KR101130553B1 - 발광다이오드(led) 칩 카운터 - Google Patents
발광다이오드(led) 칩 카운터 Download PDFInfo
- Publication number
- KR101130553B1 KR101130553B1 KR1020090117980A KR20090117980A KR101130553B1 KR 101130553 B1 KR101130553 B1 KR 101130553B1 KR 1020090117980 A KR1020090117980 A KR 1020090117980A KR 20090117980 A KR20090117980 A KR 20090117980A KR 101130553 B1 KR101130553 B1 KR 101130553B1
- Authority
- KR
- South Korea
- Prior art keywords
- led
- emitting diode
- light emitting
- camera
- chip
- Prior art date
Links
- 238000005259 measurement Methods 0.000 claims description 25
- 238000005286 illumination Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims 1
- 238000004891 communication Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Operations Research (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Led Device Packages (AREA)
- Led Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (2)
- 측정 대상물(40)에 조명을 조사하는 조명수단(20)과, 상기 조명이 상기 측정 대상물(40)을 통과하거나 측정대상물(40)에 반사되면서 생성된 측정대상물(40)의 영상을 획득하는 카메라(10)와, 상기 카메라(10)에서 획득한 영상을 전송받아 해석하는 컴퓨터(30)로 이루어진 발광다이오드(LED) 칩 카운터에 있어서,상기 카메라는 일반 DSLR 카메라임을 특정으로 하는 발광다이오드(LED) 칩 카운터.
- 제 1항에 있어서,상기 조명수단은 측정 대상물(40)의 하부에 배치되며, 면광인 것을 특징으로 하는 발광다이오드(LED) 칩 카운터.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090117980A KR101130553B1 (ko) | 2009-12-01 | 2009-12-01 | 발광다이오드(led) 칩 카운터 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090117980A KR101130553B1 (ko) | 2009-12-01 | 2009-12-01 | 발광다이오드(led) 칩 카운터 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20110061359A KR20110061359A (ko) | 2011-06-09 |
KR101130553B1 true KR101130553B1 (ko) | 2012-03-23 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020090117980A KR101130553B1 (ko) | 2009-12-01 | 2009-12-01 | 발광다이오드(led) 칩 카운터 |
Country Status (1)
Country | Link |
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KR (1) | KR101130553B1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180067103A (ko) | 2016-12-12 | 2018-06-20 | (주)자비스 | 다수 개의 전자 부품의 탐지를 위한 엑스레이 장치 및 그에 의한 전자 부품의 탐지 방법 |
KR102142029B1 (ko) | 2019-04-30 | 2020-08-06 | (주)자비스 | 다수 개의 전자 부품의 탐지를 위한 엑스레이 장치 및 그에 의한 전자 부품의 탐지 방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060071507A (ko) * | 2004-12-22 | 2006-06-27 | 주식회사 팬택앤큐리텔 | 보행 보조 장치 및 방법 |
JP2009162515A (ja) | 2007-12-28 | 2009-07-23 | Nippon Telegr & Teleph Corp <Ntt> | 照明条件の測定方法および照明条件の測定装置 |
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2009
- 2009-12-01 KR KR1020090117980A patent/KR101130553B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20060071507A (ko) * | 2004-12-22 | 2006-06-27 | 주식회사 팬택앤큐리텔 | 보행 보조 장치 및 방법 |
JP2009162515A (ja) | 2007-12-28 | 2009-07-23 | Nippon Telegr & Teleph Corp <Ntt> | 照明条件の測定方法および照明条件の測定装置 |
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Publication number | Publication date |
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KR20110061359A (ko) | 2011-06-09 |
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