KR100598552B1 - 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어 - Google Patents
2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어 Download PDFInfo
- Publication number
- KR100598552B1 KR100598552B1 KR1020047008173A KR20047008173A KR100598552B1 KR 100598552 B1 KR100598552 B1 KR 100598552B1 KR 1020047008173 A KR1020047008173 A KR 1020047008173A KR 20047008173 A KR20047008173 A KR 20047008173A KR 100598552 B1 KR100598552 B1 KR 100598552B1
- Authority
- KR
- South Korea
- Prior art keywords
- discharge
- laser
- repetition rate
- pulse
- high repetition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000007789 gas Substances 0.000 claims description 68
- 239000003990 capacitor Substances 0.000 claims description 48
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 229910052754 neon Inorganic materials 0.000 claims description 6
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims description 6
- 229910052731 fluorine Inorganic materials 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 239000011737 fluorine Substances 0.000 claims description 3
- 239000001307 helium Substances 0.000 claims description 3
- 229910052734 helium Inorganic materials 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- 238000012986 modification Methods 0.000 claims description 3
- 230000004048 modification Effects 0.000 claims description 3
- 210000004457 myocytus nodalis Anatomy 0.000 claims description 3
- 230000003595 spectral effect Effects 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 claims 1
- 239000002826 coolant Substances 0.000 claims 1
- 229910052743 krypton Inorganic materials 0.000 claims 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims 1
- 239000000203 mixture Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 19
- 230000003321 amplification Effects 0.000 abstract description 7
- 238000002347 injection Methods 0.000 abstract description 7
- 239000007924 injection Substances 0.000 abstract description 7
- 238000003199 nucleic acid amplification method Methods 0.000 abstract description 7
- 238000005457 optimization Methods 0.000 abstract description 4
- 238000007906 compression Methods 0.000 description 13
- 230000006835 compression Effects 0.000 description 12
- 238000013461 design Methods 0.000 description 9
- 238000001459 lithography Methods 0.000 description 9
- 230000006872 improvement Effects 0.000 description 8
- 230000005291 magnetic effect Effects 0.000 description 8
- 238000004804 winding Methods 0.000 description 7
- 230000004044 response Effects 0.000 description 6
- 230000033228 biological regulation Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 239000011162 core material Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000002441 reversible effect Effects 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 230000001960 triggered effect Effects 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000006698 induction Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229920006395 saturated elastomer Polymers 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910004261 CaF 2 Inorganic materials 0.000 description 2
- 229910003271 Ni-Fe Inorganic materials 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- VIKNJXKGJWUCNN-XGXHKTLJSA-N norethisterone Chemical compound O=C1CC[C@@H]2[C@H]3CC[C@](C)([C@](CC4)(O)C#C)[C@@H]4[C@@H]3CCC2=C1 VIKNJXKGJWUCNN-XGXHKTLJSA-N 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 210000004027 cell Anatomy 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000001802 infusion Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000002045 lasting effect Effects 0.000 description 1
- 210000004185 liver Anatomy 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/038—Electrodes, e.g. special shape, configuration or composition
- H01S3/0385—Shape
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70025—Production of exposure light, i.e. light sources by lasers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70041—Production of exposure light, i.e. light sources by pulsed sources, e.g. multiplexing, pulse duration, interval control or intensity control
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/036—Means for obtaining or maintaining the desired gas pressure within the tube, e.g. by gettering, replenishing; Means for circulating the gas, e.g. for equalising the pressure within the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08004—Construction or shape of optical resonators or components thereof incorporating a dispersive element, e.g. a prism for wavelength selection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
- H01S3/09705—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser with particular means for stabilising the discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
- H01S3/0971—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser transversely excited
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2366—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media comprising a gas as the active medium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
- H01S3/0057—Temporal shaping, e.g. pulse compression, frequency chirping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/03—Constructional details of gas laser discharge tubes
