KR100407907B1 - 자기 터널 접합 소자의 열처리 방법과 그 방법으로 제조된자기 터널 접합 소자 - Google Patents
자기 터널 접합 소자의 열처리 방법과 그 방법으로 제조된자기 터널 접합 소자 Download PDFInfo
- Publication number
- KR100407907B1 KR100407907B1 KR10-2001-0026486A KR20010026486A KR100407907B1 KR 100407907 B1 KR100407907 B1 KR 100407907B1 KR 20010026486 A KR20010026486 A KR 20010026486A KR 100407907 B1 KR100407907 B1 KR 100407907B1
- Authority
- KR
- South Korea
- Prior art keywords
- tunnel junction
- heat treatment
- magnetic
- magnetic tunnel
- junction element
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/30—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
- H01F41/302—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F41/305—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices applying the spacer or adjusting its interface, e.g. in order to enable particular effect different from exchange coupling
- H01F41/307—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE] for applying spin-exchange-coupled multilayers, e.g. nanostructured superlattices applying the spacer or adjusting its interface, e.g. in order to enable particular effect different from exchange coupling insulating or semiconductive spacer
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
- Y10T29/49032—Fabricating head structure or component thereof
- Y10T29/49036—Fabricating head structure or component thereof including measuring or testing
- Y10T29/49043—Depositing magnetic layer or coating
- Y10T29/49044—Plural magnetic deposition layers
Abstract
Description
CTA | RTA | |
램프(ramp) 작동 시간 | 15분 | 10초 |
열처리 시간 | 1시간 | 10초 |
냉각 시간 | 1.5시간 이내 | 6분 이내 |
전체 처리 시간 | 2.5시간 이상 | 7분 이내 |
처리 온도 | 200-300℃ | 200-400℃ |
Claims (12)
- 반강자성 재료로 이루어진 반강자성층과; 상기 반강자성층 상에 강자성 재료로 이루어진 고정층과; 상기 고정층 상에 전기적 절연성을 갖는 재료로 이루어진 터널 장벽 및; 상기 터널 장벽 상에 강자성 재료로 이루어진 자유층으로 구성된 자기 터널 접합 소자를 적외선 램프를 사용하여 급속 열처리하는 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 스핀 방향을 제어할 수 있는 보자력이 다른 두개의 강자성층과; 상기 강자성층 사이에 전기적 절연성을 갖는 재료로 이루어진 터널 장벽으로 구성된 자기 터널 접합 소자를 적외선 램프를 사용하여 급속 열처리하는 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 급속 열처리는 자기장을 가하면서 이루어지는 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 급속 열처리는 가열 시간이 10초 이내인 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 급속 열처리는 냉각 시간이 6분 이내인 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 급속 열처리는 가열 온도가 200 내지 400℃인 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 열처리 방법은 상기 급속 열처리이후에, 종래의 열처리 방법으로 열처리하는 단계를 추가적으로 포함하는 것을 특징으로 하는 자기 터널 접합 소자의 열처리 방법.
- 제 1항의 방법에 의해 처리된 것을 특징으로 하는 자기 터널 접합 소자.
