JP2002131196A - 表面の微粒子汚染物質を測定する装置 - Google Patents

表面の微粒子汚染物質を測定する装置

Info

Publication number
JP2002131196A
JP2002131196A JP2001290338A JP2001290338A JP2002131196A JP 2002131196 A JP2002131196 A JP 2002131196A JP 2001290338 A JP2001290338 A JP 2001290338A JP 2001290338 A JP2001290338 A JP 2001290338A JP 2002131196 A JP2002131196 A JP 2002131196A
Authority
JP
Japan
Prior art keywords
spool
smear
diameter portion
spring
tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2001290338A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002131196A5 (enExample
Inventor
Donald E Woodmansee
ドナルド・アーネスト・ウッドマンシー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2002131196A publication Critical patent/JP2002131196A/ja
Publication of JP2002131196A5 publication Critical patent/JP2002131196A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2001290338A 2000-09-26 2001-09-25 表面の微粒子汚染物質を測定する装置 Ceased JP2002131196A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/670,452 US6382036B1 (en) 2000-09-26 2000-09-26 Apparatus for measuring surface particulate contamination
US09/670452 2000-09-26

Publications (2)

Publication Number Publication Date
JP2002131196A true JP2002131196A (ja) 2002-05-09
JP2002131196A5 JP2002131196A5 (enExample) 2008-11-06

Family

ID=24690451

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001290338A Ceased JP2002131196A (ja) 2000-09-26 2001-09-25 表面の微粒子汚染物質を測定する装置

Country Status (5)

Country Link
US (1) US6382036B1 (enExample)
EP (1) EP1191324B1 (enExample)
JP (1) JP2002131196A (enExample)
KR (1) KR100659802B1 (enExample)
CZ (1) CZ20012839A3 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002122519A (ja) * 2000-09-26 2002-04-26 General Electric Co <Ge> 表面清浄度測定方法及び表面清浄度を測定する装置
KR101289473B1 (ko) 2013-01-22 2013-07-24 한국생산기술연구원 불균염 정량 시스템 및 이를 이용한 불균염 정량 방법
JP2016070861A (ja) * 2014-10-01 2016-05-09 三浦工業株式会社 試料採取ペン
JP2020534522A (ja) * 2017-09-21 2020-11-26 ベクトン・ディキンソン・アンド・カンパニーＢｅｃｔｏｎ， Ｄｉｃｋｉｎｓｏｎ Ａｎｄ Ｃｏｍｐａｎｙ 有害汚染物質を高いピックアップ効率及び分離効率で収集するサンプリングシステム及び技術
JP2023105453A (ja) * 2022-01-19 2023-07-31 株式会社豊田中央研究所 生物由来核酸回収方法、および、生物由来核酸回収装置

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8011258B2 (en) * 2003-08-28 2011-09-06 L-3 Communications Cyterra Corporation Explosive residue sampling
KR100910906B1 (ko) 2008-11-05 2009-08-05 (주)코스코텍 방사능 표면오염 측정을 위한 균일압력기
DE102008059112A1 (de) * 2008-11-26 2010-06-17 Eads Deutschland Gmbh Probensammler und Probensammeleinrichtung für eine Analyseeinrichtung sowie Verfahren zu dessen Betrieb
CA2696647A1 (en) * 2009-03-17 2010-09-17 The Procter & Gamble Company Demonstrative methods for paper towel products
EP2410317A1 (de) * 2010-07-13 2012-01-25 Krämer AG Bassersdorf Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln
JP6116709B2 (ja) 2013-02-05 2017-04-19 ポカード・ディアグノスティクス・リミテッドＰｏｃａｒｅｄ Ｄｉａｇｎｏｓｔｉｃｓ， Ｌｔｄ． フィルタ装置及びその使用方法
DE102016119628A1 (de) * 2016-10-14 2018-04-19 Minebea Intec GmbH Probensammler mit integriertem Kraftmesser
DE102016012369B3 (de) * 2016-10-15 2017-02-23 Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, vertreten durch das Bundesamt für Ausrüstung, Informationstechnik und Nutzung der Bundeswehr Probennahmekit für eine CBRN-Probe
WO2019060270A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company HIGH DYNAMIC RANGE ASSAYS IN HAZARDOUS CONTAMINANT ANALYSIS
WO2019060276A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company INCREASED REALITY DEVICES FOR DANGEROUS CONTAMINANT TESTING
JP7206257B2 (ja) 2017-09-21 2023-01-17 ベクトン・ディキンソン・アンド・カンパニー 危険汚染物質の収集キット及び迅速試験
US11199529B2 (en) 2017-09-21 2021-12-14 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
WO2019060275A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company DEMARCATION TEMPLATE FOR DANGEROUS CONTAMINANT TEST
CA3075771A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Reactive demarcation template for hazardous contaminant testing
CN108827686B (zh) * 2018-07-31 2023-07-25 河南师范大学 一种用于手掌灰尘样品采集以用于真皮暴露评估的手套
US11280801B2 (en) 2019-01-28 2022-03-22 Becton, Dickinson And Company Hazardous contaminant collection device with integrated swab and test device
CN109946109A (zh) * 2019-03-20 2019-06-28 西安热工研究院有限公司 一种汽轮机叶片微量水溶性沉积物的取样和检测方法
CZ309251B6 (cs) * 2020-10-23 2022-06-22 Univerzita Karlova Způsob čištění a nedestruktivního sledování procesu čištění křemenných ampulí pro polovodičové technologie

