KR100843148B1 - 액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법 - Google Patents
액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법 Download PDFInfo
- Publication number
- KR100843148B1 KR100843148B1 KR1020060133053A KR20060133053A KR100843148B1 KR 100843148 B1 KR100843148 B1 KR 100843148B1 KR 1020060133053 A KR1020060133053 A KR 1020060133053A KR 20060133053 A KR20060133053 A KR 20060133053A KR 100843148 B1 KR100843148 B1 KR 100843148B1
- Authority
- KR
- South Korea
- Prior art keywords
- voltage
- pin
- gate
- test
- liquid crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3696—Generation of voltages supplied to electrode drivers
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/02—Details of power systems and of start or stop of display operation
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G5/00—Control arrangements or circuits for visual indicators common to cathode-ray tube indicators and other visual indicators
- G09G5/003—Details of a display terminal, the details relating to the control arrangement of the display terminal and to the interfaces thereto
- G09G5/006—Details of the interface to the display terminal
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal (AREA)
- Liquid Crystal Display Device Control (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060133053A KR100843148B1 (ko) | 2006-12-22 | 2006-12-22 | 액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법 |
| JP2007100532A JP5079371B2 (ja) | 2006-12-22 | 2007-04-06 | 液晶表示装置、液晶表示装置のテスト用コネクタ、およびそのテスト方法 |
| US11/850,415 US7911217B2 (en) | 2006-12-22 | 2007-09-05 | Liquid crystal display, connector and method of testing the liquid crystal display |
| CN2007101802762A CN101206323B (zh) | 2006-12-22 | 2007-10-16 | 液晶显示器、连接器以及测试所述液晶显示器的方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060133053A KR100843148B1 (ko) | 2006-12-22 | 2006-12-22 | 액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080058872A KR20080058872A (ko) | 2008-06-26 |
| KR100843148B1 true KR100843148B1 (ko) | 2008-07-02 |
Family
ID=39542061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060133053A Expired - Fee Related KR100843148B1 (ko) | 2006-12-22 | 2006-12-22 | 액정 표시 장치, 액정 표시 장치의 테스트용 커넥터 및이의 테스트 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7911217B2 (https=) |
| JP (1) | JP5079371B2 (https=) |
| KR (1) | KR100843148B1 (https=) |
| CN (1) | CN101206323B (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108615490A (zh) * | 2018-03-16 | 2018-10-02 | 昆山龙腾光电有限公司 | 测试电路 |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101086508B (zh) * | 2006-06-07 | 2010-05-12 | 瀚斯宝丽股份有限公司 | 检测设备及其连接器及其检测方法 |
| CN101424795B (zh) * | 2007-11-02 | 2010-12-01 | 群康科技(深圳)有限公司 | 液晶显示器及其检测方法 |
| KR101427592B1 (ko) * | 2007-12-21 | 2014-08-08 | 삼성디스플레이 주식회사 | 액정표시장치용 검사장치 및 그 제어방법 |
