KR100796848B1 - 작업물 측정 장치 - Google Patents
작업물 측정 장치 Download PDFInfo
- Publication number
- KR100796848B1 KR100796848B1 KR1020040012263A KR20040012263A KR100796848B1 KR 100796848 B1 KR100796848 B1 KR 100796848B1 KR 1020040012263 A KR1020040012263 A KR 1020040012263A KR 20040012263 A KR20040012263 A KR 20040012263A KR 100796848 B1 KR100796848 B1 KR 100796848B1
- Authority
- KR
- South Korea
- Prior art keywords
- workpiece
- probe
- guide plate
- base
- receiving hole
- Prior art date
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02G—INSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
- H02G3/00—Installations of electric cables or lines or protective tubing therefor in or on buildings, equivalent structures or vehicles
- H02G3/02—Details
- H02G3/06—Joints for connecting lengths of protective tubing or channels, to each other or to casings, e.g. to distribution boxes; Ensuring electrical continuity in the joint
- H02G3/0616—Joints for connecting tubing to casing
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16L—PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL
- F16L43/00—Bends; Siphons
- F16L43/008—Bends; Siphons made from plastic material
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16L—PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL
- F16L47/00—Connecting arrangements or other fittings specially adapted to be made of plastics or to be used with pipes made of plastics
- F16L47/06—Connecting arrangements or other fittings specially adapted to be made of plastics or to be used with pipes made of plastics with sleeve or socket formed by or in the pipe end
- F16L47/08—Connecting arrangements or other fittings specially adapted to be made of plastics or to be used with pipes made of plastics with sleeve or socket formed by or in the pipe end with sealing rings arranged between the outer surface of one pipe end and the inner surface of the sleeve or socket, the sealing rings being placed previously in the sleeve or socket
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Architecture (AREA)
- Civil Engineering (AREA)
- Structural Engineering (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
- Feeding Of Articles By Means Other Than Belts Or Rollers (AREA)
Abstract
Description
Claims (9)
- 베이스;상기 베이스 위를 슬라이딩 이동하며 작업물 수납구멍이 관통 형성된 반송체;상기 반송체 위에 고정되고, 상기 작업물 수납구멍의 적어도 한쪽 단부에 가이드 포트가 형성되어 있는 가이드 판; 및프로브 홀더와, 상기 프로브 홀더에 의해 유지되는 프로브를 구비한 작업물 검측부를 포함하는 작업물 측정 장치로서,상기 작업물은 상기 작업물 수납구멍의 한쪽 단부보다 안쪽에 수납되어 있으며,적어도 하나의 프로브는 상기 작업물 수납구멍 속의 작업물에 대하여 가압되고, 상기 프로브는 가이드 포트로 안내되어 작업물 수납구멍 속으로 진입해 작업물과 접촉한 후, 가이드 포트로부터 작업물 수납구멍 외부로 나오게 되는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,반송체는 전기 절연재에 의해 일체로 형성되어 있는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,반송체는 반송기판과, 상기 반송기판에 적층되며 가이드 포트를 갖는 가이드 판을 구비하는 것을 특징으로 하는 작업물 측정 장치.
- 제 3 항에 있어서,가이드 판은 전도성 재료로 이루어지는 것을 특징으로 하는 작업물 측정 장치.
- 제 3 항에 있어서,가이드 판은 절연성 재료로 이루어지는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,반송체의 다른 쪽에 베이스가 설치되며,다른 프로브는 베이스에 설치된 베이스 프로브로 이루어지는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,반송체는 회전 테이블로 이루어지는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,반송체는 벨트로 이루어지는 것을 특징으로 하는 작업물 측정 장치.
- 제 1 항에 있어서,가이드 포트의 형상은 작업물 수납구멍보다 대형으로 형성되어 있는 것을 특징으로 하는 작업물 측정 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003047149A JP4121870B2 (ja) | 2003-02-25 | 2003-02-25 | ワーク測定装置 |
JPJP-P-2003-00047149 | 2003-02-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040076629A KR20040076629A (ko) | 2004-09-01 |
KR100796848B1 true KR100796848B1 (ko) | 2008-01-22 |
Family
ID=32866561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040012263A KR100796848B1 (ko) | 2003-02-25 | 2004-02-24 | 작업물 측정 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6988609B2 (ko) |
JP (1) | JP4121870B2 (ko) |
KR (1) | KR100796848B1 (ko) |
CN (1) | CN100538368C (ko) |
TW (1) | TWI276803B (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5294195B2 (ja) * | 2008-05-01 | 2013-09-18 | 株式会社 東京ウエルズ | ワーク特性測定装置およびワーク特性測定方法 |
US8598888B2 (en) | 2010-05-04 | 2013-12-03 | Electro Scientific Industries, Inc. | System and method for improved testing of electronic devices |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5929649A (en) | 1996-04-18 | 1999-07-27 | Advanced Micro Devices, Inc. | Method and apparatus for electrical parasitic measurement of pin grid array |
US6384618B1 (en) | 2000-03-15 | 2002-05-07 | Advanced Micro Devices, Inc. | Chip scale electrical test fixture with isolation plate having an angled test hole |
US6512362B1 (en) | 1997-09-11 | 2003-01-28 | Fraunhofer Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Method and device for charging integrated circuits and structures with a pulsed heavy current |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3201183B2 (ja) * | 1994-10-25 | 2001-08-20 | 株式会社村田製作所 | 電子部品の特性測定装置 |
US5842579A (en) * | 1995-11-16 | 1998-12-01 | Electro Scientific Industries, Inc. | Electrical circuit component handler |
US5969752A (en) * | 1998-06-15 | 1999-10-19 | Electro Scientific Industries | Multi-function viewer/tester for miniature electric components |
US6531774B1 (en) * | 2000-05-03 | 2003-03-11 | Advanced Micro Devices, Inc. | Chip scale electrical test fixture with isolation plate having a recess |
JP2001332460A (ja) * | 2000-05-23 | 2001-11-30 | Taiyo Yuden Co Ltd | チップ部品選別装置及びその方法 |
-
2003
- 2003-02-25 JP JP2003047149A patent/JP4121870B2/ja not_active Expired - Lifetime
-
2004
- 2004-02-20 TW TW093104317A patent/TWI276803B/zh not_active IP Right Cessation
- 2004-02-24 US US10/784,195 patent/US6988609B2/en active Active
- 2004-02-24 KR KR1020040012263A patent/KR100796848B1/ko active IP Right Grant
- 2004-02-25 CN CNB200410007034XA patent/CN100538368C/zh not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5929649A (en) | 1996-04-18 | 1999-07-27 | Advanced Micro Devices, Inc. | Method and apparatus for electrical parasitic measurement of pin grid array |
US6512362B1 (en) | 1997-09-11 | 2003-01-28 | Fraunhofer Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Method and device for charging integrated circuits and structures with a pulsed heavy current |
US6384618B1 (en) | 2000-03-15 | 2002-05-07 | Advanced Micro Devices, Inc. | Chip scale electrical test fixture with isolation plate having an angled test hole |
Also Published As
Publication number | Publication date |
---|---|
CN1525179A (zh) | 2004-09-01 |
CN100538368C (zh) | 2009-09-09 |
KR20040076629A (ko) | 2004-09-01 |
JP4121870B2 (ja) | 2008-07-23 |
JP2004257793A (ja) | 2004-09-16 |
TWI276803B (en) | 2007-03-21 |
US6988609B2 (en) | 2006-01-24 |
US20040163927A1 (en) | 2004-08-26 |
TW200427987A (en) | 2004-12-16 |
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