- H01S3/038—Electrodes, e.g. special shape, configuration or composition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/02—Constructional details
- H01S3/04—Arrangements for thermal management
- H01S3/041—Arrangements for thermal management for gas lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08004—Construction or shape of optical resonators or components thereof incorporating a dispersive element, e.g. a prism for wavelength selection
- H01S3/08009—Construction or shape of optical resonators or components thereof incorporating a dispersive element, e.g. a prism for wavelength selection using a diffraction grating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/091—Processes or apparatus for excitation, e.g. pumping using optical pumping
- H01S3/094—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light
- H01S3/0943—Processes or apparatus for excitation, e.g. pumping using optical pumping by coherent light of a gas laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
- H01S3/09702—Details of the driver electronics and electric discharge circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/09—Processes or apparatus for excitation, e.g. pumping
- H01S3/097—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser
- H01S3/0975—Processes or apparatus for excitation, e.g. pumping by gas discharge of a gas laser using inductive or capacitive excitation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/131—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
- H01S3/134—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the active medium, e.g. by controlling the processes or apparatus for excitation in gas lasers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
- H01S3/139—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/2207—Noble gas ions, e.g. Ar+>, Kr+>
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
- H01S3/2251—ArF, i.e. argon fluoride is comprised for lasing around 193 nm
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
- H01S3/2256—KrF, i.e. krypton fluoride is comprised for lasing around 248 nm
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/22—Gases
- H01S3/223—Gases the active gas being polyatomic, i.e. containing two or more atoms
- H01S3/225—Gases the active gas being polyatomic, i.e. containing two or more atoms comprising an excimer or exciplex
- H01S3/2258—F2, i.e. molecular fluoride is comprised for lasing around 157 nm
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2308—Amplifier arrangements, e.g. MOPA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
- H01S3/2308—Amplifier arrangements, e.g. MOPA
- H01S3/2325—Multi-pass amplifiers, e.g. regenerative amplifiers
- H01S3/2333—Double-pass amplifiers
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Lasers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
정류자 및 압축 헤드에 대한 상세한 설명
Claims (27)
- 일정한 타이밍 제어 특징부를 갖춘 초 협대역이고 2 챔버를 갖는 고 반복율 가스 방전 레이저 시스템에 있어서,A) 1) a) 제1 레이저 가스와, b) 제1 방전 영역을 정의하는 제1 쌍의 신장되고 이격된 전극을 포함하는, 제1 방전 챔버,2) 초당 4,000 펄스 이상의 범위의 반복율로 동작하는 경우, 각각의 펄스에 뒤이어지는, 다음 펄스 이전에 실질적으로 모든 방전 산출된 이온을 상기 제1 방전 영역으로부터 클리어시키기에 충분한 상기 제1 레이저 가스의 속도를 상기 제1 방전 영역에 발생시키기 위한 제1 팬,3) 상기 제 1 레이저 가스로부터 적어도 16kw의 열 에너지를 제거할 수 있는 제1 열 교환기 시스템, 및4) 상기 제1 방전 챔버에 산출된 광 펄스의 스펙트럼 대역폭을 협소화하기 위한 라인 협소화 유닛을 포함하는,제1 레이저 유닛;B) 1) a) 제2 레이저 가스와, b) 제2 방전 영역을 정의하는 제2 쌍의 신장되고 이격된 전극을 포함하는, 제2 방전 챔버,2) 초당 4,000 펄스 이상의 범위의 반복율로 동작하는 경우, 각각의 펄스에 뒤이어지는, 다음 펄스 이전에 실질적으로 모든 방전 산출된 이온을 상기 제2 방전 영역으로부터 클리어시키기에 충분한 상기 제2 레이저 가스의 속도를 상기 제2 방전 영역에 발생시키기 위한 제2 팬, 및3) 상기 제 2 레이저 가스로부터 적어도 16kw의 열 에너지를 제거할 수 있는 제2 열 교환기 시스템을 포함하는,제2 레이저 유닛;C) 5mJ을 초과하는 제어된 펄스 에너지로 초당 약 4,000펄스의 반복율로 레이저 펄스를 생성하기에 충분한 상기 제2 쌍의 전극과 상기 제1 쌍의 전극에 전기 펄스를 공급하도록 구성된 펄스 파워 시스템;D) 상기 2 챔버 레이저 시스템에 의해 산출된 레이저 출력 펄스의 펄스 에너지, 파장 및 대역폭을 측정하고 상기 레이저 출력 펄스를 피드백 제어 장치에서 제어하기 위한 레이저 빔 측정 및 제어 시스템; 및E) 피드백 타이밍 제어를 제공하는 알고리즘으로 프로그래밍된 프로세서를 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 제1 레이저 유닛은 마스터 오실레이터로서 구성되고 상기 제2 레이저 유닛은 전력 증폭기로서 구성되는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제2 항에 있어서, 상기 레이저 가스는 아르곤, 플루오라이드 및 네온으로 이루어지는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제2 항에 있어서, 상기 레이저 가스는 크립톤, 플루오르 및 네온으로 이루어 지는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제2 항에 있어서, 상기 레이저 가스는 네온, 헬륨 또는 네온과 헬륨의 혼합물로 구성된 군으로부터 선택된 버퍼 가스 및 플루오르로 이루어 지는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 제 1 팬 및 상기 제 2 팬은 각각 탄젠셜 팬이고 각각은 두 개의 브러시리스 DC 모터에 의해 구동되는 축을 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제6 항에 있어서, 상기 모터는 수냉식 모터인 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 펄스 파워 시스템은 수냉식 전기 컴포넌트를 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제8 항에 있어서, 상기 수냉식 전기 컴포넌트의 적어도 하나는 12,000볼트를 초과하는 고전압으로 동작되는 컴포넌트인 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제9 항에 있어서, 상기 고전압은 냉각수의 흐름이 관통하는 인덕터를 이용하여 접지로부터 절연되는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 펄스 파워 시스템은 충전 커패시터를 정밀하게 제어된 전압으로 충전시키는 공진 충전 시스템을 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 시스템은 최소한의 수정으로, KrF 레이저 시스템, ArF 레이저 시스템 또는 F2 레이저 시스템중의 하나를 동작시키도록 구성된 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 실질적으로 모든 컴포넌트가 레이저 인클로우저에 포함되지만 상기 시스템은 인클로우저로부터 물리적으로 분리된 AC/DC 모듈을 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 펄스 파워 시스템은 커패시터 뱅크를 충전하는 마스터 오실레이터와 커패시터 뱅크를 충전하는 전력 증폭기와 두 충전 커패시터 뱅크를 동시에 충전하도록 구성된 공진 충전기를 포함하는 것을 특징으로 하는 고 반복 율 가스 방전 레이저 시스템.
