KR101723196B1 - Probe fixing device for display panel inspection - Google Patents

Probe fixing device for display panel inspection Download PDF

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Publication number
KR101723196B1
KR101723196B1 KR1020160109286A KR20160109286A KR101723196B1 KR 101723196 B1 KR101723196 B1 KR 101723196B1 KR 1020160109286 A KR1020160109286 A KR 1020160109286A KR 20160109286 A KR20160109286 A KR 20160109286A KR 101723196 B1 KR101723196 B1 KR 101723196B1
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KR
South Korea
Prior art keywords
block
probe
display panel
fixing
fixing block
Prior art date
Application number
KR1020160109286A
Other languages
Korean (ko)
Inventor
구철환
이두진
김승교
Original Assignee
구철환
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Publication date
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Priority to KR1020160109286A priority Critical patent/KR101723196B1/en
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Publication of KR101723196B1 publication Critical patent/KR101723196B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

A probe fixing apparatus for inspection of a display panel is disclosed. The probe fixation device for a display panel inspection includes a body block having an upper surface that can be in contact with a lower surface of a probe for inspection of a display panel; And a lower surface capable of contacting the probe on the first of the first and second regions of the body block, wherein the lower surface is capable of engaging the body block to fix the first portion of the probe A first fixed block; A second securing block coupled to the first securing block and capable of securing a second portion of the probe; And a third immobilizing block coupled to the body block on the second region to fix the third portion of the probe.

Description

[0001] PROBE FIXING DEVICE FOR DISPLAY PANEL INSPECTION [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe fixing device, and more particularly, to a fixing device capable of fixing a film-type probe used for a display panel inspection.

A liquid crystal display panel (hereinafter referred to as an LCD panel), a plasma display panel (hereinafter referred to as a PDP panel), an active matrix organic panel a plurality of electrode pads for applying an electrical signal may be provided at edge portions of an image display panel such as a light emitting diode display panel (AMOLED panel).

An object to be inspected such as the image display panel may be inspected using a probe having a plurality of signal input lines provided to be in contact with the electrode pads. A film type probe is generally used for the inspection, and a fixing device (probe unit) for fixing the probe is used.

For example, the probe unit may be a display such as a thin film transistor (TFT), a twisted nematic (TN), a super twisted nematic (STN), a color super twisted nematic (CSTN), a double super twisted nematic (DSTN), an organic electroluminescence A test electric signal is applied to the electrode (or pad) of the panel to check whether the display panel operates normally without pixel error.

Korean Patent Laid-Open Publication No. 10-2011-0122900 (November 14, 2011) discloses that the probe portion can be uniformly and uniformly formed at a high density so that the display panel having the high-density fine electrodes arranged therein can be effectively inspected, There is disclosed a probe block for use in a display panel inspection and a probe unit in which a pin miss is reduced during an inspection process due to lack of fluidity.

FIG. 1 is a perspective view of a conventional probe unit disclosed herein. The probe unit 1200 includes a head block 1210, a probe block 1220 and a compression block 1230. The head block 1210 includes a probe block 1220 To move and fix the probe block 1220 up and down such that the probe portion of the probe block 1220 comes into contact with the electrode of the display panel at an appropriate physical pressure. The probe block 1220 includes a probe block body portion 1222 including an inclined projection 1224 and a projection block 1224 coupled to a lower surface of the inclined projection 1224 and extending to project toward the longitudinal end side of the inclined projection 1224, A probe film 1100 which is in contact with the electrode and applies a signal to the probe film 1100 and an upper surface of the oblique protrusion 1224 and which is in contact with the upper surface of the protruded probe film 1100 to support the probe film 1100, Plate < / RTI > The probe block 1220 may further include a fixing block 1250 coupled to the upper surface of the first plate 1242 and fixedly supporting the first plate 1242.

However, in the conventional probe unit, since the probe film 100 is fixed using the probe block 1220 and the compression block 1230, the probe film 100 itself is unevenly fixed have. This is because, since the probe film 100 is fastened by hand using a bolt, it is practically not easy to uniformly fasten a large area of the flexible probe film 100 at a time.

