KR101528709B1 - depositon crucible for improving evaporation uniformity - Google Patents
depositon crucible for improving evaporation uniformity Download PDFInfo
- Publication number
- KR101528709B1 KR101528709B1 KR1020140132000A KR20140132000A KR101528709B1 KR 101528709 B1 KR101528709 B1 KR 101528709B1 KR 1020140132000 A KR1020140132000 A KR 1020140132000A KR 20140132000 A KR20140132000 A KR 20140132000A KR 101528709 B1 KR101528709 B1 KR 101528709B1
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- KR
- South Korea
- Prior art keywords
- nozzle
- unit
- accommodating
- heat transfer
- deposition
- Prior art date
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/06—Metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/12—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the method of spraying
Abstract
Description
The present invention relates to a vapor deposition vessel for improving the uniformity of vapor deposition, and more particularly, to a vapor deposition vessel which minimizes the temperature difference in the longitudinal direction in the vapor deposition vessel, thereby uniformizing the amount of organic matter vaporized along the longitudinal direction, To a deposition vessel which improves the deposition uniformity which prevents the occurrence of a clogging phenomenon on the nozzle side by increasing the temperature difference of the deposition chamber.
Recently, a variety of thin film patterns are formed for the fabrication of semiconductor or flat panel displays. Such thin film patterns can be implemented by a deposition process or a photolothography process.
Here, unless there are special circumstances, the deposition process is mainly used in consideration of the manufacturing cost. The thin film deposition process can be roughly divided into physical vapor deposition (PVD) and chemical vapor deposition (CVD) . Among them, physical vapor deposition is a method of depositing a deposition material on a substrate surface by physically changing a state of a gas state to a solid state by moving a deposition material to be deposited to a substrate surface in a gaseous state, Various thin films can be formed, and it is widely used because it can be mass-produced by a relatively simple process.
Here, a deposition vessel such as an organic material crucible is mainly used as a device for changing the deposition material to a gaseous state, and the deposition material is vaporized or sublimated by filling the deposition material such as organic material therein and heating it.
For example, when the temperature at which the vaporization or sublimation starts is 300 ° C and A is used, when the temperature of the organic material crucible reaches 300 ° C, A is spouted through the nozzle at the top of the organic material crucible in a vaporized state, As the temperature increases, the amount of A ejected increases more and more.
In this process, the vaporized organic material is sprayed onto the substrate side through the nozzle on the top of the organic crucible and deposited on the substrate. Here, in the organic material crucible, the gaseous organic material is liquefied again by absorbing the energy to the surroundings. In particular, this phenomenon often occurs in the nozzle connecting the inside and the outside of the organic material crucible. That is, when the organic material is liquefied or sublimated in the nozzle, the inner diameter of the nozzle is reduced to reduce the amount of organic matter injected toward the substrate side, which is called "clogging phenomenon ".
The amount of organic matter sprayed from some nozzles causing such clogging phenomenon is significantly smaller than the amount of organic matter sprayed from other nozzles where no clogging phenomenon occurs, thereby causing a problem of inducing the formation of an uneven thin film layer.
On the other hand, in addition to the above-mentioned clogging phenomenon, a temperature change in the longitudinal direction of the organic crucible at the upper portion or the lower portion of the organic material crucible also causes a problem of inducing the formation of a nonuniform thin film layer.
That is, as described above, the organic material crucible is vaporized according to the temperature to change the amount of the organic material deposited on the substrate side. For example, when the temperature of the material A is 300 °, an ejection amount of 0.1 g / , A discharge amount of 1 g / min is generated and a discharge amount of 2 g / min is generated when the temperature is 320 °, the temperature on the left side is 300 °, the temperature on the center side is 310 °, Assuming that the temperature is maintained at 320 °, the thickness of the thin film layer on the substrate becomes thicker from the left to the right as there is a significant difference in the amount of ejection from the left to the right.
Such a clogging phenomenon and a temperature deviation in the organic material crucible may be a main cause of the formation of a nonuniform thin film layer, and studies are under way to solve this problem.
SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a deposition container for improving deposition uniformity which can improve deposition uniformity by preventing clogging phenomenon and temperature deviation in the longitudinal direction of an organic material crucible. .
