JPWO2024075511A1 - - Google Patents

Info

Publication number
JPWO2024075511A1
JPWO2024075511A1 JP2024555699A JP2024555699A JPWO2024075511A1 JP WO2024075511 A1 JPWO2024075511 A1 JP WO2024075511A1 JP 2024555699 A JP2024555699 A JP 2024555699A JP 2024555699 A JP2024555699 A JP 2024555699A JP WO2024075511 A1 JPWO2024075511 A1 JP WO2024075511A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024555699A
Other languages
Japanese (ja)
Other versions
JPWO2024075511A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024075511A1 publication Critical patent/JPWO2024075511A1/ja
Publication of JPWO2024075511A5 publication Critical patent/JPWO2024075511A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00623Quality control of instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2024555699A 2022-10-07 2023-09-19 Pending JPWO2024075511A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022162359 2022-10-07
PCT/JP2023/033904 WO2024075511A1 (ja) 2022-10-07 2023-09-19 自動分析装置

Publications (2)

Publication Number Publication Date
JPWO2024075511A1 true JPWO2024075511A1 (https=) 2024-04-11
JPWO2024075511A5 JPWO2024075511A5 (https=) 2025-06-17

Family

ID=90607689

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024555699A Pending JPWO2024075511A1 (https=) 2022-10-07 2023-09-19

Country Status (4)

Country Link
EP (1) EP4600655A1 (https=)
JP (1) JPWO2024075511A1 (https=)
CN (1) CN119895266A (https=)
WO (1) WO2024075511A1 (https=)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05264559A (ja) * 1992-03-18 1993-10-12 Hitachi Ltd 自動分析装置
JPH05281001A (ja) * 1992-04-03 1993-10-29 Fuji Electric Co Ltd 部品の寿命時間予測装置
US5915932A (en) * 1990-02-02 1999-06-29 Isco, Inc. Peristaltic pump having a roller support
JP2010107478A (ja) * 2008-10-31 2010-05-13 Sysmex Corp 検体分析装置、検体分析装置における試薬情報の表示方法およびコンピュータプログラム
JP4508163B2 (ja) * 2006-06-23 2010-07-21 オムロン株式会社 温度検出構造および電子機器
JP4893703B2 (ja) * 2008-07-11 2012-03-07 トヨタ自動車株式会社 蓄電装置の劣化表示システムおよび蓄電装置の劣化表示方法
JP2014032022A (ja) * 2012-08-01 2014-02-20 Shimadzu Corp 分析装置制御システム、及び分析装置制御システム用プログラム
JP2020194583A (ja) * 2020-08-21 2020-12-03 ファナック株式会社 サービスセンタ管理装置
WO2022196346A1 (ja) * 2021-03-16 2022-09-22 株式会社日立ハイテク 自動分析装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5915932A (en) * 1990-02-02 1999-06-29 Isco, Inc. Peristaltic pump having a roller support
JPH05264559A (ja) * 1992-03-18 1993-10-12 Hitachi Ltd 自動分析装置
JPH05281001A (ja) * 1992-04-03 1993-10-29 Fuji Electric Co Ltd 部品の寿命時間予測装置
JP4508163B2 (ja) * 2006-06-23 2010-07-21 オムロン株式会社 温度検出構造および電子機器
JP4893703B2 (ja) * 2008-07-11 2012-03-07 トヨタ自動車株式会社 蓄電装置の劣化表示システムおよび蓄電装置の劣化表示方法
JP2010107478A (ja) * 2008-10-31 2010-05-13 Sysmex Corp 検体分析装置、検体分析装置における試薬情報の表示方法およびコンピュータプログラム
JP2014032022A (ja) * 2012-08-01 2014-02-20 Shimadzu Corp 分析装置制御システム、及び分析装置制御システム用プログラム
JP2020194583A (ja) * 2020-08-21 2020-12-03 ファナック株式会社 サービスセンタ管理装置
WO2022196346A1 (ja) * 2021-03-16 2022-09-22 株式会社日立ハイテク 自動分析装置

Also Published As

Publication number Publication date
WO2024075511A1 (ja) 2024-04-11
CN119895266A (zh) 2025-04-25
EP4600655A1 (en) 2025-08-13

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