In the case of the conventional probe unit, the signal line of the probe film 100, which can contact the plurality of electrode pads, is formed integrally with the portion where the signal line is in contact with the signal line. If an abnormality occurs in a portion to be in contact (for example, a tilted portion of the probe block 1220), there is a problem that only the portion where the abnormality occurs can not be separated and the probe unit itself must be manufactured again.

SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and it is an object of the present invention to provide a probe card which can be fixed in a detachable manner, And to provide a probe fixing device for a display panel inspection.

According to an aspect of the present invention, there is provided a probe fixing apparatus for testing a display panel, including: a body block having an upper surface that can be brought into contact with a lower surface of a probe for a display panel inspection; And a lower surface capable of contacting the probe on the first of the first and second regions of the body block, wherein the lower surface is capable of engaging the body block to fix the first portion of the probe A first fixed block; A second securing block coupled to the first securing block and capable of securing a second portion of the probe; And a third immobilizing block coupled to the body block on the second region to fix the third portion of the probe.

The probe may be a film type for the display panel inspection or a probe unit used for the display panel inspection.

In one embodiment, the bolt penetrates the lower surface of the body block so that the head of the bolt is fixed to the latching jaw of the body block, and the thread of the bolt is fastened to the screw groove formed in the first fixing block, Block and the first fixed block are combined.

In one embodiment, the first fixing block is formed with a plurality of through holes each having a thread groove formed in a line along the longitudinal axis direction of the first fixing block, and a plurality of bolts penetrate the second fixing block And the threads of the plurality of bolts are fastened to the through holes, respectively, so that the first fixing block and the second fixing block can be combined.

In one embodiment, the body block includes a first body and a second body, and the first body is configured to be detachable from the second body.

In one embodiment, an elastic block for contacting the signal line of the probe and the plurality of electrodes of the display panel may be formed on the upper surface of the first body.

In one embodiment, the elastic block may be made of urethane.

In one embodiment, the elastic block is preferably formed through an insert injection method.

In one embodiment, a groove may be formed on the first area of the upper surface of the body block.

In one embodiment, a first protective block having elasticity may be formed on one surface of the second fixed block facing the second portion of the probe to fix the second portion of the probe.

In one embodiment, a second protective block having elasticity may be formed on one surface of the third fixing block facing the third portion of the probe to fix the third portion of the probe.

Since the film type probe is fixed using a plurality of separate structures, the probe can be uniformly fixed to the fixing device.

The present invention is capable of separating only a problematic part in the case where a problem occurs in a part of a fixing device which is in contact with a signal line of a probe capable of contacting with a plurality of electrode pads of a display panel, It can be removed or repaired or replaced. In addition, since only the problematic portion can be separated and repaired or replaced, it is not necessary to re-manufacture the fixing device itself, and the cost and time due to repairs or replacement of the fixing device itself can be reduced.

The present invention can form an elastic block through an insert injection method, so that it is easy to manufacture and shorten a manufacturing time compared with a conventional method of adhering an elastic block.

1 is a perspective view of a conventional probe unit.
2A is a side view for explaining a body block according to an embodiment of the present invention.
2B is a plan view illustrating a body block according to an embodiment of the present invention.
3A is a side view for explaining a first fixing block according to an embodiment of the present invention.
3B is a plan view for explaining a first fixing block according to an embodiment of the present invention.
4 is a side view for explaining a state where a body block and a first fixing block are combined according to an embodiment of the present invention.
5A is a side view for explaining a second fixing block according to an embodiment of the present invention.
5B is a plan view for explaining a second fixing block according to an embodiment of the present invention.
FIG. 6 is a side view for explaining a state where a body block, a first fixing block, and a second fixing block according to an embodiment of the present invention are coupled.
7A is a side view for explaining a third fixed block according to an embodiment of the present invention.
7B is a plan view for explaining a third fixing block according to the embodiment of the present invention.
8 is a side view for explaining a state where the body block, the first fixing block, the second fixing block, and the third fixing block according to the embodiment of the present invention are coupled.
9 is a view for explaining a probe fixing apparatus for a display panel inspection according to an embodiment of the present invention.
10 is a view for explaining a probe fixing apparatus for inspection of a display panel according to an embodiment of the present invention.