According to an aspect of the present invention, there is provided a deposition vessel for vaporizing or sublimating an organic material contained therein and injecting the organic material into a substrate side, comprising: a nozzle unit having a plurality of nozzles along a longitudinal direction; An accommodating portion accommodating an organic material therein and being spaced apart from the nozzle portion so as to form a heating space in which organic substances are vaporized or sublimated between the nozzle portion and the accommodating portion; And a connection part interposed between the nozzle part and the accommodating part to connect the nozzle part and the accommodating part so as to lower the heat transfer between the nozzle part and the accommodating part and to finish the heating space from outside, Is achieved by an improved deposition vessel.
Here, it is preferable that the heat transfer coefficient of the nozzle portion and the accommodation portion is larger than the heat transfer coefficient of the connection portion.
Also, the heat transfer coefficient of the nozzle portion and the receiving portion is set to 50 W / m ° K to 410 W / m ° K, and the heat transfer coefficient of the connection portion is set to 14 W / m ° K to 25 W / m ° K .
The nozzle portion and the receiving portion may be formed of tantalum, copper, aluminum, or tungsten, and the connecting portion may be formed of titanium, stainless steel, or inconel.
The apparatus may further include a heating unit for heating the organic material contained in the receiving unit.
It is preferable that the heating unit is provided with a plurality of heating units for heating the nozzle unit and the accommodation unit so that the temperature of the nozzle unit is higher than the temperature of the accommodation unit.
In addition, it is preferable that the heating unit heats the nozzle unit at a vaporization temperature or sublimation temperature of the organic substance contained in the accommodation unit.
And a reinforcing member mounted on at least one of the nozzle unit and the accommodation unit to correct a heat transfer coefficient of at least one of the nozzle unit and the accommodation unit, .
It is preferable that a plurality of the reinforcing members are arranged parallel to each other along the width direction of the nozzle portion or the accommodating portion.
The nozzle portion, the connection portion, and the receiving portion may be formed of titanium, stainless steel, or inconel, and the reinforcing member may be formed of tantalum, copper, aluminum, or tungsten.
Preferably, the wall thickness of the connecting portion is smaller than the wall thickness of the nozzle portion or the wall portion of the receiving portion.
It is preferable that at least one end of the connection portion has a reduced thickness along a direction approaching the accommodation portion or the nozzle portion so that the contact area between the accommodation portion and the nozzle portion is reduced.
Preferably, at least one of the end portion of the receiving portion and the end portion of the nozzle portion has a reduced thickness along a direction approaching the connecting portion so that the contact area with the connecting portion decreases.
According to the present invention, there is provided a vapor deposition container that prevents clogging phenomenon and prevents the formation of a temperature variation in the longitudinal direction of the vapor deposition container, thereby improving the vapor deposition uniformity.
Further, by controlling the width of the connecting portion, the heat transfer between the receiving portion and the nozzle portion can be further reduced.
In addition, it is possible to further reduce the heat transfer between the receiving portion and the nozzle portion by adjusting the contact area between the connecting portion and the receiving portion or between the connecting portion and the nozzle portion.
Further, by heating the nozzle unit and the accommodation unit, the nozzle unit and the accommodation unit can maintain different temperatures.
Further, the heat transfer coefficient of the nozzle portion or the accommodation portion can be further increased by attaching the reinforcing member to the nozzle portion or the accommodation portion, and the temperature deviation in the nozzle portion or the accommodation portion can be reduced by selecting an appropriate reinforcing member.
1 is a view schematically showing a deposition apparatus in which a deposition vessel is used,
2 is a perspective view schematically showing a deposition container for improving deposition uniformity according to the first embodiment of the present invention,
FIG. 3 is a cross-sectional view schematically showing a deposition container for improving deposition uniformity according to FIG. 1,
FIGS. 4 and 5 are cross-sectional views schematically showing a modification of the deposition container for improving the deposition uniformity according to FIG. 1,
6 is a perspective view schematically showing a deposition container for improving deposition uniformity according to a second embodiment of the present invention,
7 is a cross-sectional view schematically showing a deposition container for improving deposition uniformity according to FIG.
Prior to the description, components having the same configuration are denoted by the same reference numerals as those in the first embodiment. In other embodiments, configurations different from those of the first embodiment will be described do.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a deposition container for improving deposition uniformity according to a first embodiment of the present invention will be described in detail with reference to the accompanying drawings.
FIG. 2 is a perspective view schematically showing a deposition container for improving deposition uniformity according to the first embodiment of the present invention, and FIG. 3 is a cross-sectional view of the vapor deposition apparatus shown in FIG. 1 FIG. 2 is a cross-sectional view schematically showing a deposition container for improving the deposition uniformity according to FIG.