- 제14 항에 있어서, 상기 펄스 파워 시스템은 적어도 2000V를 상기 공진 충전기에 공급하도록 구성된 전력 공급부를 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 마스터 오실레이터 빔 파라미터를 제어하기 위해 상기 제1 레이저 가스내의 F2 농도를 제어하기 위한 가스 제어 시스템을 더 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 마스터 오실레이터 빔 파라미터를 제어하기 위해 상기 제1 레이저 가스내의 레이저 가스 압력을 제어하기 위한 가스 제어 시스템을 더 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제2 항에 있어서, 상기 마스터 오실레이터에서의 방전 후 20 ns 내지 60ns 사이에 발생하도록 상기 전력 증폭기내의 방전을 트리거링시키기 위한 방전 타이밍 컨트롤러를 더 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제2 항에 있어서, 임의의 커다란 출력 펄스 에너지를 방지하도록 정해진 타이밍으로 방전이 일어나도록 프로그램된 방전 컨트롤러를 더 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제19 항에 있어서, 상기 컨트롤러는, 상기 마스터 오실레이터에서의 방전 이전의 적어도 20 ns에서 상기 전력 증폭기에서의 방전을 일으키도록 프로그램된 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제19 항에 있어서, 상기 컨트롤러는, 상기 마스터 오실레이터에서의 방전 이후의 적어도 70 ns에서 상기 전력 증폭기에서의 방전을 일으키도록 프로그램된 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제20 항에 있어서, 상기 적어도 20 ns는 약 40 ns인 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제21 항에 있어서, 상기 적어도 70 ns는 약 110 ns인 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제1 항에 있어서, 상기 레이저는 상기 제1 및 제2 챔버의 각각에서의 방전의 ASE를 측정하기 위한 P-셀을 포함하는 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제24 항에 있어서, 상기 컨트롤러는 상기 P-셀로부터의 신호를 사용하여 방전을 지시하도록 프로그램된 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 제21 항에 있어서, 상기 컨트롤러는 커패시터 전압의 측정에 기초하여 방전을 결정하도록 프로그램된 것을 특징으로 하는 고 반복율 가스 방전 레이저 시스템.
- 삭제
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/012,002 US6625191B2 (en) | 1999-12-10 | 2001-11-30 | Very narrow band, two chamber, high rep rate gas discharge laser system |
| US10/012,002 | 2001-11-30 | ||
| US10/036,727 US6865210B2 (en) | 2001-05-03 | 2001-12-21 | Timing control for two-chamber gas discharge laser system |
| US10/036,727 | 2001-12-21 | ||
| PCT/US2002/034045 WO2003049241A1 (en) | 2001-11-30 | 2002-10-23 | Timing control for two-chamber gas discharge laser system |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067003552A Division KR100850447B1 (ko) | 2001-11-30 | 2002-10-23 | 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20040058350A KR20040058350A (ko) | 2004-07-03 |
| KR100598552B1 true KR100598552B1 (ko) | 2006-07-07 |
Family
ID=26683031
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020047008173A Expired - Lifetime KR100598552B1 (ko) | 2001-11-30 | 2002-10-23 | 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어 |
| KR1020067003552A Expired - Lifetime KR100850447B1 (ko) | 2001-11-30 | 2002-10-23 | 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020067003552A Expired - Lifetime KR100850447B1 (ko) | 2001-11-30 | 2002-10-23 | 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어방법 |
Country Status (10)
| Country | Link |
|---|---|
| US (3) | US6865210B2 (ko) |
| EP (1) | EP1449284B1 (ko) |
| JP (1) | JP3971385B2 (ko) |
| KR (2) | KR100598552B1 (ko) |
| CN (1) | CN100350686C (ko) |
| AT (1) | ATE443358T1 (ko) |
| AU (1) | AU2002353869A1 (ko) |
| DE (1) | DE60233746D1 (ko) |
| IL (1) | IL161818A0 (ko) |
| WO (1) | WO2003049241A1 (ko) |
Families Citing this family (76)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6801560B2 (en) * | 1999-05-10 | 2004-10-05 | Cymer, Inc. | Line selected F2 two chamber laser system |
| US6865210B2 (en) * | 2001-05-03 | 2005-03-08 | Cymer, Inc. | Timing control for two-chamber gas discharge laser system |
| US6914919B2 (en) * | 2000-06-19 | 2005-07-05 | Cymer, Inc. | Six to ten KHz, or greater gas discharge laser system |
| US6912052B2 (en) * | 2000-11-17 | 2005-06-28 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| US7167499B2 (en) * | 2001-04-18 | 2007-01-23 | Tcz Pte. Ltd. | Very high energy, high stability gas discharge laser surface treatment system |
| US7061959B2 (en) * | 2001-04-18 | 2006-06-13 | Tcz Gmbh | Laser thin film poly-silicon annealing system |
| US7009140B2 (en) * | 2001-04-18 | 2006-03-07 | Cymer, Inc. | Laser thin film poly-silicon annealing optical system |
| US20050259709A1 (en) | 2002-05-07 | 2005-11-24 | Cymer, Inc. | Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate |
| US7088758B2 (en) | 2001-07-27 | 2006-08-08 | Cymer, Inc. | Relax gas discharge laser lithography light source |
| US6963595B2 (en) * | 2001-08-29 | 2005-11-08 | Cymer, Inc. | Automatic gas control system for a gas discharge laser |
| US7830934B2 (en) * | 2001-08-29 | 2010-11-09 | Cymer, Inc. | Multi-chamber gas discharge laser bandwidth control through discharge timing |
| US20030219094A1 (en) * | 2002-05-21 | 2003-11-27 | Basting Dirk L. | Excimer or molecular fluorine laser system with multiple discharge units |
| US20040202220A1 (en) * | 2002-11-05 | 2004-10-14 | Gongxue Hua | Master oscillator-power amplifier excimer laser system |
