KR100522089B1 - Sorting Handler for Burn-In-Tester and A Controlling Method Thereof - Google Patents

Abstract

The present invention relates to a sorting handler for a burn-in tester which can detach / attach an auxiliary buffer according to a process and a control method thereof.

The present invention and the mainframe; A loading unit installed at one side of the main frame and loaded with a tray filled with devices; An unloading part installed at the other side of the loading part to unload the bin tray; DC test unit installed between loading / unloading unit, loading buffer installed under DC test unit, BIB installed on one side of DC test unit, unloading buffer installed on one side of BIB, and sorting installed on one side of loading buffer A test unit consisting of parts; It is installed on top of the loading / unloading part, and consists of a slider on which a loading / unloading robot and an insert / removing robot are installed, and a transfer part made up of one side of the slider and an XY axis on which a sorting robot is installed. It is further configured to further include an auxiliary buffer that can be attached / detached on top of the BIB. The present invention configured as described above can perform various tests of the device by using one piece of equipment by detaching / attaching the auxiliary buffer.

Description

Sorting Handler for Burn-In-Tester and A Controlling Method Thereof}

The present invention relates to a sorting handler used when testing electrical characteristics of a manufactured semiconductor device, and more particularly, to a sorting handler for a burn-in-tester. The present invention relates to a sorting handler for a burn-in tester that can remove / attach an auxiliary buffer according to a test process of a device, and a control method thereof.

1 is a plan view schematically showing the configuration of a sorting handler for a burn-in tester according to the related art, and FIG. 2 is a schematic view for explaining the operation of the transfer means in the handler for the burn-in tester according to the related art.

1 and 2, a burn-in board loader 2 and a burn-in board unloader 3 are provided at an upper side of the main body 1, and a DC reject portion 4 is provided at one side thereof. ), A tray loader section 5 and a DC test section 6, and a Y table 8 provided with a turn return device section 7 that rotates 90 degrees on one side of the bottom surface thereof. The empty pocket part 9, the tray unloader part 10, and the sorting part 11 are provided in this order.

And, on the upper part of the DC reject part 4, the tray loader part 5, and the DC test part 6, the 1st tool 12 which operates left, right, up, and down by a servo motor is provided, and DC On the upper side of the Y table 8 in which the test section 6 and the turn return device section 7 are provided, a second tool 13 that is operated between the gaps is provided.

Further, on the upper part of the Y table 8, the empty pocket portion 9, and the tray unloader portion 10, a third tool 14 operated between the gaps is provided, and the empty pocket portion 9 and the sorting portion are provided. On the upper side of (11), the 4th tool 15 which operates between the spaces is provided.

Therefore, the tray (not shown) filled with the device to be burned-in (not shown) is placed in the tray loader section 5, and the burn-in tested device is placed in the test socket (not shown) in the burn-in board loader section (2). Place the inserted burn-in board (not shown).

When the burn-in board is located in the burn-in board loader unit 2 as described above, the burn-in board is located on the rotating plate (not shown) installed at the top of the Y table 8 and at the same time coupled to the connector of the handler. It rotates 90 degrees by the turn return device part 7 conveyed to the Y table 8.

As described above, when the rotating plate rotates by 90 °, the ball screw is rotated by the servo motor, so that the Y table 8 moves to the process line where the tools 1, 2, 3, 12, 13, and 14 operate.

Therefore, the four devices which have been burned in the test socket of the burn-in board after the burn-in test are taken out at the same time by the tool No. 3 installed on the upper side, and the empty pocket 9 or the tray unloader section ( 10), the device determined to be defective is transferred from the empty pocket portion 9 to the sorting portion 11 by the tool 4 (15).

On the other hand, when the burn-in test-completed device inserted into the test socket of the burn-in board exits as described above, the first tool 12 operates four devices in the tray of the tray loader section 5 to operate the DC test section ( 6), the DC test is carried out, and the device in the DC test section is inserted into the test socket on the burn-in board by the tool 2 (13).

That is, the devices that are plugged into the test sockets of the burn-in board are burn-in tests completed, and are transported and classified by the tool 3 and the tool 15 by the grade, and the tool 3 and the tool 4 (15). When the device is pulled out of the test socket by 1), tool 1 and 2 (12) are operated in the empty space to perform DC test and insert the device judged as good product, so that the device loading and unloading operation is performed. Will be.

However, when looking at the semiconductor process, efficient productivity can proceed as planned only when the operations of each process (FAB process, test process, etc.) are performed sequentially.

