KR100779279B1 - 표면 청정도 측정 조립체 및 방법 - Google Patents

표면 청정도 측정 조립체 및 방법 Download PDF

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Publication number
KR100779279B1
KR100779279B1 KR1020010028366A KR20010028366A KR100779279B1 KR 100779279 B1 KR100779279 B1 KR 100779279B1 KR 1020010028366 A KR1020010028366 A KR 1020010028366A KR 20010028366 A KR20010028366 A KR 20010028366A KR 100779279 B1 KR100779279 B1 KR 100779279B1
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South Korea
Prior art keywords
component
cleanliness
smear
tool
foreign material
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Expired - Fee Related
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KR1020010028366A
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English (en)
Korean (ko)
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KR20020024769A (ko
Inventor
슈로더마크스튜어트
우드만시도날드어네스트
베디더글라스프랭크
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제너럴 일렉트릭 캄파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B08B1/14—Wipes; Absorbent members, e.g. swabs or sponges
    • B08B1/143—Wipes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020010028366A 2000-09-26 2001-05-23 표면 청정도 측정 조립체 및 방법 Expired - Fee Related KR100779279B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/669,574 2000-09-26
US09/669,574 US6397690B1 (en) 2000-09-26 2000-09-26 Tools for measuring surface cleanliness

Publications (2)

Publication Number Publication Date
KR20020024769A KR20020024769A (ko) 2002-04-01
KR100779279B1 true KR100779279B1 (ko) 2007-11-23

Family

ID=24686863

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KR1020010028366A Expired - Fee Related KR100779279B1 (ko) 2000-09-26 2001-05-23 표면 청정도 측정 조립체 및 방법

Country Status (5)

Country Link
US (2) US6397690B1 (enExample)
EP (1) EP1191323A3 (enExample)
JP (1) JP2002122519A (enExample)
KR (1) KR100779279B1 (enExample)
CZ (1) CZ20011861A3 (enExample)

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US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness
US7144427B2 (en) * 2002-12-05 2006-12-05 Depuy Products, Inc. Apparatus and method for advancing synovial fluid in a prosthetic joint
GB2426334A (en) * 2005-05-20 2006-11-22 Orion Diagnostica Oy Application of a reagent to a matrix material
US20070192979A1 (en) * 2005-05-31 2007-08-23 Knopow Jeremy F Cleaning implement having a visual indicator for determining debris removal effectiveness and end of useful life
US8011050B2 (en) * 2005-05-31 2011-09-06 S.C. Johnson & Son, Inc. Fabric sweeper
CN101363778B (zh) * 2007-08-10 2011-06-15 同方威视技术股份有限公司 一种可防止采样载体变形的手持式采样装置及方法
CN101470051A (zh) * 2007-12-29 2009-07-01 同方威视技术股份有限公司 擦拭采样组件
FR2927168B1 (fr) * 2008-02-01 2012-10-19 Ctip Conseil Table representant differentes nuances de gris notees de 0 a 9 permettant de noter par comparaison un prelevement realise sur un tissu ou papier blanc dans le but de quantifier un niveau de proprete de surfaces
US20100050354A1 (en) * 2008-02-28 2010-03-04 Neavin Timothy S Instrument for cleaning surgical instruments during surgery
DE102008059112A1 (de) * 2008-11-26 2010-06-17 Eads Deutschland Gmbh Probensammler und Probensammeleinrichtung für eine Analyseeinrichtung sowie Verfahren zu dessen Betrieb
CA2696647A1 (en) * 2009-03-17 2010-09-17 The Procter & Gamble Company Demonstrative methods for paper towel products
IT1394043B1 (it) * 2009-03-25 2012-05-25 Dussmann Service S R L Metodo di misurazione della pulizia di un ambiente
US8397554B2 (en) * 2010-01-22 2013-03-19 The Procter & Gamble Company Method of testing softness attributes of paper towel products
USD689660S1 (en) 2010-06-24 2013-09-10 S.C. Johnson & Son, Inc. Fabric sweeper
USD657573S1 (en) 2010-07-02 2012-04-17 S.C. Johnson & Son, Inc. Lid for a fabric sweeper device
EP2410317A1 (de) * 2010-07-13 2012-01-25 Krämer AG Bassersdorf Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln
CN102095599A (zh) * 2010-10-12 2011-06-15 上海宏力半导体制造有限公司 机械手臂表面金属污染检测方法
WO2012091419A2 (ko) * 2010-12-28 2012-07-05 주식회사 세니젠 비접촉식 구획방식을 이용한 고체표면 미생물 검체 채취방법 및 그 고체표면 구획장치
WO2012175820A1 (fr) * 2011-06-20 2012-12-27 Long Lasting Innovation - L2I Procede de determination de la concentration surfacique en molecules actives d'une surface d'un element actif et dispositif pour sa mise en œuvre
BR112015014361A2 (pt) * 2012-12-17 2017-07-11 Man Chung Wo Andrew conjunto de amostragem para amostragem de um espécime, módulo de microscópio aplicado para proporcionar uma imagem de uma amostra, e aparelho de microscópio
JP5924390B2 (ja) * 2014-10-01 2016-05-25 三浦工業株式会社 試料採取ペン
FR3039647B1 (fr) * 2015-07-31 2020-11-13 Commissariat Energie Atomique Procede d'analyse d'impuretes organiques presentes a la surface d'un substrat, et dispositif de collecte des impuretes organiques a la surface d'un substrat
SE540253C2 (en) * 2016-07-01 2018-05-15 Expertus Kemiteknik Ab Device for surface sampling with removal device
CN209400423U (zh) 2017-09-21 2019-09-17 贝克顿·迪金森公司 横向流测定物、测定物读取器装置和包括其的系统
EP3684944B1 (en) 2017-09-21 2025-01-01 Becton, Dickinson and Company Hazardous contaminant collection kit and rapid testing
JP7275113B2 (ja) 2017-09-21 2023-05-17 ベクトン・ディキンソン・アンド・カンパニー 有害汚染物質を高いピックアップ効率及び分離効率で収集するサンプリングシステム及び技術
CN209559735U (zh) * 2017-09-21 2019-10-29 贝克顿·迪金森公司 用于引导收集有害污染物样本的系统
AU2018337036B2 (en) 2017-09-21 2023-07-06 Becton, Dickinson And Company Augmented reality devices for hazardous contaminant testing
US11002642B2 (en) * 2017-09-21 2021-05-11 Becton, Dickinson And Company Demarcation template for hazardous contaminant testing
CA3075766A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
CN212748381U (zh) 2019-01-28 2021-03-19 贝克顿·迪金森公司 一种有害污染物检测系统和一种有害污染物收集装置
JP7182787B2 (ja) * 2019-04-10 2022-12-05 株式会社エルメックス 拭き取り枠
USD963489S1 (en) * 2020-12-12 2022-09-13 Hans Wyssen Air sampler