| US7308013B2 (en) | 2002-11-05 | 2007-12-11 | Lambda Physik Ag | Excimer or molecular fluorine laser system with precision timing |
| US7741639B2 (en) * | 2003-01-31 | 2010-06-22 | Cymer, Inc. | Multi-chambered excimer or molecular fluorine gas discharge laser fluorine injection control |
| US6987790B2 (en) * | 2003-02-14 | 2006-01-17 | Lambda Physik Ag | Excimer or molecular fluorine laser with several discharge chambers |
| US7277188B2 (en) * | 2003-04-29 | 2007-10-02 | Cymer, Inc. | Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate |
| US7366213B2 (en) * | 2003-05-19 | 2008-04-29 | Lambda Physik Ag | MOPA excimer or molecular fluorine laser system with improved synchronization |
| US7209507B2 (en) * | 2003-07-30 | 2007-04-24 | Cymer, Inc. | Method and apparatus for controlling the output of a gas discharge MOPA laser system |
| US6894785B2 (en) | 2003-09-30 | 2005-05-17 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| US6873418B1 (en) | 2003-09-30 | 2005-03-29 | Cymer, Inc. | Optical mountings for gas discharge MOPA laser spectral analysis module |
| US20060146906A1 (en) * | 2004-02-18 | 2006-07-06 | Cymer, Inc. | LLP EUV drive laser |
| US7035012B2 (en) * | 2004-03-01 | 2006-04-25 | Coherent, Inc. | Optical pulse duration extender |
| US20050286599A1 (en) * | 2004-06-29 | 2005-12-29 | Rafac Robert J | Method and apparatus for gas discharge laser output light coherency reduction |
| JP4012216B2 (ja) * | 2005-06-08 | 2007-11-21 | ファナック株式会社 | レーザ発振器 |
| US7317536B2 (en) | 2005-06-27 | 2008-01-08 | Cymer, Inc. | Spectral bandwidth metrology for high repetition rate gas discharge lasers |
| US7653095B2 (en) * | 2005-06-30 | 2010-01-26 | Cymer, Inc. | Active bandwidth control for a laser |
| US7679029B2 (en) * | 2005-10-28 | 2010-03-16 | Cymer, Inc. | Systems and methods to shape laser light as a line beam for interaction with a substrate having surface variations |
| US7317179B2 (en) * | 2005-10-28 | 2008-01-08 | Cymer, Inc. | Systems and methods to shape laser light as a homogeneous line beam for interaction with a film deposited on a substrate |
| US7471455B2 (en) | 2005-10-28 | 2008-12-30 | Cymer, Inc. | Systems and methods for generating laser light shaped as a line beam |
| US7746913B2 (en) | 2005-11-01 | 2010-06-29 | Cymer, Inc. | Laser system |
| US20090296758A1 (en) * | 2005-11-01 | 2009-12-03 | Cymer, Inc. | Laser system |
| US7643529B2 (en) * | 2005-11-01 | 2010-01-05 | Cymer, Inc. | Laser system |
| US7630424B2 (en) * | 2005-11-01 | 2009-12-08 | Cymer, Inc. | Laser system |
| US7999915B2 (en) * | 2005-11-01 | 2011-08-16 | Cymer, Inc. | Laser system |
| US7778302B2 (en) * | 2005-11-01 | 2010-08-17 | Cymer, Inc. | Laser system |
| KR101238739B1 (ko) * | 2005-11-01 | 2013-03-04 | 사이머 인코포레이티드 | 레이저 시스템 |
| US7715459B2 (en) * | 2005-11-01 | 2010-05-11 | Cymer, Inc. | Laser system |
| US20090296755A1 (en) * | 2005-11-01 | 2009-12-03 | Cymer, Inc. | Laser system |
| US7920616B2 (en) * | 2005-11-01 | 2011-04-05 | Cymer, Inc. | Laser system |
| US7885309B2 (en) | 2005-11-01 | 2011-02-08 | Cymer, Inc. | Laser system |
| US7307237B2 (en) * | 2005-12-29 | 2007-12-11 | Honeywell International, Inc. | Hand-held laser welding wand nozzle assembly including laser and feeder extension tips |
| US8803027B2 (en) * | 2006-06-05 | 2014-08-12 | Cymer, Llc | Device and method to create a low divergence, high power laser beam for material processing applications |
| EP2025419B1 (de) | 2007-07-20 | 2011-09-07 | Renate Fourné | Verfahren und Vorrichtung zum Entlacken von Bauteilen |
| US7830942B2 (en) * | 2007-09-11 | 2010-11-09 | Cymer, Inc. | Ultraviolet laser light source pulse energy control system |
| JP2009246345A (ja) * | 2008-03-12 | 2009-10-22 | Komatsu Ltd | レーザシステム |
| US7819945B2 (en) * | 2008-10-30 | 2010-10-26 | Cymer, Inc. | Metal fluoride trap |
| JP5844536B2 (ja) * | 2011-03-28 | 2016-01-20 | ギガフォトン株式会社 | レーザシステムおよびレーザ生成方法 |
| JP5815987B2 (ja) * | 2011-05-20 | 2015-11-17 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| KR20130034474A (ko) * | 2011-09-28 | 2013-04-05 | 참엔지니어링(주) | 레이저 출력 조정 장치 및 그 방법 |
| US8681832B2 (en) * | 2011-09-30 | 2014-03-25 | Cymer, Inc. | System and method for high accuracy gas inject in a two chamber gas discharge laser system |
| CN102810810A (zh) * | 2012-03-02 | 2012-12-05 | 中国科学院光电研究院 | 单腔双电极放电腔及准分子激光器 |
| CN102931569B (zh) * | 2012-11-08 | 2014-07-30 | 中国科学院光电研究院 | 准分子激光器的自动温控系统 |
| WO2015101959A2 (en) * | 2014-01-06 | 2015-07-09 | Saudi Basic Industries Corporation | Modified preformation method for catalyst activation in ethylene reactions |
| WO2015189895A1 (ja) | 2014-06-09 | 2015-12-17 | ギガフォトン株式会社 | レーザシステム |
| CN104820137B (zh) * | 2015-04-14 | 2017-10-31 | 中国科学院光电研究院 | 高频高压快脉冲时序采集装置和方法 |