| KR101492116B1 (ko) * | 2008-01-24 | 2015-02-09 | 삼성디스플레이 주식회사 | 커넥터 및 이를 갖는 표시장치 |
| JP5428299B2 (ja) * | 2008-03-18 | 2014-02-26 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
| US20090267877A1 (en) * | 2008-04-29 | 2009-10-29 | Himax Display, Inc. | Liquid crystal on silicon panel |
| TWI379116B (en) * | 2008-05-30 | 2012-12-11 | Chimei Innolux Corp | Liquid crystal display high-voltage testing circuit and method of testing liquid crystal display |
| TWI395041B (zh) * | 2008-07-16 | 2013-05-01 | Electronic paper display screen pin device | |
| KR101485584B1 (ko) * | 2008-08-06 | 2015-01-28 | 삼성디스플레이 주식회사 | 액정 표시 장치 및 그것의 구동 방법 |
| CN101719352B (zh) * | 2008-10-09 | 2012-07-25 | 北京京东方光电科技有限公司 | 液晶盒成盒后检测装置和方法 |
| JP5504507B2 (ja) | 2008-10-20 | 2014-05-28 | 国立大学法人 東京大学 | 集積回路装置 |
| CN101958091B (zh) * | 2009-07-15 | 2012-10-31 | 北京京东方光电科技有限公司 | 一种液晶显示面板盒后检测装置和检测方法 |
| CN102063877B (zh) * | 2009-11-12 | 2013-01-02 | 群康科技(深圳)有限公司 | 液晶显示器及其检测方法 |
| JP2013058428A (ja) * | 2011-09-09 | 2013-03-28 | Japan Display East Co Ltd | コネクタ接続検査回路、表示装置、コネクタ接続検査方法及び表示装置の製造方法 |
| US20130273776A1 (en) * | 2012-04-16 | 2013-10-17 | Shenzhen China Star Optoelectronics Technology Co Ltd. | Conversion Adaptor and LCD Inspection System |
| US8994219B2 (en) * | 2012-12-25 | 2015-03-31 | Shenzhen China Star Optoelectronics Technology Co., Ltd | DC/DC module of LCD driving circuit |
| CN104732913B (zh) * | 2013-12-19 | 2018-12-14 | 昆山国显光电有限公司 | Amoled的屏体结构及其电压转换电路 |
| KR102374748B1 (ko) * | 2015-06-30 | 2022-03-17 | 엘지디스플레이 주식회사 | 전원공급부 및 이를 이용한 표시장치 |
| CN105161065B (zh) * | 2015-09-30 | 2017-10-27 | 深圳市华星光电技术有限公司 | 液晶屏信号控制电路、显示面板及显示装置 |
| KR102618361B1 (ko) * | 2017-02-02 | 2023-12-27 | 삼성디스플레이 주식회사 | 표시 장치 |
| CN107038985B (zh) * | 2017-06-02 | 2020-04-03 | 京东方科技集团股份有限公司 | 用于显示面板的驱动模块、显示面板及显示装置 |
| CN107316618B (zh) * | 2017-07-19 | 2019-11-12 | 深圳市华星光电半导体显示技术有限公司 | 直流电压变换电路及直流电压变换方法和液晶显示装置 |
| CN107329291A (zh) * | 2017-08-11 | 2017-11-07 | 深圳同兴达科技股份有限公司 | 一种液晶显示模组高效检测系统 |
| CN112368762A (zh) * | 2018-06-29 | 2021-02-12 | 堺显示器制品株式会社 | 显示装置 |
| CN113160728B (zh) * | 2021-02-19 | 2024-02-20 | 厦门天马微电子有限公司 | 显示面板、检测显示面板的高压漏检方法及显示装置 |
| CN113745865B (zh) * | 2021-08-30 | 2022-09-09 | 武汉华星光电技术有限公司 | 引脚连接器和显示面板 |
| CN113920957B (zh) * | 2021-10-29 | 2022-07-26 | 重庆惠科金渝光电科技有限公司 | 液晶显示设备及其驱动方法 |
| CN115148141B (zh) * | 2022-06-27 | 2023-03-03 | 绵阳惠科光电科技有限公司 | 栅极驱动电路、栅极驱动方法和显示装置 |
| CN119001287B (zh) * | 2024-08-15 | 2025-12-09 | 四川航天烽火伺服控制技术有限公司 | 一种驱动板批量化测试电路及测试方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11186516A (ja) | 1997-12-17 | 1999-07-09 | Toshiba Microelectronics Corp | 半導体メモリ装置及び半導体メモリ装置の試験方法 |
| KR20000065751A (ko) * | 1999-04-08 | 2000-11-15 | 김영환 | 내부전원전위를 이용한 번인테스트용 고전압 발생장치 |
