KR100659802B1 - 표면 미립자 오염을 측정하기 위한 장치 및 오염 샘플을대상 표면으로부터 수집하기 위한 공구 - Google Patents

표면 미립자 오염을 측정하기 위한 장치 및 오염 샘플을대상 표면으로부터 수집하기 위한 공구 Download PDF

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KR100659802B1
KR100659802B1 KR1020010059396A KR20010059396A KR100659802B1 KR 100659802 B1 KR100659802 B1 KR 100659802B1 KR 1020010059396 A KR1020010059396 A KR 1020010059396A KR 20010059396 A KR20010059396 A KR 20010059396A KR 100659802 B1 KR100659802 B1 KR 100659802B1
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spool
diameter portions
smear
tool
large diameter
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KR20020024799A (ko
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우드만시도날드어네스트
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제너럴 일렉트릭 캄파니
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
KR1020010059396A 2000-09-26 2001-09-25 표면 미립자 오염을 측정하기 위한 장치 및 오염 샘플을대상 표면으로부터 수집하기 위한 공구 Expired - Fee Related KR100659802B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/670,452 US6382036B1 (en) 2000-09-26 2000-09-26 Apparatus for measuring surface particulate contamination
US09/670,452 2000-09-26

Publications (2)

Publication Number Publication Date
KR20020024799A KR20020024799A (ko) 2002-04-01
KR100659802B1 true KR100659802B1 (ko) 2006-12-19

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KR1020010059396A Expired - Fee Related KR100659802B1 (ko) 2000-09-26 2001-09-25 표면 미립자 오염을 측정하기 위한 장치 및 오염 샘플을대상 표면으로부터 수집하기 위한 공구

Country Status (5)

Country Link
US (1) US6382036B1 (enExample)
EP (1) EP1191324B1 (enExample)
JP (1) JP2002131196A (enExample)
KR (1) KR100659802B1 (enExample)
CZ (1) CZ20012839A3 (enExample)

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US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness
US8011258B2 (en) * 2003-08-28 2011-09-06 L-3 Communications Cyterra Corporation Explosive residue sampling
KR100910906B1 (ko) 2008-11-05 2009-08-05 (주)코스코텍 방사능 표면오염 측정을 위한 균일압력기
DE102008059112A1 (de) * 2008-11-26 2010-06-17 Eads Deutschland Gmbh Probensammler und Probensammeleinrichtung für eine Analyseeinrichtung sowie Verfahren zu dessen Betrieb
CA2696647A1 (en) * 2009-03-17 2010-09-17 The Procter & Gamble Company Demonstrative methods for paper towel products
EP2410317A1 (de) * 2010-07-13 2012-01-25 Krämer AG Bassersdorf Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln
KR101289473B1 (ko) 2013-01-22 2013-07-24 한국생산기술연구원 불균염 정량 시스템 및 이를 이용한 불균염 정량 방법
EP2953703A4 (en) 2013-02-05 2017-02-08 Pocared Diagnostics Ltd Filter arrangement and method for using the same
JP5924390B2 (ja) * 2014-10-01 2016-05-25 三浦工業株式会社 試料採取ペン
DE102016119628A1 (de) * 2016-10-14 2018-04-19 Minebea Intec GmbH Probensammler mit integriertem Kraftmesser
DE102016012369B3 (de) * 2016-10-15 2017-02-23 Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, vertreten durch das Bundesamt für Ausrüstung, Informationstechnik und Nutzung der Bundeswehr Probennahmekit für eine CBRN-Probe
JP7275113B2 (ja) * 2017-09-21 2023-05-17 ベクトン・ディキンソン・アンド・カンパニー 有害汚染物質を高いピックアップ効率及び分離効率で収集するサンプリングシステム及び技術
CN209400423U (zh) 2017-09-21 2019-09-17 贝克顿·迪金森公司 横向流测定物、测定物读取器装置和包括其的系统
JP7277442B2 (ja) 2017-09-21 2023-05-19 ベクトン・ディキンソン・アンド・カンパニー 有害汚染物質検査のための拡張現実デバイス
US11002642B2 (en) * 2017-09-21 2021-05-11 Becton, Dickinson And Company Demarcation template for hazardous contaminant testing
CA3075766A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
EP3685139B1 (en) 2017-09-21 2023-12-13 Becton, Dickinson and Company Reactive demarcation template and method for hazardous contaminant testing
CA3075773A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
CN108827686B (zh) * 2018-07-31 2023-07-25 河南师范大学 一种用于手掌灰尘样品采集以用于真皮暴露评估的手套
EP3918300A4 (en) 2019-01-28 2022-11-16 Becton, Dickinson and Company Hazardous contaminant collection device with integrated swab and test device
CN109946109A (zh) * 2019-03-20 2019-06-28 西安热工研究院有限公司 一种汽轮机叶片微量水溶性沉积物的取样和检测方法
CZ309251B6 (cs) * 2020-10-23 2022-06-22 Univerzita Karlova Způsob čištění a nedestruktivního sledování procesu čištění křemenných ampulí pro polovodičové technologie
JP2023105453A (ja) * 2022-01-19 2023-07-31 株式会社豊田中央研究所 生物由来核酸回収方法、および、生物由来核酸回収装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
US5571976A (en) * 1994-12-08 1996-11-05 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Revenue Apparatus and method for collecting samples for IMS (Ion Mobility Spectrometers) analyzers and the like
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis
US5939647A (en) * 1996-01-16 1999-08-17 Applied Materials, Inc. Surface particle sampling head having a rotatable probe

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US3074276A (en) * 1959-04-20 1963-01-22 Walter S Moos Radioactivity smear sampler
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
FR1535675A (fr) * 1967-06-28 1968-08-09 Commissariat Energie Atomique Dispositif de prélèvement, par frottement sur une surface, de traces de substances susceptibles d'être radioactives
JPS618389Y2 (enExample) * 1980-08-11 1986-03-14
JPS618388Y2 (enExample) * 1980-08-11 1986-03-14
JPS586290U (ja) * 1981-07-03 1983-01-14 株式会社東芝 放射性物質の試料採取装置
JPH0449595Y2 (enExample) * 1985-08-07 1992-11-20
JPS6235275U (enExample) * 1985-08-20 1987-03-02
JPS62143278U (enExample) * 1986-03-05 1987-09-09
JPS636375U (enExample) * 1986-06-26 1988-01-16
FR2622972B1 (fr) * 1987-11-09 1990-03-16 Inhni Procede de controle de proprete d'une surface et dispositif pour la mise en oeuvre dudit procede
JPH075264A (ja) * 1993-06-16 1995-01-10 Fuji Electric Co Ltd 表面汚染検査装置、該検査装置のスミヤパッド及び該スミヤパッドのスミヤろ紙自動交換装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
US5571976A (en) * 1994-12-08 1996-11-05 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Revenue Apparatus and method for collecting samples for IMS (Ion Mobility Spectrometers) analyzers and the like
US5939647A (en) * 1996-01-16 1999-08-17 Applied Materials, Inc. Surface particle sampling head having a rotatable probe
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis

Also Published As

Publication number Publication date
JP2002131196A (ja) 2002-05-09
US6382036B1 (en) 2002-05-07
EP1191324B1 (en) 2010-12-08
EP1191324A2 (en) 2002-03-27
EP1191324A3 (en) 2003-10-22
CZ20012839A3 (cs) 2002-05-15
KR20020024799A (ko) 2002-04-01

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