| CN104836102B (zh) * | 2015-04-14 | 2018-03-23 | 中国科学院光电研究院 | 一种高重频双腔准分子激光器放电同步控制系统和方法 |
| US9785050B2 (en) | 2015-06-26 | 2017-10-10 | Cymer, Llc | Pulsed light beam spectral feature control |
| CN107851957B (zh) | 2015-09-14 | 2020-09-18 | 极光先进雷射株式会社 | 激光系统 |
| US9819136B2 (en) * | 2016-01-08 | 2017-11-14 | Cymer, Llc | Gas mixture control in a gas discharge light source |
| US9634455B1 (en) * | 2016-02-16 | 2017-04-25 | Cymer, Llc | Gas optimization in a gas discharge light source |
| WO2017158694A1 (ja) | 2016-03-14 | 2017-09-21 | ギガフォトン株式会社 | レーザ装置及び極端紫外光生成システム |
| FR3052563B1 (fr) * | 2016-06-13 | 2018-08-24 | Universite De Rennes 1 | Module d'affinement spectral, dispositif a raie spectrale affinee et procede afferent |
| US9989866B2 (en) | 2016-10-17 | 2018-06-05 | Cymer, Llc | Wafer-based light source parameter control |
| US10416471B2 (en) | 2016-10-17 | 2019-09-17 | Cymer, Llc | Spectral feature control apparatus |
| US9835959B1 (en) | 2016-10-17 | 2017-12-05 | Cymer, Llc | Controlling for wafer stage vibration |
| US9997888B2 (en) | 2016-10-17 | 2018-06-12 | Cymer, Llc | Control of a spectral feature of a pulsed light beam |
| US9966725B1 (en) * | 2017-03-24 | 2018-05-08 | Cymer, Llc | Pulsed light beam spectral feature control |
| CN108964487B (zh) * | 2018-07-19 | 2019-08-16 | 中国科学院合肥物质科学研究院 | 一种用于磁压缩等离子体聚变的电源系统 |
| GB201905126D0 (en) | 2019-04-11 | 2019-05-29 | Perlemax Ltd | Fluidic oscilators |
| CN110086074B (zh) * | 2019-05-06 | 2020-01-24 | 南京瑞贻电子科技有限公司 | 一种大功率光纤激光器线性补偿的动态耦合控制装置及控制方法 |
| CN113853551B (zh) | 2019-05-22 | 2024-09-10 | 西默有限公司 | 用于多个深紫外光学振荡器的控制系统 |
| CN113841309B (zh) * | 2019-05-22 | 2025-03-18 | 西默有限公司 | 生成多个激光束的设备和方法 |
| WO2021138026A1 (en) * | 2019-12-31 | 2021-07-08 | Cymer, Llc | Dual pulsed power system with independent voltage and timing control and reduced power consumption |
| CN115244801B (zh) * | 2020-03-16 | 2025-02-25 | 三菱电机株式会社 | 激光放大装置及极紫外光发生装置 |
| CN117543324B (zh) * | 2022-12-27 | 2025-03-25 | 北京科益虹源光电技术有限公司 | 双腔准分子激光器的同步控制方法、控制设备及激光器 |
Family Cites Families (91)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1458066A (en) * | 1922-06-14 | 1923-06-05 | Compte Edward P Le | Coat adjuster |
| US2740963A (en) * | 1951-01-29 | 1956-04-03 | Gilfillan Bros Inc | Automatic amplitude cancellation in moving target indicator |
| US4009391A (en) * | 1974-06-25 | 1977-02-22 | Jersey Nuclear-Avco Isotopes, Inc. | Suppression of unwanted lasing in laser isotope separation |
| US4223279A (en) | 1977-07-18 | 1980-09-16 | Mathematical Sciences Northwest, Inc. | Pulsed electric discharge laser utilizing water dielectric blumlein transmission line |
| US4329664A (en) * | 1980-06-09 | 1982-05-11 | Ali Javan | Generation of stable frequency radiation at an optical frequency |
| US4550408A (en) | 1981-02-27 | 1985-10-29 | Heinrich Karning | Method and apparatus for operating a gas laser |
| US4455658A (en) | 1982-04-20 | 1984-06-19 | Sutter Jr Leroy V | Coupling circuit for use with a transversely excited gas laser |
| US4891820A (en) | 1985-12-19 | 1990-01-02 | Rofin-Sinar, Inc. | Fast axial flow laser circulating system |
| US5189678A (en) | 1986-09-29 | 1993-02-23 | The United States Of America As Represented By The United States Department Of Energy | Coupling apparatus for a metal vapor laser |
| US5315611A (en) | 1986-09-25 | 1994-05-24 | The United States Of America As Represented By The United States Department Of Energy | High average power magnetic modulator for metal vapor lasers |
| JPS63141381A (ja) | 1986-12-04 | 1988-06-13 | Toshiba Corp | 金属蒸気レ−ザ装置 |
| US5023884A (en) | 1988-01-15 | 1991-06-11 | Cymer Laser Technologies | Compact excimer laser |
| US4959840A (en) | 1988-01-15 | 1990-09-25 | Cymer Laser Technologies | Compact excimer laser including an electrode mounted in insulating relationship to wall of the laser |
| US5142543A (en) * | 1988-01-27 | 1992-08-25 | Kabushiki Kaisha Komatsu Seisakusho | Method and system for controlling narrow-band oscillation excimer laser |
| US5025446A (en) | 1988-04-01 | 1991-06-18 | Laserscope | Intra-cavity beam relay for optical harmonic generation |
| US5005180A (en) | 1989-09-01 | 1991-04-02 | Schneider (Usa) Inc. | Laser catheter system |
| US5022033A (en) * | 1989-10-30 | 1991-06-04 | The United States Of America As Represented By The United States Department Of Energy | Ring laser having an output at a single frequency |
| US5025445A (en) | 1989-11-22 | 1991-06-18 | Cymer Laser Technologies | System for, and method of, regulating the wavelength of a light beam |
| JPH0456374A (ja) | 1990-06-26 | 1992-02-24 | Matsushita Electric Ind Co Ltd | 炭酸ガスレーザ制御方法およびその装置 |
| JPH0483387A (ja) | 1990-07-26 | 1992-03-17 | Mitsubishi Electric Corp | レーザ装置 |
