KR101068790B1 - 전자 빔 처리 장치 - Google Patents
전자 빔 처리 장치 Download PDFInfo
- Publication number
- KR101068790B1 KR101068790B1 KR1020067010458A KR20067010458A KR101068790B1 KR 101068790 B1 KR101068790 B1 KR 101068790B1 KR 1020067010458 A KR1020067010458 A KR 1020067010458A KR 20067010458 A KR20067010458 A KR 20067010458A KR 101068790 B1 KR101068790 B1 KR 101068790B1
- Authority
- KR
- South Korea
- Prior art keywords
- cathode
- gas
- anode
- chamber
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/025—Electron guns using a discharge in a gas or a vapour as electron source
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/067—Replacing parts of guns; Mutual adjustment of electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/077—Electron guns using discharge in gases or vapours as electron sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/248—Components associated with the control of the tube
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Electron Beam Exposure (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/698,726 | 2003-10-30 | ||
| US10/698,726 US7049606B2 (en) | 2003-10-30 | 2003-10-30 | Electron beam treatment apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20060122875A KR20060122875A (ko) | 2006-11-30 |
| KR101068790B1 true KR101068790B1 (ko) | 2011-09-30 |
Family
ID=34550733
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067010458A Expired - Fee Related KR101068790B1 (ko) | 2003-10-30 | 2004-10-29 | 전자 빔 처리 장치 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7049606B2 (enExample) |
| JP (1) | JP5242055B2 (enExample) |
| KR (1) | KR101068790B1 (enExample) |
| CN (1) | CN1875452B (enExample) |
| TW (1) | TWI318416B (enExample) |
| WO (1) | WO2005043599A2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10320597A1 (de) * | 2003-04-30 | 2004-12-02 | Aixtron Ag | Verfahren und Vorrichtung zum Abscheiden von Halbleiterschichten mit zwei Prozessgasen, von denen das eine vorkonditioniert ist |
| WO2008050321A2 (en) * | 2006-10-24 | 2008-05-02 | B-Nano Ltd. | An interface, a methof for observing an object within a non-vacuum environment and a scanning electron microscope |
| KR100895630B1 (ko) * | 2007-10-01 | 2009-05-06 | 박흥균 | 전자빔 방출장치 |
| US8981294B2 (en) | 2008-07-03 | 2015-03-17 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
| US10658161B2 (en) * | 2010-10-15 | 2020-05-19 | Applied Materials, Inc. | Method and apparatus for reducing particle defects in plasma etch chambers |
| CN105143866A (zh) | 2013-02-20 | 2015-12-09 | B-纳米股份有限公司 | 扫描电子显微镜 |
| KR102118604B1 (ko) * | 2018-12-14 | 2020-06-03 | 박흥균 | 라인 형태의 이온빔 방출 장치 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6212059A (ja) * | 1985-07-10 | 1987-01-21 | Matsushita Electric Works Ltd | 光放射電子管 |
| US6429445B1 (en) * | 1999-08-16 | 2002-08-06 | Samsung Electronics Co., Ltd. | Electron beam irradiating apparatus having cathode plate formed of non-metal conductive material |
| US20050003178A1 (en) * | 2003-04-21 | 2005-01-06 | Detert James W. | Apparatus and methods for the attachment of materials to polyurethane foam, and articles made using them |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4581118A (en) * | 1983-01-26 | 1986-04-08 | Materials Research Corporation | Shaped field magnetron electrode |
| US4721885A (en) * | 1987-02-11 | 1988-01-26 | Sri International | Very high speed integrated microelectronic tubes |