While the invention is susceptible to various modifications and alternative forms, specific embodiments thereof are shown by way of example in the drawings and will herein be described in detail. It should be understood, however, that the invention is not intended to be limited to the particular embodiments, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

Hereinafter, a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings. Wherein like reference numerals refer to like elements throughout.

FIG. 2A is a side view illustrating a body block according to an embodiment of the present invention, FIG. 2B is a plan view illustrating a body block according to an embodiment of the present invention, FIG. FIG. 3 is a plan view for explaining a first fixing block according to an embodiment of the present invention. FIG. 4 is a side view illustrating a state where a body block and a first fixing block are combined according to an embodiment of the present invention FIG. 5A is a side view for explaining a second fixing block according to an embodiment of the present invention, FIG. 5B is a plan view for explaining a second fixing block according to an embodiment of the present invention, and FIG. 6 is a side view for explaining a state in which the body block, the first fixing block and the second fixing block are coupled according to the embodiment of the present invention. FIG. 7A is a side view for explaining a third fixing block according to the embodiment of the present invention 7B is a side view, FIG. 8 is a plan view illustrating a third fixed block according to an embodiment of the present invention. FIG. 8 is a view illustrating a state in which the body block, the first fixed block, the second fixed block, FIG. 9 is a view for explaining a probe fixing apparatus for a display panel inspection according to an embodiment of the present invention, and FIG. 10 is a view for explaining a probe fixing apparatus for testing a display panel according to an embodiment of the present invention. FIG.

1 to 10, a probe fixing apparatus 1000 for a display panel inspection according to an embodiment of the present invention includes a body block 100, a first fixing block 200, a second fixing block 300, 3 fixing block 400 and an elastic block 500. [ For example, the body block 100, the first fixed block 200, the second fixed block 300, and the third fixed block 400 may be made of aluminum.

The body block 100 may have an upper surface that can be in contact with a lower surface of a probe for a display panel inspection. The body block 100 may include a first body 110 and a second body 120 and the first body 110 may be detachably attached to the second body 120. This is because when a problem occurs in a portion of the first body 110 which is in contact with a signal line of a probe capable of contacting with a plurality of electrode pads of the display panel or a problem occurs in the elastic block 500, ) Can be separated for repair or replacement. The first body 110 and the second body 120 may be detachably attached to each other by a bolt fastening method or the like, but the detachable attachment method is not limited thereto.

A stable contact between the signal line of the probe and a plurality of electrodes of the display panel and a stable contact between the signal line of the probe and a plurality of electrodes of the display panel are provided at one end of the upper surface of the first body 110 And an elastic block 500 for correcting the flatness when the probe is in contact with the signal line. A contact terminal for contacting the plurality of electrodes is formed on a signal line of the probe, and the contact terminal and the plurality of electrodes can be electrically connected by being in contact with each other. Stable contact between the signal line of the probe and a plurality of electrodes of the display panel can be achieved by the elastic block 500, so that a stable lighting test for inspection of the display panel can be performed.

The elastic block 500 may be formed of a flexible material, for example, urethane having insulation and flexibility. The shore hardness of the urethane is preferably 50 to 100 [pts] for stable contact between the signal line of the probe and a plurality of electrodes of the display panel.

In the case of using urethane, the elastic block 500 can be formed by an insert injection method, which is easy to manufacture and can significantly reduce the defective rate that may occur during manufacture. Since the conventional method of manufacturing the elastic block 500 and manually attaching the elastic block 500 to the upper end of the first body 110 is used, the operation time is long and the defect rate due to the operation is high. However, This problem can be solved when the elastic block 500 is formed.

On the first area of the upper surface of the body block 100, a groove 102 capable of receiving a chip disposed on the lower surface of the probe is formed. The chips can be protected by being received in the grooves 102.

The first area of the body block 100 refers to a certain area of the upper surface of the body block 100 that is close to the part where the probe contacts the pads of the display panel and the second area of the body block 100 corresponds to the first And may be a region of the upper surface of the body block 100 that is spaced from the portion where the probe can contact the pads of the display panel as compared to the first region.

A coupling guide protrusion 106 is formed at one end of the upper surface of the second body 120 of the body block 100 (a portion for inputting an input signal for testing in the probe) 106 and then fixed on the input projection 106 by means of a coupling means 108. [ The engaging guide projection 106 and the engaging means 108 can be coupled through a screw fastening method. For example, a bolt may be used as the coupling means 108 and the bolt may be fastened to the coupling guide projection 106 so that the probe can be fixed by the coupling guide projection 106 and the coupling means 108.

