JPWO2024214180A5 - - Google Patents

Info

Publication number
JPWO2024214180A5
JPWO2024214180A5 JP2025513541A JP2025513541A JPWO2024214180A5 JP WO2024214180 A5 JPWO2024214180 A5 JP WO2024214180A5 JP 2025513541 A JP2025513541 A JP 2025513541A JP 2025513541 A JP2025513541 A JP 2025513541A JP WO2024214180 A5 JPWO2024214180 A5 JP WO2024214180A5
Authority
JP
Japan
Prior art keywords
conductor layer
layer
impurity region
region
semiconductor region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025513541A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2024214180A1 (https=
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/014698 external-priority patent/WO2024214180A1/ja
Publication of JPWO2024214180A1 publication Critical patent/JPWO2024214180A1/ja
Publication of JPWO2024214180A5 publication Critical patent/JPWO2024214180A5/ja
Pending legal-status Critical Current

Links

JP2025513541A 2023-04-11 2023-04-11 Pending JPWO2024214180A1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/014698 WO2024214180A1 (ja) 2023-04-11 2023-04-11 半導体素子を用いたメモリ装置

Publications (2)

Publication Number Publication Date
JPWO2024214180A1 JPWO2024214180A1 (https=) 2024-10-17
JPWO2024214180A5 true JPWO2024214180A5 (https=) 2026-01-19

Family

ID=93016351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025513541A Pending JPWO2024214180A1 (https=) 2023-04-11 2023-04-11

Country Status (5)

Country Link
US (1) US12588186B2 (https=)
JP (1) JPWO2024214180A1 (https=)
KR (1) KR20250162811A (https=)
TW (1) TWI892578B (https=)
WO (1) WO2024214180A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2703970B2 (ja) 1989-01-17 1998-01-26 株式会社東芝 Mos型半導体装置
JP3808763B2 (ja) 2001-12-14 2006-08-16 株式会社東芝 半導体メモリ装置およびその製造方法
US20060192249A1 (en) 2004-09-20 2006-08-31 Samsung Electronics Co., Ltd. Field effect transistors with vertically oriented gate electrodes and methods for fabricating the same
KR100752661B1 (ko) * 2005-04-09 2007-08-29 삼성전자주식회사 수직 방향의 게이트 전극을 갖는 전계효과 트랜지스터 및그 제조 방법
JP5078338B2 (ja) 2006-12-12 2012-11-21 ルネサスエレクトロニクス株式会社 半導体記憶装置
US7919800B2 (en) 2007-02-26 2011-04-05 Micron Technology, Inc. Capacitor-less memory cells and cell arrays
CN107592943B (zh) * 2015-04-29 2022-07-15 芝诺半导体有限公司 提高漏极电流的mosfet和存储单元
KR102905486B1 (ko) * 2021-08-30 2025-12-29 삼성전자주식회사 반도체 장치
KR102784170B1 (ko) 2021-09-06 2025-03-19 유니산티스 일렉트로닉스 싱가포르 프라이빗 리미티드 반도체 소자를 사용한 메모리 장치
JP7705670B2 (ja) * 2022-02-01 2025-07-10 ユニサンティス エレクトロニクス シンガポール プライベート リミテッド 半導体素子を用いたメモリ装置

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