2010112171A1 (en) * 2009-04-02 2010-10-07 Eth Zurich Extreme ultraviolet light source with a debris-mitigated and cooled collector optics

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6452199B1 (en) 1997-05-12 2002-09-17 Cymer, Inc. Plasma focus high energy photon source with blast shield
US6538257B2 (en) * 1999-12-23 2003-03-25 Koninklijke Philips Electronics N.V. Method of generating extremely short-wave radiation, and extremely short-wave radiation source unit
US6972421B2 (en) * 2000-06-09 2005-12-06 Cymer, Inc. Extreme ultraviolet light source
US7372056B2 (en) 2005-06-29 2008-05-13 Cymer, Inc. LPP EUV plasma source material target delivery system
US7897947B2 (en) 2007-07-13 2011-03-01 Cymer, Inc. Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave
US20060255298A1 (en) 2005-02-25 2006-11-16 Cymer, Inc. Laser produced plasma EUV light source with pre-pulse
US7465946B2 (en) 2004-03-10 2008-12-16 Cymer, Inc. Alternative fuels for EUV light source
US7491954B2 (en) 2006-10-13 2009-02-17 Cymer, Inc. Drive laser delivery systems for EUV light source
US7843632B2 (en) * 2006-08-16 2010-11-30 Cymer, Inc. EUV optics
US7405416B2 (en) 2005-02-25 2008-07-29 Cymer, Inc. Method and apparatus for EUV plasma source target delivery
US7439530B2 (en) 2005-06-29 2008-10-21 Cymer, Inc. LPP EUV light source drive laser system
US7671349B2 (en) * 2003-04-08 2010-03-02 Cymer, Inc. Laser produced plasma EUV light source
US7164144B2 (en) 2004-03-10 2007-01-16 Cymer Inc. EUV light source
US7087914B2 (en) 2004-03-17 2006-08-08 Cymer, Inc High repetition rate laser produced plasma EUV light source
US7184124B2 (en) 2004-10-28 2007-02-27 Asml Holding N.V. Lithographic apparatus having an adjustable projection system and device manufacturing method
US7402825B2 (en) * 2005-06-28 2008-07-22 Cymer, Inc. LPP EUV drive laser input system
US8158960B2 (en) 2007-07-13 2012-04-17 Cymer, Inc. Laser produced plasma EUV light source
DE102007023444B4 (de) * 2007-05-16 2009-04-09 Xtreme Technologies Gmbh Einrichtung zur Erzeugung eines Gasvorhangs für plasmabasierte EUV-Strahlungsquellen
US7655925B2 (en) * 2007-08-31 2010-02-02 Cymer, Inc. Gas management system for a laser-produced-plasma EUV light source
US7812329B2 (en) * 2007-12-14 2010-10-12 Cymer, Inc. System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus
US8115900B2 (en) * 2007-09-17 2012-02-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP5339742B2 (ja) * 2008-03-04 2013-11-13 ウシオ電機株式会社 極端紫外光が出射する装置と極端紫外光が導入される装置との接続装置
US7872245B2 (en) 2008-03-17 2011-01-18 Cymer, Inc. Systems and methods for target material delivery in a laser produced plasma EUV light source
KR101652364B1 (ko) 2008-09-11 2016-09-09 에이에스엠엘 네델란즈 비.브이. 방사선 소스 및 리소그래피 장치
JP5312959B2 (ja) * 2009-01-09 2013-10-09 ギガフォトン株式会社 極端紫外光源装置
US8138487B2 (en) * 2009-04-09 2012-03-20 Cymer, Inc. System, method and apparatus for droplet catcher for prevention of backsplash in a EUV generation chamber
US8304752B2 (en) * 2009-04-10 2012-11-06 Cymer, Inc. EUV light producing system and method utilizing an alignment laser
EP2480936B1 (en) 2009-09-25 2015-03-18 ASML Netherlands BV Source collector apparatus, lithographic apparatus and device manufacturing method
US8173985B2 (en) * 2009-12-15 2012-05-08 Cymer, Inc. Beam transport system for extreme ultraviolet light source
US8368039B2 (en) * 2010-04-05 2013-02-05 Cymer, Inc. EUV light source glint reduction system
US9066412B2 (en) * 2010-04-15 2015-06-23 Asml Netherlands B.V. Systems and methods for cooling an optic
EP2561407B1 (en) * 2010-04-22 2014-12-10 ASML Netherlands B.V. Collector mirror assembly and method for producing extreme ultraviolet radiation

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004501491A (ja) * 2000-06-09 2004-01-15 サイマー, インコーポレイテッド 活性ガス及びバッファガス制御を有するプラズマ集束光源
JP2010161092A (ja) * 2009-01-06 2010-07-22 Komatsu Ltd 極端紫外光源装置
WO2010112171A1 (en) * 2009-04-02 2010-10-07 Eth Zurich Extreme ultraviolet light source with a debris-mitigated and cooled collector optics

Also Published As

Publication number Publication date
US20120313016A1 (en) 2012-12-13
TWI576013B (zh) 2017-03-21
WO2012170144A1 (en) 2012-12-13
EP2719261A1 (en) 2014-04-16
TW201251517A (en) 2012-12-16
US9516730B2 (en) 2016-12-06
EP2719261A4 (en) 2015-04-08
JP6043789B2 (ja) 2016-12-14
KR20140036219A (ko) 2014-03-25
JP2014523640A (ja) 2014-09-11

Similar Documents

Publication Publication Date Title
KR101940162B1 (ko) 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법
KR101503897B1 (ko) 극자외선(euv) 포토리소그래피 장치의 챔버간 가스 흐름을 관리하는 시스템
US9000404B2 (en) Systems and methods for optics cleaning in an EUV light source
KR101503894B1 (ko) 레이저 생성 플라즈마 euv 광원용 가스 관리 시스템
KR101703788B1 (ko) 레이저 생성 플라즈마 euv 광원
US20090267005A1 (en) Drive laser delivery systems for euv light source
US9066412B2 (en) Systems and methods for cooling an optic
EP2707099A1 (en) Droplet generator with actuator induced nozzle cleaning
KR102709891B1 (ko) 패싯형 euv 광학 요소
KR102618009B1 (ko) 극자외선 광원용 공급 시스템
CN111316171B (zh) 清洁极紫外光源的腔室内的光学器件的表面
KR102824385B1 (ko) 극자외선 광원을 위한 보호 시스템
US11940736B2 (en) Tin trap device, extreme ultraviolet light generation apparatus, and electronic device manufacturing method
US20230164900A1 (en) Apparatus for and method of accelerating droplets in a droplet generator for an euv source
TW202309992A (zh) 極紫外微影方法

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20131209

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
N231 Notification of change of applicant
PN2301 Change of applicant

Patent event date: 20150129

Comment text: Notification of Change of Applicant

Patent event code: PN23011R01D

A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20170502

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20180409

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20181022

GRNT Written decision to grant
PR0701 Registration of establishment

Comment text: Registration of Establishment

Patent event date: 20190114

Patent event code: PR07011E01D

PR1002 Payment of registration fee

Payment date: 20190114

End annual number: 3

Start annual number: 1

PG1601 Publication of registration
PR1001 Payment of annual fee

Payment date: 20220105

Start annual number: 4

End annual number: 4

PR1001 Payment of annual fee

Payment date: 20230103

Start annual number: 5

End annual number: 5