JPWO2022196394A1 - - Google Patents

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Publication number
JPWO2022196394A1
JPWO2022196394A1 JP2023506970A JP2023506970A JPWO2022196394A1 JP WO2022196394 A1 JPWO2022196394 A1 JP WO2022196394A1 JP 2023506970 A JP2023506970 A JP 2023506970A JP 2023506970 A JP2023506970 A JP 2023506970A JP WO2022196394 A1 JPWO2022196394 A1 JP WO2022196394A1
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JP
Japan
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JP2023506970A
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Japanese (ja)
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JPWO2022196394A5 (https=
JP7811935B2 (ja
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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/11Comprising a photonic bandgap structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • H01S5/0425Electrodes, e.g. characterised by the structure
    • H01S5/04254Electrodes, e.g. characterised by the structure characterised by the shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • H01S5/0425Electrodes, e.g. characterised by the structure
    • H01S5/04256Electrodes, e.g. characterised by the structure characterised by the configuration
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2222Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special electric properties
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2301/00Functional characteristics
    • H01S2301/17Semiconductor lasers comprising special layers
    • H01S2301/176Specific passivation layers on surfaces other than the emission facet
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/062Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
    • H01S5/06226Modulation at ultra-high frequencies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • H01S5/185Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only horizontal cavities, e.g. horizontal cavity surface-emitting lasers [HCSEL]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/2054Methods of obtaining the confinement
    • H01S5/2081Methods of obtaining the confinement using special etching techniques
    • H01S5/2086Methods of obtaining the confinement using special etching techniques lateral etch control, e.g. mask induced
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/20Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223Buried stripe structure
    • H01S5/2231Buried stripe structure with inner confining structure only between the active layer and the upper electrode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34306Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000nm, e.g. InP based 1300 and 1500nm lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Geometry (AREA)
  • Semiconductor Lasers (AREA)
JP2023506970A 2021-03-19 2022-03-04 フォトニック結晶面発光レーザおよびその製造方法 Active JP7811935B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021045486 2021-03-19
JP2021045486 2021-03-19
PCT/JP2022/009415 WO2022196394A1 (ja) 2021-03-19 2022-03-04 フォトニック結晶面発光レーザおよびその製造方法

Publications (3)

Publication Number Publication Date
JPWO2022196394A1 true JPWO2022196394A1 (https=) 2022-09-22
JPWO2022196394A5 JPWO2022196394A5 (https=) 2023-12-14
JP7811935B2 JP7811935B2 (ja) 2026-02-06

Family

ID=83320370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023506970A Active JP7811935B2 (ja) 2021-03-19 2022-03-04 フォトニック結晶面発光レーザおよびその製造方法

Country Status (5)

Country Link
US (1) US20240170917A1 (https=)
EP (1) EP4311043A4 (https=)
JP (1) JP7811935B2 (https=)
CN (1) CN116918200A (https=)
WO (1) WO2022196394A1 (https=)

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0548210A (ja) * 1991-08-09 1993-02-26 Mitsubishi Electric Corp 半導体レーザ装置
JPH0918081A (ja) * 1995-06-29 1997-01-17 Mitsubishi Electric Corp 半導体レーザ
JP2003264346A (ja) * 2002-03-08 2003-09-19 Sanyo Electric Co Ltd 窒化物系半導体レーザ素子
JP2005203644A (ja) * 2004-01-19 2005-07-28 Yokogawa Electric Corp 面発光レーザ
JP2006128548A (ja) * 2004-11-01 2006-05-18 Seiko Epson Corp 面発光型半導体レーザおよびその製造方法、光モジュール、並びに、光伝達装置
JP2007234835A (ja) * 2006-02-28 2007-09-13 Canon Inc 垂直共振器型面発光レーザ
JP2008500711A (ja) * 2004-05-28 2008-01-10 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 垂直の放出方向を有する面放出型の半導体レーザ素子
JP2008047638A (ja) * 2006-08-11 2008-02-28 Sumitomo Electric Ind Ltd 面発光レーザ素子およびその製造方法、ならびに面発光レーザアレイおよびその製造方法
JP2008085033A (ja) * 2006-09-27 2008-04-10 Canon Inc 発光素子およびそれを用いた表示素子
WO2008117562A1 (ja) * 2007-03-23 2008-10-02 Sumitomo Electric Industries, Ltd. フォトニック結晶レーザおよびフォトニック結晶レーザの製造方法
JP2010283335A (ja) * 2009-05-07 2010-12-16 Canon Inc フォトニック結晶面発光レーザ
JP2011124301A (ja) * 2009-12-09 2011-06-23 Canon Inc 二次元フォトニック結晶面発光レーザ
CN102623890A (zh) * 2012-03-27 2012-08-01 北京工业大学 多孔缺陷匹配型光子晶体面发射激光器
US20150288146A1 (en) * 2011-04-29 2015-10-08 The Regents Of The University Of California Vertical cavity surface emitting lasers with silicon-on-insulator high contrast grating
JP2018198302A (ja) * 2016-07-25 2018-12-13 浜松ホトニクス株式会社 半導体発光素子およびその製造方法
JP2019016750A (ja) * 2017-07-10 2019-01-31 浜松ホトニクス株式会社 半導体レーザ素子
WO2019111787A1 (ja) * 2017-12-08 2019-06-13 浜松ホトニクス株式会社 発光装置およびその製造方法
US10340659B1 (en) * 2018-06-14 2019-07-02 Conary Enterprise Co., Ltd. Electronically pumped surface-emitting photonic crystal laser

