KR101374328B1 - 액정 셀 파라미터 측정 방법 및 장치 - Google Patents

액정 셀 파라미터 측정 방법 및 장치 Download PDF

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Publication number
KR101374328B1
KR101374328B1 KR1020110000340A KR20110000340A KR101374328B1 KR 101374328 B1 KR101374328 B1 KR 101374328B1 KR 1020110000340 A KR1020110000340 A KR 1020110000340A KR 20110000340 A KR20110000340 A KR 20110000340A KR 101374328 B1 KR101374328 B1 KR 101374328B1
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KR
South Korea
Prior art keywords
liquid crystal
polarization
crystal cell
angle
sample
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KR1020110000340A
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English (en)
Korean (ko)
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KR20120067903A (ko
Inventor
치앙 치-중
리우 치-샹
Original Assignee
인더스트리얼 테크놀로지 리서치 인스티튜트
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Publication of KR20120067903A publication Critical patent/KR20120067903A/ko
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Analytical Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Liquid Crystal (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
KR1020110000340A 2010-12-16 2011-01-04 액정 셀 파라미터 측정 방법 및 장치 KR101374328B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW099144264 2010-12-16
TW099144264A TWI432715B (zh) 2010-12-16 2010-12-16 測定液晶參數的方法及裝置

Publications (2)

Publication Number Publication Date
KR20120067903A KR20120067903A (ko) 2012-06-26
KR101374328B1 true KR101374328B1 (ko) 2014-03-12

Family

ID=46411891

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110000340A KR101374328B1 (ko) 2010-12-16 2011-01-04 액정 셀 파라미터 측정 방법 및 장치

Country Status (4)

Country Link
JP (1) JP2012127933A (zh)
KR (1) KR101374328B1 (zh)
CN (1) CN102566092B (zh)
TW (1) TWI432715B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104905778B (zh) * 2014-03-12 2018-08-10 科际器材工业股份有限公司 双向排气装置及其双向出气结构
CN104236857B (zh) * 2014-09-11 2017-02-15 电子科技大学 基于四分之一波片法的液晶光学移相分布检测系统及方法
CN107064595B (zh) * 2017-05-25 2019-08-06 上海大学 基于复合光涡旋的晶体电流传感器
CN111812869B (zh) * 2020-07-02 2022-07-29 深圳市华星光电半导体显示技术有限公司 液晶显示面板的光学量测方法及量测系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0498147A (ja) * 1990-08-17 1992-03-30 Nikon Corp 複屈折測定装置
JP2002311406A (ja) * 2001-04-17 2002-10-23 Susumu Sato 液晶パネルパラメータ検出装置
JP2005106689A (ja) * 2003-09-30 2005-04-21 Fuji Photo Film Co Ltd 液晶性材料の物性測定方法及び液晶性材料の物性測定装置
JP2008544302A (ja) * 2005-06-10 2008-12-04 アクソメトリクス インコーポレイテッド 完全なミュラー行列測定から液晶セルパラメータを決定するための方法および装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162360A (ja) * 2000-11-22 2002-06-07 Seiko Epson Corp 液晶パネルの評価方法及び評価装置
JP3936712B2 (ja) * 2004-09-22 2007-06-27 名菱テクニカ株式会社 検出対象のパラメータ検出方法及び検出装置
JP2006337288A (ja) * 2005-06-03 2006-12-14 Fujifilm Holdings Corp 液晶材料の物性測定方法及び物性測定システム
CN101464576B (zh) * 2009-01-14 2010-12-08 北京航空航天大学 液晶相位可变延迟器特性参数定标系统
JP5185160B2 (ja) * 2009-03-03 2013-04-17 大塚電子株式会社 反射型液晶セルのチルト角測定方法及び装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0498147A (ja) * 1990-08-17 1992-03-30 Nikon Corp 複屈折測定装置
JP2002311406A (ja) * 2001-04-17 2002-10-23 Susumu Sato 液晶パネルパラメータ検出装置
JP2005106689A (ja) * 2003-09-30 2005-04-21 Fuji Photo Film Co Ltd 液晶性材料の物性測定方法及び液晶性材料の物性測定装置
JP2008544302A (ja) * 2005-06-10 2008-12-04 アクソメトリクス インコーポレイテッド 完全なミュラー行列測定から液晶セルパラメータを決定するための方法および装置

Also Published As

Publication number Publication date
TW201226881A (en) 2012-07-01
KR20120067903A (ko) 2012-06-26
CN102566092B (zh) 2014-09-24
TWI432715B (zh) 2014-04-01
JP2012127933A (ja) 2012-07-05
CN102566092A (zh) 2012-07-11

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