KR100538972B1 - 다가의, 자기 저항 기록/판독 메모리 및 상기 메모리의기록 및 판독 방법 - Google Patents

다가의, 자기 저항 기록/판독 메모리 및 상기 메모리의기록 및 판독 방법 Download PDF

Info

Publication number
KR100538972B1
KR100538972B1 KR10-2002-7003993A KR20027003993A KR100538972B1 KR 100538972 B1 KR100538972 B1 KR 100538972B1 KR 20027003993 A KR20027003993 A KR 20027003993A KR 100538972 B1 KR100538972 B1 KR 100538972B1
Authority
KR
South Korea
Prior art keywords
layers
layer
memory
magnetic layers
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR10-2002-7003993A
Other languages
English (en)
Korean (ko)
Other versions
KR20030009301A (ko
Inventor
테베스롤란트
베버베르너
슈바르츨지그프리트
Original Assignee
인피니언 테크놀로지스 아게
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 인피니언 테크놀로지스 아게 filed Critical 인피니언 테크놀로지스 아게
Publication of KR20030009301A publication Critical patent/KR20030009301A/ko
Application granted granted Critical
Publication of KR100538972B1 publication Critical patent/KR100538972B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5607Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/16Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
    • G11C11/161Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/561Multilevel memory cell aspects
    • G11C2211/5615Multilevel magnetic memory cell using non-magnetic non-conducting interlayer, e.g. MTJ

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Hall/Mr Elements (AREA)
  • Mram Or Spin Memory Techniques (AREA)
KR10-2002-7003993A 1999-09-28 2000-09-21 다가의, 자기 저항 기록/판독 메모리 및 상기 메모리의기록 및 판독 방법 Expired - Fee Related KR100538972B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19946490A DE19946490A1 (de) 1999-09-28 1999-09-28 Magnetoresistiver Schreib/Lese-Speicher sowie Verfahren zum Beschreiben und Auslesen eines solchen Speichers
DE19946490.1 1999-09-28
PCT/DE2000/003293 WO2001024190A1 (de) 1999-09-28 2000-09-21 Mehrwertiger magnetoresistiver schreib/lese-speicher sowie verfahren zum beschreiben und auslesen eines solchen speichers

Publications (2)

Publication Number Publication Date
KR20030009301A KR20030009301A (ko) 2003-01-29
KR100538972B1 true KR100538972B1 (ko) 2005-12-26

Family

ID=7923600

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2002-7003993A Expired - Fee Related KR100538972B1 (ko) 1999-09-28 2000-09-21 다가의, 자기 저항 기록/판독 메모리 및 상기 메모리의기록 및 판독 방법

Country Status (8)

Country Link
US (1) US6717843B1 (enExample)
EP (1) EP1222662B1 (enExample)
JP (1) JP4338926B2 (enExample)
KR (1) KR100538972B1 (enExample)
CN (1) CN1183548C (enExample)
DE (2) DE19946490A1 (enExample)
TW (1) TW480489B (enExample)
WO (1) WO2001024190A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100982455B1 (ko) 2008-04-30 2010-09-16 노던 라이트 세미컨덕터 코포레이션 전기 에너지 저장 장치

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002334971A (ja) * 2001-05-09 2002-11-22 Nec Corp 磁性メモリ及びその動作方法
US6795336B2 (en) * 2001-12-07 2004-09-21 Hynix Semiconductor Inc. Magnetic random access memory
TWI222763B (en) * 2002-03-29 2004-10-21 Toshiba Corp Magnetic logic element and magnetic logic element array
US7502248B2 (en) * 2004-05-21 2009-03-10 Samsung Electronics Co., Ltd. Multi-bit magnetic random access memory device
EP1890296B1 (en) * 2004-05-21 2010-11-17 Samsung Electronics Co., Ltd. Multi-bit magnetic random access memory device and methods of operating and sensing the same
JP4599259B2 (ja) 2005-09-20 2010-12-15 株式会社東芝 磁気素子及びこれを用いた磁気信号処理装置
TWI449040B (zh) * 2006-10-06 2014-08-11 Crocus Technology Sa 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法
US7388776B1 (en) * 2006-12-22 2008-06-17 Hitachi Global Storage Technologies Netherlands, B.V. Three-dimensional magnetic memory
JP2009080904A (ja) * 2007-09-26 2009-04-16 Toshiba Corp 磁気記録装置
CN101635841B (zh) * 2009-09-04 2012-02-08 杭州华三通信技术有限公司 视频业务信息读写性能的调整方法和设备
TWI393894B (zh) * 2009-11-20 2013-04-21 Inst Information Industry 識別迴路上電器用電行為的方法、系統與電腦程式產品
KR101598833B1 (ko) * 2009-12-21 2016-03-03 삼성전자주식회사 자기 메모리 소자 및 그 동작방법
KR20130015927A (ko) * 2011-08-05 2013-02-14 에스케이하이닉스 주식회사 멀티 레벨을 갖는 자기 저항 메모리 장치 및 그 구동방법

