KR100532672B1 - 본딩 장치에서의 옵셋 측정기구 및 본딩 장치에서의 옵셋측정방법 - Google Patents

본딩 장치에서의 옵셋 측정기구 및 본딩 장치에서의 옵셋측정방법 Download PDF

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Publication number
KR100532672B1
KR100532672B1 KR10-2003-0058667A KR20030058667A KR100532672B1 KR 100532672 B1 KR100532672 B1 KR 100532672B1 KR 20030058667 A KR20030058667 A KR 20030058667A KR 100532672 B1 KR100532672 B1 KR 100532672B1
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KR
South Korea
Prior art keywords
camera
offset
measuring
bonding
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR10-2003-0058667A
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English (en)
Korean (ko)
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KR20040028495A (ko
Inventor
하라구치마나부
Original Assignee
가부시키가이샤 신가와
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Publication date
Application filed by 가부시키가이샤 신가와 filed Critical 가부시키가이샤 신가와
Publication of KR20040028495A publication Critical patent/KR20040028495A/ko
Application granted granted Critical
Publication of KR100532672B1 publication Critical patent/KR100532672B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K20/00Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
    • B23K20/002Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
    • B23K20/004Wire welding
    • B23K20/005Capillary welding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • B23K2101/40Semiconductor devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/0711Apparatus therefor
    • H10W72/07141Means for applying energy, e.g. ovens or lasers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making
    • Y10T29/49117Conductor or circuit manufacturing
    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49131Assembling to base an electrical component, e.g., capacitor, etc. by utilizing optical sighting device
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/53Means to assemble or disassemble
    • Y10T29/5313Means to assemble electrical device
    • Y10T29/53174Means to fasten electrical component to wiring board, base, or substrate
    • Y10T29/53178Chip component

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Wire Bonding (AREA)
  • Die Bonding (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR10-2003-0058667A 2002-09-30 2003-08-25 본딩 장치에서의 옵셋 측정기구 및 본딩 장치에서의 옵셋측정방법 Expired - Fee Related KR100532672B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2002-00286214 2002-09-30
JP2002286214A JP4105926B2 (ja) 2002-09-30 2002-09-30 ボンディング装置におけるオフセット測定機構及びボンディング装置におけるオフセット測定方法

Publications (2)

Publication Number Publication Date
KR20040028495A KR20040028495A (ko) 2004-04-03
KR100532672B1 true KR100532672B1 (ko) 2005-12-01

Family

ID=32025363

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2003-0058667A Expired - Fee Related KR100532672B1 (ko) 2002-09-30 2003-08-25 본딩 장치에서의 옵셋 측정기구 및 본딩 장치에서의 옵셋측정방법

Country Status (4)

Country Link
US (2) US6915827B2 (https=)
JP (1) JP4105926B2 (https=)
KR (1) KR100532672B1 (https=)
TW (1) TWI278047B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20170129936A (ko) * 2015-03-31 2017-11-27 가부시키가이샤 신가와 와이어 본딩 장치 및 와이어 본딩 방법

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10338809B4 (de) * 2003-08-21 2008-05-21 Hesse & Knipps Gmbh Verfahren und Vorrichtung zur Justage von Bondkopfelementen
US20070260420A1 (en) * 2006-05-03 2007-11-08 Data I/O Corporation Automated calibration system
US7810698B2 (en) * 2008-11-20 2010-10-12 Asm Assembly Automation Ltd. Vision system for positioning a bonding tool
KR101132842B1 (ko) 2009-10-22 2012-04-02 세크론 주식회사 다이본딩장치의 오프셋입력방법
JP5725796B2 (ja) * 2010-10-27 2015-05-27 株式会社牧野フライス製作所 工具の測定方法及び測定装置、並びに工作機械
TWI545663B (zh) 2014-05-07 2016-08-11 新川股份有限公司 接合裝置以及接合方法
US9847313B2 (en) * 2015-04-24 2017-12-19 Kulicke And Soffa Industries, Inc. Thermocompression bonders, methods of operating thermocompression bonders, and horizontal scrub motions in thermocompression bonding
US11540399B1 (en) * 2020-04-09 2022-12-27 Hrl Laboratories, Llc System and method for bonding a cable to a substrate using a die bonder
TWI826789B (zh) * 2020-06-05 2023-12-21 日商新川股份有限公司 打線接合裝置
JP6946584B1 (ja) * 2021-02-15 2021-10-06 Dmg森精機株式会社 画像処理装置および工作機械
CN113567433A (zh) * 2021-06-09 2021-10-29 中车青岛四方机车车辆股份有限公司 粘接接头的检测方法及装置
US12374650B2 (en) * 2021-07-06 2025-07-29 Shinkawa Ltd. Manufacturing apparatus and manufacturing method of semiconductor device
CN118936309B (zh) * 2024-08-26 2025-12-05 西北工业大学深圳研究院 适用于卷绕系统的高反光卷材偏移量测量方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2982000B1 (ja) * 1998-07-03 1999-11-22 株式会社新川 ボンディング方法及びその装置
JP3416091B2 (ja) 2000-01-21 2003-06-16 株式会社新川 ボンディング装置およびボンディング方法
JP3967518B2 (ja) * 2000-03-06 2007-08-29 株式会社新川 オフセット測定方法、ツール位置検出方法およびボンディング装置
US6678058B2 (en) * 2000-10-25 2004-01-13 Electro Scientific Industries, Inc. Integrated alignment and calibration of optical system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20170129936A (ko) * 2015-03-31 2017-11-27 가부시키가이샤 신가와 와이어 본딩 장치 및 와이어 본딩 방법
KR101962888B1 (ko) 2015-03-31 2019-03-27 가부시키가이샤 신가와 와이어 본딩 장치 및 와이어 본딩 방법

Also Published As

Publication number Publication date
TW200408022A (en) 2004-05-16
JP4105926B2 (ja) 2008-06-25
US20040060663A1 (en) 2004-04-01
USRE41506E1 (en) 2010-08-17
JP2004127995A (ja) 2004-04-22
KR20040028495A (ko) 2004-04-03
US6915827B2 (en) 2005-07-12
TWI278047B (en) 2007-04-01

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