In other words, the FAB process proceeds quickly and produces a lot, but if the test process is delayed and congestion occurs, no matter how fast the FAB process proceeds, there is a shortage in which the amount of the final device is reduced.

Therefore, in order to control the amount of work between the processes, the burn-in test process usually processes only the loading of the device to be burn-in test on the burn-in board at the beginning of the month, and at the end of the month, the unloaded device is loaded from the burn-in board and put in the tray. Only proceed.

However, in the conventional sorting handler, since the work flow is performed only in one direction, that is, from the loader part 5 to the unloader part 10, the DC-tested device cannot be quickly loaded into the burn-in board, or the test is completed. Unable to unload the device from the burn-in board, a major problem has arisen in the planned production process of the semiconductor (device) production.

In other words, when loading the device in the burn-in board, only the tool 1 and 2 tools 12 and 13 are used, and the tool 3 and 4 tools 14 and 15 are not used. On the contrary, the burn-in tested device is unloaded from the burn-in board. In the case of using tools 3 and 4 (14) and 15 only, and tools 1 and 2 (12 and 13) are not used, a large number of equipments are needed to increase the production volume, and a large number of equipments are installed. In order to do so, a large area of space is required, which adds to the cost burden due to the expansion of facilities.

The present invention has been made to solve such a problem in the prior art, it is possible to remove / attach the auxiliary buffer applied to the sorting handler for the burn-in tester, thereby improving the work efficiency of two equipment with one equipment according to the process An object of the present invention is to provide a sorting handler for a burn-in tester and a control method thereof.

In order to achieve the above object, a sorting handler for a burn-in tester of the present invention includes a mainframe; A loading unit installed at one side of the main frame to load a tray filled with a device; An unloading unit installed at the other side of the loading unit to unload the bin tray; A DC test unit installed between the loading / unloading unit, a loading buffer installed under the DC test unit, a burn-in board (BIB: burn in board) installed at one side of the DC test unit, and installed at one side of the BIB A test unit comprising an unloading buffer and a sorting unit installed at one side of the unloading buffer; The slider is installed on the loading / unloading part, and the loading / unloading robot and the insert / removing robot are movably installed in the X direction, and are installed on one side of the slider, and the sorting robot moves in the XY direction. It is composed of a transfer unit consisting of the XY axis that is possibly installed, and further comprises an auxiliary buffer that can be attached / detached on top of the BIB.

The burn-in tester sorting handler may be installed with an auxiliary buffer on the upper part of the BIB when performing the DC test only. When the loading and sorting by the DC test unit and the BIB and the unloading buffer are performed together, the auxiliary buffer is released. You can.

The sorting handler for the burn-in tester may selectively use the loading buffer of the DC test unit when performing the loading and sorting of the device in the BIB without performing the DC test.

The sorting unit in which the plurality of test trays are installed may be sequentially loaded by dividing a device determined to be defective in each test tray.

The sorting unit may selectively use any one of a plurality of test trays.

According to another aspect of the invention, the present invention comprises the steps of placing the tray and the bin tray filled with the device on both sides of the main frame loading and unloading unit; Transferring the device to the DC test unit by the loading robot to determine whether the device is defective or not by the DC test unit; The device determined as good in the DC test unit is transferred to the BIB by the insert robot, and the device determined as defective is sequentially filled in the plurality of test trays for each grade by the sorting robot; Moving the device burn-in tested in the BIB to the unloading buffer by a limb robot and determined to be positive / undetermined; A device determined as good in the unloading buffer is filled in the empty tray by the unloading robot; Provided is a control method of a sorting handler for a burn-in tester comprising a step in which a device determined as defective in an unloading buffer is sequentially filled in a plurality of test trays for each grade by a sorting robot.

According to another feature of the invention, the present invention comprises the steps of installing an auxiliary buffer on top of the BIB is installed on one side of the sorting handler for the burn-in tester; Placing trays and bin trays filled with devices on both sides of the mainframe, the loading and unloading units; Transferring the device to the DC test unit by the loading robot, and determining whether the device is defective or not by the DC test unit; Transferring the device in the DC test unit to an auxiliary buffer installed on the upper part of the BIB by an insert robot; Moving the device from the auxiliary buffer to the unloading buffer by the remove robot; A device determined as good in the unloading buffer is filled in the empty tray by the unloading robot; Provided is a control method of a sorting handler for a burn-in tester, comprising a step in which a device determined to be defective in an unloading buffer is sequentially loaded into a plurality of test trays by a sorting robot.