Referring to FIGS. 1 to 3, the
The
That is, since the
In the first embodiment of the present invention, the
The
In the first embodiment of the present invention, the
The
In the first embodiment of the present invention, the
Hereinafter, the coupling relationship between the
According to the first embodiment of the present invention, the heat transfer in the longitudinal direction is promoted and the heat transfer in the height direction is lowered. In order to realize this, in the
Here, promoting the heat transfer in the longitudinal direction is to keep the amount of organic matter O vaporized or sublimated along the longitudinal direction substantially uniform. As described above, since the amount of the organic material O to be vaporized or sublimated is sensitive to temperature, if the temperature varies along the longitudinal direction, the thickness of the thin film deposited on the substrate S also fluctuates, thereby promoting heat transfer in the longitudinal direction It is important to keep the temperature in the longitudinal direction substantially uniform.
The lowering of heat transfer in the height direction is to generate a large temperature difference between the
The heat transfer coefficient in the
Here, the
Hereinafter, a vapor deposition container provided with a material having a low heat transfer coefficient and having a low heat transfer capability, a vapor deposition container provided with a material having a low heat transfer coefficient and having a low heat transfer capability, and a
Table 1 is a table showing the temperature at each site in a low-heat-transferable deposition vessel provided with a low heat transfer coefficient. The temperature difference between the upper and lower parts is kept as large as 40 °, so that the risk of clogging is lowered. However, the uniformity of the amount of vaporized or sublimed organic matter (O) Falls.
Table 2 is a table showing the temperature at each site in a deposition vessel having a high heat transfer coefficient and having a high heat transfer coefficient. The temperature deviation in the right and left direction is small in the lower part where the organic material is disposed and vaporized or sublimated, so that the uniformity of the vaporized or sublimed organic matter can be maintained well. However, the temperature difference between the upper part and the lower part is about 20 °, so that the risk of clogging is high.
Table 3 is a table showing the temperatures at respective portions of the
FIGS. 4 and 5 are cross-sectional views schematically showing a modification of the vapor deposition container for improving the deposition uniformity according to FIG.
4, in the first embodiment of the present invention, the wall thickness of the
Even if the same material is provided, the heat transfer ability is lowered in a thin thickness direction, and the heat transfer ability is improved in a thick thickness direction. By adjusting the thickness of the connection part made of different materials and the thickness of the nozzle part, The heat transfer in the height direction can be further reduced.
5, in the first embodiment of the present invention, the contact area between the
That is, at least one of the upper end portion and the lower end portion of the
Alternatively, at least one of the end of the
The
The
According to the first embodiment of the present invention, a plurality of
The
Next, a
FIG. 6 is a perspective view schematically showing a deposition container for improving deposition uniformity according to a second embodiment of the present invention, and FIG. 7 is a cross-sectional view schematically showing a deposition container for improving deposition uniformity according to FIG.
Referring to FIG. 6 or FIG. 7, the
Since the
However, there is a difference in the material aspects from the first embodiment, which will be described later.
Since the
The reinforcing
The reinforcing
The reinforcing
In the second embodiment of the present invention, the reinforcing
The heat transfer coefficient in the
That is, the
Meanwhile, in the second embodiment of the present invention, the
In addition, the materials of the
Next, a deposition container (not shown) for improving deposition uniformity according to the third embodiment of the present invention will be described.
A deposition vessel (not shown) for improving deposition uniformity according to the third embodiment of the present invention reduces the heat transfer between the nozzle portion and the accommodating portion through shape modification of at least one of the nozzle portion, the accommodating portion, A nozzle portion, a receiving portion, a connecting portion, and a heating portion.
Here, since the shape in the third embodiment of the present invention is substantially similar to the shape described in the modification of the first embodiment, detailed description is omitted here.
However, in the modification of the first embodiment, at least one of the
Here, the nozzle portion, the receiving portion, and the connecting portion may be formed of any one of titanium, stainless steel, and tantalum.
The scope of the present invention is not limited to the above-described embodiments, but may be embodied in various forms of embodiments within the scope of the appended claims. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the appended claims.
