KR101528651B1 - 진단 가능한 홀 센서 - Google Patents

진단 가능한 홀 센서 Download PDF

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Publication number
KR101528651B1
KR101528651B1 KR1020107021864A KR20107021864A KR101528651B1 KR 101528651 B1 KR101528651 B1 KR 101528651B1 KR 1020107021864 A KR1020107021864 A KR 1020107021864A KR 20107021864 A KR20107021864 A KR 20107021864A KR 101528651 B1 KR101528651 B1 KR 101528651B1
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KR
South Korea
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diagnostic
hall
sensor device
sensor
probe
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Expired - Fee Related
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KR1020107021864A
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English (en)
Korean (ko)
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KR20110021718A (ko
Inventor
안드레아스 포이케르트
볼프강 클리만넬
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젯트에프 프리드리히스하펜 아게
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
KR1020107021864A 2008-04-02 2009-04-02 진단 가능한 홀 센서 Expired - Fee Related KR101528651B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102008000943.1A DE102008000943B4 (de) 2008-04-02 2008-04-02 Diagnostizierbarer Hallsensor und Verfahren zur Funktionsdiagnose einer Hall-Sensoreinrichtung
DE102008000943.1 2008-04-02
PCT/DE2009/050012 WO2009121352A2 (de) 2008-04-02 2009-04-02 Diagnostizierbarer hallsensor

Publications (2)

Publication Number Publication Date
KR20110021718A KR20110021718A (ko) 2011-03-04
KR101528651B1 true KR101528651B1 (ko) 2015-06-12

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Application Number Title Priority Date Filing Date
KR1020107021864A Expired - Fee Related KR101528651B1 (ko) 2008-04-02 2009-04-02 진단 가능한 홀 센서

Country Status (7)

Country Link
US (1) US8362764B2 (https=)
EP (1) EP2260315A2 (https=)
JP (1) JP5599112B2 (https=)
KR (1) KR101528651B1 (https=)
CN (1) CN101983340A (https=)
DE (1) DE102008000943B4 (https=)
WO (1) WO2009121352A2 (https=)

