KR101284362B1 - Inspection jig and method of producing the same - Google Patents

Abstract

The present invention relates to an inspection jig used for electrical inspection of a circuit board or an electronic component, and, according to the present invention, is disposed adjacent to an inspection object and includes a first support plate having a plurality of first insertion holes into which a tip of a probe is inserted. And a second support plate spaced apart from the first support plate at a predetermined interval and formed with a plurality of second insertion holes into which a rear end of the probe is inserted, and between the first support plate and the second support plate to surround the probe. And a filler filled in the test jig, wherein the first support plate and the second support plate are arranged such that a line connecting the center of the first insertion hole and the second insertion hole is inclined with respect to a normal perpendicular to the surface of the first support plate. Is provided.

Description

Inspection jig and its manufacturing method {INSPECTION JIG AND METHOD OF PRODUCING THE SAME}

The present invention relates to an inspection jig used for electrical inspection of a circuit board or an electronic component, and more particularly, an inspection jig including a plurality of probes electrically contacting an inspection terminal formed on an inspection object and a support supporting the same. And to a method for producing the same.

In general, an inspection jig having a plurality of probes in electrical contact with an inspection terminal formed on an inspection object is used for an electrical inspection for detecting an abnormality such as a short circuit or disconnection of a circuit board. The inspection jig includes a plurality of probes electrically contacting the inspection terminals formed on the inspection object and a support for supporting the probes.

In recent years, inspection terminals formed on inspection objects have been diversified. For example, there is an inspection object in which a long thin terminal such as a rectangle is formed. Moreover, in recent years, the width | variety of the shorter direction of a long thin terminal has become very narrow according to the complexity of the wiring pattern of the circuit board used as a test object, high integration of an integrated circuit, etc. For example, the terminal of the very narrow width | variety whose width | variety of a short direction is 20 micrometers-30 micrometers may be formed in a test object.

Since the insertion hole formed to insert the probe in the general probe support is formed to penetrate in the vertical direction with respect to the surface of the probe support, the inserted probe also contacts the terminal to be measured vertically. Thus, the probe comes into contact with the terminal by sliding in an irregular direction from the surface of the terminal. In particular, as described above, the terminal to be inspected is long and thin, which is more problematic when the interval between the terminals is narrow. In some cases, adjacent probes slide in close proximity to each other and contact the same terminals, causing short circuits and inaccurate inspection.

In an attempt to solve such a problem, Patent Publication No. 2006-111248 discloses a distal end support having a distal end insertion hole having a probe guide direction toward an inspection object, and is disposed with a predetermined gap therebetween. The rear end insertion hole is formed, the rear end insertion hole having the probe guide direction inclined along the long direction with respect to the probe guide direction of the front end insertion hole, and the tip contacting the terminal. A probe having a proximal end portion inserted into the proximal end insertion hole and a proximal end portion inserted into the proximal end insertion hole to be protruded from the target side, and the proximal end portion of the probe is inserted into the proximal end with respect to the proximal end portion. An inspection jig is disclosed, which is disposed at a position shifted from the side inclined to the probe guide direction of the ball. The.

In addition, Korean Patent Publication No. 2010-0124929 discloses a probe support having a plurality of ceramic green sheets laminated and sintered and having an insertion hole into which a probe can be inserted, wherein the insertion hole has a centerline perpendicular to the surface of the support. A probe support characterized by being inclined with respect to the normal to be disclosed.

The inspection jig 1 disclosed in Japanese Patent Application Laid-Open No. 2006-111248 has a center-shifted front end support 2 and rear end support 3 so as to tilt the probes 5a and 5b as shown in FIG. 1. Several support plates 2a, 2b, 2c, 3a, 3b and 3c having through holes formed therein are used. However, such a support plate is expensive, and the processing cost for forming a large number of through holes is very expensive. In addition, if a defect occurs in the process of forming the through hole there was a problem that the entire support plate can not be used.

The present invention has been made to improve the above-mentioned conventional problems, using a minimum support plate and a filler, the terminal to be inspected is formed in a long and thin shape, even if the distance between the terminals is very narrow, the probe is surely It is an object of the present invention to provide an entirely new inspection jig and a method of producing the same that can be brought into contact with a terminal to be inspected.

According to the present invention, the first support plate is arranged adjacent to the inspection object, the first support plate formed with a plurality of first insertion holes into which the tip of the probe is inserted, and are arranged side by side with a predetermined distance from the first support plate, the rear end of the probe A second support plate having a plurality of second insertion holes formed therein, and a filler filled between the first support plate and the second support plate so as to support the probe, wherein the first support plate and the second support plate are connected to the first insertion hole. An inspection jig is provided in which a line connecting the center of the second insertion hole is inclined with respect to a normal perpendicular to the surface of the first supporting plate.

The method may further include arranging the first support plate and the second support plate, each having a plurality of insertion holes, side by side at regular intervals, inserting the tip of the probe into the insertion hole of the first support plate, and Inserting a rear end of the probe into an insertion hole, horizontally moving the first support plate or the second support plate to incline the probe with respect to a normal perpendicular to the surface of the first support plate, and using a case Surrounding the space between the first support plate and the second support plate, and injecting filler into the space surrounded by the inner surface of the case, the first support plate and the second support plate. A method is provided.

