KR100843188B1 - 웨이퍼 정렬장치 - Google Patents
웨이퍼 정렬장치 Download PDFInfo
- Publication number
- KR100843188B1 KR100843188B1 KR1020050133802A KR20050133802A KR100843188B1 KR 100843188 B1 KR100843188 B1 KR 100843188B1 KR 1020050133802 A KR1020050133802 A KR 1020050133802A KR 20050133802 A KR20050133802 A KR 20050133802A KR 100843188 B1 KR100843188 B1 KR 100843188B1
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- unit
- group
- wafers
- receiving unit
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67718—Changing orientation of the substrate, e.g. from a horizontal position to a vertical position
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/136—Associated with semiconductor wafer handling including wafer orienting means
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (8)
- 수평방향으로 소정 간격 이격되는 한 쌍의 프레임(220)과, 상기 한 쌍의 프레임(220) 사이에 회전 가능하게 결합되어 웨이퍼 그룹을 수취하는 회전체(210)를 포함하고, 상기 회전체(210)는 내부에 웨이퍼 그룹이 안착되는 슬롯(214)이 형성되며, 상기 회전체(210)의 전후에 각각 설치되고 서로 인접 또는 이격되는 방향으로 슬라이딩 되어 상기 회전체(210) 회전 시 안착된 웨이퍼 그룹이 이탈되는 것을 방지하는 한 쌍의 로커(230)가 구비되고, 수평상태에서 공급되는 웨이퍼 그룹들을 웨이퍼 그룹별로 각각 일방향 또는 그 반대방향 중 어느 하나로 회전시켜 웨이퍼 그룹이 경면 반전되는 방향의 수직상태로 배열시키는 수취 유닛(200)과;복수 매의 웨이퍼를 안착시킬 수 있는 안착 키트(310)와, 상기 안착 키트(310)를 승강시키는 승강수단(320)과, 상기 안착 키트(310)를 웨이퍼의 배열방향으로 이동시키는 이동수단(330)으로 이루어져서, 상기 수직상태의 웨이퍼 그룹을 인계받아 정렬시키는 푸셔 유닛(300);을 포함하여 구성되고, 상기 웨이퍼 수취 유닛(200)과 푸셔 유닛(300)은 웨이퍼의 배열방향으로 서로 상대 이동 가능한 것을 특징으로 하는 웨이퍼 정렬장치.
- 삭제
- 삭제
- 삭제
- 청구항 1에 있어서,상기 이동수단(330)은, 웨이퍼의 배열방향으로 길게 형성되는 가이드 레일(322)과, 상기 가이드 레일(322)을 따라 이동하는 가이드 블록(324)과, 상기 가이드 블록(324)을 이동시키는 모터로 구성되는 것을 특징으로 하는 웨이퍼 정렬장치.
- 기판을 로딩 및 언로딩하기 위한 로딩부 및 언로딩부와;세정 처리를 하기 위한 세정조를 포함하는 처리실과;기판을 이송하는 기판 이송부와;각각에 세정액이 저장된 다수개의 측량탱크;를 포함하여 구성되고, 상기 로딩부는 청구항 1에 따른 웨이퍼 정렬장치를 포함하는 것을 특징으로 하는 웨이퍼 세정장치.
- 삭제
- 삭제
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050133802A KR100843188B1 (ko) | 2005-12-29 | 2005-12-29 | 웨이퍼 정렬장치 |
TW95139022A TWI331787B (en) | 2005-10-24 | 2006-10-23 | Apparatus and method of arraying wafers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050133802A KR100843188B1 (ko) | 2005-12-29 | 2005-12-29 | 웨이퍼 정렬장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070070847A KR20070070847A (ko) | 2007-07-04 |
KR100843188B1 true KR100843188B1 (ko) | 2008-07-02 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020050133802A KR100843188B1 (ko) | 2005-10-24 | 2005-12-29 | 웨이퍼 정렬장치 |
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KR (1) | KR100843188B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI663645B (zh) * | 2018-03-09 | 2019-06-21 | 禾邑實業股份有限公司 | 蝕刻機台的偵測機構 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990072722A (ko) * | 1998-02-18 | 1999-09-27 | 히가시 데쓰로 | 피처리기판반송장치및반송방법 |
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2005
- 2005-12-29 KR KR1020050133802A patent/KR100843188B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19990072722A (ko) * | 1998-02-18 | 1999-09-27 | 히가시 데쓰로 | 피처리기판반송장치및반송방법 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI663645B (zh) * | 2018-03-09 | 2019-06-21 | 禾邑實業股份有限公司 | 蝕刻機台的偵測機構 |
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KR20070070847A (ko) | 2007-07-04 |
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