- 삭제
- 삭제
- 삭제
- 제 2항의 방법에 의해 처리된 것을 특징으로 하는 자기 터널 접합 소자.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0026486A KR100407907B1 (ko) | 2001-05-15 | 2001-05-15 | 자기 터널 접합 소자의 열처리 방법과 그 방법으로 제조된자기 터널 접합 소자 |
US10/145,167 US6848169B2 (en) | 2001-05-15 | 2002-05-13 | Magnetic tunneling junction and fabrication method thereof |
AT02253351T ATE376259T1 (de) | 2001-05-15 | 2002-05-14 | Herstellungsverfahren für einen magnetischen tunnelübergang |
DE60222963T DE60222963T2 (de) | 2001-05-15 | 2002-05-14 | Herstellungsverfahren für einen magnetischen Tunnelübergang |
EP02253351A EP1258930B1 (en) | 2001-05-15 | 2002-05-14 | Fabrication method for a magnetic tunneling junction |
JP2002140511A JP4498660B2 (ja) | 2001-05-15 | 2002-05-15 | 磁気トンネル接合の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0026486A KR100407907B1 (ko) | 2001-05-15 | 2001-05-15 | 자기 터널 접합 소자의 열처리 방법과 그 방법으로 제조된자기 터널 접합 소자 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020087640A KR20020087640A (ko) | 2002-11-23 |
KR100407907B1 true KR100407907B1 (ko) | 2003-12-03 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0026486A KR100407907B1 (ko) | 2001-05-15 | 2001-05-15 | 자기 터널 접합 소자의 열처리 방법과 그 방법으로 제조된자기 터널 접합 소자 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6848169B2 (ko) |
EP (1) | EP1258930B1 (ko) |
JP (1) | JP4498660B2 (ko) |
KR (1) | KR100407907B1 (ko) |
AT (1) | ATE376259T1 (ko) |
DE (1) | DE60222963T2 (ko) |
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JP2004079632A (ja) * | 2002-08-12 | 2004-03-11 | Toshiba Corp | 半導体集積回路装置 |
KR20040083934A (ko) * | 2003-03-25 | 2004-10-06 | 주식회사 하이닉스반도체 | 마그네틱 램의 형성방법 |
US7054085B2 (en) * | 2003-06-30 | 2006-05-30 | Hitachi Global Storage Technologies Netherlands B.V. | Use of shunt resistor with large RA product tunnel barriers |
JP2006059963A (ja) * | 2004-08-19 | 2006-03-02 | Tohoku Univ | トンネル型磁気抵抗素子、その製造方法およびその製造装置 |
JP4101240B2 (ja) * | 2005-01-28 | 2008-06-18 | Tdk株式会社 | 磁気ヘッド |
US7695761B1 (en) | 2006-12-21 | 2010-04-13 | Western Digital (Fremont), Llc | Method and system for providing a spin tunneling magnetic element having a crystalline barrier layer |
US8559141B1 (en) | 2007-05-07 | 2013-10-15 | Western Digital (Fremont), Llc | Spin tunneling magnetic element promoting free layer crystal growth from a barrier layer interface |
US8545999B1 (en) | 2008-02-21 | 2013-10-01 | Western Digital (Fremont), Llc | Method and system for providing a magnetoresistive structure |
US8381391B2 (en) * | 2009-06-26 | 2013-02-26 | Western Digital (Fremont), Llc | Method for providing a magnetic recording transducer |
US8498084B1 (en) | 2009-07-21 | 2013-07-30 | Western Digital (Fremont), Llc | Magnetoresistive sensors having an improved free layer |
US8194365B1 (en) | 2009-09-03 | 2012-06-05 | Western Digital (Fremont), Llc | Method and system for providing a read sensor having a low magnetostriction free layer |
US8336194B2 (en) * | 2009-11-03 | 2012-12-25 | Western Digital (Fremont), Llc | Method of fabricating a tunneling magnetoresistive (TMR) reader |
US9054298B2 (en) * | 2010-12-10 | 2015-06-09 | Avalanche Technology, Inc. | Magnetic random access memory (MRAM) with enhanced magnetic stiffness and method of making same |
US8760819B1 (en) | 2010-12-23 | 2014-06-24 | Western Digital (Fremont), Llc | Magnetic recording sensor with sputtered antiferromagnetic coupling trilayer between plated ferromagnetic shields |
US9880232B2 (en) | 2012-03-14 | 2018-01-30 | Seagate Technology Llc | Magnetic sensor manufacturing |
