GB2509849B - Method and apparatus for injecting errors into memory - Google Patents

Method and apparatus for injecting errors into memory Download PDF

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Publication number
GB2509849B
GB2509849B GB1405276.5A GB201405276A GB2509849B GB 2509849 B GB2509849 B GB 2509849B GB 201405276 A GB201405276 A GB 201405276A GB 2509849 B GB2509849 B GB 2509849B
Authority
GB
United Kingdom
Prior art keywords
memory
injecting errors
injecting
errors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1405276.5A
Other languages
English (en)
Other versions
GB201405276D0 (en
GB2509849A (en
Inventor
Yigzaw Theodros
Cheng Kai
J Kumar Mohan
A Vargas Jose
Jandhyala Gopikrishna
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of GB201405276D0 publication Critical patent/GB201405276D0/en
Publication of GB2509849A publication Critical patent/GB2509849A/en
Application granted granted Critical
Publication of GB2509849B publication Critical patent/GB2509849B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668—Testing of software
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Prevention of errors by analysis, debugging or testing of software
    • G06F11/3698—Environments for analysis, debugging or testing of software

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Detection And Correction Of Errors (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
GB1405276.5A 2011-09-29 2011-09-29 Method and apparatus for injecting errors into memory Expired - Fee Related GB2509849B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2011/053956 WO2013048406A1 (en) 2011-09-29 2011-09-29 Method and apparatus for injecting errors into memory

Publications (3)

Publication Number Publication Date
GB201405276D0 GB201405276D0 (en) 2014-05-07
GB2509849A GB2509849A (en) 2014-07-16
GB2509849B true GB2509849B (en) 2021-02-03

Family

ID=47996149

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1405276.5A Expired - Fee Related GB2509849B (en) 2011-09-29 2011-09-29 Method and apparatus for injecting errors into memory

Country Status (8)

Country Link
US (1) US9405646B2 (https=)
JP (1) JP2014531681A (https=)
KR (1) KR101732557B1 (https=)
CN (1) CN103890733B (https=)
BR (1) BR112014007425A2 (https=)
DE (1) DE112011105692T5 (https=)
GB (1) GB2509849B (https=)
WO (1) WO2013048406A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10777294B2 (en) 2016-01-26 2020-09-15 Hewlett Packard Enterprise Development Lp DRAM-level error injection and tracking
US10691572B2 (en) 2017-08-30 2020-06-23 Nvidia Corporation Liveness as a factor to evaluate memory vulnerability to soft errors
CN107729231B (zh) * 2017-09-19 2021-02-02 北京东土科技股份有限公司 一种基于操作系统的故障注入方法及装置
KR102388803B1 (ko) * 2017-11-02 2022-04-20 삼성전자주식회사 반도체 메모리 장치, 이를 포함하는 메모리 시스템 및 반도체 메모리 장치의 동작 방법
CN108959049B (zh) * 2018-06-27 2021-12-17 郑州云海信息技术有限公司 Smm的健壮性和稳定性的测试方法、装置及存储介质
US10922203B1 (en) 2018-09-21 2021-02-16 Nvidia Corporation Fault injection architecture for resilient GPU computing
KR102826233B1 (ko) 2020-06-02 2025-06-26 삼성전자주식회사 메모리 모듈 및 메모리 모듈의 동작 방법
US11983100B2 (en) * 2020-09-29 2024-05-14 Amazon Technologies, Inc. Automated testing of systems and applications
CN112349343A (zh) * 2020-11-06 2021-02-09 海光信息技术股份有限公司 电路结构、芯片以及电子设备
CN115019862B (zh) * 2021-03-04 2026-01-13 瑞昱半导体股份有限公司 静态随机存取存储器的纠错电路的验证方法
CN113064782B (zh) * 2021-03-22 2023-03-24 山东英信计算机技术有限公司 一种内存注错自动化系统、使用方法及介质
US12135625B2 (en) * 2022-12-27 2024-11-05 Advanced Micro Devices, Inc. Devices, systems, and methods for injecting fabricated errors into machine check architectures
CN118314945A (zh) 2023-01-06 2024-07-09 戴尔产品有限公司 用于错误注入的方法、电子设备和计算机程序产品

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5671352A (en) * 1995-07-07 1997-09-23 Sun Microsystems, Inc. Error injection to a behavioral model
US5875195A (en) * 1997-03-31 1999-02-23 International Business Machines Corporation Method and apparatus for error injection techniques
US20090177932A1 (en) * 2007-03-26 2009-07-09 Cray Inc. Method and apparatus for tracking, reporting and correcting single-bit memory errors
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4759019A (en) * 1986-07-10 1988-07-19 International Business Machines Corporation Programmable fault injection tool
JPH05134018A (ja) * 1991-11-13 1993-05-28 Nec Ibaraki Ltd 擬障方式
JP3512442B2 (ja) * 1993-08-31 2004-03-29 富士通株式会社 記憶装置の試験用エラー発生制御装置
JPH10312337A (ja) * 1997-05-12 1998-11-24 Kofu Nippon Denki Kk 記憶装置の試験回路
US7587639B2 (en) * 2004-11-09 2009-09-08 Intel Corporation System and method for error injection using a flexible program interface field
CN100350390C (zh) * 2006-11-29 2007-11-21 哈尔滨工业大学 容错计算机系统的搭接式故障注入装置及方法
US8522080B2 (en) * 2008-03-24 2013-08-27 Emulex Design & Manufacturing Corporation Generation of simulated errors for high-level system validation
JP2010225239A (ja) * 2009-03-24 2010-10-07 Toshiba Corp 半導体集積回路およびメモリの機能検証方法
US20110161592A1 (en) 2009-12-31 2011-06-30 Nachimuthu Murugasamy K Dynamic system reconfiguration

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5671352A (en) * 1995-07-07 1997-09-23 Sun Microsystems, Inc. Error injection to a behavioral model
US5875195A (en) * 1997-03-31 1999-02-23 International Business Machines Corporation Method and apparatus for error injection techniques
US7818626B1 (en) * 2007-01-12 2010-10-19 Oracle America, Inc. Memory error injector and associated methods
US20090177932A1 (en) * 2007-03-26 2009-07-09 Cray Inc. Method and apparatus for tracking, reporting and correcting single-bit memory errors

Also Published As

Publication number Publication date
US20130275810A1 (en) 2013-10-17
BR112014007425A2 (pt) 2017-04-04
DE112011105692T5 (de) 2014-07-24
CN103890733B (zh) 2018-05-15
JP2014531681A (ja) 2014-11-27
CN103890733A (zh) 2014-06-25
GB201405276D0 (en) 2014-05-07
GB2509849A (en) 2014-07-16
KR20140057369A (ko) 2014-05-12
WO2013048406A1 (en) 2013-04-04
US9405646B2 (en) 2016-08-02
KR101732557B1 (ko) 2017-05-04

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PCNP Patent ceased through non-payment of renewal fee

Effective date: 20210929