| US5091778A (en) * | 1990-12-21 | 1992-02-25 | Kaman Aerospace Corporation | Imaging lidar systems and K-meters employing tunable and fixed frequency laser transmitters |
| US5181135A (en) * | 1990-12-21 | 1993-01-19 | Kaman Aerospace Corporation | Optical underwater communications systems employing tunable and fixed frequency laser transmitters |
| US5471965A (en) | 1990-12-24 | 1995-12-05 | Kapich; Davorin D. | Very high speed radial inflow hydraulic turbine |
| US5157684A (en) * | 1991-10-23 | 1992-10-20 | United Technologies Corporation | Optically pulsed laser |
| US5425922A (en) * | 1991-12-27 | 1995-06-20 | Vicor Company Of Japan, Ltd. | Apparatus for manufacturing microcrystal particles and manufacturing method for the microcrystal particles |
| JPH05335675A (ja) | 1992-05-28 | 1993-12-17 | Mitsubishi Electric Corp | レーザ装置 |
| US5463650A (en) * | 1992-07-17 | 1995-10-31 | Kabushiki Kaisha Komatsu Seisakusho | Apparatus for controlling output of an excimer laser device |
| US5359620A (en) | 1992-11-12 | 1994-10-25 | Cymer Laser Technologies | Apparatus for, and method of, maintaining a clean window in a laser |
| US5450436A (en) * | 1992-11-20 | 1995-09-12 | Kabushiki Kaisha Komatsu Seisakusho | Laser gas replenishing apparatus and method in excimer laser system |
| US5534824A (en) * | 1993-03-26 | 1996-07-09 | The Boeing Company | Pulsed-current electron beam method and apparatus for use in generating and amplifying electromagnetic energy |
| US5313481A (en) | 1993-09-29 | 1994-05-17 | The United States Of America As Represented By The United States Department Of Energy | Copper laser modulator driving assembly including a magnetic compression laser |
| US5778016A (en) * | 1994-04-01 | 1998-07-07 | Imra America, Inc. | Scanning temporal ultrafast delay methods and apparatuses therefor |
| US5434882A (en) * | 1994-04-12 | 1995-07-18 | The United States Of America As Represented By The United States Department Of Energy | Injection-controlled laser resonator |
| US5448580A (en) | 1994-07-05 | 1995-09-05 | The United States Of America As Represented By The United States Department Of Energy | Air and water cooled modulator |
| US5863017A (en) | 1996-01-05 | 1999-01-26 | Cymer, Inc. | Stabilized laser platform and module interface |
| US5867305A (en) * | 1996-01-19 | 1999-02-02 | Sdl, Inc. | Optical amplifier with high energy levels systems providing high peak powers |
| JPH10156558A (ja) | 1996-11-27 | 1998-06-16 | Ushio Inc | レーザマーキング装置 |
| US5982800A (en) | 1997-04-23 | 1999-11-09 | Cymer, Inc. | Narrow band excimer laser |
| US5991324A (en) | 1998-03-11 | 1999-11-23 | Cymer, Inc. | Reliable. modular, production quality narrow-band KRF excimer laser |
| US6128323A (en) | 1997-04-23 | 2000-10-03 | Cymer, Inc. | Reliable modular production quality narrow-band high REP rate excimer laser |
| US6192064B1 (en) | 1997-07-01 | 2001-02-20 | Cymer, Inc. | Narrow band laser with fine wavelength control |
| US6094448A (en) | 1997-07-01 | 2000-07-25 | Cymer, Inc. | Grating assembly with bi-directional bandwidth control |
| US6212217B1 (en) | 1997-07-01 | 2001-04-03 | Cymer, Inc. | Smart laser with automated beam quality control |
| USRE38054E1 (en) * | 1997-07-18 | 2003-04-01 | Cymer, Inc. | Reliable, modular, production quality narrow-band high rep rate F2 laser |
| US6018537A (en) | 1997-07-18 | 2000-01-25 | Cymer, Inc. | Reliable, modular, production quality narrow-band high rep rate F2 laser |
| US6330261B1 (en) | 1997-07-18 | 2001-12-11 | Cymer, Inc. | Reliable, modular, production quality narrow-band high rep rate ArF excimer laser |
| US5852621A (en) | 1997-07-21 | 1998-12-22 | Cymer, Inc. | Pulse laser with pulse energy trimmer |
| US6757316B2 (en) | 1999-12-27 | 2004-06-29 | Cymer, Inc. | Four KHz gas discharge laser |
| US6067306A (en) * | 1997-08-08 | 2000-05-23 | Cymer, Inc. | Laser-illuminated stepper or scanner with energy sensor feedback |
| US5953360A (en) | 1997-10-24 | 1999-09-14 | Synrad, Inc. | All metal electrode sealed gas laser |
| US6151346A (en) | 1997-12-15 | 2000-11-21 | Cymer, Inc. | High pulse rate pulse power system with fast rise time and low current |
| US6240112B1 (en) | 1997-12-15 | 2001-05-29 | Cymer, Inc. | High pulse rate pulse power system with liquid cooling |
| US6240117B1 (en) | 1998-01-30 | 2001-05-29 | Cymer, Inc. | Fluorine control system with fluorine monitor |
| US6151349A (en) | 1998-03-04 | 2000-11-21 | Cymer, Inc. | Automatic fluorine control system |
| US5978406A (en) | 1998-01-30 | 1999-11-02 | Cymer, Inc. | Fluorine control system for excimer lasers |
| US6327286B1 (en) * | 1998-04-27 | 2001-12-04 | Cymer, Inc. | High speed magnetic modulator voltage and temperature timing compensation circuit |
