KR101940162B1 - 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 - Google Patents
레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 Download PDFInfo
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- KR101940162B1 KR101940162B1 KR1020137032594A KR20137032594A KR101940162B1 KR 101940162 B1 KR101940162 B1 KR 101940162B1 KR 1020137032594 A KR1020137032594 A KR 1020137032594A KR 20137032594 A KR20137032594 A KR 20137032594A KR 101940162 B1 KR101940162 B1 KR 101940162B1
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- optical member
- light source
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- volume
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- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/002—Supply of the plasma generating material
- H05G2/0027—Arrangements for controlling the supply; Arrangements for measurements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/008—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
- H05G2/0082—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
- H05G2/0086—Optical arrangements for conveying the laser beam to the plasma generation location
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/156,188 US9516730B2 (en) | 2011-06-08 | 2011-06-08 | Systems and methods for buffer gas flow stabilization in a laser produced plasma light source |
| US13/156,188 | 2011-06-08 | ||
| PCT/US2012/037363 WO2012170144A1 (en) | 2011-06-08 | 2012-05-10 | Systems and methods for buffer gas flow stabilization in a laser produced plasma light source |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20140036219A KR20140036219A (ko) | 2014-03-25 |
| KR101940162B1 true KR101940162B1 (ko) | 2019-01-18 |
Family
ID=47292352
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020137032594A Active KR101940162B1 (ko) | 2011-06-08 | 2012-05-10 | 레이저 생성 플라즈마 광원 내의 완충가스 흐름 안정화를 위한 시스템 및 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9516730B2 (enExample) |
| EP (1) | EP2719261A4 (enExample) |
| JP (1) | JP6043789B2 (enExample) |
| KR (1) | KR101940162B1 (enExample) |
| TW (1) | TWI576013B (enExample) |
| WO (1) | WO2012170144A1 (enExample) |
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| US9390892B2 (en) | 2012-06-26 | 2016-07-12 | Kla-Tencor Corporation | Laser sustained plasma light source with electrically induced gas flow |
| JP6099241B2 (ja) * | 2012-06-28 | 2017-03-22 | ギガフォトン株式会社 | ターゲット供給装置 |
| US8853655B2 (en) * | 2013-02-22 | 2014-10-07 | Kla-Tencor Corporation | Gas refraction compensation for laser-sustained plasma bulbs |
| US8872143B2 (en) | 2013-03-14 | 2014-10-28 | Asml Netherlands B.V. | Target for laser produced plasma extreme ultraviolet light source |
| US8791440B1 (en) * | 2013-03-14 | 2014-07-29 | Asml Netherlands B.V. | Target for extreme ultraviolet light source |
| US8680495B1 (en) * | 2013-03-15 | 2014-03-25 | Cymer, Llc | Extreme ultraviolet light source |
| US9560730B2 (en) | 2013-09-09 | 2017-01-31 | Asml Netherlands B.V. | Transport system for an extreme ultraviolet light source |
| US9557650B2 (en) * | 2013-09-09 | 2017-01-31 | Asml Netherlands B.V. | Transport system for an extreme ultraviolet light source |
| WO2015086232A1 (en) * | 2013-12-09 | 2015-06-18 | Asml Netherlands B.V. | Radiation source device, lithographic apparatus and device manufacturing method |
| US9338870B2 (en) | 2013-12-30 | 2016-05-10 | Asml Netherlands B.V. | Extreme ultraviolet light source |
| US9539622B2 (en) * | 2014-03-18 | 2017-01-10 | Asml Netherlands B.V. | Apparatus for and method of active cleaning of EUV optic with RF plasma field |
| US9155178B1 (en) * | 2014-06-27 | 2015-10-06 | Plex Llc | Extreme ultraviolet source with magnetic cusp plasma control |
| US9544986B2 (en) | 2014-06-27 | 2017-01-10 | Plex Llc | Extreme ultraviolet source with magnetic cusp plasma control |
| US9357625B2 (en) | 2014-07-07 | 2016-05-31 | Asml Netherlands B.V. | Extreme ultraviolet light source |