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4793820B2 (ja) 2006-03-20 2011-10-12 国立大学法人京都大学 2次元フォトニック結晶面発光レーザ光源

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0548210A (ja) * 1991-08-09 1993-02-26 Mitsubishi Electric Corp 半導体レーザ装置
JPH0918081A (ja) * 1995-06-29 1997-01-17 Mitsubishi Electric Corp 半導体レーザ
JP2003264346A (ja) * 2002-03-08 2003-09-19 Sanyo Electric Co Ltd 窒化物系半導体レーザ素子
JP2005203644A (ja) * 2004-01-19 2005-07-28 Yokogawa Electric Corp 面発光レーザ
JP2008500711A (ja) * 2004-05-28 2008-01-10 オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング 垂直の放出方向を有する面放出型の半導体レーザ素子
JP2006128548A (ja) * 2004-11-01 2006-05-18 Seiko Epson Corp 面発光型半導体レーザおよびその製造方法、光モジュール、並びに、光伝達装置
JP2007234835A (ja) * 2006-02-28 2007-09-13 Canon Inc 垂直共振器型面発光レーザ
JP2008047638A (ja) * 2006-08-11 2008-02-28 Sumitomo Electric Ind Ltd 面発光レーザ素子およびその製造方法、ならびに面発光レーザアレイおよびその製造方法
JP2008085033A (ja) * 2006-09-27 2008-04-10 Canon Inc 発光素子およびそれを用いた表示素子
WO2008117562A1 (ja) * 2007-03-23 2008-10-02 Sumitomo Electric Industries, Ltd. フォトニック結晶レーザおよびフォトニック結晶レーザの製造方法
JP2010283335A (ja) * 2009-05-07 2010-12-16 Canon Inc フォトニック結晶面発光レーザ
JP2011124301A (ja) * 2009-12-09 2011-06-23 Canon Inc 二次元フォトニック結晶面発光レーザ
US20150288146A1 (en) * 2011-04-29 2015-10-08 The Regents Of The University Of California Vertical cavity surface emitting lasers with silicon-on-insulator high contrast grating
CN102623890A (zh) * 2012-03-27 2012-08-01 北京工业大学 多孔缺陷匹配型光子晶体面发射激光器
JP2018198302A (ja) * 2016-07-25 2018-12-13 浜松ホトニクス株式会社 半導体発光素子およびその製造方法
JP2019016750A (ja) * 2017-07-10 2019-01-31 浜松ホトニクス株式会社 半導体レーザ素子
WO2019111787A1 (ja) * 2017-12-08 2019-06-13 浜松ホトニクス株式会社 発光装置およびその製造方法
US10340659B1 (en) * 2018-06-14 2019-07-02 Conary Enterprise Co., Ltd. Electronically pumped surface-emitting photonic crystal laser

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CARL REUTERSKIOLD HEDLUND, ET AL.: ""Buried-Tunnel Junction Current Injection for InP-Based Nanomembrane Photonic Crystal Surface Emitt", PHYSICA STATUS SOLIDI (A), vol. 217, no. 3, JPN6025040697, 12 September 2019 (2019-09-12), pages 1900527, ISSN: 0005774965 *

Also Published As

Publication number Publication date
WO2022196394A1 (ja) 2022-09-22
EP4311043A1 (en) 2024-01-24
CN116918200A (zh) 2023-10-20
JP7811935B2 (ja) 2026-02-06
US20240170917A1 (en) 2024-05-23
EP4311043A4 (en) 2024-08-28

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