JPS62143278U - - Google Patents
Info
- Publication number
- JPS62143278U JPS62143278U JP3156986U JP3156986U JPS62143278U JP S62143278 U JPS62143278 U JP S62143278U JP 3156986 U JP3156986 U JP 3156986U JP 3156986 U JP3156986 U JP 3156986U JP S62143278 U JPS62143278 U JP S62143278U
- Authority
- JP
- Japan
- Prior art keywords
- wiping
- pressing force
- handle
- elastic member
- smear
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011109 contamination Methods 0.000 claims 1
- 230000002285 radioactive effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
Landscapes
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3156986U JPS62143278U (enExample) | 1986-03-05 | 1986-03-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3156986U JPS62143278U (enExample) | 1986-03-05 | 1986-03-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62143278U true JPS62143278U (enExample) | 1987-09-09 |
Family
ID=30837425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3156986U Pending JPS62143278U (enExample) | 1986-03-05 | 1986-03-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62143278U (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002131196A (ja) * | 2000-09-26 | 2002-05-09 | General Electric Co <Ge> | 表面の微粒子汚染物質を測定する装置 |
| JP2010204083A (ja) * | 2009-02-03 | 2010-09-16 | Panasonic Corp | 検体採取器具 |
-
1986
- 1986-03-05 JP JP3156986U patent/JPS62143278U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002131196A (ja) * | 2000-09-26 | 2002-05-09 | General Electric Co <Ge> | 表面の微粒子汚染物質を測定する装置 |
| JP2010204083A (ja) * | 2009-02-03 | 2010-09-16 | Panasonic Corp | 検体採取器具 |