Hereinafter, a sorting handler for a burn-in tester and a control method thereof according to the present invention will be described in detail with reference to the accompanying drawings.

3 is a sorting handler for a burn-in tester to which the present invention is applied, and FIG. 4 is a perspective view showing an enlarged portion of the sorting handler for burn-in tester to which the present invention is applied, and FIG. 5 shows a DC test unit and a loading buffer applied to the present invention. 6 is a perspective view of the auxiliary buffer of the present invention.

First, as shown in FIGS. 3 and 4, the sorting handler for the burn-in tester according to the present invention has a main frame 100, a loading unit 200, an unloading unit 300, a test unit 400, and a transfer unit ( 500).

The loading unit 200 has a loading position 210 in which a tray (not shown) can be loaded at the center thereof, and a device (not shown) to be tested is filled in front of the loading position 210. A front stacker 220 for loading a tray is installed, and a rear stacker 230 for loading a bin tray for transporting the device is installed at the rear of the loading position 210.

The unloading unit 300 has an unloading position 310 in which a tray can be unloaded at the center thereof, and a rear stacker in which a bin tray can be loaded at the rear of the unloading position 310. 330 is installed, and the front stacker 320 is installed in front of the unloading position 310 to load the tray filled with the good device in the bin tray.

Between the front and rear stackers 220, 320, 230, 330 installed at the front and rear of the loading and unloading unit 200, 300, guide rails 240 and 340 may be transported while the tray is slid. It is installed.

The test unit 400 may include a DC test unit 410 installed at one side of the main frame 100, a loading buffer 420 installed below the DC test unit 410, and the DC test unit ( Burn in board (BIB) (430) installed on one side of the 130, the sorting unit 440 is installed on one side of the BIB 430, and the frozen portion is installed on one side of the sorting unit 440 It is composed of a loading buffer 450, and an auxiliary buffer 460 (see Fig. 6) that can be attached / detached on top of the BIB (430).

The DC test unit 410 (refer to FIG. 5) has a plurality of sockets 411 formed therein for filling a plurality of devices, and a base plate 412 is formed below the DC test unit 410. It is installed.

In addition, the base plate 412 is slidable along the guide rail 413 installed at the bottom thereof, and the base plate 412 is provided with a first cylinder 414 and a second cylinder 415 installed at one side thereof. The DC test unit 410 may be operated by the third cylinder 416 installed on the lower portion of the DC test unit 410 to close / open the socket 411.

The loading buffer 420 has a plurality of buffers 421 are formed thereon for loading a plurality of devices.

The DC test unit 410 and the loading buffer 420 may be moved forward / backward by the driving of the second cylinder 415 to be located in the DC test mode or the loading buffer mode working position, and the test is performed in the DC test mode. When there is a device that is determined to be defective after completion, the first cylinder 414 may be driven to be positioned at the working position so that the defective device may be transferred to the sorting unit 440 by the sorting robot 570.

The BIB 430 is provided with a plurality of sockets 431 in which a plurality of devices can be tested.

The sorting unit 440 is provided with a plurality of test trays 441 for loading the devices determined to be defective.

The unloading buffer 450 is provided with a plurality of buffer blocks 451. When the tested device burned in the BIB is transferred to the unloading buffer 450 by the remove robot, the positively determined device is unloaded. Each buffer block 451 is positioned to be filled in the bin tray by the loading robot 540 and to be moved to the sorting unit 440 by the sorting robot 570.

The auxiliary buffer 460 (see FIG. 6) is formed with a plurality of buffer blocks 461, and the auxiliary buffer 460 may be installed and separated by a fastening member 462 on the upper side of the BIB 430. have.

The transfer part 500 is provided with a slider 510 in the X direction on the upper part of the main frame 100, XY axis 520 is provided in the X-axis direction spaced apart from the slider 510 by a predetermined distance. .

Loading and unloading robots 530 and 540 are installed in the slider 510 so as to be movable in the X-axis direction. Between the loading and unloading robots 530 and 540, an insert robot 550 and a reloader are mounted. The robotless 560 is provided to be movable simultaneously or individually in the X-axis direction.

