KR101300551B1 - 전자파의 측정 방법 및 측정 장치 - Google Patents

전자파의 측정 방법 및 측정 장치 Download PDF

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KR101300551B1
KR101300551B1 KR1020100137406A KR20100137406A KR101300551B1 KR 101300551 B1 KR101300551 B1 KR 101300551B1 KR 1020100137406 A KR1020100137406 A KR 1020100137406A KR 20100137406 A KR20100137406 A KR 20100137406A KR 101300551 B1 KR101300551 B1 KR 101300551B1
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South Korea
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wavelet
wavelet expansion
time waveform
expansion coefficient
spectrum
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Korean (ko)
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KR20110081764A (ko
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미치노리 시오다
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캐논 가부시끼가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G06F2218/04—Denoising
    • G06F2218/06—Denoising by applying a scale-space analysis, e.g. using wavelet analysis

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020100137406A 2010-01-08 2010-12-29 전자파의 측정 방법 및 측정 장치 Expired - Fee Related KR101300551B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010002482A JP5596982B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法
JPJP-P-2010-002482 2010-01-08

Publications (2)

Publication Number Publication Date
KR20110081764A KR20110081764A (ko) 2011-07-14
KR101300551B1 true KR101300551B1 (ko) 2013-09-03

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KR1020100137406A Expired - Fee Related KR101300551B1 (ko) 2010-01-08 2010-12-29 전자파의 측정 방법 및 측정 장치

Country Status (6)

Country Link
US (2) US8527227B2 (enExample)
EP (1) EP2345880A1 (enExample)
JP (1) JP5596982B2 (enExample)
KR (1) KR101300551B1 (enExample)
CN (1) CN102135447B (enExample)
RU (1) RU2473917C2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法
JP5552321B2 (ja) * 2010-01-08 2014-07-16 キヤノン株式会社 電磁波の測定装置及び方法
CN105652166B (zh) * 2016-03-01 2018-04-17 国网江西省电力科学研究院 一种用于局放在线监测的加权阈值小波降噪方法
CN110208229B (zh) * 2019-05-17 2021-07-06 清华大学天津高端装备研究院 微流控生物芯片扫描信号检测装置
CN111313932B (zh) * 2020-02-07 2021-07-13 西安交通大学 一种基于电磁时间反演的传递函数相关性的传输线及网络故障定位方法
CN111474594B (zh) * 2020-05-27 2021-08-17 长安大学 一种三维时间域航空电磁快速反演方法

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JP2002257882A (ja) * 2001-03-05 2002-09-11 Ricoh Co Ltd 電磁妨害波測定装置及び方法
JP2002277499A (ja) * 2001-03-21 2002-09-25 Ricoh Co Ltd 電磁妨害波測定装置
US6763322B2 (en) * 2002-01-09 2004-07-13 General Electric Company Method for enhancement in screening throughput
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JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法

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JPH09211040A (ja) * 1996-01-31 1997-08-15 Nec Corp 波形解析装置
JP2008001785A (ja) * 2006-06-21 2008-01-10 Meiji Univ 漆系塗料、その製造方法及び漆塗装材

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JP2011141215A (ja) 2011-07-21
US8527227B2 (en) 2013-09-03
US20110168896A1 (en) 2011-07-14
EP2345880A1 (en) 2011-07-20
RU2473917C2 (ru) 2013-01-27
CN102135447A (zh) 2011-07-27
CN102135447B (zh) 2013-05-22
JP5596982B2 (ja) 2014-10-01
US20130313435A1 (en) 2013-11-28
US8954286B2 (en) 2015-02-10
RU2010154004A (ru) 2012-07-10
KR20110081764A (ko) 2011-07-14

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