The inspection jig manufactured by the present invention has an advantage that the direction in which the probe is bent when the probe is in contact with the terminal is exerted because the insertion hole into which the probe contacting the inspection object is inserted is inclined. Therefore, when the terminal to be inspected is long and thin, the probe is not bent along the short direction of the terminal but bent along the long direction of the terminal so that the probe is surely brought into contact with the terminal to be inspected. Appropriate inspection can be performed.

In addition, since the probe can be stably supported through the minimum support plate and the filler, there is an advantage that the manufacturing cost can be drastically reduced.

1 is a cross-sectional view of a conventional inspection jig.
2 is a plan view of one embodiment of an inspection jig according to the present invention.
3 is a cross-sectional view of the inspection jig shown in FIG.
4 is a plan view of the inspection object.
FIG. 5 is a cross-sectional view for describing a movement of a probe when inspecting an inspection target using the inspection jig illustrated in FIG. 2.

Hereinafter, with reference to the accompanying drawings will be described in detail an embodiment of the present invention.

The following embodiments are provided by way of example so that those skilled in the art can fully understand the spirit of the present invention. Therefore, the present invention is not limited to the embodiments described below, but may be embodied in other forms. In the drawings, the width, length, thickness, and the like of the components may be exaggerated for convenience. Like numbers refer to like elements throughout.

2 is a plan view of one embodiment of an inspection jig according to the present invention, Figure 3 is a cross-sectional view of the inspection jig shown in FIG. 2 and 3, one embodiment of the inspection jig according to the present invention includes a first support plate 10, a second support plate 20, a probe 30, a case 40, and a filler 50. .

The probe 30 is inserted into the insertion holes 11 and 21 formed in the support plates 10 and 20. The tip 31 of the probe 30 passes through the first support plate 10 and contacts the terminal to be inspected, and the rear end 32 of the probe 30 passes through the second support plate 20 and then the Contact the terminal. The suspension 33 of the probe 30 is stably supported by the filler 50.

A plurality of first insertion holes 11 are formed in the center of the first support plate 10. The front end 31 of the probe 30 penetrates through the first insertion hole 11.

Engaging grooves 12 and 13 for inserting the support posts 22 are formed around the first insertion hole 11. The coupling grooves 12 and 13 are spaced apart to the right from the first coupling groove 13 and the first coupling groove 13 each consisting of four grooves 12 disposed at the corner portions of the first support plate 10. The second coupling groove 12 is composed of four grooves 13.

The first support plate 10 is made of engineering plastics having high strength and excellent workability. For example, polyamide, polyacetal, ABS, polycarbonate, vinyl chloride and the like.

The second support plate 20 is arranged side by side spaced apart from the first support plate 10 by a predetermined interval. The rear end 32 of the probe 30 penetrating the second insertion hole 21 of the second support plate 20 is in contact with the terminal of the measuring device. One end of the second support plate 20 is coupled to the second support plate 20, and the other end thereof has four support posts 22 extending in the direction of the first support plate 10.

The first support plate 10 and the second support plate 20 have a line connecting the center of the first insertion hole 11 and the second insertion hole 21 to each other of the first support plate 10 and the second support plate 20. It is arranged to be inclined with respect to a normal perpendicular to the surface. That is, the first support plate 10 is in relation to the second support plate 20 so that the central axes of the first insertion hole 11 and the second insertion hole 21 into which the same probe 30 is inserted are shifted from each other. It is arranged to move horizontally to the left.

When the support post 22 of the second support plate 20 is engaged with the first coupling groove 13 of the first support plate 10, the center of the first insertion hole 11 and the second insertion hole 21 is connected. One line is parallel with a normal line orthogonal to the surfaces of the first support plate 10 and the second support plate 20, and the support posts 22 of the second support plate 20 have a second coupling groove of the first support plate 10. When combined with (12), with respect to the normal line in which the line connecting the centers of the first insertion hole 11 and the second insertion hole 21 is perpendicular to the surfaces of the first support plate 10 and the second support plate 20. Incline The first coupling groove 13 is used when the probe 30 is inserted into the first support plate 10 and the second support plate 20. After the probe 30 is inserted, the support post 22 may be inserted into the second support plate 22. By inserting into the coupling groove 12, the normal line which the line connecting the center of the 1st insertion hole 11 and the 2nd insertion hole 21 orthogonal to the surface of the 1st support plate 10 and the 2nd support plate 20 is normal. Be inclined with respect to

Since the line connecting the center of the first insertion hole 11 and the second insertion hole 21 into which the probe 30 in contact with the inspection object 5 is inserted is inclined, the inserted probe 30 is the inspection object. It is not in contact with the terminal 6 of (5) perpendicularly, but in an inclined state at an angle. Therefore, when pressure is applied, it bends in a naturally inclined state and contacts the terminal 6 of the inspection object 5.