When the insert robot 550 loads the device in the DC test unit 410 or the loading buffer 420, the remove robot 560 may load a device to be sorted in the BIB 430, Then, when the insert robot 550 loads the device to burn-in test to the BIB 430, the remove robot 560 from the BIB 430 to the unloading buffer 450, the device to sort after the burn-in test Can be transported

The sorting robot 570 is installed on the XY axis 520 so as to be movable in the XY direction, and the sorting robot 570 sequentially loads a device determined to be defective in the test tray 441 of the sorting unit 440. (See Fig. 3).

Referring to the operation of the present invention configured as described above is as follows.

First, the tray filled with the device in the front stacker 220 installed in front of the loading unit 200 is located in the loading position 210, at this time, also in the unloading unit 300 installed on the other side of the loading unit 200 In the rear stacker 330, the bin tray is positioned to the unloading position 310.

Then, the device is transferred to the test unit 400 by the loading robot 530 installed on the slider 510. At this time, when all the devices filled in the tray are transferred, the bin tray is installed at the rear of the main frame 100. The stacker 230 or the rear stacker 330 of the unloading unit 300 or the front stacker 320 of the unloading unit 300 is transferred and loaded.

In addition, when the test device is completely filled in the bin tray located at the unloading position 310, the tray filled with the device is transferred to the front stacker 320 installed in front of the main frame 100 and loaded.

The device transferred by the loading robot 530 is transferred to the DC test unit 410, the device is tested in the socket 411 of the DC test unit 410 is determined whether or not.

When the device does not perform the DC test, when the DC test unit 410 moves backward to open the upper portion of the loading buffer 420, the device is transferred by the insert robot 550 in the loading buffer 420.

In addition, the device determined as good in the DC test unit 410 is transferred to the BIB 430 by the insert robot 550, and the device determined as defective is moved to the sorting robot 570 by the DC test unit 410 moving forward. By the transfer to the sorting unit 440 is divided into the test tray 441 of the sorting unit 440 for each grade is loaded.

The device transferred to the BIB 430 is tested and then transferred to the unloading buffer 450 by the remove robot 560 and inserted into each buffer block 451 of the unloading buffer 450. In addition, the BIB 430 may sort according to the amount / fire of the device that has been previously tested.

The device determined to be good in the unloading buffer 450 is filled in the bin tray positioned at the unloading position 310 by the unloading robot 540, and the tray in which the good device is filled is the front stacker 320. Are loaded).

In addition, the device determined as defective in the unloading buffer 450 is divided into the test tray 441 installed in the sorting unit 440 by the sorting robot 570, and is filled by grade.

As described above, according to the present invention configured, the DC test and the device loading / sorting and the like can be performed simultaneously or separately in the BIB.

On the other hand, when only the DC test is performed as follows.

First, the auxiliary buffer 460 is installed using the fastening member 462 on the upper part of the BIB board 430.

In addition, the cylinder 415 installed at the lower portion of the DC test unit 410 is driven to close the loading buffer 420 installed at the lower portion of the DC test unit 410 while advancing the DC test unit 410 and at the same time, the DC test unit 410 ) Completes the test preparation.

At this time, the tray filled with the device in the front stacker 220 installed in front of the loading unit 200 is located in the loading position 210, at this time, in the unloading unit 300 installed on the other side of the loading unit 200 In the rear stacker 330, the bin tray is positioned to the unloading position 310.

Then, the device is transferred to the DC test unit 410 by the loading robot 530 installed on the slider 510. At this time, when all the devices filled in the tray are transferred, the bin tray is installed at the rear of the main frame 100. Transferred to the rear stacker 330 of the unloading unit 300 is loaded.

In addition, when the DC tray has been completely filled in the bin tray located at the unloading position 310, the tray filled with the device is transferred to the front stacker 320 installed in front of the main frame 100 is loaded.

The device transferred by the loading robot 530 is transferred to the DC test unit 410, the device is tested in the socket 411 of the DC test unit 410 is determined whether or not.

The device is tested in the DC test unit 410. In addition, the device tested in the DC test unit 410 is transferred to the auxiliary buffer 460 installed on the BIB 430 by the insert robot 550.

The device transferred to the auxiliary buffer 460 is transferred to the unloading buffer 450 by the limb robot 560, and the device determined as good in the unloading buffer 450 is unloaded by the robot 540. The empty tray located at the unloading position 310 is filled, and a tray filled with a good device is loaded on the front stacker 320.

In addition, the device determined as defective in the unloading buffer 450 is divided into the test tray 441 installed in the sorting unit 440 by the sorting robot 570, and is filled by grade.

As described above, the control method of the sorting handler for the burn-in tester of the present invention configured as described above will be described as follows.

