KR100336881B1 - 박막트랜지스터액정표시소자의제조방법 - Google Patents
박막트랜지스터액정표시소자의제조방법 Download PDFInfo
- Publication number
- KR100336881B1 KR100336881B1 KR10-1998-0024339A KR19980024339A KR100336881B1 KR 100336881 B1 KR100336881 B1 KR 100336881B1 KR 19980024339 A KR19980024339 A KR 19980024339A KR 100336881 B1 KR100336881 B1 KR 100336881B1
- Authority
- KR
- South Korea
- Prior art keywords
- film
- etching
- mask
- organic insulating
- amorphous silicon
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 10
- 239000010409 thin film Substances 0.000 title claims abstract description 10
- 239000010408 film Substances 0.000 claims abstract description 95
- 238000005530 etching Methods 0.000 claims abstract description 60
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 33
- 239000002184 metal Substances 0.000 claims abstract description 33
- 238000000034 method Methods 0.000 claims abstract description 30
- 239000011521 glass Substances 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 18
- 230000001681 protective effect Effects 0.000 claims abstract description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 6
- 238000000151 deposition Methods 0.000 claims abstract description 5
- 239000012535 impurity Substances 0.000 claims abstract description 5
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 3
- 238000002161 passivation Methods 0.000 claims description 2
- 238000004528 spin coating Methods 0.000 claims description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66765—Lateral single gate single channel transistors with inverted structure, i.e. the channel layer is formed after the gate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (3)
- 유리기판 상에 게이트 금속막을 증착하고, 제1마스크를 식각 마스크로 하는 식각 공정으로 상기 게이트 금속막을 식각하여 유리기판 상에 게이트 전극을 형성하는 단계;상기 게이트 전극이 형성된 유리기판 전면에 게이트 절연막, 불순물이 도핑되지 않은 제1비정질실리콘막, 및 감광성 유기절연막을 순차적으로 형성하는 단계;상기 감광성 유기절연막에 대하여 유리기판의 후면에서 상기 게이트 전극을 노광 마스크로 하는 노광 공정을 실시한 후, 현상 공정을 실시하여 상기 제1비정질실리콘막 상에 감광성 유기절연막으로된 에치 스톱퍼를 형성하는 단계;상기 에치 스톱퍼 및 제1비정질실리콘막 상에 불순물이 도핑된 제2비정질실리콘막과 소오스/드레인용 금속막을 순차적으로 형성하는 단계;제2마스크를 식각 마스크로 하는 식각 공정을 통해 상기 소오스/드레인용 금속막과 제2비정질실리콘막 및 제1비정질실리콘막을 연속적으로 식각하여 소오스/드레인 전극과, 오믹층, 및 반도체층을 형성하는 단계;전체 상부에 유기절연막을 도포하고, 제3마스크를 식각 마스크로 하는 식각 공정을 실시하여 소오스/드레인 전극과 이에 인접된 게이트 절연막 부분을 피복함과 동시에 드레인 전극의 소정 부분을 노출시키는 콘택홀이 형성된 보호막을 형성하는 단계; 및상기 보호막을 포함한 게이트 절연막 전면 상에 ITO 금속막을 증착하고, 제4마스크를 식각 마스크로 하는 식각 공정으로 상기 ITO 금속막을 식각하여 화소영역에 상기 드레인 전극과 콘택되는 화소전극을 형성하는 단계를 포함하는 것을 특징으로 하는 박막 트랜지스터 액정표시소자의 제조방법.
- 제 1 항에 있어서, 상기 감광성 유기절연막은 아크릴 또는 BCB인 것을 특징으로 하는 박막 트랜지스터 액정표시소자의 제조방법.
- 제 1 항 또는 제 2 항에 있어서, 상기 감광성 유기절연막은 스핀 코팅으로 도포하는 것을 특징으로 하는 박막 트랜지스터 액정표시소자의 제조방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-1998-0024339A KR100336881B1 (ko) | 1998-06-26 | 1998-06-26 | 박막트랜지스터액정표시소자의제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-1998-0024339A KR100336881B1 (ko) | 1998-06-26 | 1998-06-26 | 박막트랜지스터액정표시소자의제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000003173A KR20000003173A (ko) | 2000-01-15 |
KR100336881B1 true KR100336881B1 (ko) | 2003-01-15 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR10-1998-0024339A KR100336881B1 (ko) | 1998-06-26 | 1998-06-26 | 박막트랜지스터액정표시소자의제조방법 |
Country Status (1)
Country | Link |
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KR (1) | KR100336881B1 (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20020080866A (ko) * | 2001-04-18 | 2002-10-26 | 주식회사 현대 디스플레이 테크놀로지 | 박막 트랜지스터 액정표시장치의 제조방법 |
KR100737641B1 (ko) * | 2001-05-07 | 2007-07-09 | 비오이 하이디스 테크놀로지 주식회사 | 박막 트랜지스터 액정표시장치 제조방법 |
KR100707016B1 (ko) * | 2001-05-31 | 2007-04-11 | 비오이 하이디스 테크놀로지 주식회사 | 박막 트랜지스터 액정표시장치의 제조방법 |
KR20020091706A (ko) * | 2001-05-31 | 2002-12-06 | 주식회사 현대 디스플레이 테크놀로지 | 액정표시소자의 박막 트랜지스터 제조방법 |
KR100476051B1 (ko) * | 2001-09-05 | 2005-03-10 | 비오이 하이디스 테크놀로지 주식회사 | 박막트랜지스터 액정표시장치의 제조방법 |
CN102655165B (zh) | 2011-03-28 | 2015-04-29 | 京东方科技集团股份有限公司 | 一种非晶氧化物薄膜晶体管及其制作方法、显示面板 |
KR102094847B1 (ko) | 2013-07-03 | 2020-03-31 | 삼성디스플레이 주식회사 | 박막 트랜지스터를 포함하는 표시 기판 및 이의 제조 방법 |
KR102131195B1 (ko) | 2013-07-16 | 2020-07-08 | 삼성디스플레이 주식회사 | 박막 트랜지스터를 포함하는 표시 기판 및 이의 제조 방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR940022164A (ko) * | 1993-03-24 | 1994-10-20 | 쯔지 하루오 | 반사형 액정표시장치 및 그의 제조방법 |
KR970028753A (ko) * | 1995-11-20 | 1997-06-24 | 김주용 | 액정 표시 소자의 제조 방법 |
-
1998
- 1998-06-26 KR KR10-1998-0024339A patent/KR100336881B1/ko not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR940022164A (ko) * | 1993-03-24 | 1994-10-20 | 쯔지 하루오 | 반사형 액정표시장치 및 그의 제조방법 |
KR970028753A (ko) * | 1995-11-20 | 1997-06-24 | 김주용 | 액정 표시 소자의 제조 방법 |
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Publication number | Publication date |
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KR20000003173A (ko) | 2000-01-15 |
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