| KR20060125076A (ko) * | 2005-06-01 | 2006-12-06 | 삼성전자주식회사 | 액정 표시 장치의 제조 방법, 액정 표시 장치 및 에이징시스템 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08202320A (ja) * | 1995-01-25 | 1996-08-09 | Nec Home Electron Ltd | ディスプレイ装置のモード切り替え方法及びディスプ レイ装置 |
| JP4147594B2 (ja) * | 1997-01-29 | 2008-09-10 | セイコーエプソン株式会社 | アクティブマトリクス基板、液晶表示装置および電子機器 |
| KR100239749B1 (ko) * | 1997-04-11 | 2000-01-15 | 윤종용 | 그로스 테스트용 tft 소자 제조 방법 및 이를 형성한 액정 표시 장치 구조와 그로스 테스트 장치 및 방법 |
| JP3206509B2 (ja) * | 1997-08-22 | 2001-09-10 | 日本電気株式会社 | 表示パネル用プローブ装置 |
| JP2001272430A (ja) * | 2000-03-24 | 2001-10-05 | Oht Inc | 検査装置及び検査方法 |
| JP2002156417A (ja) * | 2000-11-17 | 2002-05-31 | Oht Inc | 回路基板の検査装置及び検査方法 |
| KR100758809B1 (ko) * | 2000-12-30 | 2007-09-13 | 엘지.필립스 엘시디 주식회사 | 액정표시소자의 검사장치 |
| JP2002340989A (ja) * | 2001-05-15 | 2002-11-27 | Semiconductor Energy Lab Co Ltd | 測定方法、検査方法及び検査装置 |
| US6940271B2 (en) * | 2001-08-17 | 2005-09-06 | Nptest, Inc. | Pin electronics interface circuit |
| JP4685336B2 (ja) * | 2003-06-06 | 2011-05-18 | 株式会社島津製作所 | Tftアレイ検査装置 |
| KR20060015201A (ko) * | 2004-08-13 | 2006-02-16 | 삼성전자주식회사 | 어레이 기판과, 이를 갖는 모기판 및 액정표시장치 |
| CN100359556C (zh) * | 2004-09-13 | 2008-01-02 | 凌阳科技股份有限公司 | 内建测试电路的源极驱动器及其测试方法 |
| KR101209050B1 (ko) * | 2005-02-22 | 2012-12-06 | 삼성디스플레이 주식회사 | 액정 표시 장치 및 그 검사 방법 |
| KR20060131021A (ko) | 2005-06-14 | 2006-12-20 | 삼성전자주식회사 | 표시 장치 |
| KR101147120B1 (ko) * | 2005-08-30 | 2012-05-25 | 엘지디스플레이 주식회사 | Lcd 검사 장비 및 lcd 검사 방법 |
| JP2007072285A (ja) * | 2005-09-08 | 2007-03-22 | Funai Electric Co Ltd | 液晶表示装置および液晶セルの検査装置 |
| JP5019194B2 (ja) * | 2005-11-30 | 2012-09-05 | 株式会社ジャパンディスプレイセントラル | 表示制御回路 |
-
2006
- 2006-12-22 KR KR1020060133053A patent/KR100843148B1/ko not_active Expired - Fee Related
-
2007
- 2007-04-06 JP JP2007100532A patent/JP5079371B2/ja not_active Expired - Fee Related
- 2007-09-05 US US11/850,415 patent/US7911217B2/en active Active
- 2007-10-16 CN CN2007101802762A patent/CN101206323B/zh not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11186516A (ja) | 1997-12-17 | 1999-07-09 | Toshiba Microelectronics Corp | 半導体メモリ装置及び半導体メモリ装置の試験方法 |
| KR20000065751A (ko) * | 1999-04-08 | 2000-11-15 | 김영환 | 내부전원전위를 이용한 번인테스트용 고전압 발생장치 |
| KR20060125076A (ko) * | 2005-06-01 | 2006-12-06 | 삼성전자주식회사 | 액정 표시 장치의 제조 방법, 액정 표시 장치 및 에이징시스템 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108615490A (zh) * | 2018-03-16 | 2018-10-02 | 昆山龙腾光电有限公司 | 测试电路 |
Also Published As
| Publication number | Publication date |
|---|---|
| US7911217B2 (en) | 2011-03-22 |
| JP2008158480A (ja) | 2008-07-10 |
| CN101206323B (zh) | 2011-06-15 |
| JP5079371B2 (ja) | 2012-11-21 |
| US20080150856A1 (en) | 2008-06-26 |
| CN101206323A (zh) | 2008-06-25 |
| KR20080058872A (ko) | 2008-06-26 |
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