7 is a flowchart illustrating a process in which a DC test unit and a BIB and an unloading buffer perform a device loading / sorting process together with the DC test unit in the present invention.

First, as shown in FIG. 7, the DC test and the DC test by the BIB 430 and the unloading buffer 450 and the control of the burn-in tester sorting handler when the device loading / sorting are performed in the BIB 430 together. The method is as follows.

A tray in which a plurality of devices are filled in the loading unit 200 and the unloading unit 300 on both sides of the main frame 100, and a bin tray in which the plurality of devices are filled, is transported along the respective guide rails 240 and 340. It is transported by (not shown) and positioned in the loading position 210 and the unloading position 310. (S1)

In this case, a plurality of devices are installed in the slider 510 installed in the X-axis direction on the upper part of the main frame 100 and are moved by the loading robot 530 in the X-axis direction. Transferred to 410, the device is tested by the DC test unit 410 to determine whether or not (S2).

In addition, the device determined to be good in the DC test unit 410 is installed in the slider 510, and is transferred to the BIB 430 by the insert robot 550 located on one side of the loading robot 530, The sockets 431 of the plurality of rows formed in the BIB 430 are sequentially filled.

In addition, the device determined as defective by the DC test unit 410 is a sorting robot 570 installed on the XY axis 520 installed on one side of the slider 510 so as to be movable in the X axis direction and the Y axis direction. By dividing by the grade is sequentially filled in the plurality of test trays 441 of the sorting unit 440. (S3)

A plurality of devices tested in the BIB 430 are transferred to the unloading buffer 450 by a remove robot 560 installed on one side of the insert robot 550 to buffer buffers 451 of the unloading buffer 450. ) Is filled in (S4)

The bin which is determined to be good in the unloading buffer 450 is located at the unloading position 310 of the unloading unit 300 by an unloading robot 540 installed at one side of the removable robot 560. When the tray is filled and the plurality of devices are filled in the bin tray, the tray is loaded on the front stacker 320 along the guide rail 340. (S5)

On the other hand, when all of the devices are transferred from the tray located at the loading position 210 of the loading unit 200, the tray is loaded on the rear stacker 330 of the unloading unit 300 along the guide rail 240.

In addition, the device determined as defective in the unloading buffer 450 is sorted by the sorting robot by the sorting robot 570 which is movable in the X-axis direction and the Y-axis direction in the buffer block 451 of the unloading buffer 450. The plurality of test trays 441 of the unit 440 is sequentially filled (S5).

Meanwhile, the control method of the sorting handler for the burn-in tester when only the DC test is performed on the device will be described with reference to the accompanying drawings.

8 is a flowchart illustrating a process of performing only a DC test.

First, as illustrated in FIG. 8, the auxiliary buffer 460 having a plurality of buffer blocks 461 in which a plurality of devices may be filled is formed on the top of the BIB 430 installed on one side of the sorting handler for the burn-in tester. ) Is installed using the fastening member 462. (S11)

A tray in which a plurality of devices are filled in the loading unit 200 and the unloading unit 300 on both sides of the main frame 100, and a bin tray in which the plurality of devices are filled, is transported along the respective guide rails 240 and 340. It is transported by and is positioned at the loading position 210 and the unloading position 310. (S12)

In this case, a plurality of devices are installed in the slider 510 installed in the X-axis direction on the upper part of the main frame 100 and are moved by the loading robot 530 in the X-axis direction. Transferred to 410, the device is tested by the DC test unit 410 is determined whether or not (S13).

In addition, the device determined to be good in the DC test unit 410 is installed on the slider 510, and is installed on the top of the BIB 430 by the insert robot 550 located on one side of the loading robot 530. It is transferred to the auxiliary buffer 460. (S14)

The device transferred to the auxiliary buffer 460 is transferred to the unloading buffer 450 by the rebubot 560. (S15)

The device determined as good in the unloading buffer 450 is filled in the bin tray by the unloading robot 540 installed in the slider 510, and the trays in which the devices are all filled are transferred along the guide rail 340. And is loaded on the front stacker 320. (S16)

Devices that are determined to be defective in the unloading buffer 450 are classified into grades and sequentially filled in the plurality of test trays 441 installed in the sorting unit 440 by the sorting robot 570. (S17)

As described above, the sorting handler for the burn-in tester and the control method thereof according to the present invention may be transferred to the test unit by the transfer unit, and the device tested by the test unit may be determined as good or bad, and each of the devices may be divided and loaded in each class. .

