KR100488264B1 - 선집속전자빔장치용캐소드어셈블리 - Google Patents
선집속전자빔장치용캐소드어셈블리 Download PDFInfo
- Publication number
- KR100488264B1 KR100488264B1 KR10-1998-0705537A KR19980705537A KR100488264B1 KR 100488264 B1 KR100488264 B1 KR 100488264B1 KR 19980705537 A KR19980705537 A KR 19980705537A KR 100488264 B1 KR100488264 B1 KR 100488264B1
- Authority
- KR
- South Korea
- Prior art keywords
- filament
- plates
- electron beam
- electron
- arcuate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/12—Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J33/00—Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
- H01J33/02—Details
Landscapes
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US8/589,265 | 1996-01-22 | ||
| US08/589,265 US5637953A (en) | 1996-01-22 | 1996-01-22 | Cathode assembly for a line focus electron beam device |
| US08/589,265 | 1996-01-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR19990081835A KR19990081835A (ko) | 1999-11-15 |
| KR100488264B1 true KR100488264B1 (ko) | 2005-09-02 |
Family
ID=24357302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-1998-0705537A Expired - Fee Related KR100488264B1 (ko) | 1996-01-22 | 1996-12-26 | 선집속전자빔장치용캐소드어셈블리 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5637953A (OSRAM) |
| EP (1) | EP0880791B1 (OSRAM) |
| JP (1) | JP3723577B2 (OSRAM) |
| KR (1) | KR100488264B1 (OSRAM) |
| DE (1) | DE69620799T2 (OSRAM) |
| TW (1) | TW315481B (OSRAM) |
| WO (1) | WO1997027612A1 (OSRAM) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7264771B2 (en) | 1999-04-20 | 2007-09-04 | Baxter International Inc. | Method and apparatus for manipulating pre-sterilized components in an active sterile field |
| US6239543B1 (en) * | 1999-08-23 | 2001-05-29 | American International Technologies, Inc. | Electron beam plasma formation for surface chemistry |
| US6785359B2 (en) * | 2002-07-30 | 2004-08-31 | Ge Medical Systems Global Technology Company, Llc | Cathode for high emission x-ray tube |
| JP5329050B2 (ja) * | 2007-04-20 | 2013-10-30 | 株式会社Sen | ビーム処理装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4855638A (en) * | 1987-04-09 | 1989-08-08 | U.S. Philips Corporation | Camera tube system and electron gun therefor |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE359165A (OSRAM) * | 1928-04-14 | |||
| US3611418A (en) * | 1967-10-03 | 1971-10-05 | Matsushita Electric Industrial Co Ltd | Electrostatic recording device |
| US3609401A (en) * | 1970-03-09 | 1971-09-28 | Gen Electric | Line focus electron gun |
| US3788892A (en) * | 1970-05-01 | 1974-01-29 | Rca Corp | Method of producing a window device |
| US4468282A (en) * | 1982-11-22 | 1984-08-28 | Hewlett-Packard Company | Method of making an electron beam window |
| ATE49322T1 (de) * | 1983-08-26 | 1990-01-15 | Feinfocus Verwaltung | Roentgenlithographiegeraet. |
| US4764947A (en) * | 1985-12-04 | 1988-08-16 | The Machlett Laboratories, Incorporated | Cathode focusing arrangement |
| FR2633773B1 (fr) * | 1988-07-01 | 1991-02-08 | Gen Electric Cgr | Tube radiogene a auto-limitation du flux electronique par saturation |
| US5414267A (en) * | 1993-05-26 | 1995-05-09 | American International Technologies, Inc. | Electron beam array for surface treatment |
-
1996
- 1996-01-22 US US08/589,265 patent/US5637953A/en not_active Expired - Lifetime
- 1996-12-26 WO PCT/US1996/020703 patent/WO1997027612A1/en not_active Application Discontinuation
- 1996-12-26 EP EP96945292A patent/EP0880791B1/en not_active Expired - Lifetime
- 1996-12-26 DE DE69620799T patent/DE69620799T2/de not_active Expired - Lifetime
- 1996-12-26 JP JP52684697A patent/JP3723577B2/ja not_active Expired - Lifetime
- 1996-12-26 KR KR10-1998-0705537A patent/KR100488264B1/ko not_active Expired - Fee Related
-
1997
- 1997-01-09 TW TW086100165A patent/TW315481B/zh not_active IP Right Cessation
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4855638A (en) * | 1987-04-09 | 1989-08-08 | U.S. Philips Corporation | Camera tube system and electron gun therefor |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3723577B2 (ja) | 2005-12-07 |
| DE69620799D1 (de) | 2002-05-23 |
| WO1997027612A1 (en) | 1997-07-31 |
| KR19990081835A (ko) | 1999-11-15 |
| TW315481B (OSRAM) | 1997-09-11 |
| DE69620799T2 (de) | 2002-11-28 |
| EP0880791A4 (OSRAM) | 1998-12-09 |
| US5637953A (en) | 1997-06-10 |
| EP0880791A1 (en) | 1998-12-02 |
| EP0880791B1 (en) | 2002-04-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| AMND | Amendment | ||
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St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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St.27 status event code: A-3-3-R10-R18-oth-X000 |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
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| J201 | Request for trial against refusal decision | ||
| PJ0201 | Trial against decision of rejection |
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St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| P13-X000 | Application amended |
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