KR100646986B1 - 포토마스크 및 이를 이용한 노광 방법 - Google Patents
포토마스크 및 이를 이용한 노광 방법 Download PDFInfo
- Publication number
- KR100646986B1 KR100646986B1 KR1020050076794A KR20050076794A KR100646986B1 KR 100646986 B1 KR100646986 B1 KR 100646986B1 KR 1020050076794 A KR1020050076794 A KR 1020050076794A KR 20050076794 A KR20050076794 A KR 20050076794A KR 100646986 B1 KR100646986 B1 KR 100646986B1
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- South Korea
- Prior art keywords
- cells
- photomask
- polar molecules
- electrode plate
- polar
- Prior art date
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
- G03F7/2043—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means with the production of a chemical active agent from a fluid, e.g. an etching agent; with meterial deposition from the fluid phase, e.g. contamination resists
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
- G03F7/2059—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a scanning corpuscular radiation beam, e.g. an electron beam
- G03F7/2063—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using a scanning corpuscular radiation beam, e.g. an electron beam for the production of exposure masks or reticles
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
- G03F7/70391—Addressable array sources specially adapted to produce patterns, e.g. addressable LED arrays
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
Claims (8)
- 복수의 하부셀들로 이루어진 하부전극판;상기 하부셀들에 대응하는 복수의 상부셀들로 이루어진 상부전극판; 및상기 전극판들 사이에 위치하며, 극성분자들로 이루어진 극성분자층을 포함하는 것을 특징으로 하는 포토마스크.
- 제 1 항에 있어서, 상기 극성분자들은 하나의 상부셀과 이에 대응하는 하부셀에 인가되는 전압에 따라 일정하게 배열되는 것을 특징으로 하는 포토마스크.
- 제 2 항에 있어서, 외부로부터 제공된 빛은 상기 배열된 극성분자들 사이로 투과하는 것을 특징으로 하는 포토마스크.
- 제 1 항에 있어서, 상기 각 전극판들은 투명한 것을 특징으로 하는 포토마스크.
- 제 4 항에 있어서, 상기 셀들은 투명한 절연체에 의해 각기 구획되는 것을 특징으로 하는 포토마스크.
- 제 1 항에 있어서, 상기 극성분자층은 상기 극성분자들을 포함하는 유전체로 이루어지는 것을 특징으로 하는 포토마스크.
- 복수의 하부셀들을 가지는 하부전극판 및 상기 하부셀들에 대응하는 상부셀들을 가지는 상부전극판을 포함하는 포토마스크를 이용한 노광 방법에 있어서,기판 위에 소정 물질을 증착하는 단계;상기 기판 위에 상기 포토마스크를 위치시키는 단계;일부 하부셀과 이에 대응하는 상부셀에 각기 전압을 인가하여 상기 하부셀과 상기 상부셀 사이에 위치하는 극성분자들을 배열하는 단계; 및상기 배열된 극성분자들을 포함하는 상기 포토마스크를 통하여 상기 증착된 물질에 빛을 제공하는 단계를 포함하는 것을 특징으로 하는 포토마스크를 이용한 노광 방법.
- 제 7 항에 있어서, 상기 각 전극판들은 투명한 것을 특징으로 하는 포토마스크를 이용한 노광 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020050076794A KR100646986B1 (ko) | 2005-08-22 | 2005-08-22 | 포토마스크 및 이를 이용한 노광 방법 |
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KR1020050076794A KR100646986B1 (ko) | 2005-08-22 | 2005-08-22 | 포토마스크 및 이를 이용한 노광 방법 |
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KR100646986B1 true KR100646986B1 (ko) | 2006-11-23 |
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KR1020050076794A KR100646986B1 (ko) | 2005-08-22 | 2005-08-22 | 포토마스크 및 이를 이용한 노광 방법 |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR840000314B1 (ko) * | 1979-10-01 | 1984-03-16 | 피이피이지이 인더스트니이즈 인코포레이팃드 | 착색된 유리 포토마스크의 제조방법 |
KR19990003864A (ko) * | 1997-06-26 | 1999-01-15 | 김영환 | 반도체 장치 제조 방법 |
KR20000003434A (ko) * | 1998-06-29 | 2000-01-15 | 김영환 | 이중코팅을 이용한 반도체 소자의 미세 콘택홀 형성 방법 |
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2005
- 2005-08-22 KR KR1020050076794A patent/KR100646986B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR840000314B1 (ko) * | 1979-10-01 | 1984-03-16 | 피이피이지이 인더스트니이즈 인코포레이팃드 | 착색된 유리 포토마스크의 제조방법 |
KR19990003864A (ko) * | 1997-06-26 | 1999-01-15 | 김영환 | 반도체 장치 제조 방법 |
KR20000003434A (ko) * | 1998-06-29 | 2000-01-15 | 김영환 | 이중코팅을 이용한 반도체 소자의 미세 콘택홀 형성 방법 |
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