KR101497695B1 - 분광기를 이용한 위상차 측정 장치 - Google Patents

분광기를 이용한 위상차 측정 장치 Download PDF

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Publication number
KR101497695B1
KR101497695B1 KR1020080031148A KR20080031148A KR101497695B1 KR 101497695 B1 KR101497695 B1 KR 101497695B1 KR 1020080031148 A KR1020080031148 A KR 1020080031148A KR 20080031148 A KR20080031148 A KR 20080031148A KR 101497695 B1 KR101497695 B1 KR 101497695B1
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KR
South Korea
Prior art keywords
wavelength
phase difference
polarizer
measurement
sample
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KR1020080031148A
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English (en)
Korean (ko)
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KR20080091002A (ko
Inventor
이치로 아미모리
후미오 오바타
고우키 다카하시
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후지필름 가부시키가이샤
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Publication of KR20080091002A publication Critical patent/KR20080091002A/ko
Application granted granted Critical
Publication of KR101497695B1 publication Critical patent/KR101497695B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/605—Specific applications or type of materials phases
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/012—Phase angle

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
KR1020080031148A 2007-04-06 2008-04-03 분광기를 이용한 위상차 측정 장치 KR101497695B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2007-00100363 2007-04-06
JP2007100363A JP5116346B2 (ja) 2007-04-06 2007-04-06 分光器を用いた位相差測定装置

Publications (2)

Publication Number Publication Date
KR20080091002A KR20080091002A (ko) 2008-10-09
KR101497695B1 true KR101497695B1 (ko) 2015-03-02

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Family Applications (1)

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KR1020080031148A KR101497695B1 (ko) 2007-04-06 2008-04-03 분광기를 이용한 위상차 측정 장치

Country Status (3)

Country Link
JP (1) JP5116346B2 (zh)
KR (1) KR101497695B1 (zh)
CN (1) CN101281091A (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6167920B2 (ja) * 2014-01-31 2017-07-26 株式会社島津製作所 分光光度計
CN106525720B (zh) * 2016-11-17 2019-03-29 常熟理工学院 采用双波长拟合相邻单波长实现食品安全快速检测的方法
US10732336B2 (en) * 2017-02-02 2020-08-04 Corning Incorporated Method of assembling optical systems and minimizing retardance distortions in optical assemblies
US11029253B2 (en) * 2017-03-30 2021-06-08 Applied Materials Israel Ltd. Computerized method for configuring an inspection system, computer program product and an inspection system
JP7349908B2 (ja) * 2019-12-27 2023-09-25 住友化学株式会社 画像表示装置
CN111537065A (zh) * 2020-04-30 2020-08-14 桂林电子科技大学 一种用于空间调制全偏振成像系统的带宽设计方法
CN111580290B (zh) * 2020-05-18 2022-07-12 北京兆维科技开发有限公司 一种无上偏光膜半导体显示面板的显示缺陷修复方法
CN113425252B (zh) * 2021-06-18 2023-03-17 耀视(苏州)医疗科技有限公司 一种眼球扫描图像阴暗不均的处理方法以及处理系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10332533A (ja) * 1997-06-03 1998-12-18 Unie Opt:Kk 複屈折評価装置
JP2000509830A (ja) * 1997-04-04 2000-08-02 ジェイ・エイ・ウーラム・カンパニー・インコーポレイテッド フォトアレイ検出器を備える回帰較正による回転補正器型分光エリプソメータシステム
JP2001165809A (ja) * 1999-12-03 2001-06-22 Nec Corp 液晶表示素子評価法及び評価装置
JP2005257508A (ja) * 2004-03-12 2005-09-22 Nokodai Tlo Kk 複屈折特性測定装置および複屈折特性測定方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3414156B2 (ja) * 1996-09-06 2003-06-09 王子製紙株式会社 複屈折測定装置
JP2001511514A (ja) * 1997-07-28 2001-08-14 ハインズ インスツルメンツ インコーポレイテッド 光弾性変調器を用いる波長板リターデーションの測定方法及び装置
JP2001141602A (ja) * 1999-11-12 2001-05-25 Unie Opt:Kk 複屈折評価装置および複屈折評価方法
EP1191320B1 (en) * 2001-06-07 2007-03-07 Agilent Technologies, Inc. Measurement of polarization dependent characteristic of optical components

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000509830A (ja) * 1997-04-04 2000-08-02 ジェイ・エイ・ウーラム・カンパニー・インコーポレイテッド フォトアレイ検出器を備える回帰較正による回転補正器型分光エリプソメータシステム
JPH10332533A (ja) * 1997-06-03 1998-12-18 Unie Opt:Kk 複屈折評価装置
JP2001165809A (ja) * 1999-12-03 2001-06-22 Nec Corp 液晶表示素子評価法及び評価装置
JP2005257508A (ja) * 2004-03-12 2005-09-22 Nokodai Tlo Kk 複屈折特性測定装置および複屈折特性測定方法

Also Published As

Publication number Publication date
JP5116346B2 (ja) 2013-01-09
KR20080091002A (ko) 2008-10-09
JP2008256591A (ja) 2008-10-23
CN101281091A (zh) 2008-10-08

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