JPWO2023163018A5 - - Google Patents

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Publication number
JPWO2023163018A5
JPWO2023163018A5 JP2024503197A JP2024503197A JPWO2023163018A5 JP WO2023163018 A5 JPWO2023163018 A5 JP WO2023163018A5 JP 2024503197 A JP2024503197 A JP 2024503197A JP 2024503197 A JP2024503197 A JP 2024503197A JP WO2023163018 A5 JPWO2023163018 A5 JP WO2023163018A5
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JP
Japan
Prior art keywords
light
optical
frequency
interference
pulse train
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024503197A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023163018A1 (https=
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/006392 external-priority patent/WO2023163018A1/ja
Publication of JPWO2023163018A1 publication Critical patent/JPWO2023163018A1/ja
Publication of JPWO2023163018A5 publication Critical patent/JPWO2023163018A5/ja
Pending legal-status Critical Current

Links

JP2024503197A 2022-02-24 2023-02-22 Pending JPWO2023163018A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022026953 2022-02-24
PCT/JP2023/006392 WO2023163018A1 (ja) 2022-02-24 2023-02-22 光計測装置

Publications (2)

Publication Number Publication Date
JPWO2023163018A1 JPWO2023163018A1 (https=) 2023-08-31
JPWO2023163018A5 true JPWO2023163018A5 (https=) 2026-03-10

Family

ID=87766049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024503197A Pending JPWO2023163018A1 (https=) 2022-02-24 2023-02-22

Country Status (3)

Country Link
US (1) US20240418634A1 (https=)
JP (1) JPWO2023163018A1 (https=)
WO (1) WO2023163018A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120559314B (zh) * 2025-07-28 2025-09-26 南京航空航天大学 基于多通道光路鉴相的微波频率测量方法及装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69111432T2 (de) * 1991-05-24 1996-02-29 Hewlett Packard Co Heterodyn-Interferometer Einrichtung.
JP3564373B2 (ja) * 2000-09-08 2004-09-08 独立行政法人 科学技術振興機構 光計測システム
DE102008062879B4 (de) * 2008-10-10 2010-10-28 Universität Stuttgart Verfahren und Anordnung zur skalierbaren Interferometrie
JP2010230653A (ja) * 2009-03-03 2010-10-14 Canon Inc 光波干渉計測装置
JP5764566B2 (ja) * 2009-10-02 2015-08-19 イムラ アメリカ インコーポレイテッド モード同期レーザによる光信号処理
ES2461188T3 (es) * 2012-01-26 2014-05-19 Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt Procedimiento para medir longitudes absolutas y dispositivo para medir longitudes
JP6136356B2 (ja) * 2013-02-25 2017-05-31 セイコーエプソン株式会社 測定装置
JP6193644B2 (ja) * 2013-06-28 2017-09-06 株式会社ミツトヨ 変位測定装置及び変位測定方法
JP6820020B2 (ja) * 2016-03-02 2021-01-27 国立大学法人電気通信大学 形状測定方法及び形状測定装置
WO2019167476A1 (ja) * 2018-03-02 2019-09-06 国立大学法人電気通信大学 干渉信号強度取得方法及び干渉信号強度取得装置
EP3916365A1 (en) * 2020-05-25 2021-12-01 Aragon Photonics Labs, S.L.U. Method and system for interrogating optical fibers
EP4174569B1 (en) * 2020-06-26 2026-03-11 Panasonic Intellectual Property Management Co., Ltd. Dual optical frequency comb generation device and measurement device
CN114544521B (zh) * 2022-03-08 2025-09-26 北京航空航天大学 刻蚀气体监测系统及气体状态分析方法
WO2023243365A1 (ja) * 2022-06-14 2023-12-21 パナソニックＩｐマネジメント株式会社 レーザ装置

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