| US6016325A (en) | 1998-04-27 | 2000-01-18 | Cymer, Inc. | Magnetic modulator voltage and temperature timing compensation circuit |
| US6477193B2 (en) | 1998-07-18 | 2002-11-05 | Cymer, Inc. | Extreme repetition rate gas discharge laser with improved blower motor |
| US6208675B1 (en) | 1998-08-27 | 2001-03-27 | Cymer, Inc. | Blower assembly for a pulsed laser system incorporating ceramic bearings |
| US6067311A (en) | 1998-09-04 | 2000-05-23 | Cymer, Inc. | Excimer laser with pulse multiplier |
| US6567450B2 (en) * | 1999-12-10 | 2003-05-20 | Cymer, Inc. | Very narrow band, two chamber, high rep rate gas discharge laser system |
| US6778584B1 (en) | 1999-11-30 | 2004-08-17 | Cymer, Inc. | High power gas discharge laser with helium purged line narrowing unit |
| US6208674B1 (en) | 1998-09-18 | 2001-03-27 | Cymer, Inc. | Laser chamber with fully integrated electrode feedthrough main insulator |
| US6181719B1 (en) * | 1998-11-24 | 2001-01-30 | Universal Laser Systems, Inc. | Gas laser RF power source apparatus and method |
| EP1147582A4 (en) * | 1998-12-15 | 2006-03-15 | Cymer Inc | ARF LASER WITH LOW PULSE ENERGY AND HIGH REPLAY RATE |
| US6219368B1 (en) | 1999-02-12 | 2001-04-17 | Lambda Physik Gmbh | Beam delivery system for molecular fluorine (F2) laser |
| US6243406B1 (en) | 1999-03-12 | 2001-06-05 | Peter Heist | Gas performance control system for gas discharge lasers |
| US6104735A (en) | 1999-04-13 | 2000-08-15 | Cymer, Inc. | Gas discharge laser with magnetic bearings and magnetic reluctance centering for fan drive assembly |
| US6164116A (en) | 1999-05-06 | 2000-12-26 | Cymer, Inc. | Gas module valve automated test fixture |
| US6625191B2 (en) * | 1999-12-10 | 2003-09-23 | Cymer, Inc. | Very narrow band, two chamber, high rep rate gas discharge laser system |
| US6370174B1 (en) * | 1999-10-20 | 2002-04-09 | Cymer, Inc. | Injection seeded F2 lithography laser |
| US6865210B2 (en) * | 2001-05-03 | 2005-03-08 | Cymer, Inc. | Timing control for two-chamber gas discharge laser system |
| US6801560B2 (en) * | 1999-05-10 | 2004-10-05 | Cymer, Inc. | Line selected F2 two chamber laser system |
| US6556600B2 (en) * | 1999-09-27 | 2003-04-29 | Cymer, Inc. | Injection seeded F2 laser with centerline wavelength control |
| US6549551B2 (en) * | 1999-09-27 | 2003-04-15 | Cymer, Inc. | Injection seeded laser with precise timing control |
| US6414979B2 (en) | 2000-06-09 | 2002-07-02 | Cymer, Inc. | Gas discharge laser with blade-dielectric electrode |
| US6381257B1 (en) * | 1999-09-27 | 2002-04-30 | Cymer, Inc. | Very narrow band injection seeded F2 lithography laser |
| US6765945B2 (en) * | 1999-09-27 | 2004-07-20 | Cymer, Inc. | Injection seeded F2 laser with pre-injection filter |
| US6281471B1 (en) * | 1999-12-28 | 2001-08-28 | Gsi Lumonics, Inc. | Energy-efficient, laser-based method and system for processing target material |
| US8217304B2 (en) * | 2001-03-29 | 2012-07-10 | Gsi Group Corporation | Methods and systems for thermal-based laser processing a multi-material device |
| US6577663B2 (en) * | 2000-06-19 | 2003-06-10 | Lambda Physik Ag | Narrow bandwidth oscillator-amplifier system |
| US6912052B2 (en) * | 2000-11-17 | 2005-06-28 | Cymer, Inc. | Gas discharge MOPA laser spectral analysis module |
| US6704340B2 (en) * | 2001-01-29 | 2004-03-09 | Cymer, Inc. | Lithography laser system with in-place alignment tool |
| US6690704B2 (en) * | 2001-04-09 | 2004-02-10 | Cymer, Inc. | Control system for a two chamber gas discharge laser |
| US7079564B2 (en) * | 2001-04-09 | 2006-07-18 | Cymer, Inc. | Control system for a two chamber gas discharge laser |
| US7167499B2 (en) * | 2001-04-18 | 2007-01-23 | Tcz Pte. Ltd. | Very high energy, high stability gas discharge laser surface treatment system |
| US6798812B2 (en) * | 2002-01-23 | 2004-09-28 | Cymer, Inc. | Two chamber F2 laser system with F2 pressure based line selection |
| US6711187B2 (en) * | 2002-04-22 | 2004-03-23 | Evans & Sutherland Computer Corporation | Rapidly oscillating laser light source |
| US7158553B2 (en) * | 2003-02-14 | 2007-01-02 | Lambda Physik Ag | Master oscillator/power amplifier excimer laser system with pulse energy and pointing control |
| US7052757B2 (en) | 2003-10-03 | 2006-05-30 | Hewlett-Packard Development Company, L.P. | Capping layer for enhanced performance media |
| US8281471B2 (en) * | 2009-03-04 | 2012-10-09 | Aire Technologies, Inc. | Ceiling radiation damper fusible link tool |
-
2001
- 2001-12-21 US US10/036,727 patent/US6865210B2/en not_active Expired - Lifetime
-
2002
- 2002-10-23 IL IL16181802A patent/IL161818A0/xx unknown
- 2002-10-23 WO PCT/US2002/034045 patent/WO2003049241A1/en not_active Ceased
- 2002-10-23 AU AU2002353869A patent/AU2002353869A1/en not_active Abandoned