| JP6393196B2 (ja) * | 2015-01-19 | 2018-09-19 | 浜松ホトニクス株式会社 | レーザ光増幅装置 |
| US9776218B2 (en) | 2015-08-06 | 2017-10-03 | Asml Netherlands B.V. | Controlled fluid flow for cleaning an optical element |
| US10128016B2 (en) * | 2016-01-12 | 2018-11-13 | Asml Netherlands B.V. | EUV element having barrier to hydrogen transport |
| EP3291650B1 (en) * | 2016-09-02 | 2019-06-05 | ETH Zürich | Device and method for generating uv or x-ray radiation by means of a plasma |
| US10149375B2 (en) * | 2016-09-14 | 2018-12-04 | Asml Netherlands B.V. | Target trajectory metrology in an extreme ultraviolet light source |
| KR102536355B1 (ko) * | 2017-01-06 | 2023-05-25 | 에이에스엠엘 네델란즈 비.브이. | 안내 장치 및 관련 시스템 |
| US10955749B2 (en) | 2017-01-06 | 2021-03-23 | Asml Netherlands B.V. | Guiding device and associated system |
| US10165664B1 (en) * | 2017-11-21 | 2018-12-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus for decontaminating windows of an EUV source module |
| US10959318B2 (en) * | 2018-01-10 | 2021-03-23 | Kla-Tencor Corporation | X-ray metrology system with broadband laser produced plasma illuminator |
| NL2022644A (en) * | 2018-03-05 | 2019-09-10 | Asml Netherlands Bv | Prolonging optical element lifetime in an euv lithography system |
| NL2023633A (en) * | 2018-09-25 | 2020-04-30 | Asml Netherlands Bv | Laser system for target metrology and alteration in an euv light source |
| JP7143439B2 (ja) | 2018-11-15 | 2022-09-28 | ギガフォトン株式会社 | 極端紫外光生成装置及び電子デバイスの製造方法 |
| KR102869765B1 (ko) * | 2019-05-17 | 2025-10-13 | 삼성전자주식회사 | 소스 용기용 잔류물 제거 장치, 소스 용기 및 극자외선 노광장치 |
| JP7368984B2 (ja) * | 2019-09-05 | 2023-10-25 | ギガフォトン株式会社 | 極端紫外光生成装置、及び電子デバイスの製造方法 |
| US10923311B1 (en) * | 2019-11-11 | 2021-02-16 | Xia Tai Xin Semiconductor (Qing Dao) Ltd. | Cathode for ion source comprising a tapered sidewall |
| JP2023121488A (ja) | 2022-02-21 | 2023-08-31 | ギガフォトン株式会社 | 極端紫外光生成装置及び電子デバイスの製造方法 |
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| JP2004501491A (ja) * | 2000-06-09 | 2004-01-15 | サイマー, インコーポレイテッド | 活性ガス及びバッファガス制御を有するプラズマ集束光源 |
| JP2010161092A (ja) * | 2009-01-06 | 2010-07-22 | Komatsu Ltd | 極端紫外光源装置 |
| WO2010112171A1 (en) * | 2009-04-02 | 2010-10-07 | Eth Zurich | Extreme ultraviolet light source with a debris-mitigated and cooled collector optics |
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| US6972421B2 (en) * | 2000-06-09 | 2005-12-06 | Cymer, Inc. | Extreme ultraviolet light source |
| US7372056B2 (en) | 2005-06-29 | 2008-05-13 | Cymer, Inc. | LPP EUV plasma source material target delivery system |
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-
2011
- 2011-06-08 US US13/156,188 patent/US9516730B2/en active Active
-
2012
- 2012-05-08 TW TW101116337A patent/TWI576013B/zh active
- 2012-05-10 EP EP12797256.0A patent/EP2719261A4/en not_active Withdrawn
- 2012-05-10 WO PCT/US2012/037363 patent/WO2012170144A1/en not_active Ceased
- 2012-05-10 JP JP2014514465A patent/JP6043789B2/ja active Active
- 2012-05-10 KR KR1020137032594A patent/KR101940162B1/ko active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004501491A (ja) * | 2000-06-09 | 2004-01-15 | サイマー, インコーポレイテッド | 活性ガス及びバッファガス制御を有するプラズマ集束光源 |
| JP2010161092A (ja) * | 2009-01-06 | 2010-07-22 | Komatsu Ltd | 極端紫外光源装置 |
| WO2010112171A1 (en) * | 2009-04-02 | 2010-10-07 | Eth Zurich | Extreme ultraviolet light source with a debris-mitigated and cooled collector optics |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120313016A1 (en) | 2012-12-13 |
| TWI576013B (zh) | 2017-03-21 |
| WO2012170144A1 (en) | 2012-12-13 |
| EP2719261A1 (en) | 2014-04-16 |
| TW201251517A (en) | 2012-12-16 |
| US9516730B2 (en) | 2016-12-06 |
| EP2719261A4 (en) | 2015-04-08 |
| JP6043789B2 (ja) | 2016-12-14 |
| KR20140036219A (ko) | 2014-03-25 |
| JP2014523640A (ja) | 2014-09-11 |
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