CN102832336A (zh) * | 2012-08-28 | 2012-12-19 | 淮阴工学院 | 激光退火提高铁磁/反铁磁双层膜交换偏置场热稳定性方法 |
US8797692B1 (en) | 2012-09-07 | 2014-08-05 | Western Digital (Fremont), Llc | Magnetic recording sensor with AFM exchange coupled shield stabilization |
US9064534B1 (en) | 2012-11-30 | 2015-06-23 | Western Digital (Fremont), Llc | Process for providing a magnetic recording transducer with enhanced pinning layer stability |
TWI501224B (zh) * | 2013-03-07 | 2015-09-21 | Nat Univ Tsing Hua | 磁性電子裝置及其製造方法 |
US8780505B1 (en) | 2013-03-12 | 2014-07-15 | Western Digital (Fremont), Llc | Method and system for providing a read transducer having an improved composite magnetic shield |
US9013836B1 (en) | 2013-04-02 | 2015-04-21 | Western Digital (Fremont), Llc | Method and system for providing an antiferromagnetically coupled return pole |
US9070381B1 (en) | 2013-04-12 | 2015-06-30 | Western Digital (Fremont), Llc | Magnetic recording read transducer having a laminated free layer |
US9431047B1 (en) | 2013-05-01 | 2016-08-30 | Western Digital (Fremont), Llc | Method for providing an improved AFM reader shield |
US9361913B1 (en) | 2013-06-03 | 2016-06-07 | Western Digital (Fremont), Llc | Recording read heads with a multi-layer AFM layer methods and apparatuses |
US9287494B1 (en) | 2013-06-28 | 2016-03-15 | Western Digital (Fremont), Llc | Magnetic tunnel junction (MTJ) with a magnesium oxide tunnel barrier |
US9076954B2 (en) | 2013-08-08 | 2015-07-07 | Samsung Electronics Co., Ltd. | Method and system for providing magnetic memories switchable using spin accumulation and selectable using magnetoelectric devices |
US9147408B1 (en) | 2013-12-19 | 2015-09-29 | Western Digital (Fremont), Llc | Heated AFM layer deposition and cooling process for TMR magnetic recording sensor with high pinning field |
KR20160056376A (ko) * | 2014-11-10 | 2016-05-20 | 삼성전자주식회사 | 금속 산화막을 형성하는 방법 및 이를 포함하는 자기 메모리 장치 |
US10074387B1 (en) | 2014-12-21 | 2018-09-11 | Western Digital (Fremont), Llc | Method and system for providing a read transducer having symmetric antiferromagnetically coupled shields |
CN105280809B (zh) * | 2015-09-14 | 2018-03-27 | 华中科技大学 | 一种磁隧道结及其制备方法 |
US10622406B2 (en) * | 2018-07-03 | 2020-04-14 | International Business Machines Corporation | Dual metal nitride landing pad for MRAM devices |
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-
2001
- 2001-05-15 KR KR10-2001-0026486A patent/KR100407907B1/ko active IP Right Grant
-
2002
- 2002-05-13 US US10/145,167 patent/US6848169B2/en not_active Expired - Lifetime
- 2002-05-14 AT AT02253351T patent/ATE376259T1/de not_active IP Right Cessation
- 2002-05-14 DE DE60222963T patent/DE60222963T2/de not_active Expired - Lifetime
- 2002-05-14 EP EP02253351A patent/EP1258930B1/en not_active Expired - Lifetime
- 2002-05-15 JP JP2002140511A patent/JP4498660B2/ja not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020020866A (ko) * | 2000-09-11 | 2002-03-16 | 니시무로 타이죠 | 터널 자기성 저항 효과 디바이스 및 포터블 퍼스널 디바이스 |
Also Published As
Publication number | Publication date |
---|---|
ATE376259T1 (de) | 2007-11-15 |
DE60222963D1 (de) | 2007-11-29 |
EP1258930A2 (en) | 2002-11-20 |
DE60222963T2 (de) | 2008-07-31 |
JP4498660B2 (ja) | 2010-07-07 |
US6848169B2 (en) | 2005-02-01 |
US20020185196A1 (en) | 2002-12-12 |
EP1258930A3 (en) | 2005-11-16 |
JP2003069113A (ja) | 2003-03-07 |
EP1258930B1 (en) | 2007-10-17 |
KR20020087640A (ko) | 2002-11-23 |
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