The first immobilizing block 200 may have a first surface of the upper surface of the body block 100 and a lower surface of the second surface that can contact the probe on the first surface. The first immobilizing block 200 may be coupled to the body block 100 to immobilize the first portion of the probe.

The body block 100 and the first fixed block 200 are coupled with each other by bolts passing through the lower surface of the body block 100 so that the head of the bolt is fixed to the locking protrusion 112 of the body block 100, It is preferable that the thread of the bolt is fastened to the thread groove 204 to which the thread of the bolt formed in the first fixing block 200 can be fastened so that the body block 100 and the first fixing block 200 are coupled . Since the head of the bolt is wider than the body of the bolt in which the thread is formed, the bolt penetrates from the upper surface of the first fixing block 200, so that the body block 100 and the first fixing block 200 are coupled The space itself through which the bolt can penetrate is insufficient to fix the probe in the space of the upper surface of the first fixed block 200 (the portion where the probe is fixed on the inclined surface of the body block 100; the second portion) Because. In order to fix the probe uniformly, it is preferable that the number of bolts that can penetrate the first fixing block 200 is larger. Therefore, in order to increase the number of bolts passing through the first fixing block 200, the bolt penetrates the lower surface of the body block 100 to uniformly fix the probe. The body block 100 and the first fixing block 200 are respectively provided with through holes 116 and 204 which can be fastened to the threads of the bolts in order to engage with the bolts.

On the upper surface of the body block 100, two first projections 104 for facilitating engagement with the first fixed block 200 are formed on both sides of the first region of the upper surface, Two first projection insertion holes 206 into which the first projection 104 can be inserted can be formed so as to correspond to a position where the first projection 104 is formed. The first protrusion 104 is inserted into the first protrusion insertion hole 206 before the body block 100 and the first fixing block 200 are fastened by bolts so that the first fixing block 200 is fastened And the fastening operation can be performed easily.

The second immobilizing block 300 may be coupled to the first immobilizing block 200 and may fix the second portion of the probe protruding to be in contact with the pads of the display panel. For example, the first fixing block 200 has a plurality of through holes 202, each having a thread groove formed in a line along the longitudinal axis direction of the first fixing block 200, and the plurality of bolts are fixed to the second fixing The first fixing block 200 and the second fixing block 300 can be coupled through the block 300 and the threads of the plurality of bolts are fastened to the through holes 202, respectively. Since the plurality of through holes 202 are formed in a row, the probe can be more uniformly fixed. The number of the plurality of through holes 202 can be changed.

For example, on the upper surface of the first fixed block 200, two second projections 208 for facilitating engagement with the second fixed block 300 are formed on both sides of the upper surface, The second protrusion insertion holes 304 into which the second protrusions 208 can be inserted may be formed in the second protrusions 300 corresponding to the positions where the second protrusions 208 are formed. The second protrusion 208 is inserted into the second protrusion insertion hole 304 before the first fixing block 200 and the second fixing block 300 are bolted together so that the second fixing block 300 is accurately positioned And the fastening operation can be carried out with ease. In addition, a groove 210 is formed on the lower surface of the first fixing block 200, and the IC chip arranged in the probe can be accommodated in the groove 210. The probe can be fixed through the first fixing block 200 without damaging the IC chip disposed on the probe.

For example, one surface of the second fixing block 300 facing the second portion of the probe may have elasticity to prevent the second portion of the probe from being damaged by an external force to fix the second portion of the probe. The first protection block 306 may be formed.

The third immobilizing block 400 may be coupled with the body block 100 on the second region to fix the third portion of the probe. The fixed block 400 and the body block 100 may be coupled through a bolt fastening method. For example, the body block 100 is formed with a through hole 122 through which a thread of a bolt can be fastened, and a thread of a bolt is fastened to the third fixing block 400 so as to correspond to a position where the through hole 122 is formed The through hole 402 is formed.

For example, in order to fix the third portion of the probe, one surface of the third fixing block 400 facing the third portion of the probe may have elasticity that can prevent the third portion of the probe from being damaged by external force The second protection block 308 may be formed.

