CN102135447B - 用于测量电磁波的方法和装置 - Google Patents

用于测量电磁波的方法和装置 Download PDF

Info

Publication number
CN102135447B
CN102135447B CN2011100024479A CN201110002447A CN102135447B CN 102135447 B CN102135447 B CN 102135447B CN 2011100024479 A CN2011100024479 A CN 2011100024479A CN 201110002447 A CN201110002447 A CN 201110002447A CN 102135447 B CN102135447 B CN 102135447B
Authority
CN
China
Prior art keywords
wavelet
time waveform
coefficient
expansions coefficient
wavelet expansions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2011100024479A
Other languages
English (en)
Chinese (zh)
Other versions
CN102135447A (zh
Inventor
盐田道徳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102135447A publication Critical patent/CN102135447A/zh
Application granted granted Critical
Publication of CN102135447B publication Critical patent/CN102135447B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G06F2218/04—Denoising
    • G06F2218/06—Denoising by applying a scale-space analysis, e.g. using wavelet analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2011100024479A 2010-01-08 2011-01-07 用于测量电磁波的方法和装置 Expired - Fee Related CN102135447B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-002482 2010-01-08
JP2010002482A JP5596982B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法

Publications (2)

Publication Number Publication Date
CN102135447A CN102135447A (zh) 2011-07-27
CN102135447B true CN102135447B (zh) 2013-05-22

Family

ID=43799489

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011100024479A Expired - Fee Related CN102135447B (zh) 2010-01-08 2011-01-07 用于测量电磁波的方法和装置

Country Status (6)

Country Link
US (2) US8527227B2 (enExample)
EP (1) EP2345880A1 (enExample)
JP (1) JP5596982B2 (enExample)
KR (1) KR101300551B1 (enExample)
CN (1) CN102135447B (enExample)
RU (1) RU2473917C2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法
JP5552321B2 (ja) * 2010-01-08 2014-07-16 キヤノン株式会社 電磁波の測定装置及び方法
CN105652166B (zh) * 2016-03-01 2018-04-17 国网江西省电力科学研究院 一种用于局放在线监测的加权阈值小波降噪方法
CN110208229B (zh) * 2019-05-17 2021-07-06 清华大学天津高端装备研究院 微流控生物芯片扫描信号检测装置
CN111313932B (zh) * 2020-02-07 2021-07-13 西安交通大学 一种基于电磁时间反演的传递函数相关性的传输线及网络故障定位方法
CN111474594B (zh) * 2020-05-27 2021-08-17 长安大学 一种三维时间域航空电磁快速反演方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101226936A (zh) * 2007-12-29 2008-07-23 湖南大学 开关电流小波变换器件
CN101379831A (zh) * 2006-02-24 2009-03-04 三星电子株式会社 图像编码/解码方法和装置

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03148073A (ja) * 1989-11-06 1991-06-24 Takeshi Kato 複数入力端子を構えたスペクトラムアナライザを用いたオープンサイト電磁波測定システム
JPH03285127A (ja) * 1990-04-02 1991-12-16 Horiba Ltd フーリエ変換赤外線分析装置
JP3040651B2 (ja) * 1994-02-23 2000-05-15 三菱重工業株式会社 信号処理装置
JP2735064B2 (ja) * 1996-01-31 1998-04-02 日本電気株式会社 波形解析装置
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
US6078047A (en) * 1997-03-14 2000-06-20 Lucent Technologies Inc. Method and apparatus for terahertz tomographic imaging
US7068851B1 (en) * 1999-12-10 2006-06-27 Ricoh Co., Ltd. Multiscale sharpening and smoothing with wavelets
JP2002257882A (ja) * 2001-03-05 2002-09-11 Ricoh Co Ltd 電磁妨害波測定装置及び方法
JP2002277499A (ja) * 2001-03-21 2002-09-25 Ricoh Co Ltd 電磁妨害波測定装置
US6763322B2 (en) * 2002-01-09 2004-07-13 General Electric Company Method for enhancement in screening throughput
JP4045902B2 (ja) * 2002-09-03 2008-02-13 株式会社デンソー 振動波判定装置
US7099714B2 (en) * 2003-03-31 2006-08-29 Medtronic, Inc. Biomedical signal denoising techniques
WO2007018949A2 (en) * 2005-07-28 2007-02-15 Exxonmobil Upstream Research Company Method for wavelet denoising of controlled source electromagnetic survey data
JP2007198965A (ja) * 2006-01-27 2007-08-09 Sony Corp 妨害電磁波測定システム、妨害電磁波測定方法およびその方法をコンピュータに実行させるためのプログラム
JP5013582B2 (ja) * 2006-06-21 2012-08-29 学校法人明治大学 漆系塗料、その製造方法及び漆塗装材
RU62469U1 (ru) * 2006-09-25 2007-04-10 Аркадий Львович Жизняков Устройство вычисления адаптивного вейвлет-преобразования
US7781737B2 (en) * 2006-12-20 2010-08-24 Schlumberger Technology Corporation Apparatus and methods for oil-water-gas analysis using terahertz radiation
CN101210874B (zh) * 2006-12-31 2010-05-19 清华大学 测量太赫兹时域光谱的方法及设备
US7869994B2 (en) * 2007-01-30 2011-01-11 Qnx Software Systems Co. Transient noise removal system using wavelets
RU2365981C1 (ru) * 2008-02-12 2009-08-27 Виктор Григорьевич Гетманов Способ и устройство для спектрально-временного анализа нестационарных сигналов
WO2010032245A2 (en) * 2008-09-17 2010-03-25 Opticul Diagnostics Ltd. Means and methods for detecting bacteria in an aerosol sample
JP5623061B2 (ja) * 2008-12-12 2014-11-12 キヤノン株式会社 検査装置及び検査方法
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101379831A (zh) * 2006-02-24 2009-03-04 三星电子株式会社 图像编码/解码方法和装置
CN101226936A (zh) * 2007-12-29 2008-07-23 湖南大学 开关电流小波变换器件

