KR100711804B1 - 단전자 트랜지스터의 제조 방법 - Google Patents
단전자 트랜지스터의 제조 방법 Download PDFInfo
- Publication number
- KR100711804B1 KR100711804B1 KR1020050127872A KR20050127872A KR100711804B1 KR 100711804 B1 KR100711804 B1 KR 100711804B1 KR 1020050127872 A KR1020050127872 A KR 1020050127872A KR 20050127872 A KR20050127872 A KR 20050127872A KR 100711804 B1 KR100711804 B1 KR 100711804B1
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- South Korea
- Prior art keywords
- electron transistor
- room temperature
- pph
- self
- manufacturing
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 24
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 4
- 238000003786 synthesis reaction Methods 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 claims description 9
- 239000002356 single layer Substances 0.000 claims description 6
- 238000000151 deposition Methods 0.000 claims description 5
- 229910052729 chemical element Inorganic materials 0.000 claims description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 3
- 239000002094 self assembled monolayer Substances 0.000 abstract description 20
- 239000013545 self-assembled monolayer Substances 0.000 abstract description 20
- 239000002105 nanoparticle Substances 0.000 abstract description 7
- 101100030361 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) pph-3 gene Proteins 0.000 abstract description 4
- 238000005516 engineering process Methods 0.000 abstract description 3
- 239000004065 semiconductor Substances 0.000 abstract description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 abstract 2
- 239000010931 gold Substances 0.000 description 18
- 238000010586 diagram Methods 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 125000001309 chloro group Chemical group Cl* 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 241000282472 Canis lupus familiaris Species 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66446—Unipolar field-effect transistors with an active layer made of a group 13/15 material, e.g. group 13/15 velocity modulation transistor [VMT], group 13/15 negative resistance FET [NERFET]
- H01L29/66469—Unipolar field-effect transistors with an active layer made of a group 13/15 material, e.g. group 13/15 velocity modulation transistor [VMT], group 13/15 negative resistance FET [NERFET] with one- or zero-dimensional channel, e.g. quantum wire field-effect transistors, in-plane gate transistors [IPG], single electron transistors [SET], Coulomb blockade transistors, striped channel transistors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/775—Field effect transistors with one dimensional charge carrier gas channel, e.g. quantum wire FET
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (6)
- 게이트, 소스, 드레인, 쿨롱 아일랜드가 있는 단전자 트랜지스터에 있어서,상기 게이트가 포함된 산화막 위에 나노 분자 Au55(PPh3)12Cl6를 이용하여 자기조립 단일막 형태로 증착시키는 단계와;상기 자기조립 단일막의 좌우측에 상기 소스와 드레인 전극을 접합하여 전압을 인가하는 2단계와;상기 자기조립 단일막위에 산화막을 증착하여 덮어서 단전자 트랜지스터를 제조하는 3단계를 포함하는 것을 특징으로 하는 단전자 트랜지스터의 제조방법.
- 제 1항에 있어서,상기 나노 분자 Au55(PPh3)12Cl6 는 화학식 Ph는 C6H5의 화학식을 갖는 페닐(Phenyle)기를 나타내고, Au, P, Cl은 화학 원소를 나타내는 것을 특징으로 하는 단전자 트랜지스터의 제조방법.
- 제 1항에 있어서,상기 단전자 트랜지스터는 상온과 대기중에서 대량 합성이 가능하고, 상온에 서 작동하는 것을 특징으로 하는 단전자 트랜지스터의 제조방법.
- 삭제
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050127872A KR100711804B1 (ko) | 2005-12-22 | 2005-12-22 | 단전자 트랜지스터의 제조 방법 |
Applications Claiming Priority (1)
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KR1020050127872A KR100711804B1 (ko) | 2005-12-22 | 2005-12-22 | 단전자 트랜지스터의 제조 방법 |
Publications (1)
Publication Number | Publication Date |
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KR100711804B1 true KR100711804B1 (ko) | 2007-04-30 |
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KR1020050127872A KR100711804B1 (ko) | 2005-12-22 | 2005-12-22 | 단전자 트랜지스터의 제조 방법 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101394412B1 (ko) | 2007-12-21 | 2014-05-14 | 재단법인 포항산업과학연구원 | 단전자 트랜지스터의 형성방법 |
EP3882348A2 (en) | 2015-11-02 | 2021-09-22 | Scuola Normale Superiore | Intrabodies targeting post-translational modifications of native proteins and method for obtaining them |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980066846A (ko) * | 1997-01-29 | 1998-10-15 | 이홍희 | 단전자 반도체 소자 및 그 제조 방법 |
KR20010105454A (ko) * | 2000-05-06 | 2001-11-29 | 윤종용 | Set 소자 제작 방법 |
JP2003338621A (ja) | 2002-05-20 | 2003-11-28 | Fujitsu Ltd | 半導体装置及びその製造方法 |
KR20050105483A (ko) * | 2003-03-21 | 2005-11-04 | 인터내셔널 비지네스 머신즈 코포레이션 | 자기조립단분자막을 포함하는 전자 디바이스 및 그제조방법 |
-
2005
- 2005-12-22 KR KR1020050127872A patent/KR100711804B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR19980066846A (ko) * | 1997-01-29 | 1998-10-15 | 이홍희 | 단전자 반도체 소자 및 그 제조 방법 |
KR20010105454A (ko) * | 2000-05-06 | 2001-11-29 | 윤종용 | Set 소자 제작 방법 |
JP2003338621A (ja) | 2002-05-20 | 2003-11-28 | Fujitsu Ltd | 半導体装置及びその製造方法 |
KR20050105483A (ko) * | 2003-03-21 | 2005-11-04 | 인터내셔널 비지네스 머신즈 코포레이션 | 자기조립단분자막을 포함하는 전자 디바이스 및 그제조방법 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101394412B1 (ko) | 2007-12-21 | 2014-05-14 | 재단법인 포항산업과학연구원 | 단전자 트랜지스터의 형성방법 |
EP3882348A2 (en) | 2015-11-02 | 2021-09-22 | Scuola Normale Superiore | Intrabodies targeting post-translational modifications of native proteins and method for obtaining them |
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