The first portion of the probe means a portion of the upper surface of the second body that is in contact with the probe on the first region and the second portion of the upper surface of the second body means the portion of the upper surface of the second body on which the probe is fixed on the inclined surface, And the third portion refers to the portion of the upper surface of the second body where the probe contacts the second region.

The present invention can partially fix the probe through the first fixed block 200, the second fixed block 300, and the third fixed block 400 without fixing the probe on the body block 100 at one time It is possible to prevent a problem that may occur when fixing at one time (for example, a case where a part of the probe is fixed unevenly by being tightened more by the bolt).

While the invention has been shown and described with reference to certain preferred embodiments thereof, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined by the appended claims. Accordingly, the true scope of the present invention should be determined by the following claims.

1000: probe fixing device for display panel inspection
100: body block 200: first fixed block
300: second fixing block 400: third fixing block
500: elastic block

Claims (11)

A body block having an upper surface that can be in contact with a lower surface of a probe for a display panel inspection;
And a lower surface capable of contacting the probe on the first of the first and second regions of the body block, wherein the lower surface is capable of engaging the body block to fix the first portion of the probe A first fixed block;
A second securing block coupled to the first securing block and capable of securing a second portion of the probe; And
And a third securing block coupled to the body block on the second region to fix a third portion of the probe.
The method according to claim 1,
Wherein a bolt is passed through a lower surface of the body block so that a head of the bolt is fixed to a latching jaw of the body block and a screw thread of the bolt is fastened to a screw groove formed in the first fixing block, Wherein the fixed block is coupled.
The method according to claim 1,
Wherein the first fixing block is formed with a plurality of through holes each having a thread groove formed in a line along the longitudinal axis direction of the first fixing block,
Wherein a plurality of bolts pass through the second fixing block and the threads of the plurality of bolts are fastened to the through holes, respectively, so that the first fixing block and the second fixing block are engaged.
The method according to claim 1,
The body block includes:
A first body and a second body,
Wherein the first body is configured to be detachable from the second body.
5. The method of claim 4,
And an elastic block for contact between the signal line of the probe and a plurality of electrodes of the display panel is formed on the upper surface of the first body.
6. The method of claim 5,
Wherein the elastic block is made of urethane.
The method according to claim 6,
Wherein the elastic block is formed through an insert injection method.
The method according to claim 1,
Wherein a groove is formed in a first area of the upper surface of the body block to receive a chip disposed on the probe.
The method according to claim 6,
Wherein the shore hardness of the urethane is in the range of 50 to 100.
The method according to claim 1,
And a first protective block having elasticity is further formed on one surface of the second fixing block facing the second portion of the probe to fix the second portion of the probe.
The method according to claim 1,
And a second protection block having elasticity is further formed on one surface of the third fixing block facing the third portion of the probe to fix the third portion of the probe.
KR1020160109286A 2016-08-26 2016-08-26 Probe fixing device for display panel inspection KR101723196B1 (en)

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Application Number Priority Date Filing Date Title
KR1020160109286A KR101723196B1 (en) 2016-08-26 2016-08-26 Probe fixing device for display panel inspection

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Application Number Priority Date Filing Date Title
KR1020160109286A KR101723196B1 (en) 2016-08-26 2016-08-26 Probe fixing device for display panel inspection

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200461758Y1 (en) * 2011-12-12 2012-08-03 주식회사 프로이천 Probe block
KR101235076B1 (en) * 2012-12-05 2013-02-21 주식회사 프로이천 Film type probe card
KR101598604B1 (en) * 2014-10-24 2016-02-29 (주) 루켄테크놀러지스 Film type prove unit
KR20160048337A (en) * 2014-10-24 2016-05-04 (주) 루켄테크놀러지스 Film type prove unit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR200461758Y1 (en) * 2011-12-12 2012-08-03 주식회사 프로이천 Probe block
KR101235076B1 (en) * 2012-12-05 2013-02-21 주식회사 프로이천 Film type probe card
KR101598604B1 (en) * 2014-10-24 2016-02-29 (주) 루켄테크놀러지스 Film type prove unit
KR20160048337A (en) * 2014-10-24 2016-05-04 (주) 루켄테크놀러지스 Film type prove unit

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