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6291842A (ja) * 1985-10-18 1987-04-27 Hitachi Ltd 清浄度評価法
US5084005A (en) * 1988-07-13 1992-01-28 Becton, Dickinson And Company Swab for collection of biological samples
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
KR19980022982A (ko) * 1996-09-25 1998-07-06 김종진 스트립 표면의 오염도 측정장치
JPH10235658A (ja) * 1997-02-26 1998-09-08 Mitsuboshi Belting Ltd 樹脂材料の金型汚染性測定方法
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis
US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness

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US2835246A (en) * 1954-12-22 1958-05-20 Boettger Paul Handling medical specimens
US3074276A (en) * 1959-04-20 1963-01-22 Walter S Moos Radioactivity smear sampler
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
US3572128A (en) 1969-06-13 1971-03-23 Wesley C L Hemeon Dustfall sampling apparatus
IT1056108B (it) 1975-09-04 1982-01-30 Cnen Dispositivo per il controllo indiretto della contaminazionne radioattiva di superfici
JPS5470493A (en) * 1977-11-17 1979-06-06 Nissan Chem Ind Ltd Preparation of unsaturated alcohol
JPS586290A (ja) * 1981-07-03 1983-01-13 Ebara Corp 曝気装置
GB2185571A (en) * 1986-01-10 1987-07-22 British Nuclear Fuels Plc Swabbing device
JPS636484A (ja) * 1986-06-26 1988-01-12 Toshiba Corp 揺動式スミヤヘツド
JP3450517B2 (ja) * 1995-05-25 2003-09-29 バイオトレース リミテッド 界面活性剤の検出方法及び界面活性剤検出用キット
JPH0915170A (ja) * 1995-06-29 1997-01-17 Hitachi Cable Ltd 粉末状物質付着量測定方法
US6021681A (en) * 1997-06-27 2000-02-08 The United States Of America As Represented By The United States Department Of Energy Sampling device with a capped body and detachable handle
US6382036B1 (en) * 2000-09-26 2002-05-07 General Electric Company Apparatus for measuring surface particulate contamination

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6291842A (ja) * 1985-10-18 1987-04-27 Hitachi Ltd 清浄度評価法
US5084005A (en) * 1988-07-13 1992-01-28 Becton, Dickinson And Company Swab for collection of biological samples
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis
KR19980022982A (ko) * 1996-09-25 1998-07-06 김종진 스트립 표면의 오염도 측정장치
JPH10235658A (ja) * 1997-02-26 1998-09-08 Mitsuboshi Belting Ltd 樹脂材料の金型汚染性測定方法
US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness

Also Published As

Publication number Publication date
KR20020024769A (ko) 2002-04-01
CZ20011861A3 (cs) 2002-05-15
EP1191323A3 (en) 2004-05-19
JP2002122519A (ja) 2002-04-26
US6397690B1 (en) 2002-06-04
EP1191323A2 (en) 2002-03-27
US20020035869A1 (en) 2002-03-28
US6378386B1 (en) 2002-04-30

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