KR0133996B1 - Period measuring device - Google Patents

Period measuring device

Info

Publication number
KR0133996B1
KR0133996B1 KR94020690A KR19940020690A KR0133996B1 KR 0133996 B1 KR0133996 B1 KR 0133996B1 KR 94020690 A KR94020690 A KR 94020690A KR 19940020690 A KR19940020690 A KR 19940020690A KR 0133996 B1 KR0133996 B1 KR 0133996B1
Authority
KR
South Korea
Prior art keywords
measuring device
period measuring
period
measuring
Prior art date
Application number
KR94020690A
Other languages
English (en)
Other versions
KR950006468A (ko
Inventor
Makoto Hatakenaka
Haruo Sakurai
Hideo Nagano
Original Assignee
Mitsubichi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubichi Electric Corp filed Critical Mitsubichi Electric Corp
Publication of KR950006468A publication Critical patent/KR950006468A/ko
Application granted granted Critical
Publication of KR0133996B1 publication Critical patent/KR0133996B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/005—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Synchronizing For Television (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Image Analysis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
KR94020690A 1993-08-23 1994-08-22 Period measuring device KR0133996B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5207791A JPH0755856A (ja) 1993-08-23 1993-08-23 周期測定装置
JP93-207791 1993-08-23

Publications (2)

Publication Number Publication Date
KR950006468A KR950006468A (ko) 1995-03-21
KR0133996B1 true KR0133996B1 (en) 1998-04-25

Family

ID=16545561

Family Applications (1)

Application Number Title Priority Date Filing Date
KR94020690A KR0133996B1 (en) 1993-08-23 1994-08-22 Period measuring device

Country Status (4)

Country Link
US (1) US5487097A (ko)
JP (1) JPH0755856A (ko)
KR (1) KR0133996B1 (ko)
TW (1) TW241432B (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2793524B2 (ja) * 1995-07-31 1998-09-03 日本電気アイシーマイコンシステム株式会社 時間測定システムおよびその測定方法
JP2001094823A (ja) * 1999-09-22 2001-04-06 Sony Corp マルチスキャン対応水平同期信号生成システム
US7401245B2 (en) 2005-04-29 2008-07-15 Hewlett-Packard Development Company, L.P. Count calibration for synchronous data transfer between clock domains
US7558317B2 (en) * 2005-04-29 2009-07-07 Hewlett-Packard Development Company, L.P. Edge calibration for synchronous data transfer between clock domains
US7477712B2 (en) * 2005-04-29 2009-01-13 Hewlett-Packard Development Company, L.P. Adaptable data path for synchronous data transfer between clock domains
CN101819231B (zh) * 2010-03-18 2014-08-06 天津农学院 连续计数间隔标记的高分辨率频率测量方法
JP6110122B2 (ja) * 2012-12-07 2017-04-05 シナプティクス・ジャパン合同会社 集積回路装置、パネル表示装置及び表示パネルドライバ
CN115732022A (zh) * 2021-08-27 2023-03-03 长鑫存储技术有限公司 一种振荡周期检测电路、方法和半导体存储器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745475A (en) * 1971-12-07 1973-07-10 Nasa Measurement system
US3878370A (en) * 1973-09-04 1975-04-15 Artronics Corp Electronic interval timer
US4001561A (en) * 1975-09-04 1977-01-04 Quaintance William J Device for measuring and indicating reading speed
US4085373A (en) * 1976-11-03 1978-04-18 Woodward Governor Company Frequency-to-voltage transducer for speed governor systems or the like
JPH01232393A (ja) * 1988-03-14 1989-09-18 Sony Corp 周波数検出器
US5382910A (en) * 1993-04-06 1995-01-17 John Fluke Mfg. Co., Inc. Dual time base zero dead zone time domain reflectometer

Also Published As

Publication number Publication date
JPH0755856A (ja) 1995-03-03
US5487097A (en) 1996-01-23
TW241432B (en) 1995-02-21
KR950006468A (ko) 1995-03-21

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20061218

Year of fee payment: 10

LAPS Lapse due to unpaid annual fee