JPWO2023163018A1 - - Google Patents
Info
- Publication number
- JPWO2023163018A1 JPWO2023163018A1 JP2024503197A JP2024503197A JPWO2023163018A1 JP WO2023163018 A1 JPWO2023163018 A1 JP WO2023163018A1 JP 2024503197 A JP2024503197 A JP 2024503197A JP 2024503197 A JP2024503197 A JP 2024503197A JP WO2023163018 A1 JPWO2023163018 A1 JP WO2023163018A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
- G01B9/02008—Two or more frequencies or sources used for interferometric measurement by using a frequency comb
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022026953 | 2022-02-24 | ||
| PCT/JP2023/006392 WO2023163018A1 (ja) | 2022-02-24 | 2023-02-22 | 光計測装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023163018A1 true JPWO2023163018A1 (https=) | 2023-08-31 |
| JPWO2023163018A5 JPWO2023163018A5 (https=) | 2026-03-10 |
Family
ID=87766049
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024503197A Pending JPWO2023163018A1 (https=) | 2022-02-24 | 2023-02-22 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20240418634A1 (https=) |
| JP (1) | JPWO2023163018A1 (https=) |
| WO (1) | WO2023163018A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120559314B (zh) * | 2025-07-28 | 2025-09-26 | 南京航空航天大学 | 基于多通道光路鉴相的微波频率测量方法及装置 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69111432T2 (de) * | 1991-05-24 | 1996-02-29 | Hewlett Packard Co | Heterodyn-Interferometer Einrichtung. |
| JP3564373B2 (ja) * | 2000-09-08 | 2004-09-08 | 独立行政法人 科学技術振興機構 | 光計測システム |
| DE102008062879B4 (de) * | 2008-10-10 | 2010-10-28 | Universität Stuttgart | Verfahren und Anordnung zur skalierbaren Interferometrie |
| JP2010230653A (ja) * | 2009-03-03 | 2010-10-14 | Canon Inc | 光波干渉計測装置 |
| JP5764566B2 (ja) * | 2009-10-02 | 2015-08-19 | イムラ アメリカ インコーポレイテッド | モード同期レーザによる光信号処理 |
| ES2461188T3 (es) * | 2012-01-26 | 2014-05-19 | Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt | Procedimiento para medir longitudes absolutas y dispositivo para medir longitudes |
| JP6136356B2 (ja) * | 2013-02-25 | 2017-05-31 | セイコーエプソン株式会社 | 測定装置 |
| JP6193644B2 (ja) * | 2013-06-28 | 2017-09-06 | 株式会社ミツトヨ | 変位測定装置及び変位測定方法 |
| JP6820020B2 (ja) * | 2016-03-02 | 2021-01-27 | 国立大学法人電気通信大学 | 形状測定方法及び形状測定装置 |
| WO2019167476A1 (ja) * | 2018-03-02 | 2019-09-06 | 国立大学法人電気通信大学 | 干渉信号強度取得方法及び干渉信号強度取得装置 |
| EP3916365A1 (en) * | 2020-05-25 | 2021-12-01 | Aragon Photonics Labs, S.L.U. | Method and system for interrogating optical fibers |
| EP4174569B1 (en) * | 2020-06-26 | 2026-03-11 | Panasonic Intellectual Property Management Co., Ltd. | Dual optical frequency comb generation device and measurement device |
| CN114544521B (zh) * | 2022-03-08 | 2025-09-26 | 北京航空航天大学 | 刻蚀气体监测系统及气体状态分析方法 |
| WO2023243365A1 (ja) * | 2022-06-14 | 2023-12-21 | パナソニックＩｐマネジメント株式会社 | レーザ装置 |
-
2023
- 2023-02-22 JP JP2024503197A patent/JPWO2023163018A1/ja active Pending
- 2023-02-22 WO PCT/JP2023/006392 patent/WO2023163018A1/ja not_active Ceased
-
2024
- 2024-08-22 US US18/812,047 patent/US20240418634A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023163018A1 (ja) | 2023-08-31 |
| US20240418634A1 (en) | 2024-12-19 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20260220 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260220 |