- 2002-10-23 CN CNB028238710A patent/CN100350686C/zh not_active Expired - Lifetime
- 2002-10-23 KR KR1020047008173A patent/KR100598552B1/ko not_active Expired - Lifetime
- 2002-10-23 AT AT02789265T patent/ATE443358T1/de not_active IP Right Cessation
- 2002-10-23 KR KR1020067003552A patent/KR100850447B1/ko not_active Expired - Lifetime
- 2002-10-23 JP JP2003550325A patent/JP3971385B2/ja not_active Expired - Lifetime
- 2002-10-23 EP EP02789265A patent/EP1449284B1/en not_active Expired - Lifetime
- 2002-10-23 DE DE60233746T patent/DE60233746D1/de not_active Expired - Lifetime
-
2004
- 2004-08-20 US US10/922,692 patent/US7203216B2/en not_active Expired - Lifetime
-
2006
- 2006-07-06 US US11/482,339 patent/US7852899B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP3971385B2 (ja) | 2007-09-05 |
| CN100350686C (zh) | 2007-11-21 |
| KR100850447B1 (ko) | 2008-08-07 |
| WO2003049241A1 (en) | 2003-06-12 |
| DE60233746D1 (de) | 2009-10-29 |
| US20030099269A1 (en) | 2003-05-29 |
| KR20060025234A (ko) | 2006-03-20 |
| US7203216B2 (en) | 2007-04-10 |
| AU2002353869A1 (en) | 2003-06-17 |
| EP1449284B1 (en) | 2009-09-16 |
| EP1449284A4 (en) | 2006-03-08 |
| US7852899B2 (en) | 2010-12-14 |
| IL161818A0 (en) | 2005-11-20 |
| US6865210B2 (en) | 2005-03-08 |
| US20050018739A1 (en) | 2005-01-27 |
| ATE443358T1 (de) | 2009-10-15 |
| EP1449284A1 (en) | 2004-08-25 |
| CN1596492A (zh) | 2005-03-16 |
| JP2005512333A (ja) | 2005-04-28 |
| US20060251135A1 (en) | 2006-11-09 |
| KR20040058350A (ko) | 2004-07-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100598552B1 (ko) | 2챔버를 갖는 가스 방전 레이저 시스템을 위한 타이밍 제어 | |
| US7079564B2 (en) | Control system for a two chamber gas discharge laser | |
| US7039086B2 (en) | Control system for a two chamber gas discharge laser | |
| US6690704B2 (en) | Control system for a two chamber gas discharge laser | |
| KR101019471B1 (ko) | 2 챔버 가스 방전 레이저를 위한 제어 시스템 | |
| KR100907299B1 (ko) | 초협대역이고 2챔버를 갖는 고반복율 가스 방전 레이저시스템 | |
| JP3204949B2 (ja) | 高信頼性、モジュラ、プロダクションクオリティ狭帯域化KrFエキシマレーザ | |
| US6018537A (en) | Reliable, modular, production quality narrow-band high rep rate F2 laser | |
| US7382816B2 (en) | Two-stage laser pulse energy control device and two-stage laser system | |
| US7308013B2 (en) | Excimer or molecular fluorine laser system with precision timing | |
| JP4721646B2 (ja) | 高精度同期制御機能を備えた2ステージレーザ装置 | |
| JP2005150526A (ja) | 電源装置および高電圧パルス発生装置並びに放電励起式ガスレーザ装置 | |
| JP2004342964A (ja) | 高精度同期制御機能を備えた2ステージレーザ装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20040528 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20040709 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20051222 Patent event code: PE09021S01D |
|
| A107 | Divisional application of patent | ||
| PA0104 | Divisional application for international application |
Comment text: Divisional Application for International Patent Patent event code: PA01041R01D Patent event date: 20060221 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20060614 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20060703 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 20060704 End annual number: 3 Start annual number: 1 |
|
| PG1601 | Publication of registration | ||
| PR1001 | Payment of annual fee |
Payment date: 20090629 Start annual number: 4 End annual number: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 20100702 Start annual number: 5 End annual number: 5 |
|
| PR1001 | Payment of annual fee |
Payment date: 20110624 Start annual number: 6 End annual number: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 20120622 Start annual number: 7 End annual number: 7 |
|
| FPAY | Annual fee payment |
Payment date: 20130624 Year of fee payment: 8 |
|
| PR1001 | Payment of annual fee |
Payment date: 20130624 Start annual number: 8 End annual number: 8 |
|
| FPAY | Annual fee payment |
Payment date: 20140702 Year of fee payment: 9 |
|
| PR1001 | Payment of annual fee |
Payment date: 20140702 Start annual number: 9 End annual number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20150626 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
Payment date: 20150626 Start annual number: 10 End annual number: 10 |
|
| FPAY | Annual fee payment |
Payment date: 20160628 Year of fee payment: 11 |
|
| PR1001 | Payment of annual fee |
Payment date: 20160628 Start annual number: 11 End annual number: 11 |
|
| FPAY | Annual fee payment |
Payment date: 20170623 Year of fee payment: 12 |
|
| PR1001 | Payment of annual fee |
Payment date: 20170623 Start annual number: 12 End annual number: 12 |
|
| PR1001 | Payment of annual fee |
Payment date: 20210622 Start annual number: 16 End annual number: 16 |
|
| PC1801 | Expiration of term |
Termination date: 20230423 Termination category: Expiration of duration |