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
JPS5737475U (enExample) * 1980-08-11 1982-02-27
JPS5737474U (enExample) * 1980-08-11 1982-02-27
JPS586290U (ja) * 1981-07-03 1983-01-14 株式会社東芝 放射性物質の試料採取装置
JPS6230178U (enExample) * 1985-08-07 1987-02-23
JPS6235275U (enExample) * 1985-08-20 1987-03-02
JPS62143278U (enExample) * 1986-03-05 1987-09-09
JPS636375U (enExample) * 1986-06-26 1988-01-16
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
JPH075264A (ja) * 1993-06-16 1995-01-10 Fuji Electric Co Ltd 表面汚染検査装置、該検査装置のスミヤパッド及び該スミヤパッドのスミヤろ紙自動交換装置
US5571976A (en) * 1994-12-08 1996-11-05 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Revenue Apparatus and method for collecting samples for IMS (Ion Mobility Spectrometers) analyzers and the like

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3074276A (en) * 1959-04-20 1963-01-22 Walter S Moos Radioactivity smear sampler
FR1535675A (fr) * 1967-06-28 1968-08-09 Commissariat Energie Atomique Dispositif de prélèvement, par frottement sur une surface, de traces de substances susceptibles d'être radioactives
FR2622972B1 (fr) * 1987-11-09 1990-03-16 Inhni Procede de controle de proprete d'une surface et dispositif pour la mise en oeuvre dudit procede
US5939647A (en) * 1996-01-16 1999-08-17 Applied Materials, Inc. Surface particle sampling head having a rotatable probe
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
JPS5737475U (enExample) * 1980-08-11 1982-02-27
JPS5737474U (enExample) * 1980-08-11 1982-02-27
JPS586290U (ja) * 1981-07-03 1983-01-14 株式会社東芝 放射性物質の試料採取装置
JPS6230178U (enExample) * 1985-08-07 1987-02-23
JPS6235275U (enExample) * 1985-08-20 1987-03-02
JPS62143278U (enExample) * 1986-03-05 1987-09-09
JPS636375U (enExample) * 1986-06-26 1988-01-16
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
JPH075264A (ja) * 1993-06-16 1995-01-10 Fuji Electric Co Ltd 表面汚染検査装置、該検査装置のスミヤパッド及び該スミヤパッドのスミヤろ紙自動交換装置
US5571976A (en) * 1994-12-08 1996-11-05 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Revenue Apparatus and method for collecting samples for IMS (Ion Mobility Spectrometers) analyzers and the like

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002122519A (ja) * 2000-09-26 2002-04-26 General Electric Co <Ge> 表面清浄度測定方法及び表面清浄度を測定する装置
KR101289473B1 (ko) 2013-01-22 2013-07-24 한국생산기술연구원 불균염 정량 시스템 및 이를 이용한 불균염 정량 방법
JP2016070861A (ja) * 2014-10-01 2016-05-09 三浦工業株式会社 試料採取ペン
JP2020534522A (ja) * 2017-09-21 2020-11-26 ベクトン・ディキンソン・アンド・カンパニーＢｅｃｔｏｎ， Ｄｉｃｋｉｎｓｏｎ Ａｎｄ Ｃｏｍｐａｎｙ 有害汚染物質を高いピックアップ効率及び分離効率で収集するサンプリングシステム及び技術
JP7275113B2 (ja) 2017-09-21 2023-05-17 ベクトン・ディキンソン・アンド・カンパニー 有害汚染物質を高いピックアップ効率及び分離効率で収集するサンプリングシステム及び技術
JP2023105453A (ja) * 2022-01-19 2023-07-31 株式会社豊田中央研究所 生物由来核酸回収方法、および、生物由来核酸回収装置

Also Published As

Publication number Publication date
EP1191324A2 (en) 2002-03-27
KR100659802B1 (ko) 2006-12-19
EP1191324A3 (en) 2003-10-22
KR20020024799A (ko) 2002-04-01
CZ20012839A3 (cs) 2002-05-15
US6382036B1 (en) 2002-05-07
EP1191324B1 (en) 2010-12-08

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