JPWO2022157905A5 - - Google Patents

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Publication number
JPWO2022157905A5
JPWO2022157905A5 JP2022576313A JP2022576313A JPWO2022157905A5 JP WO2022157905 A5 JPWO2022157905 A5 JP WO2022157905A5 JP 2022576313 A JP2022576313 A JP 2022576313A JP 2022576313 A JP2022576313 A JP 2022576313A JP WO2022157905 A5 JPWO2022157905 A5 JP WO2022157905A5
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JP
Japan
Prior art keywords
gas
humidity
temperature
mass spectrometer
circuit board
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JP2022576313A
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English (en)
Japanese (ja)
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JP7449418B2 (ja
JPWO2022157905A1 (https=
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Priority claimed from PCT/JP2021/002136 external-priority patent/WO2022157905A1/ja
Publication of JPWO2022157905A1 publication Critical patent/JPWO2022157905A1/ja
Publication of JPWO2022157905A5 publication Critical patent/JPWO2022157905A5/ja
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Publication of JP7449418B2 publication Critical patent/JP7449418B2/ja
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JP2022576313A 2021-01-22 2021-01-22 質量分析装置 Active JP7449418B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/002136 WO2022157905A1 (ja) 2021-01-22 2021-01-22 質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2022157905A1 JPWO2022157905A1 (https=) 2022-07-28
JPWO2022157905A5 true JPWO2022157905A5 (https=) 2023-07-26
JP7449418B2 JP7449418B2 (ja) 2024-03-13

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ID=82548594

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Application Number Title Priority Date Filing Date
JP2022576313A Active JP7449418B2 (ja) 2021-01-22 2021-01-22 質量分析装置

Country Status (5)

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US (1) US20230402273A1 (https=)
EP (1) EP4283657B1 (https=)
JP (1) JP7449418B2 (https=)
CN (1) CN116745883A (https=)
WO (1) WO2022157905A1 (https=)

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4260886A (en) * 1979-09-07 1981-04-07 Rca Corporation Measurement of a gas constituent by a mass spectrometer
JPS6271712U (https=) * 1985-10-22 1987-05-08
JPH0418960U (https=) * 1990-06-06 1992-02-18
JP2003166785A (ja) 2001-11-30 2003-06-13 Dainippon Printing Co Ltd 乾燥装置
EP2591482B1 (en) * 2010-07-09 2017-05-24 Micromass UK Limited Capacitor assembly for a mass spectrometer
JP5285735B2 (ja) * 2011-03-31 2013-09-11 株式会社日立ハイテクノロジーズ 質量分析装置
US8455815B2 (en) * 2011-07-15 2013-06-04 Bruker Daltonics, Inc. Radio frequency voltage temperature stabilization
JP5970274B2 (ja) * 2012-07-18 2016-08-17 株式会社日立ハイテクノロジーズ 質量分析装置
JP5847678B2 (ja) * 2012-09-14 2016-01-27 株式会社日立ハイテクノロジーズ 質量分析装置及び方法
JP2014123469A (ja) 2012-12-20 2014-07-03 Hitachi High-Technologies Corp 質量分析装置および質量分析装置の調整方法
JP6047414B2 (ja) 2013-01-30 2016-12-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6205806B2 (ja) 2013-04-08 2017-10-04 コニカミノルタ株式会社 RIfS(反射干渉分光法)測定装置
JP6313092B2 (ja) * 2014-03-31 2018-04-18 キヤノンメディカルシステムズ株式会社 X線コンピュータ断層撮影装置
GB2533168B (en) 2014-12-12 2017-05-24 Thermo Fisher Scient (Bremen) Gmbh An electrical connection assembly
GB2552965B (en) 2016-08-15 2020-07-15 Thermo Fisher Scient Bremen Gmbh Temperature-compensated rectifying component
US10971348B2 (en) * 2017-07-11 2021-04-06 Thermo Finnigan Apparatus for delivering reagent ions to a mass spectrometer
CN120275621A (zh) * 2017-12-19 2025-07-08 拜克门寇尔特公司 具有可变工作流的集成样品处理系统
WO2020213283A1 (ja) 2019-04-16 2020-10-22 株式会社日立ハイテク 質量分析装置および質量分析方法

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