| US5003178A (en) | 1988-11-14 | 1991-03-26 | Electron Vision Corporation | Large-area uniform electron source |
| US5094885A (en) * | 1990-10-12 | 1992-03-10 | Genus, Inc. | Differential pressure cvd chuck |
| US5421888A (en) * | 1992-05-12 | 1995-06-06 | Sony Corporation | Low pressure CVD apparatus comprising gas distribution collimator |
| US5302238A (en) * | 1992-05-15 | 1994-04-12 | Micron Technology, Inc. | Plasma dry etch to produce atomically sharp asperities useful as cold cathodes |
| US5350480A (en) * | 1993-07-23 | 1994-09-27 | Aspect International, Inc. | Surface cleaning and conditioning using hot neutral gas beam array |
| US6607991B1 (en) * | 1995-05-08 | 2003-08-19 | Electron Vision Corporation | Method for curing spin-on dielectric films utilizing electron beam radiation |
| JPH11176765A (ja) * | 1997-12-05 | 1999-07-02 | Samsung Electron Co Ltd | イオン注入損傷を抑制した浅接合形成方法 |
| US6037717A (en) * | 1999-01-04 | 2000-03-14 | Advanced Ion Technology, Inc. | Cold-cathode ion source with a controlled position of ion beam |
| US6214183B1 (en) * | 1999-01-30 | 2001-04-10 | Advanced Ion Technology, Inc. | Combined ion-source and target-sputtering magnetron and a method for sputtering conductive and nonconductive materials |
| JP2001023959A (ja) * | 1999-07-05 | 2001-01-26 | Mitsubishi Electric Corp | プラズマ処理装置 |
| US6407399B1 (en) * | 1999-09-30 | 2002-06-18 | Electron Vision Corporation | Uniformity correction for large area electron source |
| JP2002190260A (ja) * | 2000-10-13 | 2002-07-05 | Toshiba Corp | 陰極線管装置 |
| US20040089535A1 (en) * | 2002-08-16 | 2004-05-13 | The Regents Of The University Of California. | Process and apparatus for pulsed dc magnetron reactive sputtering of thin film coatings on large substrates using smaller sputter cathodes |
| US6831284B2 (en) * | 2002-11-21 | 2004-12-14 | Applied Materials, Inc. | Large area source for uniform electron beam generation |
-
2003
- 2003-10-30 US US10/698,726 patent/US7049606B2/en not_active Expired - Fee Related
-
2004
- 2004-10-29 WO PCT/US2004/036406 patent/WO2005043599A2/en not_active Ceased
- 2004-10-29 JP JP2006538427A patent/JP5242055B2/ja not_active Expired - Lifetime
- 2004-10-29 KR KR1020067010458A patent/KR101068790B1/ko not_active Expired - Fee Related
- 2004-10-29 CN CN2004800316668A patent/CN1875452B/zh not_active Expired - Fee Related
- 2004-10-29 TW TW093133114A patent/TWI318416B/zh not_active IP Right Cessation
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6212059A (ja) * | 1985-07-10 | 1987-01-21 | Matsushita Electric Works Ltd | 光放射電子管 |
| US6429445B1 (en) * | 1999-08-16 | 2002-08-06 | Samsung Electronics Co., Ltd. | Electron beam irradiating apparatus having cathode plate formed of non-metal conductive material |
| US20050003178A1 (en) * | 2003-04-21 | 2005-01-06 | Detert James W. | Apparatus and methods for the attachment of materials to polyurethane foam, and articles made using them |
Also Published As
| Publication number | Publication date |
|---|---|
| US20050092935A1 (en) | 2005-05-05 |
| JP2007510311A (ja) | 2007-04-19 |
| JP5242055B2 (ja) | 2013-07-24 |
| WO2005043599A2 (en) | 2005-05-12 |
| KR20060122875A (ko) | 2006-11-30 |
| TWI318416B (en) | 2009-12-11 |
| CN1875452A (zh) | 2006-12-06 |
| US7049606B2 (en) | 2006-05-23 |
| WO2005043599A3 (en) | 2005-07-14 |
| CN1875452B (zh) | 2010-06-16 |
| TW200515461A (en) | 2005-05-01 |
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