KR101732557B1 - 메모리에 에러들을 인젝션하기 위한 방법 및 장치 - Google Patents

메모리에 에러들을 인젝션하기 위한 방법 및 장치 Download PDF

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KR101732557B1
KR101732557B1 KR1020147008424A KR20147008424A KR101732557B1 KR 101732557 B1 KR101732557 B1 KR 101732557B1 KR 1020147008424 A KR1020147008424 A KR 1020147008424A KR 20147008424 A KR20147008424 A KR 20147008424A KR 101732557 B1 KR101732557 B1 KR 101732557B1
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South Korea
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error
memory
error injection
system address
register
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Korean (ko)
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KR20140057369A (ko
Inventor
티오드로스 이그자우
카이 쳉
모한 제이. 쿠마르
조세 에이. 바르가스
고피크리쉬나 잔드히얄라
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인텔 코포레이션
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3698—Environments for analysis, debugging or testing of software

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020147008424A 2011-09-29 2011-09-29 메모리에 에러들을 인젝션하기 위한 방법 및 장치 Expired - Fee Related KR101732557B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2011/053956 WO2013048406A1 (en) 2011-09-29 2011-09-29 Method and apparatus for injecting errors into memory

Publications (2)

Publication Number Publication Date
KR20140057369A KR20140057369A (ko) 2014-05-12
KR101732557B1 true KR101732557B1 (ko) 2017-05-04

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KR1020147008424A Expired - Fee Related KR101732557B1 (ko) 2011-09-29 2011-09-29 메모리에 에러들을 인젝션하기 위한 방법 및 장치

Country Status (8)

Country Link
US (1) US9405646B2 (https=)
JP (1) JP2014531681A (https=)
KR (1) KR101732557B1 (https=)
CN (1) CN103890733B (https=)
BR (1) BR112014007425A2 (https=)
DE (1) DE112011105692T5 (https=)
GB (1) GB2509849B (https=)
WO (1) WO2013048406A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10777294B2 (en) 2016-01-26 2020-09-15 Hewlett Packard Enterprise Development Lp DRAM-level error injection and tracking
US10691572B2 (en) 2017-08-30 2020-06-23 Nvidia Corporation Liveness as a factor to evaluate memory vulnerability to soft errors
CN107729231B (zh) * 2017-09-19 2021-02-02 北京东土科技股份有限公司 一种基于操作系统的故障注入方法及装置
KR102388803B1 (ko) * 2017-11-02 2022-04-20 삼성전자주식회사 반도체 메모리 장치, 이를 포함하는 메모리 시스템 및 반도체 메모리 장치의 동작 방법
CN108959049B (zh) * 2018-06-27 2021-12-17 郑州云海信息技术有限公司 Smm的健壮性和稳定性的测试方法、装置及存储介质
US10922203B1 (en) 2018-09-21 2021-02-16 Nvidia Corporation Fault injection architecture for resilient GPU computing
KR102826233B1 (ko) 2020-06-02 2025-06-26 삼성전자주식회사 메모리 모듈 및 메모리 모듈의 동작 방법
US11983100B2 (en) * 2020-09-29 2024-05-14 Amazon Technologies, Inc. Automated testing of systems and applications
CN112349343A (zh) * 2020-11-06 2021-02-09 海光信息技术股份有限公司 电路结构、芯片以及电子设备
CN115019862B (zh) * 2021-03-04 2026-01-13 瑞昱半导体股份有限公司 静态随机存取存储器的纠错电路的验证方法
CN113064782B (zh) * 2021-03-22 2023-03-24 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
US12135625B2 (en) * 2022-12-27 2024-11-05 Advanced Micro Devices, Inc. Devices, systems, and methods for injecting fabricated errors into machine check architectures
CN118314945A (zh) 2023-01-06 2024-07-09 戴尔产品有限公司 用于错误注入的方法、电子设备和计算机程序产品

Citations (2)

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US20060112307A1 (en) * 2004-11-09 2006-05-25 Marisetty Suresh K System and method for error injection using a flexible program interface field
JP2010225239A (ja) 2009-03-24 2010-10-07 Toshiba Corp 半導体集積回路およびメモリの機能検証方法

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US4759019A (en) * 1986-07-10 1988-07-19 International Business Machines Corporation Programmable fault injection tool
JPH05134018A (ja) * 1991-11-13 1993-05-28 Nec Ibaraki Ltd 擬障方式
JP3512442B2 (ja) * 1993-08-31 2004-03-29 富士通株式会社 記憶装置の試験用エラー発生制御装置
US5671352A (en) * 1995-07-07 1997-09-23 Sun Microsystems, Inc. Error injection to a behavioral model
US5875195A (en) 1997-03-31 1999-02-23 International Business Machines Corporation Method and apparatus for error injection techniques
JPH10312337A (ja) * 1997-05-12 1998-11-24 Kofu Nippon Denki Kk 記憶装置の試験回路
CN100350390C (zh) * 2006-11-29 2007-11-21 哈尔滨工业大学 容错计算机系统的搭接式故障注入装置及方法
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods
US8065573B2 (en) 2007-03-26 2011-11-22 Cray Inc. Method and apparatus for tracking, reporting and correcting single-bit memory errors
US8522080B2 (en) * 2008-03-24 2013-08-27 Emulex Design & Manufacturing Corporation Generation of simulated errors for high-level system validation
US20110161592A1 (en) 2009-12-31 2011-06-30 Nachimuthu Murugasamy K Dynamic system reconfiguration

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060112307A1 (en) * 2004-11-09 2006-05-25 Marisetty Suresh K System and method for error injection using a flexible program interface field
JP2010225239A (ja) 2009-03-24 2010-10-07 Toshiba Corp 半導体集積回路およびメモリの機能検証方法

Also Published As

Publication number Publication date
US20130275810A1 (en) 2013-10-17
BR112014007425A2 (pt) 2017-04-04
DE112011105692T5 (de) 2014-07-24
GB2509849B (en) 2021-02-03
CN103890733B (zh) 2018-05-15
JP2014531681A (ja) 2014-11-27
CN103890733A (zh) 2014-06-25
GB201405276D0 (en) 2014-05-07
GB2509849A (en) 2014-07-16
KR20140057369A (ko) 2014-05-12
WO2013048406A1 (en) 2013-04-04
US9405646B2 (en) 2016-08-02

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