JPWO2022210159A1 - - Google Patents

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Publication number
JPWO2022210159A1
JPWO2022210159A1 JP2023511055A JP2023511055A JPWO2022210159A1 JP WO2022210159 A1 JPWO2022210159 A1 JP WO2022210159A1 JP 2023511055 A JP2023511055 A JP 2023511055A JP 2023511055 A JP2023511055 A JP 2023511055A JP WO2022210159 A1 JPWO2022210159 A1 JP WO2022210159A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2023511055A
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Japanese (ja)
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JP7764467B2 (ja
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Publication of JPWO2022210159A1 publication Critical patent/JPWO2022210159A1/ja
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Publication of JP7764467B2 publication Critical patent/JP7764467B2/ja
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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/70Adapting basic layout or design of masks to lithographic process requirements, e.g., second iteration correction of mask patterns for imaging
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/10Moulds; Masks; Masterforms

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
JP2023511055A 2021-03-29 2022-03-23 電鋳型の製造方法及びフォトマスク Active JP7764467B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021054711 2021-03-29
JP2021054711 2021-03-29
PCT/JP2022/013484 WO2022210159A1 (ja) 2021-03-29 2022-03-23 電鋳型の製造方法及びフォトマスク

Publications (2)

Publication Number Publication Date
JPWO2022210159A1 true JPWO2022210159A1 (https=) 2022-10-06
JP7764467B2 JP7764467B2 (ja) 2025-11-05

Family

ID=83455355

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023511055A Active JP7764467B2 (ja) 2021-03-29 2022-03-23 電鋳型の製造方法及びフォトマスク

Country Status (5)

Country Link
US (1) US20240176229A1 (https=)
EP (1) EP4317535A4 (https=)
JP (1) JP7764467B2 (https=)
CN (1) CN117098875A (https=)
WO (1) WO2022210159A1 (https=)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216052A (ja) * 1987-03-05 1988-09-08 Fujitsu Ltd 露光方法
JPH04127150A (ja) * 1990-09-19 1992-04-28 Hitachi Ltd 半導体装置の製造方法
JP2006343776A (ja) * 1995-05-03 2006-12-21 Asml Masktools Bv リソグラフィックィックマスクパターンのための近接効果補正フィーチャの生成方法
JP2007046109A (ja) * 2005-08-10 2007-02-22 Seiko Instruments Inc 電鋳型、電鋳部品及び電鋳部品の製造方法
JP2011248347A (ja) * 2010-04-28 2011-12-08 Semiconductor Energy Lab Co Ltd フォトマスク
JP2016057158A (ja) * 2014-09-09 2016-04-21 セイコーインスツル株式会社 時計部品、ムーブメント、時計、および時計部品の製造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5920487A (en) * 1997-03-03 1999-07-06 Motorola Inc. Two dimensional lithographic proximity correction using DRC shape functions
JP3998458B2 (ja) * 2001-11-08 2007-10-24 富士通株式会社 波長に依存しないリソグラフィ用の露光パターン生成方法及び露光パターン生成装置
JP2003255508A (ja) * 2002-02-28 2003-09-10 Oki Electric Ind Co Ltd マスクパターンの補正方法、フォトマスク、露光方法、半導体装置
JP4550569B2 (ja) 2004-12-20 2010-09-22 セイコーインスツル株式会社 電鋳型とその製造方法
JP7575904B2 (ja) 2019-09-30 2024-10-30 国立大学法人 東京大学 鉄系酸化物磁性粉およびその製造方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63216052A (ja) * 1987-03-05 1988-09-08 Fujitsu Ltd 露光方法
JPH04127150A (ja) * 1990-09-19 1992-04-28 Hitachi Ltd 半導体装置の製造方法
JP2006343776A (ja) * 1995-05-03 2006-12-21 Asml Masktools Bv リソグラフィックィックマスクパターンのための近接効果補正フィーチャの生成方法
JP2007046109A (ja) * 2005-08-10 2007-02-22 Seiko Instruments Inc 電鋳型、電鋳部品及び電鋳部品の製造方法
JP2011248347A (ja) * 2010-04-28 2011-12-08 Semiconductor Energy Lab Co Ltd フォトマスク
JP2016057158A (ja) * 2014-09-09 2016-04-21 セイコーインスツル株式会社 時計部品、ムーブメント、時計、および時計部品の製造方法

Also Published As

Publication number Publication date
EP4317535A1 (en) 2024-02-07
CN117098875A (zh) 2023-11-21
US20240176229A1 (en) 2024-05-30
WO2022210159A1 (ja) 2022-10-06
JP7764467B2 (ja) 2025-11-05
EP4317535A4 (en) 2025-10-22

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