The sorting handler for the burn-in tester and the control method thereof according to the present invention have the advantage that the work buffer can be easily removed / attached without additional equipment according to the process and two work efficiency can be obtained with one equipment.

1 is a plan view schematically showing the configuration of a sorting handler for a conventional burn-in tester,

Figure 2 is a schematic diagram for explaining the operation of the transfer means in the sorting handler for a burn-in tester of the prior art,

3 is a sorting handler for a burn-in tester to which the present invention is applied,

4 is an enlarged perspective view illustrating a part of a sorting handler for a burn-in tester to which the present invention is applied;

5 is a perspective view showing a DC test unit and a loading buffer applied to the present invention;

Figure 6 is a perspective view of the auxiliary buffer of the present invention,

FIG. 7 is a flowchart illustrating a process of performing device loading / sorting in a DC test unit and a BIB by a DC test unit, a BIB, and an unloading buffer in the present invention; FIG.

8 is a flowchart illustrating a DC test process.

<Explanation of symbols for main parts>

100: mainframe 200,300: loading, unloading unit

210,310: loading, unloading position 220,320: front stacker

230,330: Rear stacker 240,340: Guide rail

400: test unit 410: DC test unit

420: loading buffer 430: BIB

440: sorting unit 450: unloading buffer

500: transfer unit 510: slider

520: X-Y axis 530,540: loading, unloading robot

550: insert robot 560: remove robot

570: Sorting Robot

Claims (7)

Main frame; A loading unit installed at one side of the main frame to load a tray filled with a device; An unloading unit installed at the other side of the loading unit to unload the bin tray; A DC test unit installed between the loading / unloading unit, a loading buffer installed under the DC test unit, a BIB (Burn In Board) installed at one side of the DC test unit, and an unloading buffer installed at one side of the BIB. And, Test unit consisting of a sorting unit installed on one side of the unloading buffer; Installed on top of the loading / unloading portion, the loading / unloading robot and the insert / remove robot is a slider that is installed to move in the X direction, and installed on one side of the slider, the transporting portion having a sorting robot For sorting handlers, The sorting robot of the transfer unit is movable in the XY direction, and an auxiliary buffer that can be attached / removed is installed on the upper part of the BIB. The auxiliary buffer is installed on the upper part of the BIB when performing only a DC test, and a DC test. A sorting handler for a burn-in tester, which can be released when the loading and sorting by the secondary, BIB, and unloading buffers are performed together. delete The method of claim 1, The sorting handler for the burn-in tester does not perform a DC test, and when the loading and sorting of the device in the BIB, the sorting handler for the burn-in tester, characterized in that it can be selectively used. The method of claim 1, A sorting handler for the burn-in tester, characterized in that the sorting unit provided with the plurality of test trays can sequentially load a device determined to be defective in each test tray by class. The method of claim 4, wherein The sorting handler for the burn-in tester, characterized in that the sorting unit can selectively use any one of the plurality of test trays. Placing trays and bin trays filled with devices on both sides of the mainframe, the loading and unloading units; Transferring the device to the DC test unit by the loading robot to determine whether the device is defective or not by the DC test unit; The device determined as good in the DC test unit is transferred to the BIB by the insert robot, and the device determined as defective is sequentially filled in the plurality of test trays for each grade by the sorting robot; Moving the device burn-in tested in the BIB to the unloading buffer by a limb robot and determined to be positive / undetermined; A device determined as good in the unloading buffer is filled in the empty tray by the unloading robot; A method for controlling a sorting handler for a burn-in tester, comprising a step of sequentially filling a plurality of test trays for each grade by a sorting robot by a device determined as defective in an unloading buffer. Installing an auxiliary buffer on an upper part of the BIB installed at one side of the sorting handler for the burn-in tester; Placing trays and bin trays filled with devices on both sides of the mainframe, the loading and unloading units; Transferring the device to the DC test unit by the loading robot, and determining whether the device is defective or not by the DC test unit; Transferring the device in the DC test unit to an auxiliary buffer installed on the upper part of the BIB by an insert robot; Moving the device from the auxiliary buffer to the unloading buffer by the remove robot; A device determined as good in the unloading buffer is filled in the empty tray by the unloading robot; A control method of a sorting handler for a burn-in tester, comprising a step in which a device determined as a defective product in an unloading buffer is sequentially loaded into a plurality of test trays by a sorting robot.