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
David L.Donoho等.Threshold selection for wavelet shrinkage of noisy data.《Proceedings of the 16th Annual International Conference of the IEEE》.1994,24-25.
JP平3-285127A 1991.12.16
Taswell.Thewhat how and why of wavelet shrinkage denoising.《Computing in Science & Engineering》.2000
The what, how and why of wavelet shrinkage denoising;Taswell;《Computing in Science & Engineering》;20000630;第2卷(第3期);第12页-第19页 *
Threshold selection for wavelet shrinkage of noisy data;David L.Donoho等;《Proceedings of the 16th Annual International Conference of the IEEE》;19941231;第24页-第25页 *

Also Published As

Publication number Publication date
EP2345880A1 (en) 2011-07-20
KR101300551B1 (ko) 2013-09-03
US20110168896A1 (en) 2011-07-14
JP2011141215A (ja) 2011-07-21
JP5596982B2 (ja) 2014-10-01
CN102135447A (zh) 2011-07-27
US8954286B2 (en) 2015-02-10
US20130313435A1 (en) 2013-11-28
KR20110081764A (ko) 2011-07-14
RU2010154004A (ru) 2012-07-10
RU2473917C2 (ru) 2013-01-27
US8527227B2 (en) 2013-09-03

Similar Documents

Publication Publication Date Title
CN102135447B (zh) 用于测量电磁波的方法和装置
Zheng et al. Variable selection by double competitive adaptive reweighted sampling for calibration transfer of near infrared spectra
Yin et al. A feature extraction method based on wavelet packet analysis for discrimination of Chinese vinegars using a gas sensors array
Wang et al. A reducing iteration orthogonal matching pursuit algorithm for compressive sensing
US8258477B2 (en) Inspection apparatus and inspection method
Singh et al. Wavelet analysis of signals in agriculture and food quality inspection
CN105158200B (zh) 一种提高近红外光谱定性分析准确度的建模方法
Hua et al. Quantitative determination of cyfluthrin in n-hexane by terahertz time-domain spectroscopy with chemometrics methods
CN116883720B (zh) 基于空谱注意力网络的果蔬农药残留检测方法及系统
Hassani et al. A preliminary investigation into the effect of outlier (s) on singular spectrum analysis
CN119881766B (zh) 一种超声波局放仪高精度动态校准系统及校准方法
CN108613943B (zh) 一种基于光谱形态转移的近红外单籽粒作物成分检测方法
Yao et al. On-line monitoring of egg freshness using a portable NIR spectrometer combined with deep learning algorithm
Vimalajeewa et al. Learning in the compressed data domain: Application to milk quality prediction
CN108613965B (zh) 一种基于数据驱动拉曼光谱的乳品中乳清蛋白测量方法
Zhu et al. Feasibility investigation on determining soluble solids content of peaches using dielectric spectra
Rashvand et al. Quality detection of common beans flour using hyperspectral imaging technology: Potential of machine learning and deep learning
Krieger et al. Design and analysis of multi-coset arrays
CN115389443B (zh) 红外高光谱大气探测仪噪声分析方法和装置
CN118050330A (zh) 一种烟草近红外光谱标准化模型及应用
CN113960124B (zh) 一种带有图像修正功能的便携式ect系统
Park et al. Multiscale exploratory analysis of regression quantiles using quantile SiZer
Aroge et al. Time-frequency analysis of the chirp response for rapid electrochemical impedance estimation
KR101381655B1 (ko) 시계열 데이터의 비학습적 마이닝 방법 및 이를 지원하는 단말기
CN119646393B (zh) 非平稳信号处理方法、装置、电子设备及存储介质

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130522

Termination date: 20170107

CF01 Termination of patent right due to non-payment of annual fee