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US8754640B2 (en) * 2012-06-18 2014-06-17 Allegro Microsystems, Llc Magnetic field sensors and related techniques that can provide self-test information in a formatted output signal
EP2985619B1 (en) * 2012-06-18 2023-05-10 Allegro MicroSystems, LLC Magnetic field sensors and related techniques that can provide self-test information
DE102012212272A1 (de) 2012-07-13 2014-01-16 Robert Bosch Gmbh Hall-Sensor
WO2014015219A2 (en) 2012-07-19 2014-01-23 Colorado Seminary, Which Owns And Operates The University Of Denver Crossed-loop resonators
WO2014043513A2 (en) * 2012-09-14 2014-03-20 Colorado Seminary, Which Owns And Operates The University Of Denver Hall probe, epr coil driver and epr rapid scan deconvolution
US12000920B2 (en) 2012-09-14 2024-06-04 University Of Denver Hall probe simulator circuit
DE102012019995B4 (de) * 2012-10-12 2015-02-19 Audi Ag Verfahren zum Betreiben einer Bedienvorrichtung für ein Kraftfahrzeug und Bedienvorrichtung
CN103075514A (zh) * 2012-11-26 2013-05-01 合肥邦立电子股份有限公司 一种高精度非接触式汽车挡位传感器
US9418823B2 (en) * 2013-03-01 2016-08-16 Sputtering Components, Inc. Sputtering apparatus
JP6003816B2 (ja) * 2013-06-10 2016-10-05 日立金属株式会社 トルクセンサ
US9249877B2 (en) * 2013-09-20 2016-02-02 GM Global Technology Operations LLC Position diagnostic test for a shift-by-wire system, and a method thereof
JP6548868B2 (ja) * 2014-03-13 2019-07-24 株式会社東芝 磁気検査装置、および紙葉類処理装置
US9179066B1 (en) * 2014-05-31 2015-11-03 Apple Inc. Temperature compensation for sensors
DE102014210653A1 (de) 2014-06-04 2015-12-17 Conti Temic Microelectronic Gmbh Vorrichtung zur Ansteuerung und/oder Überwachung eines bürstenlosen Gleichstrommotors
CN105509773B (zh) * 2014-09-26 2018-07-13 泰科电子(上海)有限公司 位置传感器和系统及用于离合器主缸的位置传感器和系统
DE102015109009B4 (de) * 2015-06-08 2025-10-30 Infineon Technologies Ag Stromsensorchip mit Magnetfeldsensor
KR101704215B1 (ko) * 2015-06-17 2017-02-08 현대자동차주식회사 모터 제어 방법
CN106405445A (zh) * 2016-10-21 2017-02-15 杭州飞越汽车零部件有限公司 扭矩传感器磁通变化检测结构及其检测方法
US10656170B2 (en) 2018-05-17 2020-05-19 Allegro Microsystems, Llc Magnetic field sensors and output signal formats for a magnetic field sensor
DE102018210830A1 (de) * 2018-07-02 2020-01-02 Zf Friedrichshafen Ag Drehschaltervorrichtung für ein Fahrzeug und Verfahren zum Ermitteln einer Schaltstellung eines Drehschalters
CN113116163B (zh) * 2019-12-31 2023-10-03 浙江苏泊尔家电制造有限公司 烹饪器具及其控制方法
CN112461109B (zh) * 2020-11-10 2022-04-05 中国北方车辆研究所 换挡操控机构换挡滑块磨损量在线测量装置
WO2023128736A1 (ko) * 2022-01-03 2023-07-06 엘지이노텍 주식회사 모터 구동 장치 및 모터 구동 방법
CN114966495B (zh) * 2022-05-31 2024-06-04 核工业西南物理研究院 一种金属霍尔探针的支撑阵列装置以及安装方法
CN115113126B (zh) * 2022-07-13 2024-06-04 核工业西南物理研究院 一种用于测试和标定金属霍尔探针的装置及方法
DE102022133510A1 (de) 2022-12-15 2024-06-20 Schaeffler Technologies AG & Co. KG Strahlpumpe und Verwendung einer Strahlpumpe in einem Brennstoffzellensystem
DE102023200774A1 (de) * 2023-01-31 2024-08-01 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zum Anpassen zumindest einer Messgröße eines Magnetfeldsensors
DE102023205513A1 (de) * 2023-01-31 2024-08-01 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Funktionsdiagnose und/oder Fehlerdiagnose von Magnetfeldsensoren in differentiellen Magnetfeldmesssystemen mittels einer Magnetfeldsensor-Diagnoseeinheit
CN116388469A (zh) * 2023-04-03 2023-07-04 浙江同舟汽车配件有限公司 一种驱动装置及其驱动方法
US12449279B2 (en) 2024-02-07 2025-10-21 Allegro Microsystems, Llc Dynamic resolution sensor

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KR19990088563A (ko) * 1998-05-30 1999-12-27 마이크로나스 인터메탈 게엠베하 센서모듈및센서모듈의기능을감시하는방법
KR20060054351A (ko) * 2003-07-30 2006-05-22 코닌클리케 필립스 일렉트로닉스 엔.브이. 개선된 신호대 잡음비를 가진 온칩 자기 입자 센서
KR20060060575A (ko) * 2004-11-30 2006-06-05 보우린스, 인크. 리니어 포지션센서
KR20060097580A (ko) * 2005-03-09 2006-09-14 타이코에이엠피 주식회사 차량시트 위치감지장치

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DE19606826A1 (de) * 1996-02-23 1997-08-28 Knorr Bremse Electronic Gmbh Verfahren und Vorrichtung zur Überprüfung eines Sensors
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Patent Citations (4)

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KR19990088563A (ko) * 1998-05-30 1999-12-27 마이크로나스 인터메탈 게엠베하 센서모듈및센서모듈의기능을감시하는방법
KR20060054351A (ko) * 2003-07-30 2006-05-22 코닌클리케 필립스 일렉트로닉스 엔.브이. 개선된 신호대 잡음비를 가진 온칩 자기 입자 센서
KR20060060575A (ko) * 2004-11-30 2006-06-05 보우린스, 인크. 리니어 포지션센서
KR20060097580A (ko) * 2005-03-09 2006-09-14 타이코에이엠피 주식회사 차량시트 위치감지장치

Also Published As

Publication number Publication date
JP5599112B2 (ja) 2014-10-01
US8362764B2 (en) 2013-01-29
DE102008000943A1 (de) 2009-10-15
WO2009121352A2 (de) 2009-10-08
CN101983340A (zh) 2011-03-02
WO2009121352A3 (de) 2009-11-26
US20110018534A1 (en) 2011-01-27
JP2011516842A (ja) 2011-05-26
EP2260315A2 (de) 2010-12-15
DE102008000943B4 (de) 2015-02-19
KR20110021718A (ko) 2011-03-04

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