KR0152449B1 - 확산이차 방출전자샤워 - Google Patents

확산이차 방출전자샤워 Download PDF

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Publication number
KR0152449B1
KR0152449B1 KR1019920012684A KR920012684A KR0152449B1 KR 0152449 B1 KR0152449 B1 KR 0152449B1 KR 1019920012684 A KR1019920012684 A KR 1019920012684A KR 920012684 A KR920012684 A KR 920012684A KR 0152449 B1 KR0152449 B1 KR 0152449B1
Authority
KR
South Korea
Prior art keywords
ion beam
ion
electrons
filament
neutralizer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019920012684A
Other languages
English (en)
Korean (ko)
Other versions
KR930003248A (ko
Inventor
모오리스 벤베니스테 빅터
Original Assignee
프랑크 엠 사죠벡
이턴 코오포레이숀
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 프랑크 엠 사죠벡, 이턴 코오포레이숀 filed Critical 프랑크 엠 사죠벡
Publication of KR930003248A publication Critical patent/KR930003248A/ko
Application granted granted Critical
Publication of KR0152449B1 publication Critical patent/KR0152449B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/004—Charge control of objects or beams
    • H01J2237/0041—Neutralising arrangements
    • H01J2237/0044—Neutralising arrangements of objects being observed or treated
    • H01J2237/0045—Neutralising arrangements of objects being observed or treated using secondary electrons
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31701—Ion implantation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Electron Sources, Ion Sources (AREA)
KR1019920012684A 1991-07-19 1992-07-16 확산이차 방출전자샤워 Expired - Fee Related KR0152449B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US732,778 1991-07-19
US07/732,778 US5164599A (en) 1991-07-19 1991-07-19 Ion beam neutralization means generating diffuse secondary emission electron shower

Publications (2)

Publication Number Publication Date
KR930003248A KR930003248A (ko) 1993-02-24
KR0152449B1 true KR0152449B1 (ko) 1998-12-01

Family

ID=24944919

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019920012684A Expired - Fee Related KR0152449B1 (ko) 1991-07-19 1992-07-16 확산이차 방출전자샤워

Country Status (9)

Country Link
US (1) US5164599A (enExample)
EP (1) EP0523983B1 (enExample)
JP (1) JPH05211055A (enExample)
KR (1) KR0152449B1 (enExample)
CA (1) CA2072848A1 (enExample)
DE (1) DE69209391T2 (enExample)
ES (1) ES2085571T3 (enExample)
TW (1) TW205605B (enExample)
ZA (1) ZA925282B (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5378899A (en) * 1993-10-07 1995-01-03 Kimber; Eugene L. Ion implantation target charge control system
US5531420A (en) 1994-07-01 1996-07-02 Eaton Corporation Ion beam electron neutralizer
US5554854A (en) * 1995-07-17 1996-09-10 Eaton Corporation In situ removal of contaminants from the interior surfaces of an ion beam implanter
US5633506A (en) * 1995-07-17 1997-05-27 Eaton Corporation Method and apparatus for in situ removal of contaminants from ion beam neutralization and implantation apparatuses
US5554857A (en) * 1995-10-19 1996-09-10 Eaton Corporation Method and apparatus for ion beam formation in an ion implanter
US5691537A (en) * 1996-01-22 1997-11-25 Chen; John Method and apparatus for ion beam transport
US5661308A (en) * 1996-05-30 1997-08-26 Eaton Corporation Method and apparatus for ion formation in an ion implanter
US5703375A (en) * 1996-08-02 1997-12-30 Eaton Corporation Method and apparatus for ion beam neutralization
US5814819A (en) * 1997-07-11 1998-09-29 Eaton Corporation System and method for neutralizing an ion beam using water vapor
US5909031A (en) * 1997-09-08 1999-06-01 Eaton Corporation Ion implanter electron shower having enhanced secondary electron emission
US5856674A (en) * 1997-09-16 1999-01-05 Eaton Corporation Filament for ion implanter plasma shower
US6271529B1 (en) 1997-12-01 2001-08-07 Ebara Corporation Ion implantation with charge neutralization
US5959305A (en) * 1998-06-19 1999-09-28 Eaton Corporation Method and apparatus for monitoring charge neutralization operation
US6555835B1 (en) 1999-08-09 2003-04-29 Samco International, Inc. Ultraviolet-ozone oxidation system and method
US6164146A (en) * 1999-08-09 2000-12-26 Samco International, Inc. Test device for ozone-ultraviolet cleaning-stripping equipment
WO2003012160A1 (en) * 2001-07-31 2003-02-13 Asahi Optronics, Ltd. High frequency ion plating vapor deposition system
DE10254416A1 (de) 2002-11-21 2004-06-09 Infineon Technologies Ag Vorrichtung zum Erzeugen von Sekundärelektronen, insbesondere Sekundärelektrode und Beschleunigungselektrode
US7038223B2 (en) * 2004-04-05 2006-05-02 Burle Technologies, Inc. Controlled charge neutralization of ion-implanted articles
KR100836765B1 (ko) * 2007-01-08 2008-06-10 삼성전자주식회사 이온빔을 사용하는 반도체 장비
CN105206492A (zh) * 2014-06-18 2015-12-30 上海华力微电子有限公司 一种改善带状离子束均匀性的装置
CN108242379A (zh) * 2016-12-26 2018-07-03 无锡中微掩模电子有限公司 一种环形电子枪

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361762A (en) * 1980-07-30 1982-11-30 Rca Corporation Apparatus and method for neutralizing the beam in an ion implanter
US4463255A (en) * 1980-09-24 1984-07-31 Varian Associates, Inc. Apparatus for enhanced neutralization of positively charged ion beam
US4786814A (en) * 1983-09-16 1988-11-22 General Electric Company Method of reducing electrostatic charge on ion-implanted devices
JPS62103951A (ja) * 1985-10-29 1987-05-14 Toshiba Corp イオン注入装置
US4886971A (en) * 1987-03-13 1989-12-12 Mitsubishi Denki Kabushiki Kaisha Ion beam irradiating apparatus including ion neutralizer
US4825087A (en) * 1987-05-13 1989-04-25 Applied Materials, Inc. System and methods for wafer charge reduction for ion implantation
JPS6410563A (en) * 1987-07-02 1989-01-13 Sumitomo Eaton Nova Electric charging suppressor of ion implanter
US4804837A (en) * 1988-01-11 1989-02-14 Eaton Corporation Ion implantation surface charge control method and apparatus
EP0397120B1 (en) * 1989-05-09 1994-09-14 Sumitomo Eaton Nova Corporation Ion implantation apparatus capable of avoiding electrification of a substrate

Also Published As

Publication number Publication date
EP0523983B1 (en) 1996-03-27
ES2085571T3 (es) 1996-06-01
DE69209391T2 (de) 1996-10-31
ZA925282B (en) 1993-04-28
TW205605B (enExample) 1993-05-11
JPH05211055A (ja) 1993-08-20
DE69209391D1 (de) 1996-05-02
EP0523983A1 (en) 1993-01-20
CA2072848A1 (en) 1993-01-20
KR930003248A (ko) 1993-02-24
US5164599A (en) 1992-11-17

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