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5930164A (en) * 1998-02-26 1999-07-27 Motorola, Inc. Magnetic memory unit having four states and operating method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5585986A (en) 1995-05-15 1996-12-17 International Business Machines Corporation Digital magnetoresistive sensor based on the giant magnetoresistance effect
US5734605A (en) * 1996-09-10 1998-03-31 Motorola, Inc. Multi-layer magnetic tunneling junction memory cells
US5768181A (en) * 1997-04-07 1998-06-16 Motorola, Inc. Magnetic device having multi-layer with insulating and conductive layers
US5864498A (en) 1997-10-01 1999-01-26 High Density Circuits Ferromagnetic memory using soft magnetic material and hard magnetic material
US5953248A (en) * 1998-07-20 1999-09-14 Motorola, Inc. Low switching field magnetic tunneling junction for high density arrays

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5930164A (en) * 1998-02-26 1999-07-27 Motorola, Inc. Magnetic memory unit having four states and operating method thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Won-Cheol Jeong et al, IEEE Transactin on Marnetics Vol 34, NO4, 10691071, July 1998 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100982455B1 (ko) 2008-04-30 2010-09-16 노던 라이트 세미컨덕터 코포레이션 전기 에너지 저장 장치

Also Published As

Publication number Publication date
EP1222662A1 (de) 2002-07-17
KR20030009301A (ko) 2003-01-29
WO2001024190A1 (de) 2001-04-05
EP1222662B1 (de) 2003-05-28
US6717843B1 (en) 2004-04-06
JP4338926B2 (ja) 2009-10-07
DE50002394D1 (de) 2003-07-03
CN1376299A (zh) 2002-10-23
CN1183548C (zh) 2005-01-05
TW480489B (en) 2002-03-21
JP2003510755A (ja) 2003-03-18
DE19946490A1 (de) 2001-04-19

Similar Documents

Publication Publication Date Title
KR100893852B1 (ko) 자기 메모리 셀
EP1320102B1 (en) Magnetic random access memory and method of operating the same
US5768181A (en) Magnetic device having multi-layer with insulating and conductive layers
EP1038299B1 (en) Low switching field magnetic tunneling junction usable for multi-state magnetic memory cell
US5448515A (en) Magnetic thin film memory and recording/reproduction method therefor
US6812537B2 (en) Magnetic memory and method of operation thereof
KR100538972B1 (ko) 다가의, 자기 저항 기록/판독 메모리 및 상기 메모리의기록 및 판독 방법
EP0773551A2 (en) High-speed, low current magnetoresistive memory device
US5703805A (en) Method for detecting information stored in a MRAM cell having two magnetic layers in different thicknesses
GB2368982A (en) Nonvolatile semiconductor memory device and method for recording information
US20050167657A1 (en) Multi-bit magnetic memory cells
US7206220B2 (en) MRAM-cell and array-architecture with maximum read-out signal and reduced electromagnetic interference
WO2004084226A1 (en) Simultaneous reading from and writing to different memory cells
US6594175B2 (en) High density giant magnetoresistive memory cell
US7200035B2 (en) Magneto-resistive memory cell structures with improved selectivity
JP4477829B2 (ja) 磁気記憶デバイスを動作させる方法
KR20090112037A (ko) 자기 저항 소자를 이용한 멀티 비트 기록 방법 및 이를이용한 mram
US7889542B2 (en) Method of addressing digital data
EP0685849A2 (en) Storage device
JPH09306160A (ja) 磁気メモリ素子および情報記憶装置
JP2005122885A (ja) メモリセルを読み取るための方法

Legal Events

Date Code Title Description
A201 Request for examination
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20081221

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20081221

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000