4 is a plan view illustrating an inspection object, and FIG. 5 is a cross-sectional view for describing a movement of a probe when an inspection object is inspected using the inspection jig illustrated in FIG. 2. FIG. 5A is a view of the long side of the terminal 6 of the inspection object 5, and (b) is a view of the short side. As shown in FIG. 5, when the terminal 6 of the inspection object 5 has a long and thin shape, a line connecting the center of the first insertion hole 11 and the second insertion hole 21 is a terminal to be inspected. When inclined in the long direction of (6), the probe 30 contacts while bending along the long direction of the terminal 6 without bending along the short direction of the terminal 6. Therefore, the probe 30 can be reliably brought into contact with the terminal 6 of the test object 5.

The front end 31 and the rear end 32 of the probe 30 are inserted into and supported by the first support plate 10 and the second support plate 20, respectively, and the stop 33 of the probe 30 is the first support plate 10. ) And the second support plate 20 is supported by the filler 50 filling. The filler 50 supports the probe 30 in an inclined state without using a plurality of support plates, and at the same time, serves to prevent adjacent probes 30 from shorting in contact with each other.

The filler 50 may support the probes 30 without limiting the deformation of the probe 30 by the pressure exerted on the probe 30 during measurement, and is not particularly limited so long as it is insulating. Do not. As the filler 50, a liquid substance having a high viscosity such that it does not flow out through the insertion holes 11 and 21 may be used. For example, high viscosity liquid silicone oil can be used. In the case of a hard rubber material, it cannot be used because it prevents the probe 30 from being deformed during measurement.

The case 40 surrounds the space between the lower surface of the first support plate 10 and the upper surface of the second support plate 20. The case 40 is composed of two pieces 41 and 42 having a cross-sectional shape c. The case 40 serves to prevent the internal filler 50, in particular, the liquid filler 50 from flowing out.

Inspection jig is manufactured in the following way. First, insertion holes 11 and 21 and coupling grooves 12 and 13 are formed in the first support plate 10 and the second support plate 20 made of engineered plastic. The insertion holes 11 and 21 and the coupling grooves 12 and 13 may be formed using a microdrill or may be processed using a laser.

Next, after the support posts 22 are coupled to the second support plate 20, the support posts 22 are coupled to the first coupling grooves 13 of the first support plate 10, whereby the first support plate 10 and the first support plate 10 are formed. 2 Place the support plate 20 side by side. In this case, a line connecting the centers of the first insertion hole 11 and the second insertion hole 12 is parallel with a normal perpendicular to the surfaces of the first support plate 10 and the second support plate 20.

Next, the tip 31 of the probe 30 is inserted into the insertion hole 11 of the first support plate 10, and the rear end 32 of the probe 30 is inserted into the insertion hole 21 of the second support plate 20. ).

Next, the support post 22 is coupled to the second coupling groove 12 of the first support plate 10. At this time, since the first support plate 10 moves horizontally with respect to the second support plate 20, the line connecting the center of the first insertion hole 11 and the second insertion hole 21 is the first support plate 10. ) And a normal perpendicular to the surface of the second support plate 20.

Next, two case parts 41 and 42 having a U-shaped cross section are combined to enclose the space between the lower surface of the first support plate 10 and the upper surface of the second support plate 20.

Finally, a filler 50 such as liquid silicone is injected into the space surrounded by the inner surface of the case 40, the lower surface of the first support plate 10, and the upper surface of the second support plate 20, thereby lowering the first support plate 10. And a space between the upper surface of the second support plate 20. Since the second coupling groove 12 of the first support plate 10 is open, the filler 50 may be injected through the second coupling groove 12.

delete

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is clearly understood that the same is by way of illustration and example only and is not to be construed as limiting the scope of the invention as defined by the appended claims. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention.

10: first support plate 11: first insertion hole
12: first coupling groove 13: second coupling groove
20: second support plate 21: second insertion hole
22: support post 30: probe
31: Probe tip 32: Probe back
33: Stop probe 40: Case
50: filler

Claims (5)

A first support plate disposed adjacent to the inspection object and having a plurality of first insertion holes into which the tip of the probe is inserted;
A second support plate disposed to be parallel to the first support plate at a predetermined interval, and having a plurality of second insertion holes into which a rear end of the probe is inserted;
A liquid filler filled between the first support plate and the second support plate to support the probe;
A case surrounding a space between the first support plate and the second support plate to prevent the liquid filler from flowing out,
And the first supporting plate and the second supporting plate are arranged such that a line connecting the center of the first insertion hole and the second insertion hole is inclined with respect to a normal perpendicular to the surface of the first support plate. delete delete Arranging the first support plate and the second support plate in which a plurality of insertion holes are formed side by side at a predetermined interval and spaced apart;
Inserting the front end of the probe into the insertion hole of the first support plate and inserting the rear end of the probe into the insertion hole of the second support plate;
Horizontally moving the first support plate or the second support plate such that the probe is inclined with respect to a normal perpendicular to the surface of the first support plate;
Surrounding the space between the first support plate and the second support plate by using a case;
Injecting a liquid filler into the inner surface of the case, the space surrounded by the first support plate and the second support plate. delete

Images