100:
120: accommodating portion 130:
140:
200:
220: receptacle 230: connection
250: reinforcing member
Claims (13)
A nozzle unit having a plurality of nozzles along the longitudinal direction;
An accommodating portion accommodating an organic material therein and being spaced apart from the nozzle portion so as to form a heating space in which organic substances are vaporized or sublimated between the nozzle portion and the accommodating portion;
A connecting portion interposed between the nozzle portion and the accommodating portion to connect the nozzle portion and the accommodating portion so as to reduce heat transfer between the nozzle portion and the accommodating portion, and to close the heating space from the outside; And
Wherein at least one of the nozzle portion and the accommodating portion includes a reinforcing member mounted on at least one of the nozzle portion and the accommodating portion to correct a heat transfer coefficient of at least one of the nozzle portion and the accommodating portion, Lt; / RTI >
Wherein a heat transfer coefficient of the nozzle portion and the accommodation portion is greater than a heat transfer coefficient of the connection portion.
Wherein the heat transfer coefficient of the nozzle portion and the receiving portion is set at 50 W / m ° K to 410 W / m ° K, and the heat transfer coefficient of the connection portion is set at 14 W / m ° K to 25 W / m ° K A deposition vessel with improved uniformity.
Wherein the nozzle portion and the receiving portion are made of tantalum, copper, aluminum, or tungsten, and the connecting portion is made of titanium, stainless steel, or inconel, and the deposition uniformity is improved.
And a heating unit heating the organic material accommodated in the accommodating unit.
Wherein the heating unit is provided with a plurality of heating units each for heating the nozzle unit and the accommodating unit so that the temperature of the nozzle unit is higher than the temperature of the accommodating unit.
Wherein the heating unit improves the deposition uniformity by heating the nozzle unit at a temperature higher than the vaporization temperature or the sublimation temperature of the organic substance contained in the accommodation unit.
Wherein a plurality of the reinforcing members are disposed parallel to each other along the width direction of the nozzle portion or the accommodating portion.
Wherein the nozzle portion, the connecting portion, and the receiving portion are formed of titanium, stainless steel, or inconel, and the reinforcing member is made of tantalum, copper, aluminum, or tungsten, and the deposition uniformity is improved.
Wherein the thickness of the wall portion of the connection portion is smaller than the thickness of the wall portion of the nozzle portion or the wall portion of the receiving portion.
Wherein at least one end portion of the connection portion has a uniform thickness uniformity which decreases along a direction approaching the accommodation portion or the nozzle portion so that a contact area with the accommodation portion or the nozzle portion is reduced.
Wherein at least one of an end portion of the receiving portion and an end portion of the nozzle portion has a reduced thickness along a direction close to the connecting portion so that the contact area with the connecting portion is reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140132000A KR101528709B1 (en) | 2014-09-30 | 2014-09-30 | depositon crucible for improving evaporation uniformity |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020140132000A KR101528709B1 (en) | 2014-09-30 | 2014-09-30 | depositon crucible for improving evaporation uniformity |
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KR101528709B1 true KR101528709B1 (en) | 2015-06-16 |
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KR1020140132000A KR101528709B1 (en) | 2014-09-30 | 2014-09-30 | depositon crucible for improving evaporation uniformity |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20190012480A (en) | 2017-07-27 | 2019-02-11 | 주식회사 선익시스템 | Furnace of Deposition Chamber |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101084333B1 (en) * | 2010-01-12 | 2011-11-16 | 주식회사 에스에프에이 | Deposition source for manufacturing organic electroluminescence display panel and deposition apparatus having the same |
KR20120078055A (en) * | 2010-12-31 | 2012-07-10 | 엘지디스플레이 주식회사 | Crusible furnace for fabricating the oled |
KR20130030131A (en) * | 2011-09-16 | 2013-03-26 | 주식회사 야스 | Linear source for large area substrate |
JP2014047365A (en) * | 2012-08-29 | 2014-03-17 | Canon Tokki Corp | Evaporation source |
-
2014
- 2014-09-30 KR KR1020140132000A patent/KR101528709B1/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101084333B1 (en) * | 2010-01-12 | 2011-11-16 | 주식회사 에스에프에이 | Deposition source for manufacturing organic electroluminescence display panel and deposition apparatus having the same |
KR20120078055A (en) * | 2010-12-31 | 2012-07-10 | 엘지디스플레이 주식회사 | Crusible furnace for fabricating the oled |
KR20130030131A (en) * | 2011-09-16 | 2013-03-26 | 주식회사 야스 | Linear source for large area substrate |
JP2014047365A (en) * | 2012-08-29 | 2014-03-17 | Canon Tokki Corp | Evaporation source |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20190012480A (en) | 2017-07-27 | 2019-02-11 | 주식회사 선익시스템 | Furnace of Deposition Chamber |
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